TWI499784B - Probe insertion auxiliary and method of probe insertion - Google Patents
Probe insertion auxiliary and method of probe insertion Download PDFInfo
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- TWI499784B TWI499784B TW100105761A TW100105761A TWI499784B TW I499784 B TWI499784 B TW I499784B TW 100105761 A TW100105761 A TW 100105761A TW 100105761 A TW100105761 A TW 100105761A TW I499784 B TWI499784 B TW I499784B
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Description
本發明係關於一種植針輔助器,尤其是一種輔助探針卡植針的輔助器。The present invention relates to a needle-assisting device, and more particularly to an auxiliary device for assisting a probe card implant.
半導體裝置係透過包括晶圓生產、晶圓測試,晶粒封裝等等之各種程序來加以製造。晶圓測試係藉由使一探針卡之探針接針接觸半導體裝置之電極接墊,並接著允許一電流流經該等半導體裝置之電極接墊來將該等半導體裝置分類成可接受產品及不可接受產品。Semiconductor devices are fabricated through various processes including wafer fabrication, wafer testing, die packaging, and the like. Wafer testing classifies the semiconductor devices into acceptable products by contacting the probe pins of a probe card with the electrode pads of the semiconductor device and then allowing a current to flow through the electrode pads of the semiconductor devices. And unacceptable products.
第1圖為探針卡示意圖,該圖所示之探針卡10具備:探針頭12,探針頭又可以細分為上蓋板14、間隔膠膜16、下蓋板18和探針20,其中各個探針20係同時貫穿上蓋板14、間隔膠膜16和下蓋板18,探針20係對應於半導體晶圓22上的電極接墊24之配置圖案而設置。另外,探針卡10另具備一基板26和一電路板28,前述的基板26一面接觸探針20另一面接觸電路板28,用以將探針20的訊號轉換到電路板28。值得注意的是:各個探針20之間的間距只有約50至100μm,且由第1圖可看出探針20的形狀非直線形,探針上有一個極大的彎曲處30。1 is a schematic view of a probe card. The probe card 10 shown in the figure is provided with a probe head 12, which can be further subdivided into an upper cover 14, a spacer film 16, a lower cover 18 and a probe 20. Each probe 20 penetrates through the upper cover 14 , the spacer film 16 and the lower cover 18 at the same time, and the probe 20 is disposed corresponding to the arrangement pattern of the electrode pads 24 on the semiconductor wafer 22 . In addition, the probe card 10 further includes a substrate 26 and a circuit board 28. The substrate 26 contacts the circuit board 28 on the other side of the probe 20 for converting the signal of the probe 20 to the circuit board 28. It is worth noting that the spacing between the individual probes 20 is only about 50 to 100 μm, and it can be seen from Figure 1 that the shape of the probe 20 is non-linear and that there is a very large bend 30 on the probe.
目前植針時是由人工方式將探針一支支穿過下蓋板和間隔膠膜,當全部的探針都穿過後,再蓋上上蓋板。但是因為探針和探針之間的密度過高,且探針具有彎曲處,使得植針員僅憑經驗和肉眼,要將探針準確的穿過間隔膠膜和下蓋板成為一個困難的工作。At present, the needle is manually passed through the lower cover and the spacer film. When all the probes pass through, the upper cover is covered. However, because the density between the probe and the probe is too high, and the probe has a bend, it is difficult for the needle implanter to pass the spacer film and the lower cover accurately through the experience and the naked eye. jobs.
有鑑於此,本發明提供了一種植針輔助器,使得植針人員能輕易的將探針植入探針頭。In view of this, the present invention provides a implant aid that allows the implanter to easily implant the probe into the probe tip.
根據本發明之一較佳實施例,本發明提供一種植針輔助器,包含:一底座,一夾具設於底座上,夾具有二夾持部,二夾持部界定出一凹槽用於容置一探針座,並且該二夾持部和底座形成一容置空間以及一光源設於容置空間中,以均勻的照亮探針座。According to a preferred embodiment of the present invention, the present invention provides a implant aid, comprising: a base, a clamp is disposed on the base, the clip has two clamping portions, and the two clamping portions define a groove for receiving A probe holder is disposed, and the two clamping portions and the base form an accommodating space and a light source is disposed in the accommodating space to uniformly illuminate the probe holder.
