TW202300925A - Probe base structure for allowing a user to selectively and partially replace damaged components - Google Patents

Abstract

The invention discloses a probe base structure comprising an assembling base, a plurality of dual head probes, a head cover, a plurality of wired sleeves, and a locking member. The assembling base has an assembling end surface, a plurality of first through holes configured on the assembling end surface, and a first locking hole. Each of dual head probes is inserted and accommodated in each of first through holes. The head cover is assembled to the assembling end surface, and is provided with a plurality of second through holes concentric to each of the first through holes and a third through hole concentric to the first locking hole. Each of the wired sleeves is assembled in each of the second through holes, and is abutted against one end of each of the dual head probes. The locking member is locked to the first locking hole after passing through the third through hole. With the structure formed by the aforementioned components, a user can be allowed to selectively and partially replace damaged components.

Description

Probe seat structure

The present invention relates to the technical field related to testing equipment, in particular to a probe seat structure.

By the way, liquid crystal display (Liquid Crystal Display, LCD) demand and application have grown significantly, function diversification, processing speed, and frequency have increased. It is mainly for testing the electrical characteristics of LCDs to find out unqualified grains.

The testing machine for testing LCD in the market is to contact the preset terminals of LCD through the probes of multiple probes to form an electrical connection and perform related tests.

Referring to FIGS. 7 to 9 , it is a single-head probe 90 , which roughly includes a base 91 , multiple probe covers 92 , multiple single-head probes 93 , and a probe cover 94 .

The seat body 91 has a plurality of first through holes 911 formed through the seat body 91 from top to bottom.

The probe cover 92 is sheathed on the outer periphery of each single-headed probe 93 , and partially arranged in each first through hole 911 with an adhesive.

The probe cover 94 has second through-holes 941 concentric with the first through-holes 911 for each single-ended probe 93 and probe cover 92 to be extended and fixed.

One end of the protruding probe cover 94 of the single-ended probe 93 with the above-mentioned structure is connected with a wire (not shown in the figure) so as to transmit the electrical response of the single-ended probe 93 .

In the structure of the aforementioned single-headed probe 90 , the single-ended probe 93 needs to penetrate the probe cover 92 to be assembled to the base body 91 , so the diameter of the single-ended probe 93 is relatively small, which is easy to be damaged by external force. Moreover, the thinner single-headed probe 93 requires a higher production process, which instead causes an increase in procurement costs.

In addition, when the single-ended probe 93 is damaged, although the damaged single-ended probe 93 can be replaced, if the probe cover 92 is damaged or the single-ended probe 93 is broken and stuck in the probe cover 92, the probe cover will 92 cannot be replaced, only the whole single head probe 90 can be replaced.

Moreover, since the single-ended probe 93 must also be connected to the wire, and the structure of the fine needle and the thin wire, the requirements and man-hours for the welding process must not be low.

Please refer to FIGS. 10 to 12 , which is a double-headed probe 80 structure, which roughly includes a body 81 , a plurality of double-headed probes 82 , a circuit board 83 , and a protective plate 84 .

The seat body 81 has a plurality of third through holes 811 formed through the seat body 81 from top to bottom.

The double-ended probes 82 are respectively accommodated in the third through holes 811 .

The circuit board 83 is stacked on the base body 81 and abutted with one end of each double-ended probe 82 so as to transmit the electrical response of the double-ended probe 82 .

The protective plate 84 is assembled on the circuit substrate 83 to protect the circuit substrate 83 .

Although the structure of the aforementioned double-headed probe 80 can improve the lack of the single-headed probe 90, which is easily damaged and needs to be replaced as a whole, the production cost of the circuit board 83 in its components is high, and the circuit board 83 and the back-end transmission The wires (not shown in the figure) are connected by welding, and precision welding requires long hours and high technical requirements, resulting in high overall cost of the double-headed probe 80 .

In view of the above-mentioned problems and deficiencies of the prior art, the main purpose of the present invention is to provide a probe base structure, which solves the deficiencies of the prior art through an innovative design of the structure.

According to the above object of the present invention, the present invention proposes a probe holder structure, which includes a set of sockets, a plurality of double-ended probes, a head cover, a plurality of sleeves with wires, and a locking member. The joint base has a joint end surface, a plurality of first through holes and first locking holes arranged on the joint end surface. Each double-ended probe is inserted and accommodated in each first through hole. The head cover is assembled on the assembly end surface, and has a plurality of second through holes concentric with each of the first through holes, and a third through hole concentric with the first locking hole. Each lined sleeve is assembled in each second through hole, and abuts against one end of each double-ended probe. The locking part is locked in the first lock hole after passing through the third through hole. By the composition of the above components, the user can selectively replace the damaged components locally.

