[go: up one dir, main page]

DE60131895D1 - Vorrichtung zur beladung eines behälters, der in einem fims-system verwendung findet - Google Patents

Vorrichtung zur beladung eines behälters, der in einem fims-system verwendung findet

Info

Publication number
DE60131895D1
DE60131895D1 DE60131895T DE60131895T DE60131895D1 DE 60131895 D1 DE60131895 D1 DE 60131895D1 DE 60131895 T DE60131895 T DE 60131895T DE 60131895 T DE60131895 T DE 60131895T DE 60131895 D1 DE60131895 D1 DE 60131895D1
Authority
DE
Germany
Prior art keywords
link
along
carriage
travel path
drive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60131895T
Other languages
English (en)
Other versions
DE60131895T2 (de
Inventor
Paul Bacchi
Paul S Filipski
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Azenta Inc
Original Assignee
Newport Corp USA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Newport Corp USA filed Critical Newport Corp USA
Application granted granted Critical
Publication of DE60131895D1 publication Critical patent/DE60131895D1/de
Publication of DE60131895T2 publication Critical patent/DE60131895T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/6735—Closed carriers
    • H01L21/67373—Closed carriers characterised by locking systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J61/00—Gas-discharge or vapour-discharge lamps
    • H01J61/02—Details
    • H01J61/30—Vessels; Containers
    • H01J61/35—Vessels; Containers provided with coatings on the walls thereof; Selection of materials for the coatings
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J65/00—Lamps without any electrode inside the vessel; Lamps with at least one main electrode outside the vessel
    • H01J65/04—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels
    • H01J65/042—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field
    • H01J65/046—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field the field being produced by using capacitive means around the vessel
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
    • H01L21/6735—Closed carriers
    • H01L21/67379—Closed carriers characterised by coupling elements, kinematic members, handles or elements to be externally gripped
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67772—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
    • H01L21/67775—Docking arrangements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
    • H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
    • H10D30/0314—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral top-gate TFTs comprising only a single gate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
    • H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/01—Manufacture or treatment
    • H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
    • H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
    • H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
    • H10D30/0323—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon comprising monocrystalline silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6731—Top-gate only TFTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743—Silicon
    • H10D30/6744—Monocrystalline silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743—Silicon
    • H10D30/6745—Polycrystalline or microcrystalline silicon
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01—Manufacture or treatment
    • H10D86/021—Manufacture or treatment of multiple TFTs
    • H10D86/0221—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
    • H10D86/0223—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies comprising crystallisation of amorphous, microcrystalline or polycrystalline semiconductor materials
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01—Manufacture or treatment
    • H10D86/021—Manufacture or treatment of multiple TFTs
    • H10D86/0251—Manufacture or treatment of multiple TFTs characterised by increasing the uniformity of device parameters

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Plasma & Fusion (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Supplying Of Containers To The Packaging Station (AREA)
  • Container Filling Or Packaging Operations (AREA)
  • Warehouses Or Storage Devices (AREA)
  • Auxiliary Devices For And Details Of Packaging Control (AREA)
  • Buffer Packaging (AREA)
  • Circuits Of Receivers In General (AREA)
  • Communication Control (AREA)
DE60131895T 2000-07-10 2001-07-10 Vorrichtung zur beladung eines behälters, der in einem fims-system verwendung findet Expired - Lifetime DE60131895T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/612,757 US6501070B1 (en) 1998-07-13 2000-07-10 Pod load interface equipment adapted for implementation in a fims system
US612757 2000-07-10
PCT/US2001/021804 WO2002005328A2 (en) 2000-07-10 2001-07-10 Pod load interface equipment adapted for implementation in a fims system

Publications (2)

Publication Number Publication Date
DE60131895D1 true DE60131895D1 (de) 2008-01-24
DE60131895T2 DE60131895T2 (de) 2008-11-27

