[go: up one dir, main page]

TW200907354A - Probe module - Google Patents

Probe module Download PDF

Info

Publication number
TW200907354A
TW200907354A TW96128915A TW96128915A TW200907354A TW 200907354 A TW200907354 A TW 200907354A TW 96128915 A TW96128915 A TW 96128915A TW 96128915 A TW96128915 A TW 96128915A TW 200907354 A TW200907354 A TW 200907354A
Authority
TW
Taiwan
Prior art keywords
probe
holes
base
guiding
probes
Prior art date
Application number
TW96128915A
Other languages
Chinese (zh)
Other versions
TWI333070B (en
Inventor
gong-xu Ye
jian-xun Huang
Original Assignee
Contrel Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Contrel Technology Co Ltd filed Critical Contrel Technology Co Ltd
Priority to TW96128915A priority Critical patent/TW200907354A/en
Publication of TW200907354A publication Critical patent/TW200907354A/en
Application granted granted Critical
Publication of TWI333070B publication Critical patent/TWI333070B/zh

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Abstract

A probe module includes a base having a step portion in the front, the step portion being provided with a plurality of through holes; a plurality of probes inserted into the through holes with the bottom ends of the probes protruding outside a bottom surface of the base; a guiding block having a plurality of guiding holes and disposed on the step portion, the guiding holes wrapping the top sections of the probes, the top ends of the probes protruding outside a top surface of the guiding block, the guiding block being fixed to the step portion via at least a fixing latch; and a cover board installed on the base for covering the probes. Whereby, this invention has advantages of convenient probe replacement, easy maintenance, and lowered costs.

