[go: up one dir, main page]

NO20040756L - Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller - Google Patents

Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Info

Publication number
NO20040756L
NO20040756L NO20040756A NO20040756A NO20040756L NO 20040756 L NO20040756 L NO 20040756L NO 20040756 A NO20040756 A NO 20040756A NO 20040756 A NO20040756 A NO 20040756A NO 20040756 L NO20040756 L NO 20040756L
Authority
NO
Norway
Prior art keywords
traceability
wafers
solar cells
establishing compliance
compliance
Prior art date
Application number
NO20040756A
Other languages
English (en)
Norwegian (no)
Other versions
NO20040756D0 (no
Inventor
Erik Sauar
Thor Christian Tuv
Original Assignee
Renewable Energy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renewable Energy Corp filed Critical Renewable Energy Corp
Priority to NO20040756A priority Critical patent/NO20040756L/no
Publication of NO20040756D0 publication Critical patent/NO20040756D0/no
Priority to US10/598,123 priority patent/US7920738B2/en
Priority to CNB2005800051604A priority patent/CN100549680C/zh
Priority to PCT/NO2005/000061 priority patent/WO2005080950A1/en
Priority to JP2006554043A priority patent/JP2007523489A/ja
Priority to DE112005000410.4T priority patent/DE112005000410B4/de
Publication of NO20040756L publication Critical patent/NO20040756L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00—Manufacture or treatment of devices covered by this subclass
    • H10F71/121—The active layers comprising only Group IV materials
    • H10F71/1221—The active layers comprising only Group IV materials comprising polycrystalline silicon
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/546—Polycrystalline silicon PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photovoltaic Devices (AREA)
NO20040756A 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller NO20040756L (no)

Priority Applications (6)

Application Number Priority Date Filing Date Title
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller
US10/598,123 US7920738B2 (en) 2004-02-20 2005-02-18 Establishing correspondence and traceability between wafers and solar cells
CNB2005800051604A CN100549680C (zh) 2004-02-20 2005-02-18 用于生产太阳能电池的方法和系统
PCT/NO2005/000061 WO2005080950A1 (en) 2004-02-20 2005-02-18 Establishing correspondence and traceability between wafers and solar cells
JP2006554043A JP2007523489A (ja) 2004-02-20 2005-02-18 ウェハと太陽電池セルとの間の対応およびトレーサビリティの確立
DE112005000410.4T DE112005000410B4 (de) 2004-02-20 2005-02-18 Verfahren und System zum Einrichten einer Entsprechung und einer Rückverfolgbarkeit zwischen Wafern und Solarzellen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Publications (2)

Publication Number Publication Date
NO20040756D0 NO20040756D0 (no) 2004-02-20
NO20040756L true NO20040756L (no) 2005-08-22

Family

ID=34793440

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Country Status (6)

Country Link
US (1) US7920738B2 (zh)
JP (1) JP2007523489A (zh)
CN (1) CN100549680C (zh)
DE (1) DE112005000410B4 (zh)
NO (1) NO20040756L (zh)
WO (1) WO2005080950A1 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008294364A (ja) * 2007-05-28 2008-12-04 Sanyo Electric Co Ltd 太陽電池モジュール及びその製造方法
WO2009026661A1 (en) * 2007-08-30 2009-03-05 Bt Imaging Pty Ltd Photovoltaic cell manufacturing
WO2010112614A1 (de) * 2009-04-03 2010-10-07 Singulus Technologies Ag Verfahren und vorrichtung zur identifizierung von gegenständen sowie zum verfolgen von gegenständen in einem produktionsprozess
US20100300259A1 (en) * 2009-05-29 2010-12-02 Applied Materials, Inc. Substrate side marking and identification
US8768040B2 (en) * 2011-01-14 2014-07-01 Varian Semiconductor Equipment Associates, Inc. Substrate identification and tracking through surface reflectance
DE102012213793B3 (de) 2012-08-03 2013-10-24 Solarworld Innovations Gmbh Untersuchung eines Siliziumsubstrats für eine Solarzelle
US9754365B2 (en) 2014-02-21 2017-09-05 Applied Materials, Inc. Wafer inspection method and software
DE112018000764T5 (de) * 2017-02-10 2019-12-19 Kla-Tencor Corporation Identifizierung von prozessvariationen während der herstellung von produkten
JP6431643B1 (ja) * 2018-03-30 2018-11-28 日新製鋼株式会社 金属板の表面欠陥検査方法および表面欠陥検査装置
CN112071952B (zh) * 2020-08-31 2022-03-22 泰州隆基乐叶光伏科技有限公司 一种硅片的制作方法及电池片、光伏组件

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4256681A (en) * 1976-12-16 1981-03-17 Semix Incorporated Method of producing semicrystalline silicon
JPH0677509A (ja) * 1992-08-25 1994-03-18 Sanyo Electric Co Ltd 太陽電池に於けるセル識別方式
US5757474A (en) * 1993-05-10 1998-05-26 Midwest Research Institute System for characterizing semiconductor materials and photovoltaic devices through calibration
JPH0722635A (ja) 1993-06-28 1995-01-24 Sanyo Electric Co Ltd 多結晶太陽電池識別方法
JP3491977B2 (ja) 1994-07-29 2004-02-03 キヤノン株式会社 多結晶シリコン太陽電池
JP2943673B2 (ja) 1995-10-31 1999-08-30 日本電気株式会社 半導体基板の製造装置及び製造方法
US5716459A (en) * 1995-12-13 1998-02-10 Hughes Aircraft Company Monolithically integrated solar cell microarray and fabrication method
DE69738979D1 (de) 1996-03-19 2008-10-23 Hitachi Ltd Prozesssteuerungssystem
JP3213563B2 (ja) 1997-03-11 2001-10-02 株式会社スーパーシリコン研究所 ノッチレスウェーハの製造方法
JP3819993B2 (ja) 1997-05-23 2006-09-13 株式会社ルネサステクノロジ ウエハ検査装置
WO2000002236A2 (en) 1998-07-07 2000-01-13 Memc Electronic Materials, Inc. Radio frequency identification system and method for tracking silicon wafers
US6140140A (en) * 1998-09-16 2000-10-31 Advanced Micro Devices, Inc. Method for detecting process sensitivity to integrated circuit layout by compound processing
US6482661B1 (en) * 2000-03-09 2002-11-19 Intergen, Inc. Method of tracking wafers from ingot
JP2001313274A (ja) 2000-04-28 2001-11-09 Nippei Toyama Corp ウエーハの回収方法
GB0107618D0 (en) * 2001-03-27 2001-05-16 Aoti Operating Co Inc Detection and classification of micro-defects in semi-conductors
US7065239B2 (en) * 2001-10-24 2006-06-20 Applied Materials, Inc. Automated repetitive array microstructure defect inspection
JP2003243675A (ja) 2002-02-19 2003-08-29 Kyocera Corp 太陽電池用多結晶シリコンウエハおよびその製造方法
US7144457B1 (en) * 2002-03-21 2006-12-05 Takeda San Diego, Inc. Methods and devices for analyzing crystalline content of precipitates and crystals without isolation

Also Published As

Publication number Publication date
JP2007523489A (ja) 2007-08-16
CN1922472A (zh) 2007-02-28
DE112005000410B4 (de) 2018-05-09
DE112005000410T5 (de) 2007-01-11
US20080160648A1 (en) 2008-07-03
CN100549680C (zh) 2009-10-14
NO20040756D0 (no) 2004-02-20
US7920738B2 (en) 2011-04-05
WO2005080950A1 (en) 2005-09-01

Similar Documents

Publication Publication Date Title
DK2264856T3 (da) Metode og anordning til levering af afbrydelsesfri effekt
PL372419A1 (pl) Układ podtrzymujący do płyt ogniw słonecznych
DK1500206T3 (da) System og fremgangsmåde til styring af trådløse apparater i en virksomhed
DK1628749T3 (da) Anordninger og fremgangsmåder til biomateriel produktion
DK1815559T3 (da) Forbindelsesorgan med en ledende del og fremgangsmåde til brug heraf
EP1962329A4 (en) SUBSTRATE SUPPORT DEVICE, EXPOSURE DEVICE, EXPOSURE METHOD, AND DEVICE MANUFACTURING METHOD
TWI371073B (en) Wafer inspection system and a method for translating wafers
IS7992A (is) Dýralaus frumuræktunar aðferð
DK1806030T3 (da) System og fremgangsmåde til adaptiv mikrofontilpasning i et høreapparat
GB2416908B (en) Array substrate for lcd and fabrication method thereof
EP1829642A4 (en) METHOD AND SYSTEM FOR PRODUCTION OF COMPARTMENT
EP1517387A4 (en) ELECTROLYTE SUPPORT FOR FUEL CELL, PROCESS FOR PRODUCING THE SAME, AND FUEL CELL OBTAINED
NO20053897D0 (no) Sustem og fremgangsmate for automatisert plattformgenerering
NO20040756L (no) Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller
IL180271A0 (en) Method and system for power generation
TWI372439B (en) Semiconductor wafer positioning method, and apparatus using the same
FI20020565A7 (fi) Kennorakenne, laite ja menetelmä
NO20044012D0 (no) Fremgangsmate og et system
GB0423670D0 (en) System and method for testing a cell
DE10393702D2 (de) Verfahren zum Hertstellen einer Speicherzelle, Speicherzelle und Speicherzellen-Anordnung
NO20055042L (no) System og fremgangsmate for avfallshandtering
GB0414742D0 (en) Method and system for test case generation
DE502004012360D1 (de) Halbleiterspeicherzelle sowie zugehöriges herstellungsverfahren
AU2003290114A8 (en) Device and method for parallel, automated cultivation of cells in technical conditions
EP1806577A4 (en) DEVICE AND METHOD FOR INSPECTING SCRATCHES ON OUTER CELL BODIES

Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application