Family

ID=24454532

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60131895T Expired - Lifetime DE60131895T2 (de) 2000-07-10 2001-07-10 Vorrichtung zur beladung eines behälters, der in einem fims-system verwendung findet

Country Status (10)

Country Link
US (5) US6501070B1 (de)
EP (1) EP1356500B1 (de)
JP (3) JP2004509454A (de)
KR (1) KR101163216B1 (de)
CN (1) CN1249775C (de)
AT (1) ATE381115T1 (de)
AU (1) AU2001280508A1 (de)
DE (1) DE60131895T2 (de)
HK (1) HK1060215A1 (de)
WO (1) WO2002005328A2 (de)

Families Citing this family (79)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6501070B1 (en) * 1998-07-13 2002-12-31 Newport Corporation Pod load interface equipment adapted for implementation in a fims system
JP4691281B2 (ja) * 2001-09-03 2011-06-01 ローツェ株式会社 シリンダ及びそれを用いたロードポート並びに生産方式
US6652212B2 (en) * 2000-05-02 2003-11-25 Ckd Corporation Cylinder, load port using it, and production system
US7147424B2 (en) * 2000-07-07 2006-12-12 Applied Materials, Inc. Automatic door opener
US6676356B2 (en) * 2000-09-18 2004-01-13 Tokyo Electron Limited Device for attaching target substrate transfer container to semiconductor processing apparatus
US6581986B2 (en) * 2000-11-21 2003-06-24 Tri Teq Lock And Security, L.L.C. Bayonet locking system and method for vending machines and the like
US6789328B2 (en) * 2001-04-17 2004-09-14 Brooks Automation, Inc. Semiconductor load port alignment device
JP2005520321A (ja) * 2001-07-16 2005-07-07 アシスト テクノロジーズ インコーポレイテッド ツールのフロントエンド加工物処理のための統合システム
US6621694B2 (en) * 2001-09-07 2003-09-16 Harris Corporation Vibration tolerant electronic assembly and related methods
US20080206028A1 (en) * 2001-11-30 2008-08-28 Tatsuhiko Nagata Pod cover removing-installing apparatus
US7344349B2 (en) * 2001-11-30 2008-03-18 Right Mfg. Co., Ltd. Pod cover removing-installing apparatus
JP2003303869A (ja) * 2002-04-05 2003-10-24 Sankyo Seiki Mfg Co Ltd 基板搬送装置における蓋部材開閉装置
KR100922051B1 (ko) * 2002-04-12 2009-10-19 도쿄엘렉트론가부시키가이샤 반도체 처리 장치에 있어서의 포트 구조
US6595075B1 (en) * 2002-05-06 2003-07-22 Taiwan Semiconductor Manufacturing Co., Ltd Method and apparatus for testing cassette pod door
US7677859B2 (en) * 2002-07-22 2010-03-16 Brooks Automation, Inc. Substrate loading and uploading station with buffer
JP4091380B2 (ja) * 2002-08-29 2008-05-28 東京エレクトロン株式会社 被処理体基板を収容した複数種類のカセットに対応可能なロードポート
US6984839B2 (en) * 2002-11-22 2006-01-10 Tdk Corporation Wafer processing apparatus capable of mapping wafers
US20050169730A1 (en) * 2003-04-30 2005-08-04 Ravinder Aggarwal Semiconductor processing tool front end interface with sealing capability
KR100729699B1 (ko) * 2003-05-15 2007-06-19 티디케이가부시기가이샤 클린 박스 개폐 장치를 구비하는 클린 장치
US7621714B2 (en) * 2003-10-23 2009-11-24 Tdk Corporation Pod clamping unit in pod opener, pod corresponding to pod clamping unit, and clamping mechanism and clamping method using pod clamping unit