Description

200907354 九、發明說明: 【發明所屬之技術領域】 本發明係與用來檢測之探針有關 探針的一種探針組具。 亏刃疋‘方便拆裝 5【先前技術】 按,現有之習知探針組具,通常是將 一固定的盒體或是夹且中、 探針設於 能/甘士甘中整組探針鎖定於内的刑 心。在”中某一根探針故障或損壞時,1 姑、 針進行維修,往往需 -去針對故^的探 但甚為浪費,亦不^批針組具整組更換,此種方式不 例如我國公告第1271,379號專利,即為 組’此種探針模組即為整組鎖固的組合方式。 針拉 為了解決前述問題,本案發明人特提出_ 15 拆裝及更雌針的結構,可更為料 及降低成本等功效。 貝冴亚有壌保 【發明内容】 &租本t Θ之主要目的在於提供—種探針組具,其可方便 拆衮,亦可方便更換探針。 万便 r省次一目的在於提供一種探針組具,其可更為 即的㈣’且具有環細及降低縣的功效。 緣疋’為了達成前述目的,依據本發明所提供之 :!二且具2含有:-基座,前方具有-階部,於該階部 β又有硬數穿孔,各該穿孔内之底段周壁向内延伸形成— 20 200907354 小徑部;複數探針,頂启 該等穿孔,且該等探針面’料探針插置於 頂緣’且該等探針之底端係突伸出該基座之底面.= ,,, 谷°亥導引孔的上段周壁向内延伸形 ^-小徑部’該導引塊係置於該階部上,而該等導引孔套 ::探針之上段,並以各該導引塊的小徑部底緣抿住 於忒專探針頂段的該肩面,該等探針的頂端係突伸出該導 引塊的頂面,該導引塊係藉由至少—固定栓固定於該階 部,以及-蓋板’設於該基座’且蓋住於該等探針。藉此, 本發明具有方便更換探針’維修容易以及節省成本等功效。 【貫施方式】 為了詳細忒明本發明之構造及特點所在,茲舉以下之 一較佳實施例並配合圖式說明如后,其中: 15 如第一圖所示,本發明一較佳實施例所提供之一種探 針組具10 ’主要由一基座11、複數探針21、一導引塊31 以及一蓋板41所組成,其中: 該基座11,具有一固定部12,用以固定於其他配合之 裝置,該基座11並且具有由該固定部丨2向前延伸之一延 2〇伸部14,該延伸部14的寬度小於該固定部12,而使該基 座11概呈T字形,該延伸部14上係形成一階部15,於該 階部15上設有複數穿孔16,各該穿孔16内之底段周壁向 内延伸形成一小徑部Π。該階部15頂面對應於該等穿孔 16的位置係下凹形成一下凹部18。該基座u於該階部15 200907354 上設有複數定位槽19。 5 15 該等探針2卜本實_中係為彈簧針,具有 以及位於該外殼22兩端之二彈性針體24,該外浐成 端周緣相對於各該彈性針體24形成—肩面23 21插置於該等穿孔16,且以該外殼22底端的該肩面、^氏 =於該等小徑部17之頂緣,且該等彈性針體24的底传 犬伸出該基座11的底面。其中,探針2 L _ ’、 係屬習知,其詳細結構容不贅述。丨1麵黃針之型態 該導引塊3卜具有複數導引孔32,各該導引孔3 ^周壁向岐伸形成—小徑部33,該導引塊3丨係置於該 階2 15上,而該等導引孔32套置於該等探針21之上段7 亚精由該外殼22頂端的則面23抵接於該等小徑部^之 :緣二酋該二彈性針體24的頂端係突伸出該導引塊31的頂 ΓΛ導引塊31係勒至少—固定栓洲定於該階部15, 貫知例係以―固定栓34來將該導引塊31固定於該階部 〜而各口玄口疋才王34係為—螺栓。該導引塊31設有複數 =孔36,複數定位柱37穿過該等定位孔%並插置於該 、疋位槽19 Θ ’藉由該等定位柱37可將該導引塊31準確 的定位於該基座11上。該導引塊Η底面對應於該等導引 孔32的位置係上凹形成一上凹部%。 “該蓋板41’本實施例巾係為—電路板,設於該基座u, H住㈣針21 ’心傳遞訊號。本實施例中,係藉 由若:固定螺栓42鎖定於該基座的固定部12。 精由上述結構’該蓋板41蓋住於該等探針21,由於該 20 200907354 盍板41本身是電路板,因此可與該等探 蓋板41上設置檢測電路或相關的電:生=兮 和木針21之底部接觸面板或待測物(圖中未 稭由該 測。而同時’該等探針21係受到該導引塊 以及的穿孔16所固定,不會在進行檢測時移位。200907354 IX. DESCRIPTION OF THE INVENTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to a probe assembly for a probe associated with a probe for detection. Defective blade 疋 'easy to disassemble 5 【Previous technology】 According to the conventional probe set, usually a fixed box or clip and the middle and probe are set in the energy / Gans Gan group The needle is locked inside. When one of the probes fails or is damaged, the needle and the needle are repaired, and it is often necessary to go to the fault of the fault but it is a waste, and the needle set has a complete set of replacement. China's announcement No. 1271, 379 patent, that is, the group 'such probe module is the combination of the whole set of locking. Needle pull in order to solve the above problems, the inventor of this case specifically proposed _ 15 disassembly and more female needle Structure, can be more expected and reduce costs and other functions. Bezia has a guarantee [invention content] & rented t Θ The main purpose is to provide a kind of probe assembly, which can be easily removed, can also be easily replaced The purpose of the needle is to provide a probe assembly which can be more (4)' and has a thin ring and lowers the efficacy of the county. In order to achieve the aforementioned purpose, according to the present invention: 2 and 2 have: - pedestal, with a - step at the front, and a hard number perforation at the step β, the peripheral wall of each of the perforations extends inwardly - 20 200907354 small diameter portion; complex probe Opening the perforations, and the probe faces are inserted into the top edge And the bottom end of the probe protrudes from the bottom surface of the base. =,,, the upper peripheral wall of the valley guide hole extends inwardly to form a small diameter portion - the guide block is placed at the step And the guiding holes: the upper part of the probe, and the bottom edge of the small diameter portion of each guiding block is clamped to the shoulder surface of the top section of the probe, the top of the probes A protruding portion protrudes from a top surface of the guiding block, the guiding block is fixed to the step by at least a fixing bolt, and a cover plate is disposed on the base and covers the probe. Therefore, the present invention has the functions of facilitating the replacement of the probes, such as easy maintenance and cost saving. [Comprehensive Mode] In order to clarify the structure and characteristics of the present invention, one of the following preferred embodiments will be described with reference to the drawings. After that, as shown in the first figure, a probe assembly 10' provided by a preferred embodiment of the present invention mainly comprises a base 11, a plurality of probes 21, a guiding block 31 and a cover plate. 41, wherein: the base 11 has a fixing portion 12 for fixing to other matching devices, and the base 11 has the fixing portion 2 extending forwardly from the extension portion 14 , the extension portion 14 has a width smaller than the fixing portion 12 , and the base portion 11 is substantially T-shaped, and the extension portion 14 forms a first-order portion 15 . The step portion 15 is provided with a plurality of perforations 16 , and a peripheral wall of the bottom portion of each of the through holes 16 extends inwardly to form a small diameter portion Π. The top surface of the step portion 15 is recessed to form a recess 18 corresponding to the position of the through holes 16 . The base u is provided with a plurality of positioning grooves 19 on the step portion 15 200907354. 5 15 The probes 2 are a spring pin having two elastic needle bodies 24 at both ends of the outer casing 22, The peripheral edge of the outer rim is formed with respect to each of the elastic needles 24 - a shoulder surface 23 21 is inserted into the perforations 16 , and the shoulder surface of the bottom end of the outer casing 22 is at the top of the small diameter portions 17 The edge of the elastic needle body 24 extends out of the bottom surface of the base 11. Among them, the probe 2 L _ ', is a well-known, and its detailed structure is not described. The guiding block 3 has a plurality of guiding holes 32, and each of the guiding holes 3 has a peripheral wall extending to form a small-diameter portion 33, and the guiding block 3 is placed at the step 2 15 , and the guiding holes 32 are placed on the upper part of the probes 21 and the sub-surface 23 is abutted against the small-diameter parts of the top surface 23 of the outer casing 22: The top end of the needle body 24 protrudes from the top sill guiding block 31 of the guiding block 31. At least the fixing bolt is fixed at the step portion 15. The guiding block is used to fix the guiding block 34. 31 is fixed at the step ~ and each port of the Xuankou Yucai 34 is a bolt. The guiding block 31 is provided with a plurality of holes 36 through which the plurality of positioning posts 37 are inserted and inserted into the positioning slots 19 Θ '. The guiding blocks 31 can be accurately determined by the positioning posts 37. Positioned on the base 11. The position of the bottom surface of the guiding block corresponding to the guiding holes 32 is concavely formed to form an upper concave portion. The cover plate 41' is a circuit board which is disposed on the base u, and the (four) pin 21' core transmits a signal. In this embodiment, the fixing bolt 42 is locked to the base. The fixing portion 12 of the seat is covered by the above-mentioned structure 'the cover plate 41 is covered by the probes 21, and since the 20 200907354 the seesaw 41 itself is a circuit board, a detecting circuit or a detecting circuit can be disposed on the detecting cover 41 or Related electricity: raw = 兮 and the bottom of the wooden needle 21 contact panel or object to be tested (the figure is not stalked by the test. At the same time 'the probe 21 is fixed by the guide block and the perforation 16 Will shift when testing.