根據本發明之另一較佳實施例,本發明提供一種植針方法,包含:首先,提供一植針輔助器,植針輔助器包含:一底座,一夾具設於底座上,夾具有二夾持部,二夾持部界定出一凹槽用於容置一探針座,並且二夾持部和底座形成一容置空間以及一光源設於容置空間中,然後將一探針座放入凹槽,其中探針座具有複數個孔洞,光源照亮各個孔洞,最後進行植針步驟。According to another preferred embodiment of the present invention, the present invention provides a method for implanting a needle, comprising: firstly, providing a needle assisting device, the needle assisting device comprising: a base, a clamp disposed on the base, and the clip having two clips a holding portion, the two clamping portions define a recess for accommodating a probe base, and the two clamping portions and the base form an accommodating space, and a light source is disposed in the accommodating space, and then a probe is placed Into the groove, wherein the probe holder has a plurality of holes, the light source illuminates each hole, and finally the needle implantation step.
隨著晶片縮小,後續檢測晶片的探針及下蓋板孔洞也會變的更小,因此更增加植針、換針困難度,但本發明利用光源照射下蓋板孔洞的方式,可將下蓋板孔洞位置更清楚顯現,增加植針員植針的便利性。As the wafer shrinks, the probes and the lower cover holes of the subsequent detection wafers become smaller, thereby increasing the difficulty of needle insertion and needle replacement. However, the present invention utilizes a light source to illuminate the aperture of the lower cover plate. The position of the cover hole is more clearly displayed, which increases the convenience of the needle implanter.
第2圖所繪示的是本發明之植針輔助器之示意圖。如第2圖所示,植針輔助器100具有一底座40,底座40可以為一矩形具有一寬邊和一短邊,但不限於此,兩個架體42、44形成一架體組46,兩個架體42、44分別位於底座40的相對兩端上方,例如,位於底座40的相對兩短邊上方,兩個架體42、44的中間設有一組橫桿48、50,使得每根橫桿48、50的末端分別固定在兩個架體42、44相對的表面上,另外,由兩個夾持部52、54所形成的夾具56設於底座40上,夾具56位於兩架體42、44之間,同時兩個夾持部52、54分別被二根橫桿48、50貫穿,使得兩個夾持部52、54可以沿著橫桿48、50的延伸方向自由滑動以改變其相對位置,兩個夾持部52、54的頂部的相對位置界定出一可調整大小的凹槽58,此凹槽58用於容置一探針座(圖未示)。另外,夾持部52、54上分別設有一固定部60、62,在夾持部52、54調整到適合的相對位置後,可利用固定部60、62固定夾持部52、54的相對位置。再者,架體42、44可將夾持部52、54的移動位置限制在架體42、44之間。Figure 2 is a schematic view of the needle assisting device of the present invention. As shown in FIG. 2, the needle assisting device 100 has a base 40. The base 40 can have a rectangular shape with a wide side and a short side, but is not limited thereto. The two frames 42 and 44 form a body group 46. The two frames 42 and 44 are respectively located above opposite ends of the base 40, for example, above the opposite short sides of the base 40, and a set of cross bars 48, 50 are disposed between the two frames 42 and 44 so that each The ends of the root rails 48, 50 are respectively fixed on the opposite surfaces of the two frames 42, 44. In addition, the clamps 56 formed by the two clamping portions 52, 54 are disposed on the base 40, and the clamps 56 are located on the two frames. Between the bodies 42, 44, the two clamping portions 52, 54 are respectively penetrated by the two cross bars 48, 50, so that the two clamping portions 52, 54 can slide freely along the extending direction of the cross bars 48, 50. Changing the relative position, the relative positions of the tops of the two gripping portions 52, 54 define a resizable recess 58 for receiving a probe holder (not shown). In addition, a fixing portion 60, 62 is respectively disposed on the clamping portions 52, 54. After the clamping portions 52, 54 are adjusted to a suitable relative position, the relative positions of the clamping portions 52, 54 can be fixed by the fixing portions 60, 62. . Furthermore, the frame bodies 42, 44 can limit the moving position of the clamping portions 52, 54 between the frame bodies 42, 44.
凹槽58包含一第一區A和一第二區B,第一區A具有一與圓形互補之形狀,例如弧形,使得第一區A所形成的凹槽形狀可以容納一圓形探針座;第二區B具有一與矩形互補之形狀,例如一直線或一角形,使得凹槽58的第二區B所形成的形狀可以容納一矩形探針座。另外,凹槽58具有一底面64和一側面66,底面64係用於支撐探針座,側面66係用於嵌住探針座於凹槽58之中,根據本發明之較佳實施例,底面64的寬度較佳為5公厘,而側面66的寬度較佳為3公厘。The groove 58 includes a first area A and a second area B. The first area A has a shape complementary to a circle, such as an arc, so that the shape of the groove formed by the first area A can accommodate a circular shape. The needle hub; the second region B has a shape complementary to the rectangle, such as a straight line or an angle, such that the second region B of the recess 58 is shaped to accommodate a rectangular probe holder. In addition, the recess 58 has a bottom surface 64 for supporting the probe holder and a side surface 66 for engaging the probe holder in the recess 58. According to a preferred embodiment of the present invention, The width of the bottom surface 64 is preferably 5 mm, and the width of the side surface 66 is preferably 3 mm.
值得注意的是:兩個夾持部52、54所形成的凹槽58下方和底座40形成一容置空間68,容置空間68可放置一光源70於其中,用以均勻的照亮位於凹槽58中的探針座,光源70的開關72可以由容置空間68延伸出來置於植針輔助器100之外。光源70可以為任意光源,以使足夠的光線可穿過探針座到達植針者的眼睛。第3圖所繪示的是光源的放大示意圖,舉例而言,光源70可以是LED陣列,光源70可選用尺寸較小的廣角型LED 74以陣列的方式排列成一4公分乘4公分面積範圍的LED光源,或者是利用燈泡作為光源亦可。另外在光源70上方另設有至少偏光片76和至少一配向膜78,根據本發明之較佳實施例,6片配向膜78和1片偏光片76可以令LED陣列形成均勻的光源。It is to be noted that the recess 58 formed by the two clamping portions 52, 54 and the base 40 form an accommodating space 68. The accommodating space 68 can be disposed with a light source 70 for uniformly illuminating the concave portion. The probe holder in the slot 58 and the switch 72 of the light source 70 can be extended from the housing space 68 beyond the needle assistor 100. Light source 70 can be any light source such that sufficient light can pass through the probe holder to the implantor's eye. FIG. 3 is an enlarged schematic view of the light source. For example, the light source 70 may be an LED array, and the light source 70 may be arranged in an array by a wide-angle LED 74 having a smaller size to a range of 4 cm by 4 cm. LED light source, or use a light bulb as a light source. In addition, at least a polarizer 76 and at least one alignment film 78 are disposed above the light source 70. According to a preferred embodiment of the present invention, the six alignment films 78 and the one polarizer 76 can form a uniform light source for the LED array.
第4a-7b圖所繪示的是利用本發明之植針輔助器所進行的植針方法示意圖。第4b圖繪示的是第4a圖中探針座沿AA’切線方向之示意圖。第5b繪示的是第5a圖中探針座和光源沿BB’切線方向之示意圖。第7b圖繪示的是第7a圖中探針座沿CC’切線方向之示意圖。Fig. 4a-7b is a schematic view showing a method of implanting a needle using the needle assisting device of the present invention. Figure 4b is a schematic view of the probe holder in the direction of AA' tangential in Figure 4a. Figure 5b is a schematic view of the probe holder and the light source along the tangential direction of BB' in Figure 5a. Figure 7b is a schematic view of the probe holder in the direction of CC' tangential direction in Figure 7a.
如第4a、4b圖所示,首先,提供一如上述第2圖所描述的植針輔助器100以及一探針座80,其中探針座80包含一間隔膠膜84和一下蓋板82,下蓋板82上具有已設計好的多數個孔洞86,第4a圖中是以圓形的探針座作為示意,然而不同的產品其探針座可以有不同的形狀。As shown in Figures 4a and 4b, first, a needle assisting device 100 and a probe holder 80 as described in Fig. 2 above are provided, wherein the probe holder 80 includes a spacer film 84 and a lower cover 82. The lower cover 82 has a plurality of holes 86 that have been designed, and the circular probe base is illustrated in Fig. 4a. However, the probe holders of different products may have different shapes.