US7458763B2 (en) 2003-11-10 2008-12-02 Blueshift Technologies, Inc. Mid-entry load lock for semiconductor handling system
US20070269297A1 (en) 2003-11-10 2007-11-22 Meulen Peter V D Semiconductor wafer handling and transport
US10086511B2 (en) 2003-11-10 2018-10-02 Brooks Automation, Inc. Semiconductor manufacturing systems
US20050223837A1 (en) 2003-11-10 2005-10-13 Blueshift Technologies, Inc. Methods and systems for driving robotic components of a semiconductor handling system
TWI246109B (en) * 2004-04-26 2005-12-21 Quanta Display Inc Apparatus for rotating and positioning a substrate-carrying cassette
JP2005340614A (ja) * 2004-05-28 2005-12-08 Tdk Corp クリーンシステム用ロードポート
US7607879B2 (en) * 2004-06-15 2009-10-27 Brooks Automation, Inc. Substrate processing apparatus with removable component module
FR2874744B1 (fr) * 2004-08-30 2006-11-24 Cit Alcatel Interface sous vide entre une boite de mini-environnement et un equipement
US7720558B2 (en) * 2004-09-04 2010-05-18 Applied Materials, Inc. Methods and apparatus for mapping carrier contents
TWI251858B (en) * 2004-09-17 2006-03-21 Ind Tech Res Inst Six-linkage positioning mechanism
JP4373316B2 (ja) * 2004-10-14 2009-11-25 ミライアル株式会社 薄板支持容器用クランプ装置
CN100361270C (zh) * 2005-06-17 2008-01-09 东南大学 外电极荧光灯管及其制备工艺
US8821099B2 (en) * 2005-07-11 2014-09-02 Brooks Automation, Inc. Load port module
DE102006008997A1 (de) 2006-02-23 2007-10-11 Integrated Dynamics Engineering Inc., Randolph Verfahren und Vorrichtung zum Aufnehmen und/oder Transportieren von Substraten
JP4338205B2 (ja) * 2006-03-29 2009-10-07 Ｔｄｋ株式会社 ポッドクランプユニット、ポッドクランプユニットを有するロードポート、ポッド及びロードポートを有するミニエンバイロンメントシステム
US7750909B2 (en) * 2006-05-16 2010-07-06 Sony Corporation Ordering artists by overall degree of influence
DE102006029003A1 (de) * 2006-06-24 2008-01-03 Vistec Semiconductor Systems Gmbh Waferhandhabungsvorrichtung
US20080041758A1 (en) * 2006-08-16 2008-02-21 Taiwan Semiconductor Manufacturing Co., Ltd. Wafer carrier
JP4713424B2 (ja) * 2006-08-24 2011-06-29 川崎重工業株式会社 オープナ側ドア駆動機構
US9117859B2 (en) 2006-08-31 2015-08-25 Brooks Automation, Inc. Compact processing apparatus
JP2008060513A (ja) * 2006-09-04 2008-03-13 Tokyo Electron Ltd 処理装置及び処理方法
US7740437B2 (en) 2006-09-22 2010-06-22 Asm International N.V. Processing system with increased cassette storage capacity
US7585142B2 (en) 2007-03-16 2009-09-08 Asm America, Inc. Substrate handling chamber with movable substrate carrier loading platform
KR100801631B1 (ko) * 2007-08-29 2008-02-11 (주)메머드 핌스로더의 맵핑장치
KR100952183B1 (ko) * 2007-09-28 2010-04-09 한전원자력연료 주식회사 용접치구 자동 장입 및 인출 장치
WO2009066573A1 (ja) * 2007-11-21 2009-05-28 Kabushiki Kaisha Yaskawa Denki 搬送ロボット、それを備えた局所クリーン化された筐体、及びそれを備えた半導体製造装置