欲更換探針21時,僅需將該蓋板41及引導塊31取下, 再拔出故障的探針21,接著再將新的探針21插入對應 弓丨孔32以及穿孔16,在蓋回該驗41後,即完成更換。 而其中’該上凹部38以及該下凹部18主要是為了減 少該基座11以及該導引塊31的局部厚度,如此一來可以 縮短該料引孔32減該等穿孔16的長度,進而減少了 該等探針21表面與該等導引孔32的孔壁以及該等穿孔16 的孔壁之間的磨擦面積,使針21可更容易的拔出或插 入,換言之’更換探針21即更為容易。When the probe 21 is to be replaced, only the cover 41 and the guide block 31 are removed, and the faulty probe 21 is pulled out, and then the new probe 21 is inserted into the corresponding bow hole 32 and the through hole 16 in the cover. After returning to the test 41, the replacement is completed. Wherein the upper concave portion 38 and the lower concave portion 18 are mainly for reducing the partial thickness of the base 11 and the guiding block 31, so that the material guiding hole 32 can be shortened to reduce the length of the through holes 16, thereby reducing The surface of the probe 21 and the wall of the hole of the guide hole 32 and the wall of the hole of the hole 16 allow the needle 21 to be easily pulled out or inserted, in other words, the replacement of the probe 21 It's easier.

