CN110303607A - 切削装置 - Google Patents
切削装置 Download PDFInfo
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- CN110303607A CN110303607A CN201910207493.9A CN201910207493A CN110303607A CN 110303607 A CN110303607 A CN 110303607A CN 201910207493 A CN201910207493 A CN 201910207493A CN 110303607 A CN110303607 A CN 110303607A
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
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- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
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- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
- H01L21/3043—Making grooves, e.g. cutting
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- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
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- B26D7/1845—Means for removing cut-out material or waste by non mechanical means
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- B26D—CUTTING; DETAILS COMMON TO MACHINES FOR PERFORATING, PUNCHING, CUTTING-OUT, STAMPING-OUT OR SEVERING
- B26D7/00—Details of apparatus for cutting, cutting-out, stamping-out, punching, perforating, or severing by means other than cutting
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- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
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- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
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- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
- B28D5/024—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels with the stock carried by a movable support for feeding stock into engagement with the cutting blade, e.g. stock carried by a pivoted arm or a carriage
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- B28D5/04—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by tools other than rotary type, e.g. reciprocating tools
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
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- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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Abstract
提供切削装置,能够作为紫外线照射装置发挥功能。切削装置具有:切削单元,其对框架单元所包含的被加工物进行切削;清洗单元,其对该框架单元进行清洗;紫外线照射单元,其对该框架单元照射紫外线;搬送单元,其对该框架单元进行搬送;以及控制单元,其中,该控制单元具有处理模式登记部,该处理模式登记部登记有在能够对该框架单元实施的多种处理中分别由该控制单元输出至该各结构要素的指令,在该处理模式登记部中登记有:使切削单元对该被加工物进行切削的切削装置模式下的指令;不使该切削单元对该被加工物进行切削而使紫外线照射单元对该框架单元照射紫外线的紫外线照射装置模式下的指令,该控制单元具有将该指令输出至该各结构要素的功能。
Description
技术领域
本发明涉及切削装置,其具有利用切削刀具对被加工物进行切削的切削单元。
背景技术
在移动电话或个人计算机等电子设备所使用的器件芯片的制造工序中,首先,在由半导体等材料构成的晶片的正面上设定多条交叉的分割预定线。并且,在由该分割预定线划分的各区域形成有IC(Integrated Circuit:集成电路)、LSI(Large ScaleIntegration:大规模集成)等器件。
然后,将粘贴于环状的框架的被称为划片带的粘接带粘贴于该晶片的背面,从而形成由晶片、粘接带以及环状的框架一体形成的框架单元。并且,沿着该分割预定线(间隔道)对框架单元所包含的晶片进行加工而分割。于是,在该粘接带上形成各个器件芯片。
在晶片的分割中,例如使用切削装置。切削装置例如具有如下的部件等:卡盘工作台,其隔着粘接带而对晶片等被加工物进行保持;切削单元,其对被加工物进行切削;以及清洗单元,其对包含切削后的被加工物的框架单元进行清洗。另外,切削装置具有:盒载置部,其载置收纳有多个框架单元的盒;搬送单元,其对框架单元进行搬送;以及控制单元,其对切削装置的各结构进行控制。
框架单元所使用的粘接带例如包含粘接层,该粘接层包含紫外线硬化型的树脂。该粘接层对于晶片等被加工物发挥强力的粘接力,另一方面当照射紫外线时发生硬化而使粘接力降低。并且,当切削完成而将粘贴于被加工物的粘接带剥离时,对粘接带照射紫外线而使粘接层的粘接力降低。例如使用具有发出紫外线的紫外线光源的紫外线照射装置对粘接带照射紫外线。
为了省略将包含切削后的被加工物的框架单元搬运至紫外线照射装置的工夫而更有效地形成器件芯片,开发了组装有紫外线照射单元的切削装置(参照专利文献1和专利文献2)。
在组装有紫外线照射单元的切削装置中,例如通过搬送单元将框架单元从载置于盒载置部的盒中搬送至卡盘工作台上,利用切削单元对该框架单元所包含的被加工物进行切削。并且,通过搬送单元将框架单元从卡盘工作台搬送至清洗单元,利用清洗单元对该框架单元进行清洗。接着,将框架单元搬送至紫外线照射单元而对粘接带照射紫外线,然后将该框架单元收纳于盒中。
专利文献1:日本特开2003-204887号公报
专利文献2:日本特开2006-295050号公报
在器件芯片的制造工厂中,按照各种用途来设置多个切削装置。搭载有紫外线照射单元的切削装置比较昂贵,设置于制造工厂的所有切削装置未必都是搭载有紫外线照射单元的切削装置。在利用未搭载紫外线照射单元的切削装置对被加工物进行切削的情况下,在该制造工厂中需要对粘接带照射紫外线的紫外线照射装置。