JP5532861B2 (ja) * 2008-11-28 2014-06-25 Ｔｄｋ株式会社 密閉容器の蓋閉鎖方法及び密閉容器の蓋開閉システム
EP2320454A1 (de) * 2009-11-05 2011-05-11 S.O.I.Tec Silicon on Insulator Technologies Substrathalter und Klammervorrichtung
DE102009053032B4 (de) * 2009-11-12 2019-07-18 Kuka Deutschland Gmbh Manipulator mit einer frei tragende Arme aufweisenden Gewichtsausgleichsvorrichtung
JP5952526B2 (ja) * 2011-02-04 2016-07-13 株式会社ダイヘン ワーク搬送システム
CN102299050A (zh) * 2011-08-01 2011-12-28 上海宏力半导体制造有限公司 一种晶圆位置探测装置
KR101226746B1 (ko) * 2012-03-06 2013-01-25 유정호 풉 자동 개폐 장치
CN105431933B (zh) 2013-01-22 2018-06-12 布鲁克斯自动化公司 衬底运送器
JP6260109B2 (ja) * 2013-05-16 2018-01-17 シンフォニアテクノロジー株式会社 ロードポート装置
JP6119436B2 (ja) * 2013-06-04 2017-04-26 シンフォニアテクノロジー株式会社 ロードポート装置
CN103295946B (zh) * 2013-06-04 2016-08-10 上海华力微电子有限公司 炉管设备的前开口接口机械标准装置
JP2015038944A (ja) * 2013-08-19 2015-02-26 株式会社ディスコ 加工装置
JP6455239B2 (ja) * 2015-03-06 2019-01-23 シンフォニアテクノロジー株式会社 ドア開閉装置
JP6554872B2 (ja) * 2015-03-31 2019-08-07 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
JP6451453B2 (ja) * 2015-03-31 2019-01-16 Tdk株式会社 ガスパージ装置、ロードポート装置、パージ対象容器の設置台およびガスパージ方法
US10515834B2 (en) * 2015-10-12 2019-12-24 Lam Research Corporation Multi-station tool with wafer transfer microclimate systems
WO2017149526A2 (en) 2016-03-04 2017-09-08 May Patents Ltd. A method and apparatus for cooperative usage of multiple distance meters
US10388547B2 (en) 2017-06-23 2019-08-20 Applied Materials, Inc. Side storage pods, equipment front end modules, and methods for processing substrates
TWI631644B (zh) * 2017-07-24 2018-08-01 億力鑫系統科技股份有限公司 連動裝置及具有該連動裝置的處理設備
KR101924185B1 (ko) 2018-06-15 2018-11-30 주식회사 싸이맥스 클램프가 장착된 로드포트모듈
JP7177333B2 (ja) * 2018-07-04 2022-11-24 シンフォニアテクノロジー株式会社 ロードポート、および、ｅｆｅｍ
US11705358B2 (en) * 2018-10-29 2023-07-18 Taiwan Semiconductor Manufacturing Co., Ltd. Systems and methods for automated processing ports
CN109698157B (zh) * 2018-12-27 2021-08-24 北京半导体专用设备研究所（中国电子科技集团公司第四十五研究所） 晶圆片盒的固定装置
TWI705229B (zh) * 2019-01-14 2020-09-21 亦立科技有限公司 晶圓厚度偵測裝置及其方法
CN110217741B (zh) * 2019-05-07 2020-12-25 芯导精密(北京)设备有限公司 一种开盒机
JP7419693B2 (ja) * 2019-07-22 2024-01-23 Tdk株式会社 ウエハマッピング装置およびロードポート装置
JP7443885B2 (ja) * 2020-03-30 2024-03-06 Tdk株式会社 マッピング装置およびロードポート装置
CN112566435B (zh) * 2020-11-26 2022-04-05 上海佳堃自动化科技有限公司 一种恒流直驱式led开关电源
US20220258363A1 (en) * 2021-02-12 2022-08-18 Hine Automation, Llc Devices and Methods for Improved Detection of Anomalous Substrates in Automated Material-Handling Systems
CN113192872B (zh) * 2021-04-29 2022-05-27 长鑫存储技术有限公司 晶圆盒、晶圆传送系统及晶圆传送方法
KR102372513B1 (ko) 2021-05-10 2022-03-10 주식회사 위존 Fims 시스템
KR102372514B1 (ko) 2021-05-10 2022-03-10 주식회사 위존 Fims 시스템의 풉 고정장치
TWI774407B (zh) * 2021-06-03 2022-08-11 鴻勁精密股份有限公司 門具機構、作業裝置及作業機
CN116338264B (zh) * 2023-05-06 2024-01-19 苏州光宝科技股份有限公司 一种电池测试防爆箱

