TW202111332A - Test probe, method of manufacturing the same, and test socket supporting the same - Google Patents

Abstract

Disclosed is a test probe for testing a device to be tested. The test probe includes a line contact portion comprising a first contact line set and a second contact line set each comprising two contact lines linearly extending to be spaced apart from each other, wherein the first contact line set and the second contact line set are disposed in a V shape or U shape.

Description

Test probe, its manufacturing method and test seat supporting it

The disclosure relates to a test probe for testing the electrical characteristics of a device to be tested (such as a camera module), a manufacturing method thereof, and a test seat supporting the test probe.

The ultra-compact camera module applied to a small mobile device has a connector 10, and the connector 10 has a partially cylindrical contact terminal 12, as shown in FIG. 1. The contact terminal 12 is formed by bending a metal strip into a partial cylindrical shape. In the test of the connector 10, a plunger of a pogo pin is in contact with the contact terminal 12.

Generally speaking, the plunger of the pogo pin has one or more tips to contact bump terminals formed of lead during testing. When contacting the contact terminal 12 having a curved convex shape, the tip of the plunger may cause contact error due to sliding. To solve this problem, the present inventor proposes a test probe with a fork-shaped plunger, as disclosed in Korean Patent No. 10-1920824. The fork-shaped plunger has a V-shaped contact surface and can accommodate the terminal to be tested to make surface contact with the terminal for testing.

However, after performing multiple repeated tests, foreign materials are transferred to and accumulated on the contact surface of such a conventional test probe, and therefore the contact resistance increases, which is problematic. In addition, the test is performed by two surface contact points with terminals to be tested. However, due to accumulated foreign materials, the contact resistance of the surface contact points is abnormally increased, and therefore the reliability of the test may be reduced. Therefore, a normal camera module may be identified as defective. Such accumulation of foreign materials or unstable contact between the test probe and the contact terminal can cause equipment maintenance or cleaning, false readings, etc., and therefore have a negative impact on mass production yield.

Aspects of one or more exemplary embodiments provide a test probe for reducing the transfer and accumulation of foreign materials and improving the reliability of the test, a manufacturing method thereof, and a test seat supporting the same.

This article provides a test probe for testing the device to be tested. The test probe includes a wire contact portion, the wire contact portion includes a first contact wire group and a second contact wire group, each of the first contact wire group and the second contact wire group includes linearly extending and mutually Two spaced-apart contact wires, wherein the first contact wire group and the second contact wire group are arranged in a V shape or a U shape.

A recessed portion may be provided in the space between the two contact lines.

The recessed portion may have a uniform curvature along the extending direction of the contact line.

The line contact portion may include one or more other contact line groups including two contact lines extending linearly and spaced apart from each other.

This article provides a method of manufacturing test probes. The method includes: providing a cylindrical member; forming a depression in a longitudinal direction on an end of the member; and performing plane cutting on the end to leave a predetermined width including a center axis of the member.

The depression may include a cone or a hemisphere.

The method may further include: forming a hole in the longitudinal direction at the apex of the recess.

This article provides a test socket for testing the device to be tested. The test socket includes: a test probe, including a line contact part, the line contact part includes a first contact line group and a second contact line group, the first contact line group and the second contact line group each include Two contact wires extending linearly and spaced apart from each other; and a probe support member configured to support the test probe The first contact line group and the second contact line group are arranged in a V shape or a U shape.

Hereinafter, the test probe 40, its manufacturing method, and the test socket according to the first embodiment of the present disclosure will be described in detail with reference to the accompanying drawings.

FIG. 1 shows a connecting piece 10 of a device to be tested (such as a camera module). The connector 10 may include a contact point 12 to be tested, and the contact point 12 has a partial cylindrical shape by bending a metal plate into a "U" shape.

FIG. 2 is a detailed perspective view of the line contact portion 20 of the probe 40 according to the first embodiment of the present disclosure.