但是,当在该制造工厂中设置独立的紫外线照射装置时,该紫外线照射装置会占据制造工厂的内部的有限空间。另外,紫外线照射装置本身也花费成本。因此,该制造工厂的生产率降低。
发明内容
本发明是鉴于该问题点而完成的,其目的在于提供切削装置,能够作为紫外线照射装置发挥功能。
根据本发明的一个方式,提供切削装置,其具有:卡盘工作台,其对框架单元进行保持,该框架单元包含环状的框架、粘贴于该环状的框架的粘接带以及该粘接带所粘贴的被加工物,该粘接带的粘接力通过紫外线的照射而降低;切削单元,其利用切削刀具对保持于该卡盘工作台的该框架单元所包含的该被加工物进行切削;清洗单元,其对包含被该切削单元切削后的该被加工物的该框架单元进行清洗;紫外线照射单元,其对该框架单元的该粘接带照射紫外线;盒载置部,其载置能够收纳该框架单元的盒;搬送单元,其在载置于该盒载置部的该盒、该卡盘工作台、该清洗单元以及该紫外线照射单元之间对该框架单元进行搬送;以及控制单元,其对包括该切削单元、该清洗单元、该紫外线照射单元以及搬送单元在内的各结构要素进行控制,该切削装置的特征在于,该控制单元具有处理模式登记部,该处理模式登记部登记有在能够对该框架单元实施的多种处理中分别由该控制单元输出至该各结构要素的指令,在该处理模式登记部中登记有:切削装置模式下的指令,该指令使该切削单元对从该盒中搬出并保持于该卡盘工作台的该框架单元所包含的被加工物进行切削,使搬送单元对包含切削后的被加工物的该框架单元进行搬送而搬入至该盒中;以及紫外线照射装置模式下的指令,该指令不使该切削单元对从该盒中搬出的该框架单元所包含的被加工物进行切削,而使该紫外线照射单元对该框架单元照射该紫外线,使搬送单元对被照射了紫外线的该框架单元进行搬送而搬入至该盒中,该控制单元具有如下的功能:从处理模式登记部获取与对该框架单元实施的处理相对应的指令,并将该指令输出至该各结构要素。
优选在该处理模式登记部中还登记有清洗装置模式下的指令,该指令不使该切削单元对从该盒中搬出的该框架单元进行切削,而使该清洗单元对该框架单元进行清洗,使搬送单元对清洗后的该框架单元进行搬送而搬入至该盒中。
本发明的一个方式的切削装置具有:切削单元,其能够对框架单元所包含的被加工物进行切削;清洗单元,其能够对框架单元进行清洗;以及紫外线照射单元,其能够对框架单元照射紫外线。另外,该切削装置具有对各结构要素进行控制的控制单元,该控制单元具有处理模式登记部,该处理模式登记部登记有与利用切削装置实施的各种处理相对应的指令。
在处理模式登记部中登记有对被加工物进行切削的切削装置模式下的指令以及对框架单元照射紫外线的紫外线照射装置模式下的指令。控制单元从处理模式登记部获取与利用该切削装置实施的预定的处理相对应的指令,并将该指令输出至各结构要素而使切削装置实施各种处理。
例如当在切削装置中实施被加工物的切削时,控制单元从处理模式登记部获取切削装置模式下的指令,对各结构要素输出该指令而使切削装置实施被加工物的切削加工。另外,当在切削装置中实施对框架单元的紫外线的照射时,控制单元从处理模式登记部获取紫外线照射装置模式下的指令,对各结构要素输出该指令而使切削装置实施对该框架单元的紫外线的照射。
在该紫外线照射装置模式下,不实施对被加工物的切削加工,而仅对框架单元照射紫外线。即,当切削装置在紫外线照射装置模式下被控制时,该切削装置作为紫外线照射装置发挥功能,因此当在器件芯片的制造工厂中配设该切削装置时,能够削减紫外线照射装置。
切削装置是为了实施被加工物的切削而制作的装置,以往的切削装置未被制作成能够适当地实施被加工物的切削以外的处理。与此相对,在本发明的一个方式的切削装置中,在处理模式登记部中登记有与各种处理相对应的指令,控制单元对各结构要素输出该指令,因此能够适当地实施切削以外的处理。
因此,根据本发明的一个方式,提供能够作为紫外线照射装置发挥功能的切削装置。
附图说明
图1是示意性示出切削装置、盒以及框架单元的立体图。
图2是示意性示出盒载置部和紫外线照射单元的立体图。
图3是示意性示出盒载置部和紫外线照射单元的剖视图。
