TWI829074B - Probe holder structure - Google Patents

Abstract

The invention discloses a probe holder structure, which includes a set of sockets, a plurality of double-headed probes, a cover, a plurality of sleeves with wires, and a locking piece. The assembly socket has a set of connection end faces, a plurality of first through holes and first lock holes arranged on the assembly end faces. Each double-headed probe is inserted into each first through hole. The head cover is assembled on the assembly end surface and has a plurality of second through holes with concentric first through holes, and a third through hole with concentric first keyholes. Each sleeve with wires is assembled in each second through hole and is in contact with one end of each double-headed probe. The locking piece extends through the third through hole and is then locked in the first keyhole. Through the composition of the above components, users can selectively partially replace damaged components.

Description

Probe holder structure

The present invention relates to the technical field related to testing equipment, and particularly refers to a probe holder structure.

According to the demand and application of Liquid Crystal Display (LCD), the substantial growth, functional diversification, and increase in processing speed and frequency, etc., in order to meet this requirement, the packaging and testing in the final stage of the LCD manufacturing process is even more important, and its testing The main purpose is to test the electrical properties of the LCD and find out the unqualified grains.

The test machines used in the market for testing LCDs use multiple probes to make contact with the preset end points of the LCD to form electrical connections and perform related tests.

Please refer to FIGS. 7 to 9 , which is a single-head probe 90 structure, which generally includes a base 91 , a plurality of probe covers 92 , a plurality of single-head probes 93 , and a probe cover 94 .

The base 91 has a plurality of first through holes 911 formed in the base 91 through top and bottom.

The probe cover 92 is placed around the outer periphery of each single-head probe 93 and is partially disposed in each first through hole 911 with adhesive.

The probe protective cover 94 has second through-holes 941 concentric with the first through-holes 911 to provide the single-head probes 93 and the probe sleeves 92 with extending and fixing.

The single-head probe 93 with the above structure is provided with a wire (not shown in the figure) connection at one end of the protruding probe cover 94 in order to transmit the electrical response of the single-head probe 93 .

In the structure of the single-head probe 90 mentioned above, the single-head probe 93 needs to extend through the probe sleeve 92 before being assembled to the base 91. Therefore, the diameter of the single-head probe 93 is relatively thin and may be easily damaged by external force. Moreover, the production process requirements of the thinner single-head probe 93 are relatively high, which in turn causes an increase in the purchase cost.

In addition, when the single-head probe 93 is damaged, although the damaged single-head probe 93 can be replaced, if the probe cover 92 is damaged or the single-head probe 93 is broken and stuck in the probe cover 92, due to the probe cover 92 cannot be replaced, only the entire single-head probe 90 can be replaced.

In addition, since the single-head probe 93 must be connected to a wire, and the structure of the thin needle matching the thin wire requires a lot of welding process and labor hours.

Please refer to FIGS. 10 to 12 , which is a double-head probe 80 structure, which generally includes a body 81 , a plurality of double-head probes 82 , a circuit substrate 83 , and a protection plate 84 .

The seat body 81 has a plurality of third through holes 811 formed through the top and bottom of the seat body 81 .

The double-headed probes 82 are respectively accommodated in the third through holes 811 .

The circuit substrate 83 is stacked on the base body 81 and is in contact with one end of each double-headed probe 82 to transmit the electrical response of the double-headed probe 82 .

The protective plate 84 is assembled on the circuit substrate 83 to protect the circuit substrate 83 .

Although the structure of the aforementioned double-headed probe 80 can improve the shortcomings of the single-headed probe 90 that the fine needle is easily damaged and needs to be replaced as a whole, the production cost of the circuit substrate 83 among its components is high, and the circuit substrate 83 is not connected to the back-end transmission The wires (not shown in the figure) are connected by welding, and precision welding requires long working hours and high process technology requirements, resulting in a high overall cost of the double-headed probe 80.

In view of the above-mentioned problems and deficiencies of the prior art, the main purpose of the present invention is to provide a probe holder structure that solves the deficiencies of the prior art through innovative structural design.

According to the above object of the present invention, the present invention proposes a probe holder structure, which includes a set of sockets, a plurality of double-headed probes, a cover, a plurality of sleeves with wires, and a locking member. The assembly socket has a set of connection end faces, a plurality of first through holes and first lock holes arranged on the assembly end faces. Each double-headed probe is inserted into each first through hole. The head cover is assembled on the assembly end surface and has a plurality of second through holes with concentric first through holes, and a third through hole with concentric first keyholes. Each sleeve with wires is assembled in each second through hole and is in contact with one end of each double-headed probe. The locking piece extends through the third through hole and is then locked in the first keyhole. Through the composition of the above components, users can selectively partially replace damaged components.

