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TWI333070B - - Google Patents

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Publication number
TWI333070B
TWI333070B TW96128915A TW96128915A TWI333070B TW I333070 B TWI333070 B TW I333070B TW 96128915 A TW96128915 A TW 96128915A TW 96128915 A TW96128915 A TW 96128915A TW I333070 B TWI333070 B TW I333070B
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TW
Taiwan
Prior art keywords
probe
base
probes
guiding
holes
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Application number
TW96128915A
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Chinese (zh)
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TW200907354A (en
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Contrel Technology Co Ltd
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Priority to TW96128915A priority Critical patent/TW200907354A/en
Publication of TW200907354A publication Critical patent/TW200907354A/en
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Publication of TWI333070B publication Critical patent/TWI333070B/zh

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Description

1333070 九、發明說明: 【發明所屬之技術領域】 探二==檢測之探針有關’特別是指方便拆裝 5【先前技術】 二^有之習知探針組具,通常是將複數個探針設於 :固體或是爽具中,而呈整組探針鎖定於内的型 二。在八中某-根探針故障或損猶,無法針對 往往需要把探針組具整組更換,: 〇仁甚為浪費,亦不環保。 例如我國公告第1271,379財利,即為一種 、,且,此種探針模組即為整組鎖固的組合方式。 .、 為了解決前述問題,本案發明人特提出一種可以 斥=及更換探針的結構,可更為節省 5及降低成本等功效。 卫保 【發明内容】 本發明之主要目的在於提供一種探針組具,其可方便 拆裝,亦可方便更換探針。 >節省目的在於提供一種探針組具,其可更為 ’探:的貝源,且具有環似及降低成本的功效。 d’ J成的:依據本發明所提供之-種 土座,刖方具有一階部,於該階部 叹有複數牙孔,各該穿孔内之底段周壁向内延伸形成一 4 1333070 ;複數探針,頂底段具有—絲,料 該專穿孔,且料探針級之抑面減於該等小徑$ 頂緣,且該等探針之底端係突伸出該基座之底面; 塊,具有複數導引孔,各該導引孔的上段周壁向内延= 成一小徑部,該導弓丨塊係置於該階部上,而該等 丄 置於該等探針之上段,並以各該導引塊的小#部底緣抵住 於該等探針頂段的該肩面’該等探針的頂端係、突伸出該導 引塊的頂面,該導引塊係藉由至少__固定栓固定於該階 部,以及-蓋板’設於該基座’且蓋住於該等探針。藉此二 本發明具有讀更換探針,維修容易以及節省成本等^效。 【實施方式】 為了詳細說明本發明之構造及特點所在,茲舉以下之 一較佳實施例並配合圖式說明如后,其中: 15 如第一圖所示,本發明一較佳實施例所提供之一種探 針組具ίο,主要由一基座η、複數探針21、一導引塊η 以及一蓋板41所組成,其中: 該基座11,具有一固定部12,用以固定於其他配合之 裝置,該基座11並且具有由該固定部12向前延伸之一延 20伸部14,該延伸部14的寬度小於該固定部12,而使該基 座11概呈Τ子形,該延伸部14上係形成一階部15,於該 I1白。卩15上5又有複數穿孔16,各該穿孔16内之底段周壁向 内延伸形成一小徑部17。該階部15頂面對應於該等穿孔 16的位置係下凹形成一下凹部18。該基座丨丨於該階部15 5 1333070 上设有複數定位槽19。 該等探針21,本實施例中係為彈簧針,具有一外殼22 以及位於該外殼22兩端之二彈性針體24 ’該外殼22之兩 端周緣相對於各該彈性針體24形成一肩面23。該等探針 5 21插置於該等穿孔16,且以該外殼22底端的該肩面23抵 接於該等小徑部17之頂緣,且該等彈性針體24的底端係 突伸出該基座11的底面。其中,探針21為彈簀針之型態 係屬習知,其詳細結構容不贅述。 該導引塊31,具有複數導引孔32 ’各該導引孔32的 1〇上段周壁向内延伸形成一小徑部33’該導引塊31係置於該 階部15上’而該等導引孔32套置於該等探針21之上段, 並藉由該外殼22頂端的該肩面23抵接於該等小徑部33之 底緣’該等彈性針體24的頂端係突伸出該導引塊μ的頂 面。該導引塊31係藉由至少一固定栓34固定於該階部ι5, 15本實施例係以二固定栓34來將該導引塊31固定於該階部 U,而各該固定栓34係為一螺栓。該導引塊31設有複數 定位孔36,複數定位柱37穿過該等定位孔36並插置於該 等定位槽19内,藉由該等定位枉37可將該導引塊31準確 的疋位於該基座11上。該導引塊31底面對應於該等導引 20孔32的位置係上凹形成一上凹部38。 該蓋板41,本實施例中係為一電路板,設於該基座1 i, 且蓋住於該等探針21,用以傳遞訊號。本實施例中,係藉 由若干固定螺栓42鎖定於該基座的固定部12。 藉由上述結構,該蓋板41蓋住於該等探針21,由於該 6 1333070 ί = 電路板’因此可與該等探針21電性連接, J且可於該盍板41上設置檢測電路或相關的電路,藉由玆 雜針21之底部接觸面板或待测 '二 51333070 IX. Description of the invention: [Technical field to which the invention pertains] Probe 2 == Probe for detection 'Specially refers to convenient disassembly and assembly 5 [Prior technology] Two conventional probe assemblies, usually a plurality of The probe is placed in a solid or a sleek, and is in the form of a second set of probes locked therein. In the eighth, a certain probe fails or is damaged. It is often impossible to replace the probe set with the entire group: The barley is very wasteful and not environmentally friendly. For example, China's announcement No. 1271, 379, is a kind of, and, such a probe module is a combination of the entire set of locks. In order to solve the above problems, the inventor of the present invention has proposed a structure that can repudiate and replace the probe, which can save 5 and reduce cost and the like. Guardian [Explanation] The main object of the present invention is to provide a probe assembly which can be easily disassembled and assembled, and can also be easily replaced. > The purpose of the savings is to provide a probe assembly that can be more versatile and has a ring-like and cost-effective effect. D' J Cheng: According to the present invention, the soil seat has a first-order portion, and a plurality of dental holes are smeared in the step, and the peripheral wall of the bottom portion of each of the perforations extends inward to form a 4 1333070; a plurality of probes, the top and bottom sections have a wire, the material is perforated, and the