2, the line contact portion 20 may include a V-shaped end portion 22, a flange 24 integrally extending from the V-shaped end portion 22, and an extension portion 26 integrally extending from the flange 24.

The V-shaped end 22 may include a V-shaped contact portion 221 that makes line contact with the contact point to be tested during the test.

The V-shaped contact portion 221 may include a first contact line group 222 and a second contact line group 223. Each of the first contact line group 222 and the second contact line group 223 has two lines extending linearly and spaced apart from each other. Contact line. Each of the first contact line group 222 and the second contact line group 223 may extend such that the two contact lines are inclined downwardly side by side at a certain interval. The first contact line group 222 and the second contact line group 223 may converge at one point at the center. The V-shaped contact part 221 may include four contact lines provided at four edges. Therefore, in the test, the contact point to be tested can make line contact with the four contact lines of the V-shaped contact portion 221.

The V-shaped end portion 22 may include a first recessed portion 224 and a second recessed portion 225. The first recessed portion 224 is provided between the two contact lines of the first contact line group 222 along the extending direction of the first recessed portion 224. Uniform curvature, the second recessed portion 225 has a uniform curvature between the two contact lines of the second contact line group 223 along the extending direction of the second recessed portion 225.

The V-shaped end 22 may include a concave portion 226 that extends in the longitudinal direction at a point where the first contact line group 222 and the second contact line group 223 converge.

The V-shaped end 22 may have a plate shape having a thickness suitable for the pitch of the contact point to be tested provided in the device to be tested.

The flange 24 may integrally extend rearward from the V-shaped end 22. The flange 24 may be formed in a plate shape having a larger width than the V-shaped end portion 22 to improve strength. In addition, the flange 24 may be formed in a plate shape to prevent rotation during the test.

The extension portion 26 may extend backward from the flange 24 integrally. The extension 26 having a cylindrical shape may contact the end of the first plunger (34). Here, the extension 26 may be omitted, and the flange 24 may be integrally formed with the first plunger (34). The extension 26 is not limited to a cylindrical shape, and may have various shapes.

The contact point to be tested having a partial cylindrical shape is accommodated between the first contact line group 222 and the second contact line group 223 of the V-shaped contact portion 221, and contacts the four contact points P1, P2, P3, and P4. Therefore, even when positional errors of the four contact points P1, P2, P3, and P4 occur due to alignment errors and tolerances, there is a probability that a contact error will occur between the V-shaped contact portion 221 and the contact point to be tested Can also be lowered. In addition, even when foreign material is transferred to the four sharp linear contact points P1, P2, P3, and P4 due to repeated testing, the transferred foreign material is still pushed to the first recessed portion 224 and the second recessed portion 225 Or be pushed out so that foreign materials will not accumulate at the four contact points P1, P2, P3, and P4. Specifically, the contact point to be tested contacts a plurality of contact points (for example, four contact points P1, P2, P3, and P4), and thus contact resistance can be reduced.

Generally speaking, the contact points to be tested of the device to be tested are set to have a very narrow pitch. Therefore, considering that the plurality of contact points to be tested have a narrow pitch, the V-shaped end portion 22 may be formed in a plate shape having a narrow width. In addition, the flange 24 may be formed in a plate shape having a wider width than the V-shaped end 22 to improve strength.

The line contact portion 20 can be manufactured using a plate having a uniform thickness as a whole, but the strength and durability may be reduced. Therefore, only the V-shaped end 22 may have a small thickness to avoid interference from adjacent contact points to be tested, and the remaining part may be processed into a flange 24 or an extension 26 with a larger width.

Hereinafter, a method of manufacturing the line contact portion 20 shown in FIG. 2 will be explained with reference to FIG. 3.

FIG. 3 is a set of diagrams schematically showing a method of manufacturing the line contact portion 20 according to an embodiment of the present disclosure.

In step S11, a cylindrical member 21 corresponding to the length of the line contact portion 20 is provided.

