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TWI256482B - Radiation detecting device and method of manufacturing the same - Google Patents

Radiation detecting device and method of manufacturing the same

Info

Publication number
TWI256482B
TWI256482B TW093106518A TW93106518A TWI256482B TW I256482 B TWI256482 B TW I256482B TW 093106518 A TW093106518 A TW 093106518A TW 93106518 A TW93106518 A TW 93106518A TW I256482 B TWI256482 B TW I256482B
Authority
TW
Taiwan
Prior art keywords
detecting device
radiation detecting
sensor panel
manufacturing
same
Prior art date
Application number
TW093106518A
Other languages
English (en)
Other versions
TW200424549A (en
Inventor
Kazumi Nagano
Tomoyuki Tamura
Satoshi Okada
Katsuro Takenaka
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of TW200424549A publication Critical patent/TW200424549A/zh
Application granted granted Critical
Publication of TWI256482B publication Critical patent/TWI256482B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/804—Containers or encapsulations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/244—Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Light Receiving Elements (AREA)
TW093106518A 2003-03-12 2004-03-11 Radiation detecting device and method of manufacturing the same TWI256482B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003066728A JP4289913B2 (ja) 2003-03-12 2003-03-12 放射線検出装置及びその製造方法

Publications (2)

Publication Number Publication Date
TW200424549A TW200424549A (en) 2004-11-16
TWI256482B true TWI256482B (en) 2006-06-11

Family

ID=32959252

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093106518A TWI256482B (en) 2003-03-12 2004-03-11 Radiation detecting device and method of manufacturing the same

Country Status (5)

Country Link
US (1) US7105830B2 (zh)
JP (1) JP4289913B2 (zh)
KR (1) KR100564519B1 (zh)
CN (1) CN1276270C (zh)
TW (1) TWI256482B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI486618B (zh) * 2012-02-23 2015-06-01 Toshiba Kk Radiation detector and manufacturing method thereof
US11522099B2 (en) 2017-05-03 2022-12-06 Shenzhen Xpectvision Technology Co., Ltd. Method of making radiation detector

