JP6760930B2 - 研磨用物品、及び、化学機械研磨用物品を製造するための統合型のシステムと方法 - Google Patents
研磨用物品、及び、化学機械研磨用物品を製造するための統合型のシステムと方法 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/10—Processes of additive manufacturing
- B29C64/106—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material
- B29C64/112—Processes of additive manufacturing using only liquids or viscous materials, e.g. depositing a continuous bead of viscous material using individual droplets, e.g. from jetting heads
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y10/00—Processes of additive manufacturing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y30/00—Apparatus for additive manufacturing; Details thereof or accessories therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y70/00—Materials specially adapted for additive manufacturing
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y80/00—Products made by additive manufacturing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2105/00—Condition, form or state of moulded material or of the material to be shaped
- B29K2105/06—Condition, form or state of moulded material or of the material to be shaped containing reinforcements, fillers or inserts
- B29K2105/16—Fillers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2995/00—Properties of moulding materials, reinforcements, fillers, preformed parts or moulds
- B29K2995/0037—Other properties
- B29K2995/007—Hardness
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
- B29L2031/00—Other particular articles
- B29L2031/736—Grinding or polishing equipment
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Optics & Photonics (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Polishing Bodies And Polishing Tools (AREA)
Description
基板上の集積回路及びその他の電子デバイスの製造においては、導電性材料、半導体材料、及び誘電体材料の多重層が、基板のフィーチャ側に堆積されるか、又は、基板のフィーチャ側から除去される。基板上でのこれらの材料の逐次的な堆積と除去は、フィーチャ側の非平面化を引き起こし、一般的に研磨と称される平坦化プロセスを要しうる。このプロセスでは、概して平坦な、平面の、又は水平な表面を形成するために、既に堆積されている材料が基板のフィーチャ側から除去される。このプロセスは、望ましくない表面の凹凸、並びに、粗面、凝集材料、結晶格子の損傷、及び傷などの表面不具合を、除去することに役立つ。研磨プロセスは、フィーチャを充填するため、並びに、後続の堆積及び処理向けに平坦又は水平な表面を提供するために使用された、堆積材料の余剰分を除去することによって、基板上にフィーチャを形成することにも役立つ。
図5A及び図5Bには、図2のプラテンアセンブリ132で使用されうる研磨用物品500の一実施形態が描かれている。研磨用物品500の研磨面505は、図3A及び図3Bのパターニングされた表面328を形成する、複数の細片部又はタイル532を備える。タイル532は、研磨材料570内に、又は研磨材料570を通って形成された、溝530によって隔てられている。研磨材料570は、バッキング材料522などのキャリアフィルムに付着していることがある。一実施形態では、少なくとも研磨面505は、図3Aから図4Bで説明した3D印刷プロセスによって製造されうる。研磨面505は、CMPプロセスで使用される化学的要素及び物理的要素に対する耐性で選ばれる適切な接着剤319によって、バッキング材料522に接合されうる。一部の実施形態では、バッキング材料522と接着剤319の一方又は両方が、図3Aから図4Bで説明した3D印刷プロセスによって製造されうる。
Claims (13)
- 研磨用物品製造システムであって、
送り部、及び、巻き取り部であって、前記送り部はバッキング材料を供給するための供給ロールを備え、前記巻き取り部は前記バッキング材料を巻き取るための巻き取りロールを備え、前記巻き取りロールが巻き取った前記バッキング材料の上には化学機械研磨プロセスのための研磨用物品が形成されている、送り部、及び、巻き取り部と、
前記送り部と前記巻き取り部との間に配置された複数のプリントヘッドを備える印刷部であって、前記複数のプリントヘッドは、前記バッキング材料の上に配置され、前記バッキング材料に対する移動が運動制御デバイスにより制御される、印刷部と、
前記印刷部と硬化部の下流の前記巻き取り部との間に配置された硬化部であって、熱硬化デバイスと電磁硬化デバイスの一方又は両方を備える硬化部とを備える、システム。 - 前記プリントヘッドの各々は、第1材料を形成するための第1材料前駆体及び第2材料を形成するための第2材料前駆体を有するソースに連結されている一又は複数のノズルを備える、請求項1に記載のシステム。
- 前記第1材料は、前記第2材料と比較すると、磁気エネルギーとの反応性が異なっている、請求項2に記載のシステム。
- 前記第1材料及び前記第2材料は一つのポリマーマトリクスを形成し、前記第1材料は、前記第1材料内に分散している複数の微小要素を更に含む、請求項2に記載のシステム。
- 前記微小要素は、ポリマー材料、金属材料、セラミック材料、又はそれらの組み合わせを含む、請求項4に記載のシステム。
- 前記微小要素の各々は、約150ミクロン〜約10ミクロン、又はそれを下回る平均径を含む、請求項4に記載のシステム。
- 複合パッド本体であって、
研磨面を形成する複数の研磨フィーチャであって、第1材料で形成されている、複数の研磨フィーチャと、
第2材料で形成された一又は複数のベースフィーチャとを備え、
前記一又は複数のベースフィーチャ及び前記複数の研磨フィーチャは、パッド前駆体材料の層の逐次的な堆積と重合により形成され、前記一又は複数のベースフィーチャの部分は少なくとも部分的に前記複数の研磨フィーチャのそれぞれを囲んで境界で結合されて一体化しており、前記第1材料は前記第2材料の硬度よりも高い硬度を有する、複合パッド本体を備え、
前記複合パッド本体はベースフィルム上に配置され、前記ベースフィルムは電磁エネルギーを透過させる、化学機械研磨用の研磨用物品。 - 前記複数の研磨フィーチャは、前記第1材料と比較すると、磁気エネルギーとの反応性が異なっている第3材料を含み、前記研磨面にテクスチャを形成する、請求項7に記載の研磨用物品。
- 前記第1材料はポリマーマトリクスであり、前記第3材料は、前記第1材料内に分散している複数の微小要素を含む、請求項8に記載の研磨用物品。
- 前記微小要素は、ポリマー材料、金属材料、セラミック材料、又はそれらの組み合わせを含む、請求項9に記載の研磨用物品。
- 前記微小要素の各々は、約150ミクロン〜約10ミクロン、又はそれを下回る平均径を含む、請求項9に記載の研磨用物品。
- 前記第1材料は、ショアDスケールで約40〜約90の硬度を備える、請求項7に記載の研磨用物品。
- 前記第2材料は、ショアAスケールで約26〜約95の硬度を備える、請求項12に記載の研磨用物品。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US201462065533P | 2014-10-17 | 2014-10-17 | |
US62/065,533 | 2014-10-17 | ||
PCT/US2015/053465 WO2016060857A1 (en) | 2014-10-17 | 2015-10-01 | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
Publications (2)
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JP2017533105A JP2017533105A (ja) | 2017-11-09 |
JP6760930B2 true JP6760930B2 (ja) | 2020-09-23 |
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JP2017520353A Active JP6760930B2 (ja) | 2014-10-17 | 2015-10-01 | 研磨用物品、及び、化学機械研磨用物品を製造するための統合型のシステムと方法 |
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US (3) | US9776361B2 (ja) |
EP (2) | EP3207559B1 (ja) |
JP (1) | JP6760930B2 (ja) |
KR (3) | KR102598725B1 (ja) |
CN (2) | CN107073679B (ja) |
SG (2) | SG10202110980SA (ja) |
TW (3) | TWI748222B (ja) |
WO (1) | WO2016060857A1 (ja) |
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US20200101657A1 (en) | 2020-04-02 |
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TW201945129A (zh) | 2019-12-01 |
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KR102598725B1 (ko) | 2023-11-07 |
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EP4276885A1 (en) | 2023-11-15 |
CN110238752B (zh) | 2021-12-10 |
TWI671162B (zh) | 2019-09-11 |
CN107073679A (zh) | 2017-08-18 |
SG10202110980SA (en) | 2021-11-29 |
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