然後,如第5a、5b圖所示,調整夾持部52、54的相對位置並且將探針座80以下蓋板82朝上的方向,置入凹槽58之中,再將夾持部52、54利用固定部60、62固定其位置,第5a圖中的探針座80為圓形,係利用凹槽58的第一區A將圓形的探針座80固定。然後開啟光源70開關72,使得光源70先穿過間隔膠膜84再穿過下蓋板82的孔洞86,最後到達植針者的眼內。第6圖繪示的是矩形探針座置入植針輔助器之示意圖,請參閱6圖,探針座80也可以是矩形,當矩形的探針座80置入凹槽58後,係利用凹槽58的第二區B部分將探針座80固定。Then, as shown in FIGS. 5a and 5b, the relative positions of the clamping portions 52, 54 are adjusted and the probe holder 80 is placed in the groove 58 in the upward direction of the cover plate 82, and the clamping portion 52 is again placed. 54 is fixed by the fixing portions 60, 62. The probe holder 80 in Fig. 5a is circular, and the circular probe holder 80 is fixed by the first region A of the recess 58. The light source 70 switch 72 is then turned on such that the light source 70 first passes through the spacer film 84 and then through the aperture 86 of the lower cover 82 and finally into the eye of the implanter. Figure 6 is a schematic view showing the rectangular probe holder placed in the needle assisting device. Referring to Figure 6, the probe base 80 can also be rectangular. When the rectangular probe holder 80 is placed in the recess 58, the recess is used. The second zone B portion of the slot 58 secures the probe holder 80.
接著如第7a和7b圖所示,將一探針121穿過下蓋板82的孔洞86,再刺穿間隔膠膜84,此時至少其中之一的孔洞86中沒有探針121,探針121可以為垂直探針為是其它形狀的探針,在植針時,光源70穿透下蓋板82的孔洞86並產生亮點,可使植針者,透過光源70引導,正確的確認植入位置,因此不需經驗十足之植針者也可快速完成植針的動作。當所有探針都植入後,即可將上蓋板蓋上,上蓋板、間隔膠膜、下蓋板和探針三者構成探針頭。最後再將完成 的探針頭裝入探針卡中。Next, as shown in Figures 7a and 7b, a probe 121 is passed through the hole 86 of the lower cover 82, and then the spacer film 84 is pierced. At this time, at least one of the holes 86 has no probe 121, and the probe 121 can be a vertical probe as a probe of other shapes. When the needle is implanted, the light source 70 penetrates the hole 86 of the lower cover 82 and generates a bright spot, so that the implanter can be guided through the light source 70 to correctly confirm the implantation. Position, so you can quickly complete the needle movement without the need for an experienced needle. When all the probes are implanted, the upper cover can be covered, and the upper cover, the spacer film, the lower cover and the probe constitute the probe head. Will finish again The probe head is loaded into the probe card.
由於檢測晶片的過程中探針會直接接觸晶圓的電極接墊,所以探針會產生一定程度的磨耗及損壞情形發生。當探針磨耗達到廠內規定的報廢標準時或發生損壞情形時,即需要對此探針進行換針、植針動作,另外,在新裝置的探針卡也需植針動作。本發明的植針輔助器,可適用於各種類型的探針座。植針者可依不同大小之探針座自行進行調整植針輔助器上的凹槽大小,不需使用其他原廠提供之固定座。另外,由於植針輔助器設有光源可照亮下蓋板的孔洞和間隔膠膜,可使得植針員清楚的分辨孔洞位置,降低植針、換針的困難度。Since the probe will directly contact the electrode pads of the wafer during the process of detecting the wafer, the probe will have a certain degree of wear and damage. When the probe wear reaches the scrapping standard specified in the factory or the damage occurs, the probe needs to be changed and needled. In addition, the probe card of the new device also needs to be implanted. The needle assisting device of the present invention can be applied to various types of probe holders. Needle implanters can adjust the size of the groove on the needle aid according to the probe holder of different sizes, without using other fixed bases. In addition, because the needle-assisting device is provided with a light source to illuminate the hole of the lower cover plate and the spacer film, the needle-clamping staff can clearly distinguish the position of the hole and reduce the difficulty of needle-planting and needle-changing.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