suppression of the probe level is reduced to the top edge of the small diameter, and the bottom end of the probe protrudes from the base a bottom surface; a block having a plurality of guiding holes, wherein the upper peripheral wall of each of the guiding holes is inwardly extended to become a small diameter portion, and the guiding bow block is placed on the step, and the same is placed on the probe The upper section, and the bottom edge of each of the guiding blocks is abutting against the shoulder surface of the top section of the probes, and the top end of the probes protrudes from the top surface of the guiding block. The guiding block is fixed to the step by at least a __ fixing bolt, and the cover plate is disposed on the base and covers the probes. Therefore, the invention has the function of reading and replacing the probe, facilitating maintenance, and saving cost. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In order to explain the structure and features of the present invention in detail, the following preferred embodiments are described with reference to the accompanying drawings, wherein: A probe assembly is provided, which is mainly composed of a base η, a plurality of probes 21, a guiding block η and a cover 41, wherein: the base 11 has a fixing portion 12 for fixing In the other matching device, the base 11 has a 20 extending portion extending forwardly from the fixing portion 12, and the extending portion 14 has a width smaller than the fixing portion 12, so that the base 11 is substantially braided. In the shape, the extension portion 14 is formed with a first step portion 15 which is white. The cymbal 15 has a plurality of perforations 16 therein, and a peripheral wall of the bottom portion of each of the perforations 16 extends inwardly to form a small diameter portion 17. The top surface of the step 15 corresponds to the position of the perforations 16 and is recessed to form a lower recess 18. The base is provided with a plurality of positioning grooves 19 on the step 15 5 1333070. The probes 21, which are spring pins in the present embodiment, have a housing 22 and two elastic needles 24 ′ at the two ends of the housing 22. The two ends of the housing 22 form a peripheral edge with respect to each of the elastic needles 24. Shoulder 23. The probes 521 are inserted into the perforations 16 , and the shoulder surface 23 at the bottom end of the outer casing 22 abuts against the top edge of the small diameter portions 17 , and the bottom ends of the elastic needles 24 are embossed The bottom surface of the base 11 is extended. Among them, the probe 21 is a type of a magazine needle, and its detailed structure is not described. The guiding block 31 has a plurality of guiding holes 32'. Each of the guiding holes 32 has an upper peripheral wall extending inwardly to form a small diameter portion 33'. The guiding block 31 is placed on the step portion 15' The guiding holes 32 are sleeved on the upper portion of the probes 21, and the shoulder surface 23 at the top end of the outer casing 22 abuts against the bottom edge of the small diameter portions 33. The top surface of the guiding block μ is protruded. The guiding block 31 is fixed to the step portion ι5 by at least one fixing bolt 34. In this embodiment, the guiding block 31 is fixed to the step portion U by two fixing bolts 34, and each of the fixing pins 34 is fixed. It is a bolt. The guiding block 31 is provided with a plurality of positioning holes 36 through which the plurality of positioning posts 37 are inserted and inserted into the positioning slots 19, and the guiding blocks 31 can be accurately positioned by the positioning holes 37. The crucible is located on the base 11. The bottom surface of the guiding block 31 is recessed to form an upper concave portion 38 corresponding to the position of the guiding holes 20. The cover plate 41, which is a circuit board in this embodiment, is disposed on the base 1 i and covers the probes 21 for transmitting signals. In this embodiment, the fixing portion 12 of the base is locked by a plurality of fixing bolts 42. With the above structure, the cover 41 covers the probes 21, and since the 6 1333070 ί = circuit board ' can be electrically connected to the probes 21, J can be set on the sill 41 Circuit or related circuit, by the bottom of the pin 21 contact panel or to be tested 'two 5

