KR100568392B1 - 은 합금 스퍼터링 타겟 및 그의 제조 방법 - Google Patents
은 합금 스퍼터링 타겟 및 그의 제조 방법 Download PDFInfo
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- KR100568392B1 KR100568392B1 KR1020047002714A KR20047002714A KR100568392B1 KR 100568392 B1 KR100568392 B1 KR 100568392B1 KR 1020047002714 A KR1020047002714 A KR 1020047002714A KR 20047002714 A KR20047002714 A KR 20047002714A KR 100568392 B1 KR100568392 B1 KR 100568392B1
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- silver alloy
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- sputtering target
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- 229910001316 Ag alloy Inorganic materials 0.000 title claims abstract description 59
- 238000005477 sputtering target Methods 0.000 title claims abstract description 25
- 238000000034 method Methods 0.000 title claims description 30
- 230000008569 process Effects 0.000 title description 5
- 239000013078 crystal Substances 0.000 claims abstract description 118
- 238000005259 measurement Methods 0.000 claims abstract description 36
- 238000004544 sputter deposition Methods 0.000 claims abstract description 30
- 238000002441 X-ray diffraction Methods 0.000 claims abstract description 9
- 238000012545 processing Methods 0.000 claims description 32
- 150000001875 compounds Chemical class 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 22
- 238000005275 alloying Methods 0.000 claims description 21
- 238000004519 manufacturing process Methods 0.000 claims description 21
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 19
- 229910052709 silver Inorganic materials 0.000 claims description 18
- 239000004332 silver Substances 0.000 claims description 18
- 229910052737 gold Inorganic materials 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 6
- 238000005482 strain hardening Methods 0.000 claims description 6
- 229910052719 titanium Inorganic materials 0.000 claims description 4
- 239000012535 impurity Substances 0.000 claims description 2
- 229910052761 rare earth metal Inorganic materials 0.000 claims description 2
- 239000010409 thin film Substances 0.000 abstract description 82
- 239000010408 film Substances 0.000 abstract description 63
- 238000009826 distribution Methods 0.000 description 71
- 239000000203 mixture Substances 0.000 description 54
- 238000005266 casting Methods 0.000 description 20
- 239000000956 alloy Substances 0.000 description 19
- 238000003754 machining Methods 0.000 description 19
- 230000003287 optical effect Effects 0.000 description 17
- 229910052751 metal Inorganic materials 0.000 description 14
- 239000002184 metal Substances 0.000 description 14
- 230000006698 induction Effects 0.000 description 13
- 239000000463 material Substances 0.000 description 12
- 238000002844 melting Methods 0.000 description 12
- 230000008018 melting Effects 0.000 description 12
- 238000005242 forging Methods 0.000 description 11
- 239000000758 substrate Substances 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 230000001747 exhibiting effect Effects 0.000 description 9
- 239000010931 gold Substances 0.000 description 9
- 238000005096 rolling process Methods 0.000 description 8
- 239000010949 copper Substances 0.000 description 7
- 238000001953 recrystallisation Methods 0.000 description 7
- 229910045601 alloy Inorganic materials 0.000 description 6
- 238000005097 cold rolling Methods 0.000 description 5
- 238000005098 hot rolling Methods 0.000 description 5
- 239000010944 silver (metal) Substances 0.000 description 5
- 230000000007 visual effect Effects 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000002474 experimental method Methods 0.000 description 4
- 230000001276 controlling effect Effects 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000006866 deterioration Effects 0.000 description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 3
- 230000001105 regulatory effect Effects 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 238000004090 dissolution Methods 0.000 description 2
- 238000004453 electron probe microanalysis Methods 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 238000004125 X-ray microanalysis Methods 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000002776 aggregation Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003703 image analysis method Methods 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000001552 radio frequency sputter deposition Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000011819 refractory material Substances 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000004576 sand Substances 0.000 description 1
- 238000010583 slow cooling Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 229910000898 sterling silver Inorganic materials 0.000 description 1
- 239000010934 sterling silver Substances 0.000 description 1
- 238000005211 surface analysis Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C5/00—Alloys based on noble metals
- C22C5/06—Alloys based on silver
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C5/00—Alloys based on noble metals
- C22C5/06—Alloys based on silver
- C22C5/08—Alloys based on silver with copper as the next major constituent
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (6)
- 은 합금 스퍼터링 타겟으로서, 상기 은 합금이 희토류 원소 1.0at% 이하, Au 2.0at% 이하, Cu 2.0at% 이하, Ti 0.5at% 이하 및 Zn 0.5at% 이하로부터 선택된 1종 이상을 포함하며, 잔부가 은 및 불가피적 불순물로 이루어진 것이고, 상기 은 합금 스퍼터링 타겟의 임의의 4개의 개소에 대해 X선 회절법에 의해 결정 배향 강도를 구하고, 가장 높은 결정 배향 강도(Xa)를 나타내는 방위가 4개의 측정 개소에서 동일하고, 각 측정 개소에서의 가장 높은 결정 배향 강도(Xa)와 2번째로 높은 결정 배향 강도(Xb)의 강도비(Xb/Xa)의 편차가 20% 이하임을 특징으로 하는 은 합금 스퍼터링 타겟.