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4815912A (en) * 1984-12-24 1989-03-28 Asyst Technologies, Inc. Box door actuated retainer
JPH07115773B2 (ja) * 1986-01-29 1995-12-13 株式会社ニコン 基板搬送装置
US4762228A (en) 1986-02-10 1988-08-09 Amaray International Corporation Video tape reel box with self opening top
US4895357A (en) * 1989-01-31 1990-01-23 Eastman Kodak Company Lighttight film-delivery box and actuator apparatus therefor
US5382806A (en) * 1991-05-07 1995-01-17 Kensington Laboratories, Inc. Specimen carrier platform and scanning assembly
US5443348A (en) * 1993-07-16 1995-08-22 Semiconductor Systems, Inc. Cassette input/output unit for semiconductor processing system
JPH0732286A (ja) * 1993-07-20 1995-02-03 Tokico Ltd 工業用ロボット
JPH07153818A (ja) 1993-11-30 1995-06-16 Daihen Corp 半導体ウエハ認識装置
ATE275759T1 (de) * 1995-03-28 2004-09-15 Brooks Automation Gmbh Be- und entladestation für halbleiterbearbeitungsanlagen
US5810537A (en) * 1995-10-18 1998-09-22 Bye/Oasis Engineering Inc. Isolation chamber transfer apparatus
JPH09186217A (ja) * 1996-01-05 1997-07-15 Canon Inc ウエハ搬入搬出装置
US5870488A (en) * 1996-05-07 1999-02-09 Fortrend Engineering Corporation Method and apparatus for prealigning wafers in a wafer sorting system
US5944475A (en) * 1996-10-11 1999-08-31 Asyst Technologies, Inc. Rotated, orthogonal load compatible front-opening interface
US5951770A (en) * 1997-06-04 1999-09-14 Applied Materials, Inc. Carousel wafer transfer system
US6321680B2 (en) * 1997-08-11 2001-11-27 Torrex Equipment Corporation Vertical plasma enhanced process apparatus and method
JPH1187460A (ja) * 1997-09-09 1999-03-30 Dainippon Screen Mfg Co Ltd 基板収納容器供給装置
WO1999028952A2 (en) * 1997-11-28 1999-06-10 Fortrend Engineering Corporation Wafer-mapping load port interface
US6082951A (en) * 1998-01-23 2000-07-04 Applied Materials, Inc. Wafer cassette load station
JPH11354602A (ja) * 1998-06-03 1999-12-24 Mecs Corp ポッドオープナーの蓋ラッチ装置
US6030208A (en) * 1998-06-09 2000-02-29 Semitool, Inc. Thermal processor
JPH11354622A (ja) * 1998-06-12 1999-12-24 Matsushita Electric Ind Co Ltd カセットボックス扉開閉装置及びカセットボックス扉開閉方法
JP2000016583A (ja) * 1998-07-03 2000-01-18 Shinko Electric Co Ltd 半導体ウエハー搬送容器装着装置
US6501070B1 (en) * 1998-07-13 2002-12-31 Newport Corporation Pod load interface equipment adapted for implementation in a fims system
US6281516B1 (en) * 1998-07-13 2001-08-28 Newport Corporation FIMS transport box load interface
US6502869B1 (en) 1998-07-14 2003-01-07 Asyst Technologies, Inc. Pod door to port door retention system
US6188323B1 (en) * 1998-10-15 2001-02-13 Asyst Technologies, Inc. Wafer mapping system
JP4310556B2 (ja) * 1998-10-23 2009-08-12 ローツェ株式会社 ウエハ搬送装置に於けるウエハ認識装置
JP3965809B2 (ja) * 1998-12-01 2007-08-29 神鋼電機株式会社 ウェハキャリア用蓋体の着脱移動装置、及び被移動体の水平移動装置
TW501194B (en) * 2000-08-23 2002-09-01 Tokyo Electron Ltd Processing system for object to be processed