另外,由於該等探針21的兩端仍然是插置於該等穿孔 16以及該等導引孔32 ’因此仍然受到該導引塊31以及該 基座11的良好固定,不會在檢測時移位。 200907354 【圖式簡單說明】 第一圖係本發明一較佳實施例之組合立體圖。 第二圖係本發明一較佳實施例之分解立體圖。 第三圖係本發明一較佳實施例之部分構件組合圖,顯 5 示探針置於基座之狀態。 第四圖係本發明一較佳實施例之俯視圖。 第五圖係沿第四圖中5-5剖線之剖視圖。 【主要元件符號說明】 10 10探針組具 11基座 12固定部 14延伸部 15階部 16穿孔 17小徑部 18下凹部 19定位槽 21探針 22外殼 23肩面 24彈性針體 15 31導引塊 32導引孔 33小徑部 34固定栓 36定位孔 37定位柱 38上凹部 41蓋板 42固定螺栓 8In addition, since the two ends of the probes 21 are still inserted in the through holes 16 and the guiding holes 32', they are still well fixed by the guiding block 31 and the base 11, and are not detected. Shift. 200907354 BRIEF DESCRIPTION OF THE DRAWINGS The first drawing is a combined perspective view of a preferred embodiment of the present invention. The second drawing is an exploded perspective view of a preferred embodiment of the present invention. The third figure is a combination of parts of a preferred embodiment of the present invention, showing the state in which the probe is placed on the base. The fourth drawing is a plan view of a preferred embodiment of the present invention. The fifth drawing is a cross-sectional view taken along line 5-5 of the fourth figure. [Main component symbol description] 10 10 probe assembly 11 base 12 fixing portion 14 extension portion 15 step portion 16 perforation 17 small diameter portion 18 lower recess portion 19 positioning groove 21 probe 22 outer casing 23 shoulder surface 24 elastic needle body 15 31 Guide block 32 guide hole 33 small diameter portion 34 fixing bolt 36 positioning hole 37 positioning post 38 upper recess 41 cover 42 fixing bolt 8

Claims (1)

200907354 十、申請專利範圍: 1·一種探針組具,包含有: 二基座,前方具有—階部’於該階部上贿複數穿孔, 各该穿孔内之底段周壁向峡伸形成―小徑部; 複數探針,頂底段具有一肩面, 穿π,曰兮笙伊处产化 & s亥專才木針插置於該等 牙孔且該料針底段之該肩面抵接於 緣,且該等探狀錢健伸以縫紅底面.R頂 一導引塊’具有複數導引孔,各料引孔的上段周壁 向内延伸形成-小徑部,該導弓丨塊係置於該階部上 料引孔套置於料探狀上段,如各該導引塊的小^ 部底緣抵住於該等探針頂段的則面,料探針的頂端係 突伸出該導引塊的頂面,該導引塊鋪由至少—固定检固 定於該階部;以及 一蓋板,設於該基座,且蓋住於該等探針。 2. 依據中料鄕圍第丨項所狀探針組具,其中: I5該基座於該階部上設有複蚊位槽,該導5丨塊設有複數定 U 位孔,複數定位枉穿過該等定位孔並插置於該等定位槽内。 3. 依據申請專利範圍第2項所述之探針組具,其中: 該基座係具有一固定部,以及具有由該固定部向前方延伸 之一延伸部,該延伸部的寬度小於該固定部,而使該基座 2〇概呈T字形,該階部係形成於該延伸部上。 4. 依據申請專利範圍第3項所述之探針組具,其中: 該蓋板係為一電路板。 5. 依據申請專利範圍第4項所述之探針組具,其中: δ玄等楝針,係為彈簧針,具有一外殼以及位於該外殼兩端 200907354 之二彈性針體,該外殼之兩端周緣即相對於各該彈性針體 形成一肩面。 6.依據申請專利範圍第5項所述之探針組具,其中:該 階部頂面對應於該等穿孔的位置係下凹形成一下凹部。 5 7.依據申請專利範圍第5項所述之探針組具,其中:該 導引塊底面對應於該等導引孔的位置係上凹形成一上凹 部。 8.依據申請專利範圍第5項所述之探針組具,其中:該 階部頂面對應於該等穿孔的位置係下凹形成一下凹部;該 ίο 導引塊底面對應於該等導引孔的位置係上凹形成一上凹 部。 10200907354 X. The scope of application for patents: 1. A probe assembly comprising: two pedestals, with a front-end part at the front part of the bribe, and a perforation of the bottom wall of each of the perforations Small diameter section; a plurality of probes, the top and bottom sections have a shoulder surface, and the π, the 曰兮笙 处 产 & & 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专 专The surface abuts against the edge, and the probes are stretched to form a red bottom surface. The R top guide block has a plurality of guiding holes, and the upper peripheral wall of each of the material guiding holes extends inward to form a small diameter portion, and the guiding bow The ram block is placed at the top of the feed hole and placed on the upper part of the probe, such as the bottom edge of each of the guide blocks abutting the top surface of the probe, the tip of the probe Projecting a top surface of the guiding block, the guiding block is fixed to the step by at least a fixed inspection; and a cover plate is disposed on the base and covers the probes. 2. According to the probe set in the middle item of the middle material, wherein: I5 the base is provided with a mosquito bit groove on the step, and the guide 5 block is provided with a plurality of fixed U-position holes, and the plurality of positions are located. The crucible passes through the positioning holes and is inserted into the positioning slots. 3. The probe set according to claim 2, wherein: the base has a fixing portion, and has an extension extending forward from the fixing portion, the extension having a width smaller than the fixing And the base 2 is substantially T-shaped, and the step is formed on the extension. 4. The probe set according to claim 3, wherein: the cover is a circuit board. 5. The probe assembly according to claim 4, wherein: the δ 楝 楝 , needle is a pogo pin having a casing and two elastic needle bodies at two ends of the casing 200907354, two of the outer casings The peripheral edge forms a shoulder surface with respect to each of the elastic needle bodies. 6. The probe set according to claim 5, wherein the top surface of the step corresponds to the position of the perforations and is recessed to form a recess. The probe assembly of claim 5, wherein the bottom surface of the guide block is recessed to form an upper recess corresponding to the position of the guide holes. 8. The probe set according to claim 5, wherein: the top surface of the step corresponds to the position of the perforations to be recessed to form a recess; the bottom surface of the guide block corresponds to the guide The position of the hole is concave to form an upper recess. 10
TW96128915A 2007-08-06 2007-08-06 Probe module TW200907354A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96128915A TW200907354A (en) 2007-08-06 2007-08-06 Probe module

