KR960042367A - 메모리디바이스의 메모리셀 억세스방법 및 억세스회로 - Google Patents
메모리디바이스의 메모리셀 억세스방법 및 억세스회로 Download PDFInfo
- Publication number
- KR960042367A KR960042367A KR1019960018860A KR19960018860A KR960042367A KR 960042367 A KR960042367 A KR 960042367A KR 1019960018860 A KR1019960018860 A KR 1019960018860A KR 19960018860 A KR19960018860 A KR 19960018860A KR 960042367 A KR960042367 A KR 960042367A
- Authority
- KR
- South Korea
- Prior art keywords
- burr
- mode signal
- memory
- row
- address
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 4
- 230000004044 response Effects 0.000 claims abstract 2
- 238000010586 diagram Methods 0.000 description 4
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F12/00—Accessing, addressing or allocating within memory systems or architectures
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/34—Accessing multiple bits simultaneously
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Dram (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (5)
- 행열배치된 복수의 메모리셀의 소정의 행을 어드레스선택기호에 응하여 어드레스하는 수단과, 상기 어드레스선택신호에 더하여 버언인모드신호가 공급될 때에, 어드레스되는 메모리셀의 행을 적어도 하나 증가시키는 수단을 구비하는 메모리디바이스의 메모리셀억세스방법.
- 행열배치된 복수의 메모리셀을 가지는 메모리어레이와, 버언인모드신호를 출력하는 버언인모드신호제너레이터와, 어드레스선택신호가 공급되고, 이 어드레스선택신호에 응하여 상기 메모리어레이의 메모리셀의 소정의 행을 어드레스함과 동시에, 상기 버언인모드신호제너레이터로부터 버언인모드신호가 출력될 때는 어드레스되는 행을 적어도 하나 증가시키는 어드레스회로를 구비하는 메모리디바이스의 메모리셀억세스회로.
- 제2항에 있어서, 어드레스회로는 복수의 행프리디코더엘리먼트를 가지고, 버언인모드신호제너레이터로부터 버언인모드신호가 출력될 때는, 복수의 행프리디코더엘리먼트로부터 신호가 생성되는 것을 특징으로 하는 메모리디바이스의 메모리셀억세스회로.
- 제2항에 있어서, 버언인모드신호제너레이터는, 복수의 신호가 특정의 순으로 입력될때에 버언인모드신호를 출력하는 것을 특징으로 하는 메모리디바이스의 메모리셀억세스회로.
- 제2항에 있어서, 어드레스회로는 메모리셀의 행을 어드레스하는 워드라인을 차례로 선택하는 것을 특징으로 하는 메모리디바이스의 메모리셀억세스회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US45605995A | 1995-05-31 | 1995-05-31 | |
US08/456,059 | 1995-05-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR960042367A true KR960042367A (ko) | 1996-12-21 |
KR100416919B1 KR100416919B1 (ko) | 2004-04-28 |
Family
ID=23811260
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960018860A KR100416919B1 (ko) | 1995-05-31 | 1996-05-30 | 메모리디바이스의메모리셀억세스방법및억세스회로 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5680362A (ko) |
EP (1) | EP0745998B1 (ko) |
JP (1) | JP3914283B2 (ko) |
KR (1) | KR100416919B1 (ko) |
DE (1) | DE69532376T2 (ko) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6047352A (en) * | 1996-10-29 | 2000-04-04 | Micron Technology, Inc. | Memory system, method and predecoding circuit operable in different modes for selectively accessing multiple blocks of memory cells for simultaneous writing or erasure |
TW360873B (en) * | 1996-11-20 | 1999-06-11 | Matsushita Electric Ind Co Ltd | Semiconductor integrated circuit and decoding circuit of memory |
US5996106A (en) | 1997-02-04 | 1999-11-30 | Micron Technology, Inc. | Multi bank test mode for memory devices |
US5913928A (en) | 1997-05-09 | 1999-06-22 | Micron Technology, Inc. | Data compression test mode independent of redundancy |