10:Assembly socket

11: Assembly end face

12:First hole

13:First keyhole

141:First positioning post

142:Second positioning column

30, 30’: Cover

31:Second hole

311: Large diameter section

312: small trail section

32:Third hole

33: First positioning hole

34: First positioning slot

35:Second keyhole

40, 40’: Sleeve with wire

41:Wire

42: Diameter expansion section

43:Diameter reduction section

50:clip

51:The fourth hole

52:Fifth through hole

53:Second positioning hole

54: Second positioning slot

55:Sixth hole

<Previous Skill>

81:Base body

811:Third through hole

82:Double-ended probe

83:Circuit substrate

84:Protective board

90:Single head probe

91: base body

92:Probe cover

93:Single head probe

94:Probe cover

911: First through hole

941: Second through hole

A1: Locking parts

A2: Lower lock piece

[Figure 1] is a schematic three-dimensional appearance diagram of an embodiment of the present invention.

[Fig. 2] is an exploded and sectional schematic view of the partial components of the embodiment shown in Fig. 1.

[Fig. 3] is a schematic cross-sectional view of the embodiment shown in Fig. 1.

[Figure 4] is a schematic three-dimensional appearance diagram of another embodiment of the present invention.

[Fig. 5] is an exploded and sectional schematic view of the partial components of the embodiment shown in Fig. 4.

[Fig. 6] is a schematic cross-sectional view of the embodiment shown in Fig. 4.

[Figure 7] is a schematic diagram of an embodiment of a single-head probe in the prior art.

[Fig. 8] is an exploded schematic diagram of partial components of the embodiment shown in Fig. 7.

[Fig. 9] is a schematic cross-sectional view of the embodiment shown in Fig. 7.

[Figure 10] is a schematic diagram of an embodiment of a double-headed probe in the prior art.

[Fig. 11] is an exploded schematic diagram of partial components of the embodiment shown in Fig. 10.

[Fig. 12] is a schematic cross-sectional view of the embodiment shown in Fig. 10.

Please refer to the relevant drawings below to further describe the structural embodiments of the probe holder of the present invention. Various objects in the embodiments are drawn according to the proportions, sizes, deformations or displacements suitable for illustration, rather than according to the proportions of actual components, and are explained first. The same and symmetrically arranged components in the remaining embodiments are represented by the same numbers. In addition, directional terms such as "front, rear, left, right, upper, lower, inner, outer" in the description of the embodiments listed below are expressed according to the specified viewing direction and cannot be construed as limitations of the present invention.

Referring to FIGS. 1 to 3 , the probe holder structure of the present invention includes a set of sockets 10 , a plurality of double-ended probes 82 , a cover 30 , and a plurality of sleeves 40 with wires.

The above-mentioned assembly socket 10 has a set of connecting end surfaces 11, a plurality of first through holes 12, a first lock hole 13, a first positioning post 141, and a second positioning post 142.

Each of the first through holes 12 is formed at the top and bottom through the assembly base 10 and is arranged on the assembly end surface 11 .

The first locking hole 13 is recessed at a preset position on the assembly end surface 11 .

The first and second positioning posts 141 and 142 are symmetrically installed on the assembly end surface 11 and are arranged on both sides of the first lock hole 13 .

Each of the above-mentioned double-headed probes 82 (previous art) is extended and accommodated in each first through hole 12, and both ends protrude from the first through hole 12 respectively.

The above-mentioned head cover 30 is stacked to match the assembly end surface 11 and has a plurality of second through holes 31 formed through the head cover 30 at the top and bottom, a third through hole 32, a first positioning hole 33, and a first positioning groove 34. .

Each of the second through holes 31 is concentric with each of the first through holes 12 .

The third through hole 32 is concentric with the first keyhole 13 .

The first and second positioning posts 141 and 142 respectively match the first positioning hole 33 and the first positioning groove 34 .

Each of the above wired sleeves 40 is fixed to each second through hole 31 of the head cover 30 with adhesive. The wire 41 of the wire sleeve 40 protrudes from the top of the second through hole 31 to the outside of the head cover 30 .

Therefore, the above is an introduction to the various components and assembly methods of the probe holder according to a preferred embodiment of the present invention. Now, the operating characteristics of the embodiment of the present invention are introduced as follows.

Referring to FIGS. 1 to 3 , the head cover 30 is disposed corresponding to the assembly end surface 11 of the assembly base 10 , and cooperates with the locking member A1 to extend through the third through hole 32 and then be locked in the lock hole 13 of the assembly base 10 . So that each wire-lined sleeve 40 provided in the head cover 30 is in contact with one end of each double-ended probe 82 accommodated in the assembly base 10 .

In the above-mentioned assembly process of the head cover 30 and the assembly base 10, in order to ensure accurate contact between each wire sleeve 40 and each double-headed probe 82, the first and second positioning posts 141, 142 on the assembly base 10 and the third positioning post 142 of the head cover 30 can be used. A positioning hole 33 and a first positioning groove 34 are provided for positioning and calibration.

It can be seen from the above implementation description that the head cover 30 is locked on the assembly base 10 through the locking member A1. When the head cover 30 is damaged for any reason, the head cover 30 can be directly replaced. Each double-headed probe 82 is movably inserted into the first through hole 12 of the assembly socket 10. Therefore, when any double-headed probe 82 is damaged, it can be freely replaced.

Please refer to Figures 4 to 6, which is another embodiment of the present invention; a clip 50 is further provided between the head cover 30' and the assembly base 10, and the clip 50 is locked toward the head cover 30' through the lower locking member A2. The lower end surface thereby jointly clamps the wire sleeve 40'.

The above-mentioned head cover 30' has a plurality of second through holes 31, a third through hole 32, a first positioning hole 33, a first positioning groove 34, and a plurality of second lock holes 35. The positions and functions of the third through hole 32, the first positioning hole 33 and the first positioning groove 34 are It is the same as the above embodiment, so no further description is given.

The second through hole 31 is formed from the top and bottom through the head cover 30', and its aperture has a large diameter section 311 and a small diameter section 312; wherein the large diameter section 311 is arranged adjacent to the downward end surface of the head cover 30'.

The second lock hole 35 is symmetrically formed on the downward end surface of the head cover 30 . During implementation, each second lock hole 35 is a screw hole.

The above-mentioned clip 50 has a plurality of fourth through holes 51, a fifth through hole 52, a second positioning hole 53, a second positioning groove 54, and a plurality of sixth through holes 55 formed through the top and bottom of the clip 50. .

Each of the fourth through holes 51 is connected to the second through hole 31 of the upper and lower concentric head covers 30′ and the first through hole 12 of the assembly base 10.

The fifth through hole 52 is connected to the third through hole 32 of the upper and lower concentric head covers 30′ and the first lock hole 13 of the assembly base 10.

The second positioning hole 53 is matched with the first positioning hole 33 of the head cover 30′ and the first positioning post 141 of the assembly base 10.

The second positioning groove 54 is matched with the first positioning groove 34 of the head cover 30′ and the second positioning post 142 of the assembly base 10.

The sixth through hole 55 is the second lock hole 35 of the concentric head cover 30', which provides the lower lock member A2 to extend.

The above-mentioned wire sleeve 40' has an expanded diameter section 42 and reduced diameter sections 43 respectively formed at both ends of the expanded diameter section 42.

With the composition of the above components, one end of the cable sleeve 40' extends through the second through hole 31 of the head cover 30', and its diameter-expanded section 42 is in contact with the large diameter section 311 of the second through hole 31. The other end of the wire sleeve 40' extends through the fourth through hole 51 of the clip 50, and the diameter expansion section 42 is in contact with the end surface of the clip 50. Each cable sleeve 40' is clamped by the head cover 30' and the clip 50, so that the adhesive implementation in the above embodiment can be omitted, and the adhesive can be used as required. Each wire-carrying sleeve 40' can be replaced if it is damaged, without discarding the head cover 30' and the undamaged wire-carrying sleeve 40' at the same time.

The above descriptions are only preferred embodiments of the present invention. They are intended to clarify the characteristics of the present invention and are not intended to limit the scope of the embodiments of the present invention. Those skilled in the art may make equivalent changes based on the present invention. , and changes well known to those skilled in the art, should still fall within the scope of the present invention.

10:Assembly socket

82:Double-ended probe

30: head cover

40: Sleeve with wire

A1: Locking parts

Claims (3)

A probe holder structure includes: A set of sockets has a set of connecting end surfaces, a plurality of first through holes formed through the set of sockets and arranged on the set of connecting end surfaces, and a first keyhole recessed in the set of connecting end surfaces; A plurality of double-headed probes are inserted and placed in each first through hole, and both ends protrude from the first through hole respectively; A head cover is assembled on the assembly end surface and has a plurality of second through holes and a third through hole formed through the top and bottom of the head cover, and each second through hole is concentric with the first through hole, and the The third through hole is concentric with the first keyhole; A plurality of sleeves with wires are cooperatively assembled in each of the second through holes, and selectively contact one end of each of the double-headed probes; A locking piece extends through the third through hole and is then locked in the first keyhole. The probe base structure of claim 1, wherein the assembly end surface is provided with a first positioning post; the head cover has a first positioning hole for the first positioning post to extend. The probe base structure of claim 1, wherein the assembly end surface is provided with a second positioning post; the head cover has a first positioning groove for the second positioning post to extend.

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