Also Published As

Publication number Publication date
US20030173510A1 (en) 2003-09-18
US6784418B2 (en) 2004-08-31
US6815661B2 (en) 2004-11-09
US20030173512A1 (en) 2003-09-18
DE60131895T2 (de) 2008-11-27
JP2004509454A (ja) 2004-03-25
US20040256547A1 (en) 2004-12-23
CN1465091A (zh) 2003-12-31
JP2014123759A (ja) 2014-07-03
ATE381115T1 (de) 2007-12-15
AU2001280508A1 (en) 2002-01-21
EP1356500B1 (de) 2007-12-12
US20030173511A1 (en) 2003-09-18
US6765222B2 (en) 2004-07-20
KR20030031115A (ko) 2003-04-18
HK1060215A1 (en) 2004-07-30
WO2002005328A3 (en) 2003-08-28
WO2002005328A2 (en) 2002-01-17
JP6170843B2 (ja) 2017-07-26
KR101163216B1 (ko) 2012-07-06
JP2012009876A (ja) 2012-01-12
CN1249775C (zh) 2006-04-05
US6501070B1 (en) 2002-12-31
JP6109469B2 (ja) 2017-04-05
US7102124B2 (en) 2006-09-05
EP1356500A2 (de) 2003-10-29

Similar Documents

Publication Publication Date Title
DE60131895D1 (de) Vorrichtung zur beladung eines behälters, der in einem fims-system verwendung findet
EP2116383A3 (de) Übertragungsvorrichtung und Aufzeichnungsvorrichtung
ATE413988T1 (de) Vorrichtung und verfahren für die bewegung einer frontplatte einer audioeinrichtung
EP1911654A4 (de) Wagen-beförderungsvorrichtung
SG143216A1 (en) Overhead traveling and transporting apparatus
ATE455062T1 (de) Transportsystem
FR2430616A1 (fr) Dispositif de transfert pour installations d'analyse
ATE281950T1 (de) Sitzgleitschiene für einen fahrersitz
ATE477779T1 (de) Fahrzeug, vorrichtung und verfahren zum einsteigen in besagtes fahrzeug seitens personen mit beschränkter mobilität
ATE502844T1 (de) Schlepper mit beweglicher schleppanlage
DE502006004776D1 (de) Hängebahn
DE50001588D1 (de) Ueberwachungsanlage
ATE508082T1 (de) Vorrichtung zum gezielten umleiten von produkten zur seite von einer fördereinrichtung
JP2015021967A (ja) ミクロトームにおける試料の移送装置
CN204528321U (zh) 一种精准定位的轨道仓储位移组件
US8061526B2 (en) Wig wag bin flow directors
ATE287816T1 (de) Weichenmechanismus im fahrzeug
GB9901360D0 (en) Improvements in or relating to window assemblies for cabs
SE8901019D0 (sv) Anordning foer styrning av ett verktyg
DE69821111D1 (de) Vergnügungsvorrichtung
CN219799480U (zh) 一种样本架传输用轨道机构及全自动化学发光免疫分析仪
JPS5633832A (en) Electron exposure device
CN111383971A (zh) 一种真空传送片装置
DE69902178D1 (en) Handhabung eines containers
SE0002474L (sv) Anordning för utmatning av dokument

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee
8327 Change in the person/name/address of the patent owner

Owner name: BROOKS AUTOMATION, INC.,(N.D.GES. D. STAATES D, US

8328 Change in the person/name/address of the agent

Representative=s name: MURGITROYD & COMPANY, 48149 MUENSTER

8370 Indication related to discontinuation of the patent is to be deleted