KR100268434B1 (ko) * | 1997-12-29 | 2000-10-16 | 윤종용 | 반도체 메모리 장치 및 그것의 번-인 테스트방법 |
JPH11328997A (ja) * | 1998-05-19 | 1999-11-30 | Nec Ic Microcomput Syst Ltd | 半導体メモリ装置及びバーイン試験方法 |
KR100287191B1 (ko) * | 1999-04-07 | 2001-04-16 | 윤종용 | 웨이퍼 번인시 워드라인들을 충분히 구동시키는 반도체 메모리장치 |
JP4558186B2 (ja) * | 1999-12-27 | 2010-10-06 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US6549470B2 (en) | 2000-08-31 | 2003-04-15 | United Memories, Inc. | Small signal, low power read data bus driver for integrated circuit devices incorporating memory arrays |
KR20050050343A (ko) * | 2003-11-25 | 2005-05-31 | 가부시키가이샤 버팔로 | 메모리 모듈 및 메모리용 보조모듈 |
US7304905B2 (en) * | 2004-05-24 | 2007-12-04 | Intel Corporation | Throttling memory in response to an internal temperature of a memory device |
KR100899392B1 (ko) * | 2007-08-20 | 2009-05-27 | 주식회사 하이닉스반도체 | 리프레시 특성 테스트 회로 및 이를 이용한 리프레시 특성테스트 방법 |
KR101069672B1 (ko) * | 2009-04-20 | 2011-10-04 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 어드레스 제어회로 |
US10497426B1 (en) * | 2018-09-21 | 2019-12-03 | Nanya Technology Corporation | Target row generator, DRAM, and method for determining a target row |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH073754B2 (ja) * | 1988-03-08 | 1995-01-18 | 三菱電機株式会社 | 半導体記憶装置 |
US5327380B1 (en) * | 1988-10-31 | 1999-09-07 | Texas Instruments Inc | Method and apparatus for inhibiting a predecoder when selecting a redundant row line |
US5131018A (en) * | 1990-07-31 | 1992-07-14 | Texas Instruments Incorporated | Counter circuit with two tri-state latches |
WO1992009084A1 (en) * | 1990-11-16 | 1992-05-29 | Fujitsu Limited | Semiconductor memory having high-speed address decoder |
KR950014099B1 (ko) * | 1992-06-12 | 1995-11-21 | 가부시기가이샤 도시바 | 반도체 기억장치 |
JP3199862B2 (ja) * | 1992-08-12 | 2001-08-20 | 日本テキサス・インスツルメンツ株式会社 | 半導体記憶装置 |
US5406526A (en) * | 1992-10-01 | 1995-04-11 | Nec Corporation | Dynamic random access memory device having sense amplifier arrays selectively activated when associated memory cell sub-arrays are accessed |
KR960000681B1 (ko) * | 1992-11-23 | 1996-01-11 | 삼성전자주식회사 | 반도체메모리장치 및 그 메모리쎌 어레이 배열방법 |
US5331601A (en) * | 1993-02-04 | 1994-07-19 | United Memories, Inc. | DRAM variable row select |
-
1995
- 1995-09-26 EP EP95630105A patent/EP0745998B1/en not_active Expired - Lifetime
- 1995-09-26 DE DE69532376T patent/DE69532376T2/de not_active Expired - Lifetime
-
1996
- 1996-05-24 JP JP13013196A patent/JP3914283B2/ja not_active Expired - Lifetime
- 1996-05-30 US US08/657,637 patent/US5680362A/en not_active Expired - Lifetime
- 1996-05-30 KR KR1019960018860A patent/KR100416919B1/ko active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
JPH08339698A (ja) | 1996-12-24 |
DE69532376T2 (de) | 2004-06-09 |
DE69532376D1 (de) | 2004-02-05 |
KR100416919B1 (ko) | 2004-04-28 |
EP0745998A1 (en) | 1996-12-04 |
EP0745998B1 (en) | 2004-01-02 |
US5680362A (en) | 1997-10-21 |
JP3914283B2 (ja) | 2007-05-16 |
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