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96128915A TW200907354A (en) 2007-08-06 2007-08-06 Probe module

Publications (2)

Publication Number Publication Date
TW200907354A true TW200907354A (en) 2009-02-16
TWI333070B TWI333070B (en) 2010-11-11

Family

ID=44723390

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96128915A TW200907354A (en) 2007-08-06 2007-08-06 Probe module

Country Status (1)

Country Link
TW (1) TW200907354A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI771085B (en) * 2021-06-29 2022-07-11 美科樂電子股份有限公司 Probe base structure
TWI829074B (en) * 2021-06-29 2024-01-11 美科樂電子股份有限公司 Probe holder structure

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI771085B (en) * 2021-06-29 2022-07-11 美科樂電子股份有限公司 Probe base structure
TWI829074B (en) * 2021-06-29 2024-01-11 美科樂電子股份有限公司 Probe holder structure

Also Published As

Publication number Publication date
TWI333070B (en) 2010-11-11

Similar Documents

Publication Publication Date Title
TW200728732A (en) Probe card assembly with an interchangeable probe insert
CN201555553U (en) Step hole coaxiality detection device
CN200956035Y (en) Replaceable probe structure
TW200907354A (en) Probe module
TW200641360A (en) Probe card and method of manufacturing the same
CN101430722A (en) Test point layout detection method
KR101156902B1 (en) The clamp for board clamping
CN203117344U (en) On/off tester capable of detecting omitted hole
KR101348423B1 (en) Ejector unit for test boards in automated test equipment
CN103605067B (en) A kind of double-sided wiring thick film circuit test set
CN209166376U (en) A kind of device for detecting cam profile
CN105588957B (en) Test seat
CN209945185U (en) Single-flow-channel turbine shell comprehensive inspection gauge
CN204989443U (en) Device is examined to withstanding voltage tester point
CN201035046Y (en) Double-ended test probe
TWM567472U (en) Needle sensor of ic pattern device
CN214951019U (en) Power plug pin test fixture
CN221725153U (en) A hydraulic torque converter blade detection auxiliary device
US6724207B1 (en) Structure composite-type test fixture
CN105823730A (en) Light path support for portable urine analyzer
AR024252A1 (en) METHOD FOR DETERMINING THE CHARACTERISTICS OF CONSUMER USE HABITS FOR AN ELECTRONIC DEVICE AND THE DEVICE FOR CARRYING OUT SUCH METHOD
CN218584715U (en) Combined array type general weak magnetic detection signal acquisition device
CN206208947U (en) TMR board fixing structures in a kind of electric energy meter
CN205665165U (en) A light path support for portable urine analysis
CN204115612U (en) Test pin measurement mechanism