In step S12, a V-shaped drill is used to form a recess 212, such as a cone or a hemisphere, in the longitudinal direction at one end of the cylindrical member 21.

In step S13, a hole 214 is formed in the longitudinal direction at the apex of the recess 212 using a straight drill.

In step S14, a cutting tool is used to perform the first plane processing and the second plane processing on the end to leave a predetermined width including the central axis of the cylindrical member 21. The V-shaped end portion 22 can be formed by a first planar treatment, and the flange 24 can be formed by a second planar treatment.

As described above, after the recess 212 is formed at the end of the cylindrical member 21, only plane cutting is performed to leave a predetermined width including the central axis, so that the first contact line group 222 and the second contact line group can be easily formed 223的V-shaped contact portion 221.

FIG. 4 is a perspective view of the test probe 40 according to the first embodiment of the present disclosure.

Referring to FIG. 4, the test probe 40 may include a wire contact part 20 and a spring pin 30.

Since the line contact portion 20 has the same structure as that shown in FIG. 2, it will not be described in detail.

The spring pin 30 may include a cylindrical barrel 32, a first plunger 34 partially housed in one side of the barrel 32, and a solder part partially housed in the other side of the barrel 32 and contacting, for example, a test substrate. The second plunger 36 of the disc.

The barrel 32 may include a spring between the first plunger 34 and the second plunger 36 in the barrel 32. At least one of the first plunger 34 and the second plunger 36 may be supported to elastically slide by compression or recovery of the spring in the barrel 32.

In the test, the end of the first plunger 34 can contact the end of the extension 26 of the wire contact portion 20.

The second plunger 36 may contact, for example, a pad of the test circuit substrate.

5 and 6 are respectively a perspective view and an exploded perspective view of the test socket 50 according to the first embodiment of the present disclosure.

As shown in the figure, the test socket 50 may include a contact portion support 51 that accommodates and supports a plurality of line contact portions 20, a housing 52 that accommodates and supports the contact portion support 51 in a floating state, and supports A probe holder 53 of a spring pin 30. The spring pin 30 is accommodated in and supported in the lower part of the housing 52, and is provided in correspondence with the plurality of wire contact portions 20 Location.

The contact portion support 51 may include a first contact portion support 512 and a second contact portion support 514. The wired contact portion 20 is inserted into the first contact portion support 512 to partially protrude, and the second contact portion support 514 It is arranged under the first contact part support 512. The first contact portion support 512 includes a first opening 5122 in which the V-shaped end 22 of the wired contact portion 20 is inserted. The second contact portion support 514 may include a second opening 5142 in which the extension 26 of the wired contact portion 20 is inserted. The contact portion support 51 may be supported by the four springs 526 in the first accommodating portion 522 of the housing 52 in a floating state.

The first accommodating portion 522 accommodating the contact portion support 51 and the second accommodating portion (not shown) accommodating the probe support 53 can be respectively formed in the upper and lower portions of the housing 52, and the partition is between Between the first accommodating part 522 and the second accommodating part. The partition plate may include a third opening 524 in which the first plunger 34 of the spring pin 30 described below is accommodated.

The spring pin 30 may include a cylindrical barrel 32, a first plunger 34 partially housed in one side of the barrel 32, a second plunger 36 partially housed in the other side of the barrel 32, and A spring 38 intervening in the barrel 32 between the first plunger 34 and the second plunger 36 and biasing the first plunger 34 and the second plunger 36 away from each other.

The probe holder 53 may be inserted and fixed in the second accommodating portion existing in the lower part of the housing 52, and the second plunger 36 may include a fourth opening 532 for accommodating the spring pin 30, so that the first The two plungers 36 may partially protrude outward. The probe support 53 can be fixed in the lower part of the housing 52 by a fixing pin 536.

The contact part support 51 supporting the line contact part 20 may be inserted into and supported in the first accommodating part 522 in a removable manner. Therefore, when the line contact part 20 is defective or the life of the line contact part 20 ends, the line contact part 20 can be easily replaced.