測。而同時,該等探針2丨係受物引塊^^;^ 以及該基座11财孔16 定,不會在進行檢測時移位。 欲更換探針21時,僅需將該蓋板41及引導塊31取下, 再拔出故障的探針21,接著再將新的探針21插入對應的導 弓I孔32以及穿孔16,在蓋回該蓋板4"矣,即完成更換。 而其中,該上凹部38以及該下凹部18主要是為了減 少5亥基座11以及該導引塊31的局部厚度,如此一來可以 縮短該等導引孔32以及該等穿孔16的長度,進而減少了 該等探針21表面與該等導引孔32的孔壁以及該等穿孔16 的孔壁之間的磨擦面積’使得探針21可更容易的拔出或插 入,換言之,更換探針21即更為容易。 另外,由於該等探針21的兩端仍然是插置於該等穿孔 16以及該等導引孔32,因此仍然受到該導引塊31以及該 基座11的良好固定,不會在檢測時移位。 7 1333070 【圖式簡單說明】 第一圖係本發明一較佳實施例之組合立體圖。 第二圖係本發明一較佳實施例之分解立體圖。 第三圖係本發明一較佳實施例之部分構件組合圖,顯 5 示探針置於基座之狀態。 第四圖係本發明一較佳實施例之俯視圖。 第五圖係沿第四圖中5-5剖線之剖視圖。 【主要元件符號說明】 10 10探針組具 11基座 12固定部 14延伸部 15階部 16穿孔 17小徑部 18下凹部 19定位槽 21探針 22外殼 23肩面 24彈性針體 15 31導引塊 32導引孔 33小徑部 34固定栓 36定位孔 37定位柱 38上凹部 41蓋板 42固定螺栓 8Measurement. At the same time, the probes 2 are subjected to the object introduction block ^^; ^ and the base 11 financial hole 16 and will not be displaced when the detection is performed. When the probe 21 is to be replaced, only the cover 41 and the guide block 31 are removed, and the faulty probe 21 is pulled out, and then the new probe 21 is inserted into the corresponding guide hole I 32 and the through hole 16, After replacing the cover 4", the replacement is completed. The upper concave portion 38 and the lower concave portion 18 are mainly for reducing the partial thickness of the 5th pedestal 11 and the guiding block 31, so that the guiding holes 32 and the lengths of the through holes 16 can be shortened. Further reducing the frictional area between the surface of the probe 21 and the hole walls of the guide holes 32 and the hole walls of the holes 16 makes the probe 21 easier to pull out or insert, in other words, replace the probe. Needle 21 is easier. In addition, since the two ends of the probes 21 are still inserted in the through holes 16 and the guiding holes 32, they are still well fixed by the guiding block 31 and the base 11, and are not detected. Shift. 7 1333070 BRIEF DESCRIPTION OF THE DRAWINGS The first drawing is a combined perspective view of a preferred embodiment of the present invention. The second drawing is an exploded perspective view of a preferred embodiment of the present invention. The third figure is a combination of parts of a preferred embodiment of the present invention, showing the state in which the probe is placed on the base. The fourth drawing is a plan view of a preferred embodiment of the present invention. The fifth drawing is a cross-sectional view taken along line 5-5 of the fourth figure. [Main component symbol description] 10 10 probe assembly 11 base 12 fixing portion 14 extension portion 15 step portion 16 perforation 17 small diameter portion 18 lower recess portion 19 positioning groove 21 probe 22 outer casing 23 shoulder surface 24 elastic needle body 15 31 Guide block 32 guide hole 33 small diameter portion 34 fixing bolt 36 positioning hole 37 positioning post 38 upper recess 41 cover 42 fixing bolt 8

Claims (1)

、申請專利範圍: L 一種探針組具,包含有: 各节^基ΐ ’前方具有—階部,於該階部上設有複數穿孔, 以穿孔内之底段周壁向内延伸形成—小徑部; 穿孔複tit 1底段具有—肩面,該等探針插置於該等 〜等探針底段之該肩面抵接於該等小徑部之頂 緣,j雜針之底端係突伸㈣基紅底面; 套置於該等探針之上段,並以各該導引塊的小徑 办&、’錄於該等探針頂段的該肩面,該等探針的頂端係 =伸出該導引塊的頂面,該導引塊係、藉由至少—固定检固 定於該階部;以及 鬼具有複數導引孔,各該導引孔的上段周壁 二内延伸形成-小經部,該導引塊係置於該階部上, 一盍板,設於該基座,且蓋住於該等探針。 2. 依據申請專纖圍第1項所狀探針組具,其中: 該基座㈣階部上設有複數m鱗引塊設有複數定 位孔’複蚊她穿過鮮植孔並插置於該等定位槽内。 3. 依據申請專利範圍第2項所述之探針組具,其中: §亥基座係具有i定部,以及具有由顧定部向前方延伸 之一延伸部,該延伸部的寬度小於該固定部,而使該基座 概呈T字形,該階部係形成於該延伸部上。 4·依據申凊專利範圍第3項所述之探針組具,其中: 該蓋板係為一電路板。 5.依據申請專利範圍第4項所述之探針組具,其中: 該等探針,係為彈簧針,具有一外殼以及位於該外殼兩端 之二彈性針體, 形成一肩面。 該外殼之兩端L卩相對於各該彈性針體 6.依據申請專利範圍第5項 階部頂面對應㈣/叙探針組具,其中:該 7㈣Γ等穿 ㈣下㈣成—下凹部。 ^ 依據申請專利範圍第5項所述之探針組具,其中:該 氐面對應於該等導引孔的位置係上凹形成一上凹 部。 8.依據申請專利範圍第5項所述之探針組具,其中:該 階部頂面對應於該等穿孔的位置係下凹形成一下凹部;該 10導引塊底面對應於該等導引孔的位置係上凹形成一上凹Patent application scope: L A probe assembly comprising: each section ^ base ΐ 'front has a step, a plurality of perforations are provided on the step, and the peripheral wall of the bottom section of the perforation extends inwardly to form a small The bottom portion of the perforated complex tit 1 has a shoulder surface, and the probes are inserted into the top surface of the bottom portion of the probes to abut the top edge of the small diameter portions, and the bottom of the j needle The end of the protruding (four) base red bottom surface; sleeved on the upper section of the probe, and the small diameter of each of the guiding blocks, and the 'shoulder surface recorded on the top section of the probes, the probe The top end of the needle is extended to the top surface of the guiding block, and the guiding block is fixed to the step by at least a fixed inspection; and the ghost has a plurality of guiding holes, and the upper peripheral wall of each of the guiding holes The inner extension forms a small warp portion, the guiding block is placed on the step, and a seesaw is disposed on the base and covers the probes. 2. According to the probe kit of the first item of the application fiber, in which: the base (four) step is provided with a plurality of m scales, and a plurality of positioning holes are provided, and the mosquitoes pass through the fresh planting holes and are inserted. In the positioning slots. 3. The probe assembly of claim 2, wherein: the base has an i-section, and has an extension extending forwardly from the predetermined portion, the extension having a width smaller than the The fixing portion is formed in a T-shape, and the step is formed on the extending portion. 4. The probe assembly of claim 3, wherein: the cover is a circuit board. 5. The probe set according to claim 4, wherein: the probe is a pogo pin having a housing and two elastic needles at opposite ends of the housing to form a shoulder surface. The two ends of the outer casing are opposite to each of the elastic needle bodies. 6. According to the top surface of the fifth aspect of the patent application, the top surface corresponds to the (four)/probe probe assembly, wherein: the 7 (four) Γ is worn (four) the lower (four) into the lower concave portion. The probe assembly of claim 5, wherein: the face of the face corresponding to the guide holes is concavely formed with an upper recess. 8. The probe set according to claim 5, wherein the top surface of the step corresponds to the position of the perforations to form a concave portion; the bottom surface of the 10 guide block corresponds to the guide The position of the hole is concave to form an upper concave
TW96128915A 2007-08-06 2007-08-06 Probe module TW200907354A (en)

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TWI771085B (en) * 2021-06-29 2022-07-11 美科樂電子股份有限公司 Probe base structure
TWI829074B (en) * 2021-06-29 2024-01-11 美科樂電子股份有限公司 Probe holder structure

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