[go: up one dir, main page]

GB1443999A - Metal oxide semiconductor field effect transistors - Google Patents

Metal oxide semiconductor field effect transistors

Info

Publication number
GB1443999A
GB1443999A GB5939073A GB5939073A GB1443999A GB 1443999 A GB1443999 A GB 1443999A GB 5939073 A GB5939073 A GB 5939073A GB 5939073 A GB5939073 A GB 5939073A GB 1443999 A GB1443999 A GB 1443999A
Authority
GB
United Kingdom
Prior art keywords
metal oxide
oxide semiconductor
field effect
providing
effect transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB5939073A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intersil Corp
Original Assignee
Intersil Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intersil Inc filed Critical Intersil Inc
Publication of GB1443999A publication Critical patent/GB1443999A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • H10D84/83Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
    • H10D84/85Complementary IGFETs, e.g. CMOS
    • H10D84/858Complementary IGFETs, e.g. CMOS comprising a P-type well but not an N-type well
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

1443999 Semi-conductor devices INTERSIL Inc 21 Dec 1973 [12 April 1973] 59390/73 Heading H1K A CMOS comprises an N epitaxial layer 52 on an N-substrate 51, a buried P+ region 53 extending beneath an entire P- well region 56, N+ channels 57-60 providing N channel source and drain regions and having a metalover-silicon gate connection 63, P+ channels 66-69 in the epitaxial layer 52 providing P channel source and drain regions and having a metal-over-silicon gate connection 73, and a body contact B. The P+ region 53 inhibits SCR action by providing short-lived minority carriers.
GB5939073A 1973-04-12 1973-12-21 Metal oxide semiconductor field effect transistors Expired GB1443999A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US35058773A 1973-04-12 1973-04-12

Publications (1)

Publication Number Publication Date
GB1443999A true GB1443999A (en) 1976-07-28

Family

ID=23377367

Family Applications (1)

Application Number Title Priority Date Filing Date
GB5939073A Expired GB1443999A (en) 1973-04-12 1973-12-21 Metal oxide semiconductor field effect transistors

Country Status (7)

Country Link
JP (1) JPS503585A (en)
CA (1) CA997869A (en)
DE (1) DE2415736A1 (en)
FR (1) FR2225844B1 (en)
GB (1) GB1443999A (en)
IT (1) IT1008753B (en)
NL (1) NL7317176A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0057563A2 (en) * 1981-02-04 1982-08-11 Western Electric Company, Incorporated Semiconductor integrated circuit
DE3316680A1 (en) * 1982-05-06 1983-11-10 Mitsubishi Denki K.K., Tokyo Integrated CMOS circuit with increased resistance to the latch-up effect
GB2128024A (en) * 1982-09-24 1984-04-18 Hitachi Ltd Method of manufacturing semiconductor integrated circuit device
EP0193172A2 (en) * 1985-02-26 1986-09-03 Nissan Motor Co., Ltd. Vertical MOS transistor with peripheral circuit

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS558019A (en) * 1978-06-30 1980-01-21 Nec Corp Semiconductor device
JPS60207368A (en) * 1984-03-31 1985-10-18 Res Dev Corp Of Japan Manufacture of complementary type mos integrated circuit
JPS60250664A (en) * 1984-05-26 1985-12-11 Toshiba Corp Semiconductor integrated circuit device and manufacture thereof
JPS6386555A (en) * 1986-09-30 1988-04-16 Toshiba Corp Semiconductor device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0057563A2 (en) * 1981-02-04 1982-08-11 Western Electric Company, Incorporated Semiconductor integrated circuit
EP0057563A3 (en) * 1981-02-04 1983-01-26 Western Electric Company, Incorporated Semiconductor integrated circuit
DE3316680A1 (en) * 1982-05-06 1983-11-10 Mitsubishi Denki K.K., Tokyo Integrated CMOS circuit with increased resistance to the latch-up effect
GB2128024A (en) * 1982-09-24 1984-04-18 Hitachi Ltd Method of manufacturing semiconductor integrated circuit device
EP0193172A2 (en) * 1985-02-26 1986-09-03 Nissan Motor Co., Ltd. Vertical MOS transistor with peripheral circuit
EP0193172A3 (en) * 1985-02-26 1987-08-19 Nissan Motor Co., Ltd. Vertical mos transistor with peripheral circuit

Also Published As

Publication number Publication date
CA997869A (en) 1976-09-28
DE2415736A1 (en) 1974-10-24
IT1008753B (en) 1976-11-30
NL7317176A (en) 1974-10-15
FR2225844B1 (en) 1977-06-10
FR2225844A1 (en) 1974-11-08
JPS503585A (en) 1975-01-14

Similar Documents

Publication Publication Date Title
GB1425986A (en) Semiconductor devices comprising insulated-gate- field-effect transistors
ES450165A1 (en) INTEGRATED SEMICONDUCTOR DEVICE.
GB1375355A (en)
GB1496413A (en) Semiconductor device and method of fabrication
GB1473394A (en) Negative resistance semiconductor device
GB1339250A (en) Gate protective device for insulated gate field-effect transistors
GB1152489A (en) Improvements in and relating to Semiconductor Devices
GB1229776A (en)
GB1246208A (en) Pn junction gated field effect transistor having buried layer
GB1527095A (en) Storage arrangements
GB1443999A (en) Metal oxide semiconductor field effect transistors
GB1480412A (en) Arrangements for operating a semiconductor device in a charge storage mode
GB1393792A (en) Field effect transistor
ES8800789A1 (en) IMPROVEMENTS IN A MOS TRANSISTOR DEVICE
GB1134019A (en) Improvements in semi-conductor devices
GB1372086A (en) Semiconductor device manufacture
GB1090696A (en) Improvements in or relating to semiconductor devices
GB1200757A (en) Uhf amplifier
GB1073135A (en) Semiconductor current limiter
GB1452882A (en) Zener diode for integrated circuits
GB1276791A (en) Semiconductor device
GB1335037A (en) Field effect transistor
GB1245765A (en) Surface diffused semiconductor devices
GB1520125A (en) Low-noise barrier injection transit time diode
JPS5491074A (en) Semiconductor device

Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee