DE60217943D1 - Nitrid-Halbleitervorrichtung und Verfahren zu deren Herstellung - Google Patents
Nitrid-Halbleitervorrichtung und Verfahren zu deren HerstellungInfo
- Publication number
- DE60217943D1 DE60217943D1 DE60217943T DE60217943T DE60217943D1 DE 60217943 D1 DE60217943 D1 DE 60217943D1 DE 60217943 T DE60217943 T DE 60217943T DE 60217943 T DE60217943 T DE 60217943T DE 60217943 D1 DE60217943 D1 DE 60217943D1
- Authority
- DE
- Germany
- Prior art keywords
- making
- same
- semiconductor device
- nitride semiconductor
- nitride
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 150000004767 nitrides Chemical class 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/813—Bodies having a plurality of light-emitting regions, e.g. multi-junction LEDs or light-emitting devices having photoluminescent regions within the bodies
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/816—Bodies having carrier transport control structures, e.g. highly-doped semiconductor layers or current-blocking structures
- H10H20/8162—Current-blocking structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
- H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
- H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001177383A JP3909811B2 (ja) | 2001-06-12 | 2001-06-12 | 窒化物半導体素子及びその製造方法 |
JP2001177383 | 2001-06-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60217943D1 true DE60217943D1 (de) | 2007-03-22 |
DE60217943T2 DE60217943T2 (de) | 2007-10-18 |
Family
ID=19018234
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60217943T Expired - Lifetime DE60217943T2 (de) | 2001-06-12 | 2002-06-06 | Nitrid-Halbleitervorrichtung und Verfahren zu deren Herstellung |
Country Status (7)
Country | Link |
---|---|
US (1) | US6693303B2 (de) |
EP (1) | EP1267422B1 (de) |
JP (1) | JP3909811B2 (de) |
KR (1) | KR100448662B1 (de) |
CN (1) | CN1249820C (de) |
DE (1) | DE60217943T2 (de) |
TW (1) | TW569470B (de) |
Families Citing this family (65)
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DE10260937A1 (de) * | 2002-12-20 | 2004-07-08 | Technische Universität Braunschweig | Strahlungssemittierender Halbleiterkörper und Verfahren zu dessen Herstellung |
JP3767863B2 (ja) * | 2003-12-18 | 2006-04-19 | ローム株式会社 | 半導体発光素子およびその製法 |
KR100678854B1 (ko) | 2004-04-13 | 2007-02-05 | 엘지이노텍 주식회사 | 발광 다이오드 및 그 제조방법 |
US7446345B2 (en) * | 2005-04-29 | 2008-11-04 | Cree, Inc. | Light emitting devices with active layers that extend into opened pits |
JP2006339550A (ja) * | 2005-06-06 | 2006-12-14 | Sony Corp | 半導体素子及びその製造方法、並びに半導体装置及びその製造方法 |
US7535031B2 (en) * | 2005-09-13 | 2009-05-19 | Philips Lumiled Lighting, Co. Llc | Semiconductor light emitting device with lateral current injection in the light emitting region |
JP4895587B2 (ja) * | 2005-11-29 | 2012-03-14 | ローム株式会社 | 窒化物半導体発光素子 |
JP2013157648A (ja) * | 2006-01-12 | 2013-08-15 | Mitsubishi Chemicals Corp | GaN系発光素子およびその製造方法 |