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US7355184B2 (en) * 2003-04-07 2008-04-08 Canon Kabushiki Kaisha Radiation detecting apparatus and method for manufacturing the same
US7193218B2 (en) * 2003-10-29 2007-03-20 Canon Kabushiki Kaisha Radiation detection device, method of producing the same, and radiation image pick-up system
JP2006098239A (ja) * 2004-09-29 2006-04-13 Fuji Photo Film Co Ltd 放射線像変換パネル
JP2006098241A (ja) * 2004-09-29 2006-04-13 Fuji Photo Film Co Ltd 放射線像変換パネル
JP4537322B2 (ja) * 2005-01-13 2010-09-01 アロカ株式会社 シンチレータ部材の製造方法及び放射線測定装置の製造方法
DE602006008994D1 (de) * 2005-01-13 2009-10-22 Aloka Co Ltd Szintillatorteil und Herstellungsverfahren dafür sowie Strahlungsmessvorrichtung
US20070001100A1 (en) * 2005-06-30 2007-01-04 Taiwan Semiconductor Manufacturing Company, Ltd. Light reflection for backside illuminated sensor
FR2891401B1 (fr) * 2005-09-23 2007-10-26 Thales Sa Realisation d'un detecteur de rayonnement.
JP2007093545A (ja) * 2005-09-30 2007-04-12 Toshiba Corp 放射線検出器
US7973380B2 (en) * 2005-11-23 2011-07-05 Taiwan Semiconductor Manufacturing Company, Ltd. Method for providing metal extension in backside illuminated sensor for wafer level testing
US7910892B2 (en) * 2005-12-22 2011-03-22 Kabushiki Kaisha Toshiba Method for manufacturing X-ray detector and X-ray detector
JP4921180B2 (ja) * 2006-01-25 2012-04-25 キヤノン株式会社 放射線検出装置及び放射線撮像システム
JP4537327B2 (ja) * 2006-02-07 2010-09-01 アロカ株式会社 放射線測定装置の製造方法及びシンチレータ部材製造方法
US7648851B2 (en) * 2006-03-06 2010-01-19 Taiwan Semiconductor Manufacturing Company, Ltd. Method of fabricating backside illuminated image sensor
US7638852B2 (en) * 2006-05-09 2009-12-29 Taiwan Semiconductor Manufacturing Company, Ltd. Method of making wafer structure for backside illuminated color image sensor
US8704277B2 (en) * 2006-05-09 2014-04-22 Taiwan Semiconductor Manufacturing Company, Ltd. Spectrally efficient photodiode for backside illuminated sensor
US7791170B2 (en) 2006-07-10 2010-09-07 Taiwan Semiconductor Manufacturing Company, Ltd. Method of making a deep junction for electrical crosstalk reduction of an image sensor
US20080079108A1 (en) * 2006-09-29 2008-04-03 Taiwan Semiconductor Manufacturing Company, Ltd. Method for Improving Sensitivity of Backside Illuminated Image Sensors
US8436443B2 (en) 2006-09-29 2013-05-07 Taiwan Semiconductor Manufacturing Company, Ltd. Backside depletion for backside illuminated image sensors
JP2008215951A (ja) * 2007-03-01 2008-09-18 Toshiba Corp 放射線検出器
CN101542635B (zh) * 2007-03-27 2013-01-23 株式会社东芝 闪烁器板和射线检测器
US20080237761A1 (en) * 2007-04-02 2008-10-02 Taiwan Semiconductor Manufacturing Company, Ltd. System and method for enhancing light sensitivity for backside illumination image sensor
JP5004848B2 (ja) * 2007-04-18 2012-08-22 キヤノン株式会社 放射線検出装置及び放射線検出システム
FR2916575B1 (fr) * 2007-05-23 2009-09-18 Trixell Sas Soc Par Actions Si Procede de realisation d'un detecteur de rayonnement
US7656000B2 (en) * 2007-05-24 2010-02-02 Taiwan Semiconductor Manufacturing Company, Ltd. Photodetector for backside-illuminated sensor
CN101743507B (zh) * 2007-07-17 2014-03-05 迪睿合电子材料有限公司 图像显示装置及其制造方法
JP2009025258A (ja) * 2007-07-24 2009-02-05 Toshiba Corp 放射線検出器
US7999342B2 (en) 2007-09-24 2011-08-16 Taiwan Semiconductor Manufacturing Company, Ltd Image sensor element for backside-illuminated sensor
JP4764407B2 (ja) 2007-11-20 2011-09-07 東芝電子管デバイス株式会社 放射線検出器及びその製造方法
KR100994836B1 (ko) * 2008-04-25 2010-11-17 주식회사바텍 대면적 디지털 센서를 구비한 치과용 엑스선 촬영장치
KR100994837B1 (ko) * 2008-04-25 2010-11-17 주식회사바텍 대면적 디지털 센서를 구비한 맘모그래피
KR100988576B1 (ko) * 2008-04-25 2010-10-18 주식회사바텍 의료용 엑스선 시티 촬영장치
KR100994838B1 (ko) * 2008-04-25 2010-11-17 주식회사바텍 대면적 디지털 센서를 구비한 디지털 영상 진단 장치
JP2010114409A (ja) * 2008-10-10 2010-05-20 Sony Corp Ｓｏｉ基板とその製造方法、固体撮像装置とその製造方法、および撮像装置
US20110233405A1 (en) * 2008-12-05 2011-09-29 Bae Systems Plc Radiation detector
JP5369906B2 (ja) * 2009-06-03 2013-12-18 コニカミノルタ株式会社 放射線像変換パネル、及び放射線像検出装置