10: Assembly seat

11: Assembly end face

12: The first through hole

13: The first keyhole

141: The first positioning column

142: The second positioning column

30, 30': cover body

31: Second through hole

311: large diameter section

312: small diameter section

32: The third through hole

33: The first positioning hole

34: The first positioning slot

35: Second keyhole

40, 40': Sleeve with wire

41: wire

42: Diameter expansion section

43: Diameter shrinkage section

50: clip

51: the fourth through hole

52: The fifth through hole

53: The second positioning hole

54: Second positioning slot

55: the sixth through hole

<Previous Art>

81: seat body

811: The third through hole

82: Double-ended probe

83: Circuit substrate

84: Protection board

90:Single head probe

91: seat body

92:Probe cover

93:Single head probe

94: Probe cover

911: The first through hole

941: Second through hole

A1: Locking piece

A2: Lower lock

[Fig. 1] is a schematic diagram of the three-dimensional appearance of the embodiment of the present invention.

〔Fig. 2〕 is an exploded and schematic sectional view of the partial components of the embodiment shown in Fig. 1.

[Fig. 3] is a schematic sectional view of the embodiment shown in Fig. 1.

[Fig. 4] is a three-dimensional appearance schematic diagram of another embodiment of the present invention.

〔Fig. 5〕 is an exploded and schematic sectional view of the partial components of the embodiment shown in Fig. 4.

[Fig. 6] is a schematic sectional view of the embodiment shown in Fig. 4.

[Fig. 7] is a schematic diagram of an embodiment of a single-head probe of the prior art.

[Fig. 8] is an exploded schematic view of the partial components of the embodiment shown in Fig. 7.

[Fig. 9] is a schematic sectional view of the embodiment shown in Fig. 7.

[Fig. 10] is a schematic diagram of an embodiment of a double-headed probe of the prior art.

[Fig. 11] is an exploded schematic view of the partial components of the embodiment shown in Fig. 10.

[Fig. 12] is a schematic sectional view of the embodiment shown in Fig. 10.

Please refer to the relevant figures below to further describe the embodiment of the structure of the probe base of the present invention. Various objects in the embodiments are drawn according to the proportions, sizes, deformations or displacements applicable to the description, rather than drawn according to the scale of the actual components, and are described first. And the elements with the same and symmetrical configurations in the remaining embodiments are denoted by the same numbers. In addition, directional terms such as "front, back, left, right, up, down, inside, outside" in the descriptions of the embodiments listed below are expressed in accordance with the specified viewing directions and cannot be interpreted as limitations of the present invention.

Referring to FIGS. 1 to 3 , the structure of the probe base of the present invention includes a set of sockets 10 , a plurality of double-ended probes 82 , a head cover 30 , and a plurality of sleeves 40 with wires.

The assembly base 10 has a set of connection end surfaces 11 , a plurality of first through holes 12 , a first locking hole 13 , a first positioning post 141 , and a second positioning post 142 .

The first through holes 12 are formed through the top and bottom of the assembly socket 10 and are arranged on the assembly end surface 11 .

The first locking hole 13 is recessed at a preset position of the assembling end surface 11 .

The first and second positioning columns 141 and 142 are symmetrically erected on the assembly end surface 11 and arranged on both sides of the first locking hole 13 .

The above-mentioned double-headed probes 82 (previous technology) are inserted and accommodated in the first through holes 12 , and both ends protrude from the first through holes 12 respectively.

The above-mentioned head cover 30 is stacked with matching end faces 11, and has a plurality of second through holes 31 formed through the top and bottom of the head cover 30, a third through hole 32, a first positioning hole 33, and a first positioning groove 34 .

Each second through hole 31 is concentric with each first through hole 12 .

The third through hole 32 is concentric with the first locking hole 13 .

The first and second positioning posts 141 , 142 match the first positioning hole 33 and the first positioning groove 34 respectively.

The above-mentioned sleeves 40 with wires are fixed in the second through holes 31 of the head cover 30 in conjunction with an adhesive. The wire 41 of the wire sleeve 40 protrudes from the top of the second through hole 31 to the outside of the head cover 30 .

Therefore, the above is an introduction to the components and assembly methods of a preferred embodiment of the probe holder provided by the present invention, and the operating features of the embodiment of the present invention are introduced as follows.

Please refer to FIGS. 1 to 3 , the head cover 30 is arranged corresponding to the assembling end surface 11 of the assembling base 10 , and is locked in the locking hole 13 of the assembling base 10 after the locking piece A1 penetrates through the third through hole 32 . So that each sleeve 40 with wires arranged in the head cover 30 is in contact with one end of each double-ended probe 82 accommodated in the assembly socket 10 .

