DE60230607D1 - Herstellungsverfahren für ein lichtaussendendes bauteil - Google Patents
Herstellungsverfahren für ein lichtaussendendes bauteilInfo
- Publication number
- DE60230607D1 DE60230607D1 DE60230607T DE60230607T DE60230607D1 DE 60230607 D1 DE60230607 D1 DE 60230607D1 DE 60230607 T DE60230607 T DE 60230607T DE 60230607 T DE60230607 T DE 60230607T DE 60230607 D1 DE60230607 D1 DE 60230607D1
- Authority
- DE
- Germany
- Prior art keywords
- manufacturing
- light emitting
- emitting component
- component
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/183—Epitaxial-layer growth characterised by the substrate being provided with a buffer layer, e.g. a lattice matching layer
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/10—Heating of the reaction chamber or the substrate
- C30B25/105—Heating of the reaction chamber or the substrate by irradiation or electric discharge
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/16—Oxides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/0242—Crystalline insulating materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02469—Group 12/16 materials
- H01L21/02472—Oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02469—Group 12/16 materials
- H01L21/02477—Selenides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02469—Group 12/16 materials
- H01L21/0248—Tellurides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02483—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
- H01L21/02505—Layer structure consisting of more than two layers
- H01L21/02507—Alternating layers, e.g. superlattice
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02551—Group 12/16 materials
- H01L21/02554—Oxides
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02565—Oxide semiconducting materials not being Group 12/16 materials, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/0257—Doping during depositing
- H01L21/02573—Conductivity type
- H01L21/02579—P-type
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/01—Manufacture or treatment
- H10H20/011—Manufacture or treatment of bodies, e.g. forming semiconductor layers
- H10H20/012—Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group II-IV materials
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Led Devices (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001131376A JP4144191B2 (ja) | 2001-04-27 | 2001-04-27 | 発光素子の製造方法 |
JP2001131328A JP4427924B2 (ja) | 2001-04-27 | 2001-04-27 | 発光素子の製造方法 |
JP2001232608A JP4431933B2 (ja) | 2001-07-31 | 2001-07-31 | 発光素子の製造方法及び発光素子 |
JP2001260742A JP4232363B2 (ja) | 2001-08-30 | 2001-08-30 | ZnO系半導体発光素子 |
PCT/JP2002/004127 WO2002089223A1 (en) | 2001-04-27 | 2002-04-25 | Production method for light emitting element absract: |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60230607D1 true DE60230607D1 (de) | 2009-02-12 |
Family
ID=27482244
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60230607T Expired - Fee Related DE60230607D1 (de) | 2001-04-27 | 2002-04-25 | Herstellungsverfahren für ein lichtaussendendes bauteil |
Country Status (7)
Country | Link |
---|---|
US (2) | US6939731B2 (de) |
EP (3) | EP1890344A1 (de) |
KR (3) | KR100875396B1 (de) |
CN (1) | CN100438088C (de) |
DE (1) | DE60230607D1 (de) |
TW (1) | TW541723B (de) |
WO (1) | WO2002089223A1 (de) |
Families Citing this family (54)
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US7189992B2 (en) * | 2002-05-21 | 2007-03-13 | State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University | Transistor structures having a transparent channel |
US7339187B2 (en) * | 2002-05-21 | 2008-03-04 | State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University | Transistor structures |
JP3679097B2 (ja) | 2002-05-31 | 2005-08-03 | 株式会社光波 | 発光素子 |
JP3947443B2 (ja) * | 2002-08-30 | 2007-07-18 | Tdk株式会社 | 電子デバイス用基板および電子デバイス |