图4的(A)是对切削装置模式进行说明的流程,图4的(B)是对紫外线照射装置模式进行说明的流程,图4的(C)是对清洗装置模式进行说明的流程。
标号说明
1:被加工物;3:粘接带;5:框架;7:框架单元;9:盒;11:搬入搬出口;13:把手;2:切削装置;4:装置基台;4a:控制单元;4b:处理模式登记部;6:盒载置部;6a:盒载置台;8:搬入搬出构件;10:暂放区域;12:对位构件;14:搬送构件;16:卡盘工作台;16a:保持面;18:夹具;20:拍摄相机;22:切削单元;24:切削刀具;26:主轴;28:搬送构件;30:清洗单元;32:清洗工作台;34:清洗喷嘴;36:操作构件;38:显示监视器;40:紫外线照射单元;42:紫外线光源;44:壳体;44a:搬入搬出口;46a、46b:支承框;48:升降机构;50:导轨;52:滚珠丝杠;54:脉冲电动机;56:移动板。
具体实施方式
参照附图,对本发明的一个方式的实施方式进行说明。首先,对通过本实施方式的切削装置实施各种处理的框架单元进行说明。图1是示意性示出本实施方式的切削装置、盒以及框架单元的立体图。
框架单元7包含:环状的框架5;粘贴于环状的框架5的粘接带3;以及粘接带3所粘贴的被加工物1。粘接带3是被称为划片带的带,加工前和加工后的被加工物1被该粘接带3支承。
被加工物1例如是由硅、SiC(碳化硅)或其他半导体等材料形成的晶片,或者是由蓝宝石、玻璃、石英等材料构成的圆板状的基板。如图1所示,在该被加工物1的正面上设定有多条相互交叉的被称为间隔道的分割预定线。
在由分割预定线划分的各区域分别形成有IC(Integrated circuit:集成电路)、LED(Light emitting diode:大规模集成)等器件。当沿着该分割预定线对被加工物1进行分割时,形成器件芯片。所形成的各个器件芯片被粘接带3支承。然后,将器件芯片从粘接带3剥离,最终安装于规定的安装对象。
粘接带3例如包含:由环氧树脂、丙烯酸系树脂、合成橡胶、聚酰亚胺等构成的基材(未图示);以及该基材上的包含紫外线硬化型的树脂的粘接层(未图示)。该粘接层对于被加工物1发挥强力的粘接力,另一方面当照射紫外线时发生硬化而使粘接力降低。并且,在将粘贴于被加工物1的粘接带3剥离时,对粘接带3照射紫外线而使粘接层的粘接力降低。
在粘接带3的外周部粘贴有由金属等形成的环状的框架5。在框架单元7中,在环状框架5的贯通孔的内部将被加工物1粘贴于粘接带3而进行支承。被加工物1在与粘接带3和框架5成为一体的框架单元7的状态下被搬入至切削装置2,并通过安装于切削装置2的切削刀具24进行切削。然后,从通过切削而形成的器件芯片的背面侧将粘接带3剥离。
接着,对切削装置2的各结构要素进行说明。如图1所示,在切削装置2的装置基台4的角部配设有盒载置部6,该盒载置部6载置收纳有多个框架单元7的盒9。盒载置部6具有对盒9进行支承的盒载置台6a。盒载置台6a通过后述的升降机构48(参照图2)而能够在上下方向(Z轴方向)上进行升降。
盒9具有箱型的壳体,在前表面形成有对框架单元7进行搬入搬出的搬入搬出口11。在该箱型的壳体的两侧面上安装有在盒9的搬运者对盒9进行搬运时进行把持的把手13。
在盒9的壳体的两侧面侧的内壁形成有分别从该内壁向该壳体的内部突出的多个支承框(未图示)。该多个支承框在盒9的两侧面形成于分别对应的高度位置。框架单元7载置在形成于该两侧面侧的对应的一对支承框上而收纳在盒9中。
在切削装置2的装置基台4上配设有搬入搬出构件8,该搬入搬出构件8对支承于盒载置台6a的盒9的内部所收纳的框架单元7进行搬入搬出。搬入搬出构件8例如具有:能够在Y轴方向上移动的移动部;以及从该移动部向盒载置台6a的方向突出的把持部。
当将框架单元7搬入至切削装置2时,使盒9升降而使对象的框架单元7的高度与搬入搬出构件8的高度一致,使搬入搬出构件8在Y轴方向上移动而进入至盒9的内部。并且,利用把持部对框架单元7进行把持,使搬入搬出构件8在Y轴方向的反方向上移动,将框架单元7搬送至装置基台4上的暂放区域10,并解除该把持部的把持。