In the assembly process of the above-mentioned head cover 30 and the assembly socket 10, in order to ensure accurate contact between the lined sleeves 40 and the double-headed probes 82, the first and second positioning posts 141, 142 on the assembly socket 10 can be matched with the first and second positioning posts 141, 142 of the head cover 30. A positioning hole 33 and a first positioning groove 34 are used for positioning and calibration.

It can be seen from the above description that the head cover 30 is locked on the assembly base 10 by the locking member A1, and when the head cover 30 is damaged for some reason, the head cover 30 can be replaced directly. And each double-ended probe 82 is movably inserted in the first through hole 12 of the assembly socket 10, so when any double-ended probe 82 is damaged, it can be freely replaced.

Please refer to Figures 4 to 6, which is another embodiment of the present invention; wherein a clip 50 is further provided between the head cover 30' and the assembly seat 10, and the clip 50 is locked on the head cover 30' through the lower lock A2. The lower end surface thereby jointly clamps the belt line sleeve 40'.

The head cover 30' has a plurality of second through holes 31, a third through hole 32, a first positioning hole 33, a first positioning groove 34, and a plurality of second locking holes 35. Wherein the third through hole 32, the first positioning hole 33 and the first positioning groove 34, its position and action system It is the same as the above-mentioned embodiment, so it is not repeated here.

The second through hole 31 is formed through the top and bottom of the skull 30', and its aperture has a large diameter section 311 and a small diameter section 312; wherein, the large diameter section 311 is adjacent to the skull 30' facing downward.

The second lock hole 35 is symmetrically formed on the downward end surface of the head cover 30 . During implementation, each second locking hole 35 is a screw hole.

The above clip 50 has a plurality of fourth through holes 51 formed through the top and bottom of the clip 50, a fifth through hole 52, a second positioning hole 53, a second positioning groove 54, and a plurality of sixth through holes 55 .

The fourth through holes 51 are connected to the second through holes 31 of the upper and lower concentric head covers 30' and the first through holes 12 of the assembly seat 10.

The fifth through hole 52 is connected with the third through hole 32 of the upper and lower concentric head covers 30' and the first lock hole 13 of the connecting seat 10.

The second positioning hole 53 matches the first positioning hole 33 of the head cover 30' and the first positioning column 141 of the assembly seat 10.

The second positioning groove 54 matches the first positioning groove 34 of the head cover 30' and the second positioning post 142 of the assembly seat 10.

The sixth through hole 55 is the second lock hole 35 of the concentric head cover 30', providing the lower lock piece A2 to penetrate.

The aforementioned sleeve 40' with wires has a diameter-expanding section 42 and diameter-contracting sections 43 respectively formed at both ends of the diameter-expanding section 42.

With the composition of the above components, one end of the wire sleeve 40' extends through the second through hole 31 of the head cover 30', and makes the enlarged diameter section 42 abut against the large diameter section 311 of the second through hole 31. And the other end of the wire sleeve 40' penetrates the fourth through hole 51 of the clip 50, and makes the diameter expansion section 42 abut against the end surface of the clip 50. The head cover 30' and the clamping piece 50 jointly clamp each belt sleeve 40' so as to omit the adhesive in the above-mentioned embodiment, and it can be implemented according to Each wire sleeve 40' is replaced in case of damage, without discarding the head cover 30' and the undamaged wire sleeve 40' at the same time.

The above description is only a preferred embodiment of the present invention, and is intended to clarify the characteristics of the present invention, and is not intended to limit the scope of the embodiments of the present invention. Those of ordinary skill in the art will make equivalent changes according to the present invention. , and changes well known to those skilled in the art should still fall within the scope of the present invention.

10: Assembly seat

82: Double-ended probe

30: head cover

40: Sleeve with wire

A1: Locking piece

Claims (3)

A probe base structure comprising: A set of sockets has a set of connecting end surfaces, a plurality of first through holes formed through the assembly sockets and arranged on the assembly end surfaces, and a first locking hole formed in the assembly end surface; A plurality of double-headed probes are inserted and accommodated in each of the first through holes, and both ends respectively protrude from the first through holes; A head cover, which is assembled on the assembly end surface, has a plurality of second through holes and a third through hole formed through the top and bottom of the head cover, and each of the second through holes is concentric with the first through hole, and the The third through hole is concentric with the first lock hole; A plurality of sleeves with wires are matched and assembled in each second through hole, and are selectively abutted against one end of each double-ended probe; A lock part is locked in the first lock hole after passing through the third through hole. The probe holder structure as claimed in item 1, wherein the assembly end surface is provided with a first positioning post; the head cover has a first positioning hole for the first positioning post to pass through. The probe holder structure as claimed in claim 1, wherein the assembly end surface is provided with a second positioning post; the head cover has a first positioning slot for the second positioning post to pass through.

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