CN102870008A (zh) * 2010-04-30 2013-01-09 富士胶片株式会社 辐射成像装置、辐射成像系统和用于将辐射转换板固定在辐射成像装置中的方法
JP2011247686A (ja) * 2010-05-25 2011-12-08 Fujifilm Corp 放射線画像撮影装置
JP5473835B2 (ja) * 2010-08-31 2014-04-16 富士フイルム株式会社 放射線検出器、放射線画像撮影装置及び放射線検出器の製造方法
WO2012032797A1 (ja) * 2010-09-07 2012-03-15 コニカミノルタエムジー株式会社 放射線画像検出器の製造方法および放射線画像検出器
CN102466808B (zh) * 2010-11-09 2014-06-18 北京大基康明医疗设备有限公司 非晶硅碘化铯数字x射线平板探测器
DE102010062040A1 (de) * 2010-11-26 2012-05-31 Siemens Aktiengesellschaft Verfahren zur Herstellung eines Szintillator-Fotosensor-Sandwich, Szintillator-Fotosensor-Sandwich und Strahlungsdetektor
DE102010062033A1 (de) * 2010-11-26 2012-05-31 Siemens Aktiengesellschaft Szintillatorschicht, Röntgendetektor und Verfahren zur Vorbereitung einer Szintillatorschicht zur Aufbringung auf eine Fotosensorschicht und Herstellung eines Röntgendetektors oder Röntgendetektorelementes
JP5792958B2 (ja) * 2011-01-13 2015-10-14 キヤノン株式会社 放射線撮像装置、放射線撮像システム及び放射線撮像装置の製造方法
JP2012154811A (ja) * 2011-01-26 2012-08-16 Canon Inc シンチレータパネルおよびその製造方法ならびに放射線検出装置
JP5677136B2 (ja) * 2011-02-24 2015-02-25 富士フイルム株式会社 放射線画像検出装置及び放射線撮影用カセッテ
JP2012177623A (ja) * 2011-02-25 2012-09-13 Fujifilm Corp 放射線画像検出装置、及び放射線画像検出装置の製造方法
US9211565B2 (en) 2012-02-28 2015-12-15 Carestream Health, Inc. Adhesive layer for digital detectors
JP2013217769A (ja) * 2012-04-09 2013-10-24 Canon Inc 放射線検出装置
JP2014074595A (ja) * 2012-10-02 2014-04-24 Canon Inc 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の製造方法
JP6092568B2 (ja) * 2012-10-11 2017-03-08 キヤノン株式会社 放射線検出装置及び放射線検出システム
US9935152B2 (en) 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
JP6310216B2 (ja) * 2013-09-06 2018-04-11 キヤノン株式会社 放射線検出装置及びその製造方法並びに放射線検出システム
EP2857866B1 (en) * 2013-10-02 2019-06-19 Rayence Co., Ltd. X-ray sensor and method of manufacturing the same
US9917133B2 (en) 2013-12-12 2018-03-13 General Electric Company Optoelectronic device with flexible substrate
EP3117204B1 (en) 2014-03-13 2021-06-16 General Electric Company Curved digital x-ray detector for weld inspection
US9526468B2 (en) 2014-09-09 2016-12-27 General Electric Company Multiple frame acquisition for exposure control in X-ray medical imagers
JP6487263B2 (ja) * 2015-04-20 2019-03-20 浜松ホトニクス株式会社 放射線検出器及びその製造方法
DE102016210935B4 (de) * 2016-06-20 2020-07-09 Siemens Healthcare Gmbh Röntgendetektor mit intransparenter Zwischenschicht
CN106873829B (zh) * 2017-01-26 2020-08-07 业成科技（成都）有限公司 触控显示器及其制造方法
JP6968668B2 (ja) * 2017-11-09 2021-11-17 キヤノン電子管デバイス株式会社 放射線検出モジュール、および放射線検出器
JP7029217B2 (ja) * 2018-04-03 2022-03-03 キヤノン電子管デバイス株式会社 放射線検出器
US10734540B1 (en) * 2019-07-03 2020-08-04 Advanced Semiconductor Engineering, Inc. Optical device and method for manufacturing the same
US20230391030A1 (en) * 2020-10-15 2023-12-07 Kuraray Co., Ltd. Plastic scintillating fiber and its manufacturing method
WO2022079956A1 (ja) * 2020-10-15 2022-04-21 株式会社クラレ プラスチックシンチレーションファイバ及びその製造方法
JP7569070B2 (ja) 2020-10-27 2024-10-17 株式会社Nsc 機能膜付き基板の製造方法

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US6835936B2 (en) * 2001-02-07 2004-12-28 Canon Kabushiki Kaisha Scintillator panel, method of manufacturing scintillator panel, radiation detection device, and radiation detection system
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI486618B (zh) * 2012-02-23 2015-06-01 Toshiba Kk Radiation detector and manufacturing method thereof
US11522099B2 (en) 2017-05-03 2022-12-06 Shenzhen Xpectvision Technology Co., Ltd. Method of making radiation detector
TWI797123B (zh) * 2017-05-03 2023-04-01 中國大陸商深圳幀觀德芯科技有限公司 輻射檢測器的制作方法

Also Published As

Publication number Publication date
CN1276270C (zh) 2006-09-20
JP2004281439A (ja) 2004-10-07
KR20040081369A (ko) 2004-09-21
CN1530667A (zh) 2004-09-22
US7105830B2 (en) 2006-09-12
JP4289913B2 (ja) 2009-07-01
KR100564519B1 (ko) 2006-03-29
TW200424549A (en) 2004-11-16
US20040178350A1 (en) 2004-09-16

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