10‧‧‧探針卡10‧‧‧ probe card
12‧‧‧探針頭12‧‧‧ probe head
14‧‧‧上蓋板14‧‧‧Upper cover
16‧‧‧間隔膠膜16‧‧‧Separate film
18‧‧‧下蓋板18‧‧‧Under cover
20、121‧‧‧探針20, 121‧‧ ‧ probe
22‧‧‧半導體晶圓22‧‧‧Semiconductor Wafer
24‧‧‧電極接墊24‧‧‧electrode pads
26‧‧‧基板26‧‧‧Substrate
28‧‧‧電路板28‧‧‧ boards
30‧‧‧彎曲處30‧‧‧bend
40‧‧‧底座40‧‧‧Base
42、44‧‧‧架體42, 44‧‧‧ ‧ body
46‧‧‧架體組46‧‧‧ ‧ body group
48、50‧‧‧橫桿48, 50‧‧‧ crossbar
52、54‧‧‧夾持部52, 54‧‧‧ gripping department
56‧‧‧夾具56‧‧‧Clamp
58‧‧‧凹槽58‧‧‧ Groove
60、62‧‧‧固定部60, 62‧‧‧ fixed department
64‧‧‧底面64‧‧‧ bottom
66‧‧‧側面66‧‧‧ side
68‧‧‧容置空間68‧‧‧ accommodating space
70‧‧‧光源70‧‧‧Light source
72‧‧‧開關72‧‧‧ switch
74‧‧‧LED74‧‧‧LED
76‧‧‧偏光片76‧‧‧ polarizer
78‧‧‧配向膜78‧‧‧Alignment film
80‧‧‧探針座80‧‧‧ probe holder
82‧‧‧下蓋板82‧‧‧Under cover
84‧‧‧間隔膠膜84‧‧‧ spacer film
86‧‧‧孔洞86‧‧‧ hole
100‧‧‧植針輔助器100‧‧‧Needle aid
第1圖為探針卡示意圖。Figure 1 is a schematic diagram of the probe card.
第2圖所繪示的是本發明之植針輔助器之示意圖。Figure 2 is a schematic view of the needle assisting device of the present invention.
第3圖所繪示的是光源的放大示意圖。Figure 3 is an enlarged schematic view of the light source.
第4a-7b圖所繪示的是利用本發明之植針輔助器所進行的植針方法示意圖。Fig. 4a-7b is a schematic view showing a method of implanting a needle using the needle assisting device of the present invention.
40...底座40. . . Base
42、44...架體42, 44. . . Frame
46...架體組46. . . Frame group
48、50...橫桿48, 50. . . Crossbar
52、54...夾持部52, 54. . . Grip
56...夾具56. . . Fixture
58...凹槽58. . . Groove
60、62...固定部60, 62. . . Fixed part
64...底面64. . . Bottom
66...側邊66. . . Side
68...容置空間68. . . Housing space
70...光源70. . . light source
72...開關72. . . switch
100...植針輔助器100. . . Needle assist
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TWI731169B (en) * | 2017-09-27 | 2021-06-21 | 創新服務股份有限公司 | Precision assembly mechanism |
CN109979837B (en) * | 2017-12-28 | 2023-03-21 | 创新服务股份有限公司 | Needle implantation method and needle implantation machine using same |
CN110856351B (en) * | 2019-11-15 | 2020-08-18 | 苏州欧方电子科技有限公司 | Intelligent positioning device and method for supporting printed substrate |
TWI847310B (en) * | 2022-10-19 | 2024-07-01 | 南韓商T1系統股份有限公司 | Probe card pin insertion device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3760266A (en) * | 1970-10-14 | 1973-09-18 | Noma World Wide Inc | Circuit tester for christmas tree light sets |
TW200718946A (en) * | 2005-11-08 | 2007-05-16 | Advanced Semiconductor Eng | Electrical test clamping fixture |
TW201027081A (en) * | 2009-01-06 | 2010-07-16 | King Yuan Electronics Co Ltd | Probe adjustment platform for vertical probe card |
TW201035573A (en) * | 2009-03-26 | 2010-10-01 | Tech System Co Ltd A | Lighting inspection apparatus |
-
2011
- 2011-02-22 TW TW100105761A patent/TWI499784B/en active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3760266A (en) * | 1970-10-14 | 1973-09-18 | Noma World Wide Inc | Circuit tester for christmas tree light sets |
TW200718946A (en) * | 2005-11-08 | 2007-05-16 | Advanced Semiconductor Eng | Electrical test clamping fixture |
TW201027081A (en) * | 2009-01-06 | 2010-07-16 | King Yuan Electronics Co Ltd | Probe adjustment platform for vertical probe card |
TW201035573A (en) * | 2009-03-26 | 2010-10-01 | Tech System Co Ltd A | Lighting inspection apparatus |
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TW201235672A (en) | 2012-09-01 |
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