FIG. 7 is a cross-sectional view of the test socket 60 to which the test probe 40 shown in FIG. 4 is applied.

Referring to FIG. 7, the test socket 60 may include a contact portion support 61 that accommodates and supports the wire contact portion 20 and a probe support 63 that accommodates and supports the spring pin 30.

The contact portion support 61 may include a first contact portion support 612 that accommodates the V-shaped end 22 and the flange 24 of the line contact portion 20, and a second contact portion support 614 that accommodates the extension portion 26 of the line contact portion 20 .

The first contact portion support 612 may include a contact terminal accommodating hole 6122 for accommodating the V-shaped end 22 of the wire contact portion 20 and a flange accommodating hole 6124 for accommodating the flange 24 of the wire contact portion 20.

The second contact portion support 614 may include an extension portion accommodating hole 6142 for accommodating the extension portion 26 of the line contact portion 20.

The probe support 63 may include a first probe support 632 that accommodates the barrel 32 and the first plunger 34 and a second probe support 634 that accommodates the second plunger 36.

The first probe support 632 may include a first plunger accommodating hole 6322 for accommodating the first plunger 32 of the spring pin 30 and a cylinder accommodating hole 6324 for the accommodating cylinder 32.

The second probe support 634 may include a second plunger accommodating hole 6342 for accommodating the second plunger 36 of the spring pin 30.

Before the test, the first plunger 34 can protrude to the extension accommodating hole 6142 of the second contact portion support 614.

FIG. 7 shows a situation in which the test terminal 12 is pressed for testing and the spring 38 is compressed. When the test is completed, the pressing of the test terminal 12 is stopped, and the first plunger 34 is projected upward due to the spring 38 and pushes the wire contact portion 20 upward. Therefore, when the test is completed, the V-shaped end 22 of the line contact portion 20 may protrude outward.

FIG. 8 is a perspective view of a test probe 70 according to another embodiment of the present disclosure.

8, the test probe 70 may include a cylindrical barrel 72, a first plunger 74 partially housed in one side of the barrel 72, and a first plunger 74 partially housed in the other side of the barrel 72 and contacting, for example, The second plunger 76 of the pad of the test substrate.

The barrel 72 may include a spring between the first plunger 74 and the second plunger 76 in the barrel 72. At least one of the first plunger 74 and the second plunger 76 may be supported to elastically slide by compression or recovery of the spring in the barrel 72.

During the test, the end of the first plunger 74 can contact the contact point to be tested of the device to be tested. The first plunger 73 may include a V-shaped end 742, a flange 744 and an extension 746. Except for the extension portion 746, the first plunger 74 has a shape similar to the line contact portion 20 shown in FIG. 2 and therefore will not be described in detail. The extension 746 may include an expanded end 748 that is received in the barrel 72 and does not extend.

The second plunger 76 may contact, for example, a pad of the test circuit substrate.

FIG. 9 is a cross-sectional view of the test socket 80 to which the test probe 70 shown in FIG. 8 is applied.

9, the test seat 80 may include a first plunger support 81 that accommodates and supports the first plunger 74, a cylinder support 82 that accommodates and supports the cylinder 72, and a cylinder support 82 that is disposed under the cylinder support 82 and accommodates The second plunger support 83 is provided with and supports the second plunger 76.

In the test probe according to the embodiment of the present disclosure, two pairs of contact wires spaced apart from each other are arranged to extend in a V-shape or U-shape, so that when the device to be tested is accommodated in the V-shaped groove, the test probe can Make line contact with the device under test at four points. Therefore, in the test probe of the present disclosure, despite repeated testing, the transfer and accumulation of foreign materials can be effectively prevented, and the contact resistance can be reduced, thereby improving the reliability of the test.

Although the present disclosure has been described with reference to limited exemplary embodiments and drawings, the present disclosure is not limited to the foregoing exemplary embodiments. Those who are familiar with this technique can make various modifications and changes according to the instructions.