JP3720341B2 (ja) * | 2003-02-12 | 2005-11-24 | ローム株式会社 | 半導体発光素子 |
EP2273569A3 (de) | 2003-02-24 | 2011-03-02 | Waseda University | B-Ga203-lichtemittierende Vorrichtung und Herstellungsverfahren dafür |
JP4630986B2 (ja) * | 2003-02-24 | 2011-02-09 | 学校法人早稲田大学 | β−Ga2O3系単結晶成長方法 |
JP4034208B2 (ja) * | 2003-02-25 | 2008-01-16 | ローム株式会社 | 透明電極 |
CN1303650C (zh) * | 2003-11-04 | 2007-03-07 | 浙江大学 | 一种p-Zn1-xMgxO晶体薄膜及其制备方法 |
KR100987451B1 (ko) * | 2003-12-04 | 2010-10-13 | 엘지전자 주식회사 | 면발광 소자 |
JP3834658B2 (ja) * | 2004-02-06 | 2006-10-18 | 国立大学法人東北大学 | 薄膜及びp型酸化亜鉛薄膜製造方法と半導体デバイス |
US7821019B2 (en) * | 2004-10-04 | 2010-10-26 | Svt Associates, Inc. | Triple heterostructure incorporating a strained zinc oxide layer for emitting light at high temperatures |
US7829444B2 (en) * | 2004-11-10 | 2010-11-09 | Canon Kabushiki Kaisha | Field effect transistor manufacturing method |
CN1309020C (zh) * | 2005-04-19 | 2007-04-04 | 中国科学院物理研究所 | 一种在铝酸镁衬底上制备ZnO单晶薄膜的方法 |
KR100691159B1 (ko) * | 2005-04-30 | 2007-03-09 | 삼성전기주식회사 | 질화갈륨계 반도체의 제조 방법 |
WO2007018216A1 (ja) * | 2005-08-09 | 2007-02-15 | Stanley Electric Co., Ltd. | ZnO結晶とその成長方法、及び発光素子の製造方法 |
KR100711203B1 (ko) * | 2005-08-23 | 2007-04-24 | 한국과학기술연구원 | 산화아연을 이용한 p형-진성-n형 구조의 발광 다이오드제조방법 |
EP1775356A3 (de) | 2005-10-14 | 2009-12-16 | Ricoh Company, Ltd. | Kristallziehungsvorrichtung und Verfahren zur Herstellung von Gruppe-III-Nitrid Kristallen |
KR100742989B1 (ko) * | 2005-12-30 | 2007-07-26 | (주)더리즈 | 질화갈륨계 발광 소자의 제조 방법 |
EP1821347B1 (de) * | 2006-02-16 | 2018-01-03 | LG Electronics Inc. | Lichtemittierende vorrichtung mit vertikaler struktur und verfahren zu ihrer herstellung |
CN100406620C (zh) * | 2006-05-11 | 2008-07-30 | 浙江大学 | Li掺杂的p-Zn1-xMgxO晶体薄膜及其制备方法 |
KR20090121274A (ko) * | 2006-12-11 | 2009-11-25 | 루멘즈, 인크 | 산화아연 다중 접합 광전지 및 광전자 소자 |
CN100432302C (zh) * | 2007-01-29 | 2008-11-12 | 浙江大学 | Sb掺杂的p型ZnO晶体薄膜的制备方法 |
TWI379438B (en) | 2007-03-02 | 2012-12-11 | Miin Jang Chen | Zinc-oxide-based semiconductor light-emitting device and method of fabricating the same |
US7606448B2 (en) * | 2007-03-13 | 2009-10-20 | Micron Technology, Inc. | Zinc oxide diodes for optical interconnections |
JP5155611B2 (ja) * | 2007-07-06 | 2013-03-06 | スタンレー電気株式会社 | ZnO系半導体発光素子 |
KR100916489B1 (ko) * | 2007-07-27 | 2009-09-08 | 엘지이노텍 주식회사 | 반도체 발광소자 및 그 제조방법 |
FR2929267B1 (fr) * | 2008-03-27 | 2011-01-14 | Commissariat Energie Atomique | Procede de preparation de zno ou de znmgo dope de type p |
TW201006014A (en) * | 2008-05-21 | 2010-02-01 | Lumenz Inc | Semiconductor device having rough sidewall |
FR2932607B1 (fr) * | 2008-06-12 | 2011-01-14 | Commissariat Energie Atomique | Procede de passivation des centres de recombinaisons non radiatives d'echantillons en zno et echantillons en zno passive ainsi prepares |
US20100117070A1 (en) * | 2008-09-18 | 2010-05-13 | Lumenz Llc | Textured semiconductor light-emitting devices |
EP2253988A1 (de) * | 2008-09-19 | 2010-11-24 | Christie Digital Systems USA, Inc. | Lichtintegrierer für mehr als eine Lampe |
JP5451280B2 (ja) * | 2008-10-09 | 2014-03-26 | キヤノン株式会社 | ウルツ鉱型結晶成長用基板およびその製造方法ならびに半導体装置 |
JP5346200B2 (ja) | 2008-11-14 | 2013-11-20 | スタンレー電気株式会社 | ZnO系半導体層とその製造方法、ZnO系半導体発光素子、及びZnO系半導体素子 |
JP5493119B2 (ja) * | 2009-03-11 | 2014-05-14 | スタンレー電気株式会社 | 酸化亜鉛系半導体素子の製造方法 |
KR101136877B1 (ko) * | 2009-04-29 | 2012-04-20 | 광주과학기술원 | 수직형 산화아연 발광소자 및 그 제조방법 |
TWI425559B (zh) * | 2009-09-17 | 2014-02-01 | Univ Nat Chiao Tung | 以單晶氧化物作為基板成長纖鋅礦結構半導體非極性m面磊晶層之方法 |
AU2010306798B2 (en) * | 2009-10-15 | 2015-05-28 | Arkema Inc. | Deposition of doped ZnO films on polymer substrates by UV-assisted chemical vapor deposition |
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TWI621184B (zh) * | 2010-08-16 | 2018-04-11 | 半導體能源研究所股份有限公司 | 半導體裝置之製造方法 |
KR101932576B1 (ko) | 2010-09-13 | 2018-12-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
