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JPH0272641A - Resin sealing apparatus for semiconductor device - Google Patents

Resin sealing apparatus for semiconductor device

Info

Publication number
JPH0272641A
JPH0272641A JP22421288A JP22421288A JPH0272641A JP H0272641 A JPH0272641 A JP H0272641A JP 22421288 A JP22421288 A JP 22421288A JP 22421288 A JP22421288 A JP 22421288A JP H0272641 A JPH0272641 A JP H0272641A
Authority
JP
Japan
Prior art keywords
hot plate
plate
resin sealing
semiconductor device
resin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP22421288A
Other languages
Japanese (ja)
Other versions
JP2676231B2 (en
Inventor
Toru Ueno
上野 透
Suekichi Tanaka
田中 末吉
Koji Tsutsumi
康次 堤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP63224212A priority Critical patent/JP2676231B2/en
Publication of JPH0272641A publication Critical patent/JPH0272641A/en
Application granted granted Critical
Publication of JP2676231B2 publication Critical patent/JP2676231B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C45/00Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
    • B29C45/17Component parts, details or accessories; Auxiliary operations
    • B29C45/1742Mounting of moulds; Mould supports
    • B29C45/1744Mould support platens

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Injection Moulding Of Plastics Or The Like (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

PURPOSE:To prevent the occurrence of breakdown of a hot plate in resin molding and to prevent the occurrence of resin burr in a lead frame by providing a backing plate between the hot plate and supporting pins, and forming the hot plate on the backing plate with a material having excellent heat conductivity. CONSTITUTION:A hot plate 11 has the upper end surface in contact with the lower end surface of a chase block 5. The hot plate 11 houses heaters 4. The entire hot plate 11 is formed with a metal material, e.g., copper alloy and the like, whose heat conductivity is high. A backing plate 12 comprising a material having rigidity higher than that of the hot plate 11 is provided between the hot plate and supporting pins 3. Since the hot plate 11 having the high heat conductivity is used, the chase block 5 can be uniformly heated in resin molding. Thus the occurrence of resin burr in a lead frame can be prevented, and the occurrence of the breakdown of the hot plate 11 can be also prevented.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、トランスファ成形プレスを用いて樹脂成形す
る半導体装置の樹脂封止装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a resin sealing device for a semiconductor device that is resin-molded using a transfer molding press.

〔従来の技術〕[Conventional technology]

従来、この種半導体装置の樹脂封止装置は第2図(上下
2つの型板のうち下側の型板を示す)に示すように構成
されている。これを同図に基づいて説明すると、同図に
おいて、符号1で示すものはベース2上に多数のサポー
トピン3を介して設けられヒータ4を内蔵する熱盤、5
はこの熱盤1上に保持されパーティング面5aに開口す
るキャビティ6を有するチェイスブロック、7はこのチ
ェイスブロック5の外側に配設されかつ前記熱盤lと前
記ベース2との間に介装され側方に開口する取付溝7a
を有するスペーサブロックである。このスペーサブロッ
ク7の内側には、前記キャビティ6内を進退するエジェ
クタービン(図示せず)を有するエジェクター機構8が
収納されている。なお、前記チェイスブロック5の上方
には上側の型板(図示せず)が配設されている。
Conventionally, a resin sealing apparatus for this type of semiconductor device has been constructed as shown in FIG. 2 (showing the lower template of the two upper and lower templates). This will be explained based on the figure. In the figure, what is indicated by reference numeral 1 is a heating plate 5 which is provided on a base 2 via a large number of support pins 3 and has a built-in heater 4.
7 is a chase block that is held on the hot platen 1 and has a cavity 6 that opens to the parting surface 5a; Mounting groove 7a that opens laterally
This is a spacer block with a An ejector mechanism 8 having an ejector turbine (not shown) that moves forward and backward within the cavity 6 is housed inside the spacer block 7 . Note that an upper template (not shown) is provided above the chase block 5.