JP5305588B2 (ja) * | 2006-01-12 | 2013-10-02 | 三菱化学株式会社 | GaN系発光素子およびその製造方法 |
JP2007214378A (ja) * | 2006-02-09 | 2007-08-23 | Rohm Co Ltd | 窒化物系半導体素子 |
US7560364B2 (en) * | 2006-05-05 | 2009-07-14 | Applied Materials, Inc. | Dislocation-specific lateral epitaxial overgrowth to reduce dislocation density of nitride films |
US20090078310A1 (en) * | 2007-09-24 | 2009-03-26 | Emcore Corporation | Heterojunction Subcells In Inverted Metamorphic Multijunction Solar Cells |
US20090078309A1 (en) * | 2007-09-24 | 2009-03-26 | Emcore Corporation | Barrier Layers In Inverted Metamorphic Multijunction Solar Cells |
KR100771792B1 (ko) * | 2006-09-04 | 2007-10-30 | 삼성전기주식회사 | 질화물 반도체 발광 소자 및 제조방법 |
JP4962130B2 (ja) * | 2007-04-04 | 2012-06-27 | 三菱化学株式会社 | GaN系半導体発光ダイオードの製造方法 |
KR101164026B1 (ko) * | 2007-07-12 | 2012-07-18 | 삼성전자주식회사 | 질화물계 반도체 발광소자 및 그 제조방법 |
US8895342B2 (en) | 2007-09-24 | 2014-11-25 | Emcore Solar Power, Inc. | Heterojunction subcells in inverted metamorphic multijunction solar cells |
US10381505B2 (en) | 2007-09-24 | 2019-08-13 | Solaero Technologies Corp. | Inverted metamorphic multijunction solar cells including metamorphic layers |
US20090078311A1 (en) * | 2007-09-24 | 2009-03-26 | Emcore Corporation | Surfactant Assisted Growth in Barrier Layers In Inverted Metamorphic Multijunction Solar Cells |
US20090229658A1 (en) * | 2008-03-13 | 2009-09-17 | Emcore Corporation | Non-Isoelectronic Surfactant Assisted Growth In Inverted Metamorphic Multijunction Solar Cells |
US8415654B2 (en) * | 2008-03-27 | 2013-04-09 | Nitek, Inc. | Low resistance ultraviolet light emitting device and method of fabricating the same |
JP2010232597A (ja) * | 2009-03-30 | 2010-10-14 | Toyoda Gosei Co Ltd | Iii族窒化物系化合物半導体発光素子及びその製造方法 |
JP5306904B2 (ja) * | 2009-05-28 | 2013-10-02 | シャープ株式会社 | 窒化物半導体発光ダイオード素子およびその製造方法 |
TWI478381B (zh) * | 2009-06-08 | 2015-03-21 | Epistar Corp | 發光元件及其製造方法 |
US8525221B2 (en) * | 2009-11-25 | 2013-09-03 | Toshiba Techno Center, Inc. | LED with improved injection efficiency |
DE102009060750B4 (de) | 2009-12-30 | 2025-04-10 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronischer Halbleiterchip und Verfahren zu dessen Herstellung |
US8421057B2 (en) * | 2010-06-25 | 2013-04-16 | Invenlux Corporation | Light-emitting devices with improved active-region |
US8476652B2 (en) | 2010-07-30 | 2013-07-02 | Invenlux Corporation | Three-dimensional light-emitting devices and method for fabricating the same |
US9287452B2 (en) * | 2010-08-09 | 2016-03-15 | Micron Technology, Inc. | Solid state lighting devices with dielectric insulation and methods of manufacturing |
GB2483689A (en) * | 2010-09-16 | 2012-03-21 | Sharp Kk | A method of reducing the density of threading dislocations in light emitting devices, by the selective creation of cavities |
CN102487111B (zh) * | 2010-12-04 | 2014-08-27 | 展晶科技(深圳)有限公司 | 半导体发光芯片制造方法 |
EP2482343B1 (de) * | 2011-01-26 | 2019-11-27 | LG Innotek Co., Ltd. | Halbleiterbasierte Leuchtdiode |