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KR101239615B1 (ko) * | 2011-04-18 | 2013-03-11 | 삼성코닝정밀소재 주식회사 | 발광장치용 기판 제조방법 및 이에 의해 제조된 발광장치용 기판 |
US8901554B2 (en) * | 2011-06-17 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including channel formation region including oxide semiconductor |
US9660092B2 (en) | 2011-08-31 | 2017-05-23 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor thin film transistor including oxygen release layer |
CN102386246B (zh) * | 2011-11-10 | 2014-09-17 | 中山大学 | 一种p型导电氧化锌薄膜材料及制备方法 |
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US10256361B2 (en) * | 2015-08-27 | 2019-04-09 | The Trustees Of Princeton University | Multiple band gap Co-Ni oxide compositions and applications thereof |
CN105297072B (zh) * | 2015-10-26 | 2017-11-17 | 南开大学 | 一种含硒的ZnO光阳极及其制备方法和应用 |
CN107681028B (zh) * | 2017-10-24 | 2023-08-29 | 江门市奥伦德光电有限公司 | 一种垂直结构ZnO基LED芯片及其制备方法 |
US20210098724A1 (en) * | 2019-10-01 | 2021-04-01 | Industry-University Cooperation Foundation Hanyang University | Thin film transistor |
CN111584658B (zh) * | 2020-06-28 | 2022-07-08 | 中国科学院长春光学精密机械与物理研究所 | 一种Ga2O3紫外探测器及其制备方法 |
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JP2545306B2 (ja) * | 1991-03-11 | 1996-10-16 | 誠 小長井 | ZnO透明導電膜の製造方法 |
US6057561A (en) | 1997-03-07 | 2000-05-02 | Japan Science And Technology Corporation | Optical semiconductor element |
JP3380422B2 (ja) | 1997-03-25 | 2003-02-24 | 科学技術振興事業団 | Ii族−酸化物を含む光半導体素子 |
JPH11168262A (ja) | 1997-09-30 | 1999-06-22 | Canon Inc | 面型光デバイス、その製造方法、および表示装置 |
WO2000016411A1 (en) * | 1998-09-10 | 2000-03-23 | Rohm Co., Ltd. | Semiconductor light-emitting device and method for manufacturing the same |
JP3724620B2 (ja) * | 1998-09-29 | 2005-12-07 | シャープ株式会社 | 発光ダイオードの製造方法 |
JP3492551B2 (ja) * | 1999-05-21 | 2004-02-03 | スタンレー電気株式会社 | p型II―VI族化合物半導体結晶、その成長方法及びそれを用いた半導体装置 |
JP3472791B2 (ja) | 1999-08-27 | 2003-12-02 | 大阪大学長 | 導電性材料、導電性薄膜、複合膜、及び導電性材料の製造方法 |
JP3424814B2 (ja) * | 1999-08-31 | 2003-07-07 | スタンレー電気株式会社 | ZnO結晶構造及びそれを用いた半導体装置 |
GB2361480B (en) * | 2000-04-19 | 2002-06-19 | Murata Manufacturing Co | Method for forming p-type semiconductor film and light emitting device using the same |
JP4431925B2 (ja) * | 2000-11-30 | 2010-03-17 | 信越半導体株式会社 | 発光素子の製造方法 |
-
2002
- 2002-04-23 TW TW091108306A patent/TW541723B/zh not_active IP Right Cessation
- 2002-04-25 KR KR1020087001145A patent/KR100875396B1/ko not_active Expired - Fee Related
- 2002-04-25 US US10/475,489 patent/US6939731B2/en not_active Expired - Fee Related
- 2002-04-25 KR KR1020087001144A patent/KR20080011730A/ko not_active Ceased
- 2002-04-25 WO PCT/JP2002/004127 patent/WO2002089223A1/ja active Application Filing
- 2002-04-25 DE DE60230607T patent/DE60230607D1/de not_active Expired - Fee Related
- 2002-04-25 EP EP07019356A patent/EP1890344A1/de not_active Withdrawn
- 2002-04-25 EP EP02720596A patent/EP1391941B1/de not_active Expired - Lifetime
- 2002-04-25 EP EP07019355A patent/EP1901358A1/de not_active Withdrawn
- 2002-04-25 CN CNB028110838A patent/CN100438088C/zh not_active Expired - Fee Related
- 2002-04-25 KR KR10-2003-7013499A patent/KR20040015100A/ko not_active Application Discontinuation
-
2005
- 2005-06-10 US US11/149,302 patent/US20050224825A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
KR20080011731A (ko) | 2008-02-05 |
EP1391941A1 (de) | 2004-02-25 |
US6939731B2 (en) | 2005-09-06 |
EP1391941A4 (de) | 2007-06-27 |
EP1901358A1 (de) | 2008-03-19 |
CN100438088C (zh) | 2008-11-26 |
CN1513210A (zh) | 2004-07-14 |
TW541723B (en) | 2003-07-11 |
US20040104392A1 (en) | 2004-06-03 |
US20050224825A1 (en) | 2005-10-13 |
EP1391941B1 (de) | 2008-12-31 |
EP1890344A1 (de) | 2008-02-20 |
KR100875396B1 (ko) | 2008-12-23 |
KR20040015100A (ko) | 2004-02-18 |
KR20080011730A (ko) | 2008-02-05 |
WO2002089223A1 (en) | 2002-11-07 |
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