このように構成された半導体装置の樹脂封止装置におい
ては、型締時にポット(図示せず)内の樹脂タブレット
(図示せず)をプランジャー(図示せず)によって加圧
し、予めチェイスブロック5に装着されたリードフレー
ム(図示せず)上の半導体素子(図示せず)を樹脂封止
することができる。
In the resin sealing apparatus for semiconductor devices configured in this way, the resin tablet (not shown) in the pot (not shown) is pressurized by a plunger (not shown) during mold clamping, and the chase block 5 is A semiconductor element (not shown) on a lead frame (not shown) attached to the semiconductor device can be sealed with resin.

なお、樹脂封止時には、ヒータ4によってチェイスブロ
ック5を樹脂成形温度に加熱する必要がある。
Note that during resin sealing, it is necessary to heat the chase block 5 to the resin molding temperature using the heater 4.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで、従来の半導体装置の樹脂封止装置においては
、熱盤1に熱伝導率の低い金属材料が使用されているた
め、樹脂成形時にチェイスブロック5が不均一に加熱さ
れて反り変形していた。すなわち、ヒータ4は熱盤1の
複数箇所に内蔵されるものであり、このため加熱時には
チェスブロック5の下端面全体が均一に加熱されないか
らである。この結果、両パーティング面5a (一方の
み図示)に間隙が形成されてしまい、チェスブロック5
上のリードフレーム(図示ぜす)に樹脂ばりが発生する
という問題があった。
By the way, in conventional resin sealing equipment for semiconductor devices, since a metal material with low thermal conductivity is used for the heating plate 1, the chase block 5 is heated unevenly during resin molding and is warped. . That is, the heaters 4 are built into the heating plate 1 at a plurality of locations, and therefore the entire lower end surface of the chess block 5 is not uniformly heated during heating. As a result, a gap is formed between both parting surfaces 5a (only one is shown), and the chess block 5
There was a problem in that resin burrs were generated on the upper lead frame (not shown).

そこで、熱盤1に高い例えば銅合金等の金属軟材料を使
用することが考えられるが、この場合サポートピン3が
軟らかい熱盤1に食い込んでこれを破損するという不都
合があった。また、例えば銅合金等の金属材料からなる
熱盤lは剛性が低いことから、前述同様反り変形して両
パーティング5a (図示せず)に間隙が形成され、リ
ードフレーム(図示せず)に樹脂ばりが発生するという
不都合もあった。
Therefore, it is conceivable to use a soft metal material such as a copper alloy for the hot platen 1, but in this case, there is a problem that the support pins 3 dig into the soft hot platen 1 and damage it. Furthermore, since the hot platen l made of a metal material such as a copper alloy has low rigidity, it warps and deforms as described above, forming a gap between both partings 5a (not shown), and causing a gap between the lead frames (not shown). There was also the inconvenience that resin burrs were generated.

本発明はこのような事情に鑑みてなされたもので、樹脂
成形時に熱盤の破損発生やリードフレームにおける樹脂
ばりの発生を防止することができる半導体装置の樹脂封
止装置を提供するものである。
The present invention has been made in view of the above circumstances, and it is an object of the present invention to provide a resin sealing device for semiconductor devices that can prevent the occurrence of damage to the hot platen and the occurrence of resin burrs on the lead frame during resin molding. .

〔課題を解決するための手段〕[Means to solve the problem]

本発明に係る半導体装置の樹脂封止装置は、熱盤とサポ
ートピンとの間にパッキングプレートを介装し、このパ
ッキングプレート上の熱盤を熱伝導率が良好な材料によ
って形成したものである。
In the resin sealing device for a semiconductor device according to the present invention, a packing plate is interposed between a heating plate and a support pin, and the heating plate on the packing plate is formed of a material having good thermal conductivity.

〔作 用〕[For production]

本発明においては、樹脂成形時にパッキングプレートに
よって熱盤の反り変形を阻止することができると共に、
熱盤がもつ高伝導性によってチェイスブロックの反り変
形を阻止することができる。
In the present invention, the packing plate can prevent the heating plate from warping during resin molding, and
The high conductivity of the hot plate can prevent the chase block from warping.

〔実施例〕〔Example〕

以下、本発明の構成等を図に示す実施例によって詳細に
説明する。
EMBODIMENT OF THE INVENTION Hereinafter, the structure etc. of this invention will be explained in detail by the Example shown in the figure.

第1図は本発明に係る半導体装置の樹脂封止装置を示す
断面図で、同図において第2図と同一の部材については
同一の符号を付し、詳細な説明は省略する。同図におい
て、符号11で示すものは前記チェイスブロック5の下
端面に対接する上端面をもつ熱盤で、前記ヒータ4を内
蔵し、全体が熱伝導率が高い例えば銅合金等の金属材料
によって形成されている。12は前記熱盤11の剛性よ
り高い剛性をもつ材料からなるパッキングプレートで、
前記熱盤1と前記サポートピン3との間に介装されてい
る。
FIG. 1 is a sectional view showing a resin sealing device for a semiconductor device according to the present invention. In this figure, the same members as those in FIG. In the same figure, the reference numeral 11 denotes a heating plate having an upper end surface that is in contact with the lower end surface of the chase block 5, which houses the heater 4 and is made of a metal material with high thermal conductivity, such as a copper alloy. It is formed. 12 is a packing plate made of a material with higher rigidity than the heating plate 11;
It is interposed between the heating plate 1 and the support pin 3.

このように構成された半導体装置の樹脂封止装置におい
ては、熱伝導率が高い熱盤11を使用したから、樹脂成
形(封止)時にチエイスプロ・ツク5を均一に加熱する
ことができる。
In the resin sealing apparatus for a semiconductor device constructed in this way, since the heating plate 11 having high thermal conductivity is used, the chain protector 5 can be uniformly heated during resin molding (sealing).

したがって、本発明においては、樹脂封止時にチェイス
ブロック5の反り変形を阻止することができるから、チ
ェイスブロック5の各パーティング面5a (一方のみ
図示)を互いに密着させることができる。
Therefore, in the present invention, since the chase block 5 can be prevented from being warped during resin sealing, the parting surfaces 5a (only one of which is shown) of the chase block 5 can be brought into close contact with each other.

また、本発明においては、パッキングプレート12を熱
盤11とサポートピン3との間に介装したから、熱盤1
1に対するサポートピン3の食い込みや熱盤11の反り
変形を阻止することができる。
Further, in the present invention, since the packing plate 12 is interposed between the heating plate 11 and the support pin 3, the heating plate 12
It is possible to prevent the support pin 3 from biting into the support pin 1 and the heating plate 11 from warping.

なお、本実施例においては、熱盤11を一つの部材によ
って形成してなるものを示したが、本発明はこれに限定
されず、熱盤11が分割形成してなるものでも実施例と
同様の効果を奏する。この場合には、チェイスブロック
5の下端面に対接する一方の熱盤(図示せず)に例えば
銅合金等の金属材料を使用する。そして、他方の熱盤(
図示せず)にヒータ4を内蔵し、このヒータ4を熱伝導
率が高い材料によって囲繞すれば、熱盤11からチェイ
スブロック5にヒータ熱を一層効果的に伝達することが
できる。
In addition, in this embodiment, the heating plate 11 is formed of one member, but the present invention is not limited to this, and even if the heating plate 11 is formed by dividing it, it is possible to use the same method as in the embodiment. It has the effect of In this case, one of the heating plates (not shown) that is in contact with the lower end surface of the chase block 5 is made of a metal material such as a copper alloy. And the other heating plate (
If a heater 4 (not shown) is built in and the heater 4 is surrounded by a material with high thermal conductivity, the heater heat can be transmitted from the hot platen 11 to the chase block 5 more effectively.