在装置基台4上配设有隔着暂放区域10的一对棒状的对位构件12。该对位构件12沿着Y轴方向延伸,能够按照相互接近的方式沿着X轴方向移动,通过夹入放置于暂放区域10的框架单元7而将框架单元7定位于规定的位置。
在装置基台4上的暂放区域10与后述的卡盘工作台16之间配设有搬送构件14。搬送构件14具有:与装置基台4连接的轴部;从该轴部的上部沿水平方向延伸的臂部;以及臂部的前端的把持部。搬送构件14利用该把持部对放置于暂放区域10的框架单元7进行把持,通过使轴部旋转而使臂部旋转,从而将框架单元7移动至卡盘工作台16上。
在装置基台4的上表面上配设有对包含要切削加工的被加工物1的框架单元7进行保持的卡盘工作台16。卡盘工作台16具有:在上表面露出的多孔质部件;与该多孔质部件连通的吸引路(未图示);以及与该吸引路的基端侧连接的吸引源(未图示)。
当使该吸引源动作时,对载置于卡盘工作台16上的框架单元7作用负压,从而将框架单元7吸引保持于卡盘工作台16。即,卡盘工作台16的上表面成为保持面16a。在卡盘工作台16的保持面16a的外周侧配设有对框架单元7所包含的框架5进行把持的夹具18。卡盘工作台16能够绕沿着与保持面16a垂直的方向的轴进行旋转。
切削装置2具有X轴移动机构(未图示),该X轴移动机构使卡盘工作台16沿着X轴方向移动。卡盘工作台16在保持着框架单元7的状态下沿X轴方向移动,将框架单元7搬送至对框架单元7所包含的被加工物1实施切削的加工区域。
在行进至该加工区域的路径的上方配设有拍摄相机20。该拍摄相机20对在下方通过的载置于卡盘工作台16的被加工物1进行拍摄。切削装置2对被加工物1的朝向和后述的切削单元22的位置进行调整(对准),以便能够沿着被加工物1的分割预定线对被加工物1进行切削。
在该加工区域的上方配设有对载置于卡盘工作台16的被加工物1进行切削的切削单元22。该切削单元22具有:沿着Y轴方向延伸的主轴26;以及安装于主轴26的前端的环状的切削刀具24。主轴26能够通过电动机等旋转构件(未图示)绕Y轴方向进行旋转。通过使主轴26旋转而能够使切削刀具24旋转。
另外,切削单元22能够通过未图示的升降机构沿着Z轴方向升降,能够通过未图示的进退机构沿着Y轴方向进退。当对被加工物1进行切削时,使切削单元22下降以使切削刀具24的下端的高度位置低于被加工物1的下端的高度位置,一边使切削刀具24旋转一边使卡盘工作台16在X轴方向上移动。于是,切削刀具24切入至被加工物1而对被加工物1进行切削。
在装置基台4的上表面上配设有清洗单元30,该清洗单元30对包含切削后的被加工物1的框架单元7进行清洗。切削装置2具有搬送构件28,该搬送构件28将框架单元7从卡盘工作台16搬送至清洗单元30。清洗单元30具有:清洗工作台32,其载置该框架单元7;以及清洗喷嘴34,其对载置于清洗工作台32的框架单元7提供清洗液而对框架单元7进行清洗。
清洗喷嘴34是管状的部件,其具有:在清洗工作台32的外周侧沿Z轴方向延伸的轴部;从该轴部的上端按照相当于清洗工作台32的中央部的长度延伸的臂部;以及配设于该臂部的前端的喷出口。当在清洗工作台32上载置框架单元7并一边从该喷出口喷出清洗液一边使轴部旋转时,对框架单元7进行清洗。
另外,搬入搬出构件8、搬送构件14以及搬送构件28作为与框架单元7的搬送相关的搬送单元来发挥功能。如图2所示,在盒载置台6a的下部配设有紫外线照射单元40。图2是示意性示出紫外线照射单元40的立体图。被清洗单元30清洗后的框架单元7通过该搬送单元搬送至紫外线照射单元40。
如图2所示,在装置基台4的内部配设有使盒载置台6a和紫外线照射单元40升降的升降机构48。当将框架单元7相对于紫外线照射单元40搬入搬出时,通过升降机构48使紫外线照射单元40在装置基台4的上方露出。
紫外线照射单元40具有:箱状的壳体44,其形成有供框架单元7沿着Y轴方向进行搬入搬出的搬入搬出口44a;以及一对支承框46a,其从壳体44的侧壁的中央附近向内侧突出,沿着Y轴方向延伸。在将壳体44的底壁与侧壁连接起来的角部配设有与支承框46a平行的一对支承框46b。在壳体44的内部的一对支承框46a与一对支承框46b之间的高度位置配设有多个紫外线光源42。