RU2494498C2 (ru) * | 2011-02-24 | 2013-09-27 | Юрий Георгиевич Шретер | Светоизлучающее полупроводниковое устройство |
US20120119254A1 (en) * | 2011-07-08 | 2012-05-17 | Yong Tae Moon | Light emitting device, light emitting device package and lighting system including the same |
JP6005346B2 (ja) * | 2011-08-12 | 2016-10-12 | シャープ株式会社 | 窒化物半導体発光素子およびその製造方法 |
KR101827973B1 (ko) * | 2011-09-06 | 2018-02-13 | 엘지이노텍 주식회사 | 발광소자 |
JP5162016B1 (ja) * | 2011-09-15 | 2013-03-13 | 株式会社東芝 | 半導体素子、ウェーハ、半導体素子の製造方法及びウェーハの製造方法 |
US8698163B2 (en) * | 2011-09-29 | 2014-04-15 | Toshiba Techno Center Inc. | P-type doping layers for use with light emitting devices |
KR101838019B1 (ko) * | 2011-10-10 | 2018-03-13 | 엘지이노텍 주식회사 | 발광 소자 및 그 제조 방법 |
US9184344B2 (en) | 2012-01-25 | 2015-11-10 | Invenlux Limited | Lighting-emitting device with nanostructured layer and method for fabricating the same |
KR101881064B1 (ko) | 2012-03-05 | 2018-07-24 | 삼성전자주식회사 | 질화물 반도체 발광소자 및 그 제조방법 |
KR102050052B1 (ko) * | 2012-11-02 | 2019-11-28 | 엘지이노텍 주식회사 | 발광소자 |
US9890353B2 (en) | 2013-03-15 | 2018-02-13 | Janssen Biotech, Inc. | Media suction devices and methods |
DE102013103601A1 (de) * | 2013-04-10 | 2014-10-16 | Osram Opto Semiconductors Gmbh | Optoelektronisches Bauelement und Verfahren zur Herstellung eines optoelektronischen Bauelements |
DE102013103602A1 (de) * | 2013-04-10 | 2014-10-16 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterchip und Verfahren zu seiner Herstellung |
DE102014115599A1 (de) * | 2013-10-28 | 2015-04-30 | Seoul Viosys Co., Ltd. | Halbleitervorrichtung und Verfahren zu deren Herstellung |
JP2015177025A (ja) * | 2014-03-14 | 2015-10-05 | 株式会社東芝 | 光半導体素子 |
CN106415860B (zh) * | 2014-06-03 | 2020-02-14 | 夏普株式会社 | 氮化物半导体发光元件 |
JP2016063176A (ja) | 2014-09-22 | 2016-04-25 | スタンレー電気株式会社 | 半導体発光素子 |
CN107924966B (zh) * | 2014-09-22 | 2020-12-22 | 夏普株式会社 | 氮化物半导体发光元件 |
CN104733579B (zh) * | 2015-01-20 | 2018-05-08 | 扬州德豪润达光电有限公司 | 半导体发光器件及其制备方法 |
JP6380172B2 (ja) | 2015-03-06 | 2018-08-29 | 豊田合成株式会社 | Iii族窒化物半導体発光素子とその製造方法 |
DE102015104665A1 (de) * | 2015-03-26 | 2016-09-29 | Osram Opto Semiconductors Gmbh | Optoelektronischer Halbleiterkörper und Verfahren zur Herstellung eines optoelektronischen Halbleiterkörpers |
CN104894532B (zh) * | 2015-04-23 | 2018-07-10 | 安徽三安光电有限公司 | 一种改善漏电流的发光二极管制备方法 |
KR102320476B1 (ko) * | 2015-05-08 | 2021-11-02 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 발광 소자 및 이의 제조 방법 |
DE102015116712B4 (de) * | 2015-10-01 | 2024-11-28 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronisches Bauelement |
KR102569461B1 (ko) * | 2015-11-30 | 2023-09-04 | 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 | 발광소자 및 이를 포함하는 조명장치 |
CN105405939B (zh) * | 2015-12-02 | 2018-01-12 | 华灿光电(苏州)有限公司 | 一种发光二极管及其制造方法 |
DE102016103346A1 (de) | 2016-02-25 | 2017-08-31 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines strahlungsemittierenden Halbleiterchips und strahlungsemittierender Halbleiterchip |