- 제 1 항에 있어서,2번째로 높은 결정 배향 강도(Xb)를 나타내는 방위가 4개의 측정 개소에서 동일한 은 합금 스퍼터링 타겟.
- 제 1 항에 있어서,평균 결정 입경이 100㎛ 이하이고, 최대 결정 입경이 200㎛ 이하인 은 합금 스퍼터링 타겟.
- 제 1 항에 있어서,결정립계, 결정립내 또는 결정립계와 결정립내 둘 다에 존재하는 은과 합금 원소의 화합물상의 원 상당 직경이 평균 30㎛ 이하이고, 상기 원 상당 직경의 최대치가 50㎛ 이하인 은 합금 스퍼터링 타겟.
- 제 1 항에 따른 은 합금 스퍼터링 타겟을 제조하는 방법에 있어서, 30 내지 70%의 가공율에서 냉간 가공 또는 온간 가공을 실시하고, 그 후 500 내지 600℃의 유지 온도 및 0.75 내지 3시간의 유지 시간의 조건으로 열 처리를 실시함을 특징으로 하는 은 합금 스퍼터링 타겟의 제조 방법.
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002183463 | 2002-06-24 | ||
JP2002183462 | 2002-06-24 | ||
JPJP-P-2002-00183462 | 2002-06-24 | ||
JPJP-P-2002-00183463 | 2002-06-24 | ||
PCT/JP2003/007909 WO2004001093A1 (ja) | 2002-06-24 | 2003-06-23 | 銀合金スパッタリングターゲットとその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040044481A KR20040044481A (ko) | 2004-05-28 |
KR100568392B1 true KR100568392B1 (ko) | 2006-04-05 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047002714A Expired - Fee Related KR100568392B1 (ko) | 2002-06-24 | 2003-06-23 | 은 합금 스퍼터링 타겟 및 그의 제조 방법 |
Country Status (5)
Country | Link |
---|---|
US (2) | US20040238356A1 (ko) |
KR (1) | KR100568392B1 (ko) |
CN (1) | CN1238554C (ko) |
TW (1) | TWI258514B (ko) |
WO (1) | WO2004001093A1 (ko) |
Families Citing this family (49)
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US7316837B2 (en) | 2000-07-21 | 2008-01-08 | Target Technology Company, Llc | Metal alloys for the reflective or the semi-reflective layer of an optical storage medium |
US7374805B2 (en) * | 2000-07-21 | 2008-05-20 | Target Technology Company, Llc | Metal alloys for the reflective or the semi-reflective layer of an optical storage medium |
US7314659B2 (en) * | 2000-07-21 | 2008-01-01 | Target Technology Company, Llc | Metal alloys for the reflective or semi-reflective layer of an optical storage medium |
TWI258514B (en) * | 2002-06-24 | 2006-07-21 | Kobelco Res Inst Inc | Silver alloy sputtering target and process for producing the same |
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TWI368819B (en) | 2003-04-18 | 2012-07-21 | Target Technology Co Llc | Metal alloys for the reflective or the semi-reflective layer of an optical storage medium |
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-
2003
- 2003-06-23 TW TW092117008A patent/TWI258514B/zh not_active IP Right Cessation
- 2003-06-23 KR KR1020047002714A patent/KR100568392B1/ko not_active Expired - Fee Related
- 2003-06-23 CN CNB038008858A patent/CN1238554C/zh not_active Expired - Fee Related
- 2003-06-23 US US10/486,913 patent/US20040238356A1/en not_active Abandoned
- 2003-06-23 WO PCT/JP2003/007909 patent/WO2004001093A1/ja active Application Filing
-
2009
- 2009-11-24 US US12/625,022 patent/US20100065425A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
US20100065425A1 (en) | 2010-03-18 |
KR20040044481A (ko) | 2004-05-28 |
US20040238356A1 (en) | 2004-12-02 |
TW200403348A (en) | 2004-03-01 |
TWI258514B (en) | 2006-07-21 |
WO2004001093A1 (ja) | 2003-12-31 |
CN1238554C (zh) | 2006-01-25 |
CN1545569A (zh) | 2004-11-10 |
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