将通过紫外线照射单元40照射紫外线的框架单元7搬入至一对支承框46a上或一对支承框46b上。当将框架单元7搬入至一对支承框46a上时,能够从背面侧对框架单元7照射紫外线。另外,当将框架单元7搬入至一对支承框46b上时,能够从框架单元7的正面侧照射紫外线。
当从框架单元7的背面侧照射紫外线时,能够使框架单元7所包含的粘接带3硬化而降低对被加工物1的粘贴力,从而容易将粘接带3从被加工物1剥离。另外,当从框架单元7的正面侧照射紫外线时,能够使被加工物1的正面侧改质,例如能够使正面亲水性化。
在紫外线照射单元40的壳体44的背面侧配设有移动板56,该移动板56以能够滑动的方式支承于升降机构48。紫外线照射单元40和盒载置部6借助移动板56而支承于升降机构48。该升降机构48具有:沿着Z轴方向延伸的一对导轨50;配设于该一对导轨50之间的滚珠丝杠52;以及与该滚珠丝杠52的下端侧连接而使滚珠丝杠52旋转的脉冲电动机54。
对由升降机构48实现的紫外线照射单元40等的升降进行说明。图3是示意性示出盒载置部6和紫外线照射单元40的剖视图。在移动板56的背面下部配设有与滚珠丝杠52螺合的螺母部。当使脉冲电动机54旋转而使滚珠丝杠52旋转时,对紫外线照射单元40和盒载置部6进行支承的移动板56沿着Z轴方向在上下方向上移动。
图3示出了在将框架单元7搬入至壳体44的支承框46a上时的紫外线照射单元40和搬入搬出构件8的高度位置的关系。当从背面侧对框架单元7照射紫外线的情况下,如图3所示,通过升降机构48使紫外线照射单元40的支承框46a的高度与搬入搬出构件8的高度一致。
被紫外线照射单元40照射了紫外线的框架单元7通过搬入搬出构件8向壳体44的外侧拉出。然后,通过升降机构48使盒9的规定的收纳位置与搬入搬出构件8的高度一致,通过搬入搬出构件8将框架单元7从盒9的搬入搬出口11搬入至该规定的收纳位置。
使用图1进一步对切削装置2进行说明。在切削装置2的装置基台4的上表面的一端配设有对切削装置2输入各种指示等的输入构件36。另外,在装置基台4的上部配设有显示监视器38,该显示监视器38显示切削装置2的处理的行程状况、处理的内容、警告、操作画面等。对切削装置2进行操作的作业者一边确认呈现在显示监视器38中的画面一边通过输入构件36对切削装置2进行操作。
切削装置2还具有控制单元4a,该控制单元4a对切削装置2的包括该切削单元22、该清洗单元30、该紫外线照射单元40以及搬送单元在内的各结构要素进行控制。控制单元4a对盒载置部6、搬送单元、切削单元22、清洗单元30、紫外线照射单元40、升降机构48等输出指令而进行控制。
控制单元4a具有处理模式登记部4b,该处理模式登记部4b登记有在切削装置2所能够对框架单元7实施的多种处理中分别由控制单元4a对该各结构要素输出的指令。控制单元4a从处理模式登记部4b获取与对框架单元7实施的处理相对应的指令,并将该指令输出至该各结构要素。
在处理模式登记部4b中除了与利用切削单元22对框架单元7所包含的被加工物1进行切削的处理相关的指令以外,还登记有与其他处理相关的指令。例如登记有与不对被加工物1进行切削而对框架单元7照射紫外线的处理相关的指令、与不对被加工物1进行切削而对框架单元7进行清洗的处理相关的指令等。
以往的切削装置是出于对被加工物进行切削的目的而设计的,搭载于切削装置的紫外线照射单元对包含被切削单元切削后的被加工物的框架单元进行处理。即,未进行用于如下用途的设计:对未被该切削装置切削而被其他切削装置切削后的被加工物或未实施切削的被加工物等实施紫外线的照射。
因此,使搭载有紫外线照射单元的以往的切削装置仅适当地实施针对框架单元的紫外线的照射并不容易,当强行进行这样的紫外线的照射时,有可能在切削装置中产生不能预期的不良情况等。
与此相对,在本实施方式的切削装置2中,在控制单元4a中具有处理模式登记部4b,在该处理模式登记部4b中登记有仅实施紫外线的照射的紫外线照射装置模式等中的指令的内容。并且,控制单元4a从处理模式登记部4b获取该指令,并将该指令输出至各结构要素。因此,切削装置2能够作为紫外线照射装置发挥功能,能够对包含未被该切削装置2切削的被加工物1的框架单元7适当地实施紫外线的照射。