JP6188866B2 (ja) * | 2016-05-19 | 2017-08-30 | シャープ株式会社 | 窒化物半導体発光素子の製造方法 |
DE102016208717B4 (de) * | 2016-05-20 | 2022-03-24 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Bauelement mit erhöhter Effizienz und Verfahren zur Herstellung eines Bauelements |
CN108807613A (zh) * | 2018-06-27 | 2018-11-13 | 聚灿光电科技股份有限公司 | Led外延结构及其制备方法 |
DE102019131422A1 (de) * | 2019-11-21 | 2021-05-27 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Optoelektronisches Bauelement und Verfahren zu dessen Herstellung |
CN112786743B (zh) * | 2021-01-26 | 2022-04-01 | 中国科学院半导体研究所 | 基于v坑调控的橙黄光led器件及其制备方法 |
JP7419652B2 (ja) * | 2021-11-22 | 2024-01-23 | 日亜化学工業株式会社 | 発光素子 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02150079A (ja) * | 1988-11-30 | 1990-06-08 | Oki Electric Ind Co Ltd | スーパールミネッセントダイオード |
JP3787195B2 (ja) * | 1996-09-06 | 2006-06-21 | シャープ株式会社 | 窒化ガリウム系化合物半導体発光素子の製造方法 |
US6281524B1 (en) * | 1997-02-21 | 2001-08-28 | Kabushiki Kaisha Toshiba | Semiconductor light-emitting device |
JP3925753B2 (ja) * | 1997-10-24 | 2007-06-06 | ソニー株式会社 | 半導体素子およびその製造方法ならびに半導体発光素子 |
JP3594826B2 (ja) * | 1999-02-09 | 2004-12-02 | パイオニア株式会社 | 窒化物半導体発光素子及びその製造方法 |
KR100323710B1 (ko) * | 1999-04-20 | 2002-02-07 | 구자홍 | 질화갈륨 반도체 레이저 기판의 제조방법 |
JP3656456B2 (ja) * | 1999-04-21 | 2005-06-08 | 日亜化学工業株式会社 | 窒化物半導体素子 |
JP3786544B2 (ja) * | 1999-06-10 | 2006-06-14 | パイオニア株式会社 | 窒化物半導体素子の製造方法及びかかる方法により製造された素子 |
JP3294223B2 (ja) * | 1999-08-18 | 2002-06-24 | 学校法人 名城大学 | 半導体の製造方法および該方法により製造した半導体素子 |
JP3583375B2 (ja) * | 2001-03-02 | 2004-11-04 | 三菱電線工業株式会社 | GaN系半導体基材およびその製造方法 |
-
2001
- 2001-06-12 JP JP2001177383A patent/JP3909811B2/ja not_active Expired - Fee Related
-
2002
- 2002-06-06 EP EP02012624A patent/EP1267422B1/de not_active Expired - Lifetime
- 2002-06-06 DE DE60217943T patent/DE60217943T2/de not_active Expired - Lifetime
- 2002-06-07 TW TW091112407A patent/TW569470B/zh not_active IP Right Cessation
- 2002-06-11 US US10/166,048 patent/US6693303B2/en not_active Expired - Lifetime
- 2002-06-12 CN CN02123204.0A patent/CN1249820C/zh not_active Expired - Fee Related
- 2002-06-12 KR KR10-2002-0032837A patent/KR100448662B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JP3909811B2 (ja) | 2007-04-25 |
EP1267422A3 (de) | 2005-08-03 |
EP1267422A2 (de) | 2002-12-18 |
EP1267422B1 (de) | 2007-01-31 |
TW569470B (en) | 2004-01-01 |
CN1249820C (zh) | 2006-04-05 |
JP2002368269A (ja) | 2002-12-20 |
US20030001161A1 (en) | 2003-01-02 |
KR20030006990A (ko) | 2003-01-23 |
KR100448662B1 (ko) | 2004-09-13 |
DE60217943T2 (de) | 2007-10-18 |
CN1391293A (zh) | 2003-01-15 |
US6693303B2 (en) | 2004-02-17 |
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Legal Events
Date | Code | Title | Description |
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8320 | Willingness to grant licences declared (paragraph 23) | ||
8364 | No opposition during term of opposition |