また、本実施例においては、チェイスブロック5が二個
であるものに適用する例を示したが、本発明はこれに限
定適用されるものでないことば勿論である。
Further, in this embodiment, an example is shown in which the chase block 5 is two, but it goes without saying that the present invention is not limited to this.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、熱器とサポートピ
ンとの間にパッキングプレートを介装し、このパッキン
グプレート上の熱器を熱伝導率が良好な材料によって形
成したので、チェイスブロック全体を均一に加熱するこ
とができ、樹脂封止時にチェイスブロックの反り変形を
阻止することができる。また、パッキングプレートによ
って熱器の反り変形を阻止することができる。したがっ
て、樹脂封止時にチェイスブロックの各パーティングを
互いに密着させることができるから、リードフレームに
おける樹脂ばりの発生を防止することができる。また、
サポートピンと熱器との間に介装したパッキングプレー
トによって、熱器に対するサポートピンの食い込みを阻
止することができるから、熱器の破損発生を防止するこ
ともできる。
As explained above, according to the present invention, a packing plate is interposed between the heating device and the support pin, and the heating device on the packing plate is made of a material with good thermal conductivity, so that the entire chase block is It is possible to heat uniformly, and it is possible to prevent the chase block from warping and deforming during resin sealing. Further, the packing plate can prevent warping of the heating device. Therefore, since each parting of the chase block can be brought into close contact with each other during resin sealing, generation of resin burrs on the lead frame can be prevented. Also,
Since the packing plate interposed between the support pin and the heating device can prevent the support pin from biting into the heating device, it is also possible to prevent the heating device from being damaged.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係る半導体装置の樹脂封止装置を示す
断面図、第2図は従来の半導体装置の樹脂封止装置を示
す断面図である。 2・・・・ベース、3・・・・サポートピン、4・・・
・ヒータ、5・・・・チエイスプロ・ツク、11・・・
・熱器、12・・・・パッキングプレート。 代 理   人   大 岩 増 雄
FIG. 1 is a sectional view showing a resin sealing device for a semiconductor device according to the present invention, and FIG. 2 is a sectional view showing a conventional resin sealing device for a semiconductor device. 2...Base, 3...Support pin, 4...
・Heater, 5...Cheese Pro Tsuk, 11...
・Heating device, 12...Packing plate. Agent Masuo Oiwa

Claims (1)

【特許請求の範囲】[Claims] ベース上にサポートピンを介して設けられヒータを内蔵
する熱盤と、この熱盤上に保持されキャビティを有する
チェイスブロックとを備えた半導体装置の樹脂封止装置
において、前記熱盤と前記サポートピンとの間にパッキ
ングプレートを介装し、このパッキングプレート上の前
記熱盤を熱伝導率が良好な材料によって形成したことを
特徴とする半導体装置の樹脂封止装置。
In a resin encapsulation device for a semiconductor device, which includes a heating platen provided on a base via a support pin and having a built-in heater, and a chase block held on the heating platen and having a cavity, the heating platen and the support pin are connected to each other. 1. A resin sealing device for a semiconductor device, characterized in that a packing plate is interposed between the packing plates, and the heating plate on the packing plate is made of a material having good thermal conductivity.
JP63224212A 1988-09-07 1988-09-07 Resin encapsulation equipment for semiconductor devices Expired - Lifetime JP2676231B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63224212A JP2676231B2 (en) 1988-09-07 1988-09-07 Resin encapsulation equipment for semiconductor devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63224212A JP2676231B2 (en) 1988-09-07 1988-09-07 Resin encapsulation equipment for semiconductor devices

Publications (2)

Publication Number Publication Date
JPH0272641A true JPH0272641A (en) 1990-03-12
JP2676231B2 JP2676231B2 (en) 1997-11-12

Family

ID=16810275

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63224212A Expired - Lifetime JP2676231B2 (en) 1988-09-07 1988-09-07 Resin encapsulation equipment for semiconductor devices

Country Status (1)

Country Link
JP (1) JP2676231B2 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6192056U (en) * 1984-11-22 1986-06-14
JPS61241109A (en) * 1985-04-19 1986-10-27 Hitachi Ltd Molding die
JPS6226827A (en) * 1985-07-27 1987-02-04 Mitsubishi Electric Corp Resin sealing device for semiconductor element

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6192056U (en) * 1984-11-22 1986-06-14
JPS61241109A (en) * 1985-04-19 1986-10-27 Hitachi Ltd Molding die
JPS6226827A (en) * 1985-07-27 1987-02-04 Mitsubishi Electric Corp Resin sealing device for semiconductor element

Also Published As

Publication number Publication date
JP2676231B2 (en) 1997-11-12

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