对登记在处理模式登记部4b中的指令的一例进行说明。图4的(A)是对切削装置模式进行说明的流程,图4的(B)是示意性示出紫外线照射装置模式的流程,图4的(C)是示意性示出清洗装置模式的流程。
首先,使用图4的(A)对切削装置模式下的指令进行说明。切削装置模式是指使切削装置2作为切削装置发挥功能的模式,实施基于切削单元22的切削、基于清洗单元30的清洗、以及基于紫外线照射单元40的紫外线的照射。
在切削装置模式下,控制单元4a首先对升降机构48和搬入搬出构件8进行控制而将框架单元7从盒9中搬出。然后,对对位构件12和搬送构件14进行控制而将框架单元7载置于卡盘工作台16的保持面16a上,使框架单元7保持于卡盘工作台16。接着,对X轴移动机构和切削单元22进行控制而利用该切削单元22对该框架单元7所包含的被加工物1进行切削。
然后,对搬送构件28进行控制而将框架单元7从卡盘工作台16搬送至清洗工作台32,对清洗单元30进行控制而对被加工物1进行清洗。另外,对升降构件48、搬送构件14以及搬入搬出构件8进行控制而将框架单元7搬入至紫外线照射单元40,对紫外线照射单元40进行控制而对框架单元7照射紫外线。然后,对升降构件48和搬入搬出构件8进行控制而将包含切削后的被加工物1的框架单元7搬入至盒9中。
当使切削装置2作为切削装置发挥功能时,控制单元4a从处理模式登记部4b获取与切削装置模式相对应的指令,并将该指令输出至各结构要素。
另外,也可以是,在切削装置模式下,在将框架单元7载置于卡盘工作台16的保持面16a上之前,对框架单元7的正面侧照射紫外线而使被加工物1亲水性化。在该情况下,通过对升降机构48和搬入搬出构件8进行控制而将框架单元7搬入至紫外线照射单元40的一对支承框46b上,从而能够对该正面侧照射紫外线。
在对被加工物1的正面照射紫外线并对被加工物1进行切削、清洗之后,当再次将框架单元7搬入至紫外线照射单元40时,将框架单元7搬入至支承框46a上,从背面侧对框架单元7照射紫外线。在处理模式登记部4b中,作为与切削装置模式相对应的指令,可以登记有在对被加工物1进行切削之前对被加工物1的正面侧照射紫外线的指令。
使用图4的(B)对紫外线照射装置模式下的指令进行说明。紫外线照射装置模式是指使切削装置2作为紫外线照射装置发挥功能的模式,实施基于紫外线照射单元40的紫外线的照射。
在紫外线照射装置模式下,控制单元4a首先对升降机构48和搬入搬出构件8进行控制而将框架单元7从盒9中搬出。然后,对升降机构48进行控制而使紫外线照射单元40上升,对搬入搬出构件8进行控制而将框架单元7搬入至壳体44中,对紫外线照射单元40进行控制而对框架单元7照射紫外线。
然后,对搬入搬出构件8进行控制而将框架单元7从紫外线照射单元40搬出,对升降机构48进行控制而使紫外线照射单元40下降,对搬入搬出构件8进行控制而将照射了紫外线的框架单元7搬入至盒9中。
当使切削装置2作为紫外线照射装置发挥功能时,控制单元4a从处理模式登记部4b获取与紫外线照射装置模式相对应的指令,并将该指令输出至各结构要素。另外,在紫外线照射装置模式下,框架单元7所包含的被加工物1未被切削单元22切削。
这里,在紫外线照射装置模式下,当将框架单元7搬入至紫外线照射单元40时,可以将框架单元7搬入至一对支承框46a上,也可以将框架单元7搬入至一对支承框46b上。当将框架单元7搬入至一对支承框46a上时,能够从背面侧对框架单元7照射紫外线,当将框架单元7搬入至一对支承框46b上时,能够从正面侧对框架单元7照射紫外线。
在处理模式登记部4b中,作为与紫外线照射装置模式相对应的指令,登记有将框架单元7搬入至一对支承框46a和一对支承框46b中的至少一方上并对框架单元7照射紫外线的指令。
另外,切削装置2还能够作为仅实施基于清洗单元30的清洗的清洗装置发挥功能。使用图4的(C)对清洗装置模式下的指令进行说明。在清洗装置模式下,实施基于清洗单元30的清洗。