Therefore, the scope of the present disclosure should not be limited to the above exemplary embodiments, and should not only be determined by the scope of the following patent applications, but also by its equivalent content.

10: Connector 12: Contact terminal/contact point/test terminal 20: Line contact part 21: Cylindrical member 22, 742: V-shaped end 24, 744: flange 26, 746: Extension 30: spring pin 32, 72: tube 34, 74: first plunger 36, 76: second plunger 38, 526: Spring 40: test probe/probe 50, 60, 80: test seat 51, 61: contact part of the support 52: shell 53, 63: Probe support 70: Test Probe 81: The first plunger support 82: tube support 83: second plunger support 212: Depression 214: Hole 221: V-shaped contact part 222: The first contact line group 223: The second contact line group 224: The first recessed part 225: The second recessed part 226: Recessed part 512, 612: first contact part support 514, 614: second contact part support 522: first housing part 524: third opening 532: fourth opening 536: Pin 632: The first probe support 634: second probe support 748: Expansion End 5122: first opening 5142: second opening 6122: Contact terminal receiving hole 6124: Flange receiving hole 6142: Extension Hole 6322: first plunger housing hole 6324: cylinder housing hole 6342: second plunger housing hole P1, P2, P3, P4: contact points S11, S12, S13, S14: steps

With reference to the accompanying drawings, according to the following description of exemplary embodiments, the above content and/or aspects will become obvious and easier to understand. In the accompanying drawings: Fig. 1 is a perspective view of a connector of a camera module. Fig. 2 is a detailed perspective view of a line contact part according to the first embodiment of the present disclosure. FIG. 3 is a set of diagrams showing a method of manufacturing a line contact part according to the first embodiment of the present disclosure. Fig. 4 is a perspective view of the test probe according to the first embodiment of the present disclosure. Fig. 5 is a perspective view of a test socket according to the first embodiment of the present disclosure. Fig. 6 is an exploded perspective view of the test socket shown in Fig. 5. Fig. 7 is a cross-sectional view of the test socket shown in Fig. 5. Fig. 8 is a perspective view of a test probe according to a second embodiment of the present disclosure. Fig. 9 is a cross-sectional view of a test socket to which the test probe shown in Fig. 8 is applied.

20: Line contact part

22: V-shaped end

24: flange

26: Extension

221: V-shaped contact part

222: The first contact line group

223: The second contact line group

224: The first recessed part

225: The second recessed part

226: Recessed part

P1, P2, P3, P4: contact points

Claims (8)

A test probe for testing a device to be tested. The test probe includes a wire contact portion, the wire contact portion includes a first contact wire group and a second contact wire group, the first contact wire group and the first contact wire group Each of the two contact wire groups includes two contact wires extending linearly and spaced apart from each other, The first contact line group and the second contact line group are arranged in a V shape or a U shape. The test probe according to claim 1, wherein a recessed portion is provided between the two contact lines. The test probe according to claim 2, wherein the concave portion has a uniform curvature along the extending direction of the contact line. The test probe according to claim 1, wherein the wire contact portion includes one or more other contact wire groups, and the one or more other contact wire groups include two contact wires extending linearly and spaced apart from each other . A method of manufacturing a test probe, the method comprising: Provide cylindrical components; Forming a depression in the longitudinal direction on the end of the member; and A plane cut is performed on the end to leave a predetermined width including the central axis of the member. The method according to claim 5, wherein the depression includes a cone or a hemisphere. The method according to claim 5, further comprising: forming a hole in the longitudinal direction at the apex of the recess. A test seat for testing a device to be tested, the test seat comprising: The test probe includes a wire contact portion, the wire contact portion includes a first contact wire group and a second contact wire group, each of the first contact wire group and the second contact wire group includes linearly extending and spaced apart from each other Two contact lines opened; and Probe support, configured to support the test probe The first contact line group and the second contact line group are arranged in a V shape or a U shape.

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