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WO2005031799A3 - 露光装置、露光方法及びデバイス製造方法 - Google Patents

露光装置、露光方法及びデバイス製造方法 Download PDF

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Publication number
WO2005031799A3
WO2005031799A3 PCT/JP2004/014693 JP2004014693W WO2005031799A3 WO 2005031799 A3 WO2005031799 A3 WO 2005031799A3 JP 2004014693 W JP2004014693 W JP 2004014693W WO 2005031799 A3 WO2005031799 A3 WO 2005031799A3
Authority
WO
WIPO (PCT)
Prior art keywords
exposure
optical system
projection optical
device manufacturing
exposure apparatus
Prior art date
Application number
PCT/JP2004/014693
Other languages
English (en)
French (fr)
Other versions
WO2005031799A2 (ja
Inventor
Hisashi Nishinaga
Ikuo Hikima
Mitsunori Toyoda
Masahiro Nakagawa
Tsuneyuki Hagiwara
Yasushi Mizuno
Naonori Kita
Osamu Tanitsu
Nozomu Emura
Original Assignee
Nippon Kogaku Kk
Hisashi Nishinaga
Ikuo Hikima
Mitsunori Toyoda
Masahiro Nakagawa
Tsuneyuki Hagiwara
Yasushi Mizuno
Naonori Kita
Osamu Tanitsu
Nozomu Emura
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to KR1020117024402A priority Critical patent/KR101289918B1/ko
Priority to KR1020147029481A priority patent/KR101664642B1/ko
Priority to KR1020177013519A priority patent/KR20170058458A/ko
Priority to KR1020067006005A priority patent/KR101323396B1/ko
Priority to KR1020137014762A priority patent/KR101421398B1/ko
Priority to KR1020147005637A priority patent/KR101498437B1/ko
Priority to HK06113781.0A priority patent/HK1093119B/en
Priority to EP04788458A priority patent/EP1670043B1/en
Priority to KR1020127021591A priority patent/KR101335736B1/ko
Priority to KR1020167006334A priority patent/KR101739711B1/ko
Priority to KR1020137014763A priority patent/KR101441840B1/ko
Application filed by Nippon Kogaku Kk, Hisashi Nishinaga, Ikuo Hikima, Mitsunori Toyoda, Masahiro Nakagawa, Tsuneyuki Hagiwara, Yasushi Mizuno, Naonori Kita, Osamu Tanitsu, Nozomu Emura filed Critical Nippon Kogaku Kk
Priority to KR1020157013859A priority patent/KR101743378B1/ko
Publication of WO2005031799A2 publication Critical patent/WO2005031799A2/ja
Publication of WO2005031799A3 publication Critical patent/WO2005031799A3/ja
Priority to IL174296A priority patent/IL174296A0/en
Priority to US11/390,178 priority patent/US8305552B2/en
Priority to US11/403,922 priority patent/US8139198B2/en
Priority to US11/896,447 priority patent/US8039807B2/en
Priority to US13/633,599 priority patent/US8749759B2/en
Priority to IL231730A priority patent/IL231730A/en
Priority to US14/268,356 priority patent/US9513558B2/en
Priority to IL235090A priority patent/IL235090A/en
Priority to US15/369,062 priority patent/US10025194B2/en
Priority to US16/034,490 priority patent/US20180348643A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/7015—Details of optical elements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274—Photolithographic processes
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70591—Testing optical components
    • G03F7/706—Aberration measurement
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Manufacturing & Machinery (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

　投影光学系ＰＬから液体ＬＱに入射した露光光のうち、光透過部４４に入射した露光光は、気体中を通過せずに光学部材４１に入射して収束される。露光装置は、投影光学系の開口数が増大しても投影光学系からの露光光を受光して、各種の計測を行うことができる。
PCT/JP2004/014693 2003-09-29 2004-09-29 露光装置、露光方法及びデバイス製造方法 WO2005031799A2 (ja)

Priority Applications (22)

Application Number Priority Date Filing Date Title
KR1020157013859A KR101743378B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020177013519A KR20170058458A (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020067006005A KR101323396B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020137014762A KR101421398B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020147005637A KR101498437B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
HK06113781.0A HK1093119B (en) 2003-09-29 2004-09-29 Exposure apparatus, exposure method, and device manufacturing method
EP04788458A EP1670043B1 (en) 2003-09-29 2004-09-29 Exposure apparatus, exposure method, and device manufacturing method
KR1020127021591A KR101335736B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020167006334A KR101739711B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020137014763A KR101441840B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020147029481A KR101664642B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
KR1020117024402A KR101289918B1 (ko) 2003-09-29 2004-09-29 노광장치, 노광방법 및 디바이스 제조방법
IL174296A IL174296A0 (en) 2003-09-29 2006-03-13 Exposure appartus, exposure method, and method for producing device
US11/390,178 US8305552B2 (en) 2003-09-29 2006-03-28 Exposure apparatus, exposure method, and method for producing device
US11/403,922 US8139198B2 (en) 2003-09-29 2006-04-14 Exposure apparatus, exposure method, and method for producing device
US11/896,447 US8039807B2 (en) 2003-09-29 2007-08-31 Exposure apparatus, exposure method, and method for producing device
US13/633,599 US8749759B2 (en) 2003-09-29 2012-10-02 Exposure apparatus, exposure method, and method for producing device
IL231730A IL231730A (en) 2003-09-29 2014-03-26 Exposure facility and method of manufacturing the facility
US14/268,356 US9513558B2 (en) 2003-09-29 2014-05-02 Exposure apparatus, exposure method, and method for producing device
IL235090A IL235090A (en) 2003-09-29 2014-10-07 Exposure facility, method of exposure and method of manufacturing the facility
US15/369,062 US10025194B2 (en) 2003-09-29 2016-12-05 Exposure apparatus, exposure method, and method for producing device
US16/034,490 US20180348643A1 (en) 2003-09-29 2018-07-13 Exposure apparatus, exposure method, and method for producing device

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
JP2003338420 2003-09-29
JP2003-338420 2003-09-29
JP2003344938 2003-10-02
JP2003-344938 2003-10-02
JP2004-042931 2004-02-19
JP2004042931 2004-02-19

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/390,178 Continuation US8305552B2 (en) 2003-09-29 2006-03-28 Exposure apparatus, exposure method, and method for producing device

Publications (2)

Publication Number Publication Date
WO2005031799A2 WO2005031799A2 (ja) 2005-04-07
WO2005031799A3 true WO2005031799A3 (ja) 2005-06-23

Family

ID=34396843

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2004/014693 WO2005031799A2 (ja) 2003-09-29 2004-09-29 露光装置、露光方法及びデバイス製造方法

Country Status (7)

Country Link
US (7) US8305552B2 (ja)
EP (6) EP2837969B1 (ja)
KR (10) KR101335736B1 (ja)
IL (3) IL174296A0 (ja)
SG (2) SG2014014971A (ja)
TW (6) TWI610342B (ja)
WO (1) WO2005031799A2 (ja)

Cited By (2)

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US8891053B2 (en) 2008-09-10 2014-11-18 Asml Netherlands B.V. Lithographic apparatus, method of manufacturing an article for a lithographic apparatus and device manufacturing method
US9195153B2 (en) 2002-11-12 2015-11-24 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method

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