在清洗装置模式下,控制单元4a首先对升降机构48和搬入搬出构件8进行控制而将框架单元7从盒9中搬出。然后,对搬送单元进行控制而将框架单元7搬送至清洗单元30。然后,对清洗单元30进行控制而对框架单元7进行清洗,对搬送单元进行控制而将清洗后的框架单元7从清洗单元30搬送至盒9中。
当使切削装置2作为清洗装置发挥功能时,控制单元4a从处理模式登记部4b获取与清洗装置模式相对应的指令,并将该指令输出至各结构要素。另外,在清洗装置模式下,框架单元7所包含的被加工物1未被切削单元22切削。
如以上所说明的那样,在本实施方式的切削装置2中,在处理模式登记部4b中登记有与各种处理相对应的指令,控制单元4a将该指令输出至各结构要素,因此能够适当地实施切削以外的处理。因此,根据本实施方式,提供能够作为紫外线照射装置和清洗装置发挥功能的切削装置2。
另外,本发明并不限于上述实施方式的记载,可以进行各种变更并实施。例如在上述实施方式中,对控制单元4a对各结构要素进行控制而分别实施各模式的情况进行了说明,但本发明的一个方式不限于此。例如也可以是,控制单元4a按照同时实施两个以上的模式的方式对各结构要素进行控制。
例如也可以是,切削装置2在对第1被加工物按照切削装置模式实施处理的期间,对第2被加工物按照紫外线照射装置模式实施处理。更具体而言,也可以是,控制单元4a在利用切削单元22对第1被加工物进行切削的期间,将第2被加工物搬入至紫外线照射单元40而对第2被加工物照射紫外线。在该情况下,通过切削装置2进行处理的效率极高。
除此以外,上述实施方式的构造、方法等只要不脱离本发明的目的的范围,则可以适当变更并实施。
Claims (2)
1.一种切削装置,其具有:
卡盘工作台,其对框架单元进行保持,该框架单元包含环状的框架、粘贴于该环状的框架的粘接带以及该粘接带所粘贴的被加工物,该粘接带的粘接力通过紫外线的照射而降低;
切削单元,其利用切削刀具对保持于该卡盘工作台的该框架单元所包含的该被加工物进行切削;
清洗单元,其对包含被该切削单元切削后的该被加工物的该框架单元进行清洗;
紫外线照射单元,其对该框架单元的该粘接带照射紫外线;
盒载置部,其载置能够收纳该框架单元的盒;
搬送单元,其在载置于该盒载置部的该盒、该卡盘工作台、该清洗单元以及该紫外线照射单元之间对该框架单元进行搬送;以及
控制单元,其对包括该切削单元、该清洗单元、该紫外线照射单元以及搬送单元在内的各结构要素进行控制,
该切削装置的特征在于,
该控制单元具有处理模式登记部,该处理模式登记部登记有在能够对该框架单元实施的多种处理中分别由该控制单元输出至该各结构要素的指令,
在该处理模式登记部中登记有:
切削装置模式下的指令,该指令使该切削单元对从该盒中搬出并保持于该卡盘工作台的该框架单元所包含的被加工物进行切削,使搬送单元对包含切削后的被加工物的该框架单元进行搬送而搬入至该盒中;以及
紫外线照射装置模式下的指令,该指令不使该切削单元对从该盒中搬出的该框架单元所包含的被加工物进行切削,而使该紫外线照射单元对该框架单元照射该紫外线,使搬送单元对被照射了紫外线的该框架单元进行搬送而搬入至该盒中,
该控制单元具有如下的功能:从处理模式登记部获取与对该框架单元实施的处理相对应的指令,并将该指令输出至该各结构要素。
2.根据权利要求1所述的切削装置,其特征在于,
在该处理模式登记部中还登记有清洗装置模式下的指令,该指令不使该切削单元对从该盒中搬出的该框架单元进行切削,而使该清洗单元对该框架单元进行清洗,使搬送单元对清洗后的该框架单元进行搬送而搬入至该盒中。
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DE102019203699A1 (de) | 2019-09-26 |
US20190295850A1 (en) | 2019-09-26 |
CN110303607B (zh) | 2022-08-30 |
US10950451B2 (en) | 2021-03-16 |
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