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TW200718946A - Electrical test clamping fixture - Google Patents

Electrical test clamping fixture

Info

Publication number
TW200718946A
TW200718946A TW094139103A TW94139103A TW200718946A TW 200718946 A TW200718946 A TW 200718946A TW 094139103 A TW094139103 A TW 094139103A TW 94139103 A TW94139103 A TW 94139103A TW 200718946 A TW200718946 A TW 200718946A
Authority
TW
Taiwan
Prior art keywords
clamping
dut
clamping fixture
electrical test
clamping unit
Prior art date
Application number
TW094139103A
Other languages
Chinese (zh)
Other versions
TWI274881B (en
Inventor
Chia-Hsing Chou
Pao-Nan Li
Original Assignee
Advanced Semiconductor Eng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Eng filed Critical Advanced Semiconductor Eng
Priority to TW94139103A priority Critical patent/TWI274881B/en
Application granted granted Critical
Publication of TWI274881B publication Critical patent/TWI274881B/en
Publication of TW200718946A publication Critical patent/TW200718946A/en

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Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

An electrically test clamping fixture is adapted for clamping a DUT (Device Under Test). The DUT has a plurality of connectors for contacting probes of a electrically test device. The electrically test clamping fixture includes a base, a first clamping unit and a second clamping unit. The base defines a XYZ coordinate, which are respectively corresponding to first, second and third directions. The first clamping unit is adapted to be adjustably moved in the first direction relative to the base for clamping the DUT. The second clamping unit is adapted to be adjustably moved in the second direction relative to the first clamping unit for clamping the DUT.
TW94139103A 2005-11-08 2005-11-08 Electrical test clamping fixture TWI274881B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94139103A TWI274881B (en) 2005-11-08 2005-11-08 Electrical test clamping fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94139103A TWI274881B (en) 2005-11-08 2005-11-08 Electrical test clamping fixture

Publications (2)

Publication Number Publication Date
TWI274881B TWI274881B (en) 2007-03-01
TW200718946A true TW200718946A (en) 2007-05-16

Family

ID=38624194

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94139103A TWI274881B (en) 2005-11-08 2005-11-08 Electrical test clamping fixture

Country Status (1)

Country Link
TW (1) TWI274881B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI499784B (en) * 2011-02-22 2015-09-11 United Microelectronics Corp Probe insertion auxiliary and method of probe insertion
US9658252B2 (en) 2011-02-21 2017-05-23 United Microelectronics Corp. Probe insertion auxiliary and method of probe insertion

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110824334B (en) * 2019-09-30 2022-02-18 福州昶永禾机械有限公司 PCB detection jig with positioning function

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9658252B2 (en) 2011-02-21 2017-05-23 United Microelectronics Corp. Probe insertion auxiliary and method of probe insertion
TWI499784B (en) * 2011-02-22 2015-09-11 United Microelectronics Corp Probe insertion auxiliary and method of probe insertion

Also Published As

Publication number Publication date
TWI274881B (en) 2007-03-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees