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KR970021370A - 플라즈마 cvd장치 및 방법과 드라이에칭장치 및 방법 - Google Patents

플라즈마 cvd장치 및 방법과 드라이에칭장치 및 방법 Download PDF

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KR970021370A
KR970021370A KR1019960038776A KR19960038776A KR970021370A KR 970021370 A KR970021370 A KR 970021370A KR 1019960038776 A KR1019960038776 A KR 1019960038776A KR 19960038776 A KR19960038776 A KR 19960038776A KR 970021370 A KR970021370 A KR 970021370A
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료키 도베
마사오 사사키
아츠시 세키구치
겐이치 다카기
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니시히라 슌지
아네루바 가부시키가이샤
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    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
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Abstract

플라즈마발생전극과 플라즈마와 처리실내벽의 상대전위관계를 최적으로 하여 시간경과에 따른 변화가 매우적은 안정된 저압고밀도 플라즈마를 얻는다.
1턴 루프형상을 한 플라즈마발생전극(61)의 한쪽의 도입단자(62)를 고주파전원(52)에 접속하고, 다른쪽 도입단자(63)를 제1콘덴서(81)를 통하여 접지한다. 사염화티탄을 매분 20밀리리터, 수소가스를 매분 30밀리리터, 질소가스를 매분 10밀리리터의 유량으로 처리실(20)에 도입하고, 처리실(20)내의 압력을 약 1Pa로 설정하고, 기체(21)온도를 450℃∼600℃로 설정한다. 고주파전원(5)의 출력을 2.5kW로 하여 저압고밀도의 플라즈마를 발생시키면, 질화티탄의 막이 매분 약 30nm의 속도로 퇴적한다.

Description

플라즈마 CVD장치 및 방법과 드라이에칭장치 및 방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발명의 플라즈마 CVD장치의 1실시형태의 구성도,
제2도는 가스도입기구의 구성도,
제3도는 플라즈마 발생전극의 평면도,
제4도는 절연링의 일부를 절단한 사시도.

Claims (35)

  1. 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
  2. 제1항에 있어서, 상기 전극전위제어기구는 제1콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  3. 제1항에 있어서, 상기 전극전위제어기구는 상기 다른쪽 단자와 어스 사이에 접속된 제1콘덴서와, 상기 다른쪽 단자와 상기 제1콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  4. 제1항에 있어서, 상기 내벽전위제어기구는 제2콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  5. 제1항에 있어서, 상기 내벽전위제어기구는 처리실과 어스 사이에 접속된 제2콘덴서와, 처리실과 상기 제2콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  6. 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리 실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
  7. 제6항에 있어서, 상기 전극전위제어기구는 제1콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  8. 제6항에 있어서, 상기 전극전위제어기구는 상기 다른쪽 단자와 어스 사이에 접속된 제1콘덴서와, 상기 다른쪽 단자와 상기 제1콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  9. 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
  10. 제9항에 있어서, 상기 내벽전위제어기구는 제2콘덴서를 구비하는 것을 특징으로 하는 플라즈아 CVD장치.
  11. 제9항에 있어서, 상기 내벽전위제어기구는 처리실과 어스 사이에 접속된 제2콘덴서와, 처리실과 상기제2콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
  12. 제2항, 제3항, 제7항 및 제8항중의 어느 1항에 있어서, 상기 제1콘덴서의 정전용량은 100pF∼10μF인 것을 특징으로 하는 플라즈마 CVD장치.
  13. 제2항, 제3항, 제7항 및 제8항중의 어느 1항에 있어서, 상기 제1콘덴서는 가변콘덴서인 것을 특징으로 하는 플라즈마 CVD장치.
  14. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면은 도전체인 것을 특징으로하는 플라즈마 CVD장치.
  15. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 실질적으로 1턴의 코일인 것을 특징으로 하는 플라즈마 CVD장치.
  16. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1주 이상 감긴코일인 것을 특징으로 하는 플라즈마 CVD장치.
  17. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1평면내에서 와류형상으로 감겨있는 것을 특징으로 하는 플라즈마 CVD장치.
  18. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1개의 직선상 막대인 것을 특징으로 하는 플라즈마 CVD장치.
  19. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 2개 이상의 직선상 막대를 병렬로 나열한 것임을 특징으로 하는 플라즈마 CVD장치.
  20. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1매의 평판상 판인 것을 특징으로 하는 플라즈마 CVD장치.
  21. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 그 내부가 유체로 냉각되는 것을 특징으로 하는 플라즈마 CVD장치.
  22. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면재질이 기체상에 퇴적할 박막 재질과 같은 것을 특징으로 하는 플라즈마 CVD장치.
  23. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면재질이 기체상에 퇴적할 박막 조성의 일부인 것을 특징으로 하는 플라즈마 CVD장치.
  24. 제1항 내지 제11항중의 어느 1항에 있어서, 멀티커스프자장을 상기 처리실 내부에 발생시킬 수 있는 멀티커스프 자장발생기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
  25. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 배기기구가 상기 처리실내의 압력을 일정하게 제어하는 압력제어기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
  26. 제1항 내지 제11항중의 어느 1항에 있어서, 상기 기체에 바이어스전압을 인가하기 위한 바이어스인가기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
  27. 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
  28. 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
  29. 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
  30. 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하며 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
  31. 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
  32. 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
  33. 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭방법.
  34. 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 드라이에칭방법.
  35. 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019960038776A 1995-10-11 1996-09-07 플라즈마 cvd장치 및 방법과 드라이에칭장치 및 방법 KR100232040B1 (ko)

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Families Citing this family (202)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW403959B (en) * 1996-11-27 2000-09-01 Hitachi Ltd Plasma treatment device
KR100560049B1 (ko) * 1997-05-10 2006-05-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 성막방법
DE19826259A1 (de) * 1997-06-16 1998-12-17 Bosch Gmbh Robert Verfahren und Einrichtung zum Vakuumbeschichten eines Substrates
JP4340348B2 (ja) * 1998-01-22 2009-10-07 株式会社日立国際電気 プラズマ生成装置
JPH11317299A (ja) * 1998-02-17 1999-11-16 Toshiba Corp 高周波放電方法及びその装置並びに高周波処理装置
US6171661B1 (en) * 1998-02-25 2001-01-09 Applied Materials, Inc. Deposition of copper with increased adhesion
US6237526B1 (en) 1999-03-26 2001-05-29 Tokyo Electron Limited Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
US6474258B2 (en) 1999-03-26 2002-11-05 Tokyo Electron Limited Apparatus and method for improving plasma distribution and performance in an inductively coupled plasma
JP4249843B2 (ja) 1999-04-12 2009-04-08 憲一 高木 プラズマ処理装置
US6444556B2 (en) * 1999-04-22 2002-09-03 Micron Technology, Inc. Chemistry for chemical vapor deposition of titanium containing films
US6318381B1 (en) 1999-07-13 2001-11-20 Micron Technology, Inc. Methods of cleaning vaporization surfaces
US6201208B1 (en) * 1999-11-04 2001-03-13 Wisconsin Alumni Research Foundation Method and apparatus for plasma processing with control of ion energy distribution at the substrates
KR100757717B1 (ko) * 2000-04-13 2007-09-11 도꾸리쯔교세이호진 상교기쥬쯔 소고겡뀨죠 박막 형성 방법, 박막 형성 장치 및 태양전지
KR100552641B1 (ko) * 2000-04-27 2006-02-20 가부시끼가이샤 히다치 세이사꾸쇼 플라즈마처리장치 및 플라즈마처리방법
US6857387B1 (en) * 2000-05-03 2005-02-22 Applied Materials, Inc. Multiple frequency plasma chamber with grounding capacitor at cathode
ES2336303T3 (es) 2000-05-17 2010-04-12 Ihi Corporation Aparato y procedimiento de cvd por plasma.
US6494998B1 (en) 2000-08-30 2002-12-17 Tokyo Electron Limited Process apparatus and method for improving plasma distribution and performance in an inductively coupled plasma using an internal inductive element
JP2002105641A (ja) * 2000-10-03 2002-04-10 Murakami Corp 複合材およびその製造方法
JP4770029B2 (ja) * 2001-01-22 2011-09-07 株式会社Ihi プラズマcvd装置及び太陽電池の製造方法
JP4819244B2 (ja) * 2001-05-15 2011-11-24 東京エレクトロン株式会社 プラズマ処理装置
US20030041970A1 (en) * 2001-08-29 2003-03-06 Tokyo Electron Limited Wafer processing machine
US20030087488A1 (en) * 2001-11-07 2003-05-08 Tokyo Electron Limited Inductively coupled plasma source for improved process uniformity
US6869880B2 (en) * 2002-01-24 2005-03-22 Applied Materials, Inc. In situ application of etch back for improved deposition into high-aspect-ratio features
JP3847184B2 (ja) * 2002-03-14 2006-11-15 東京エレクトロン株式会社 プラズマ処理装置
JP3897620B2 (ja) 2002-03-14 2007-03-28 三菱重工業株式会社 高周波電力供給構造およびそれを備えたプラズマcvd装置
JP4013674B2 (ja) * 2002-07-11 2007-11-28 松下電器産業株式会社 プラズマドーピング方法及び装置
US7186663B2 (en) * 2004-03-15 2007-03-06 Sharp Laboratories Of America, Inc. High density plasma process for silicon thin films
AU2003304125A1 (en) * 2002-12-18 2004-12-03 Cardinal Cg Company Plasma-enhanced film deposition
US7767056B2 (en) * 2003-01-14 2010-08-03 Canon Anelva Corporation High-frequency plasma processing apparatus
US20050067934A1 (en) * 2003-09-26 2005-03-31 Ishikawajima-Harima Heavy Industries Co., Ltd. Discharge apparatus, plasma processing method and solar cell
JP2005167019A (ja) * 2003-12-03 2005-06-23 Sharp Corp トランジスタおよびそのゲート絶縁膜の成膜に用いるcvd装置
US8357242B2 (en) * 2007-05-03 2013-01-22 Jewett Russell F Crystalline film devices, apparatuses for and methods of fabrication
JP4523352B2 (ja) * 2004-07-20 2010-08-11 株式会社日立ハイテクノロジーズ プラズマ処理装置
US8251012B2 (en) 2005-03-01 2012-08-28 Hitachi Kokusai Electric Inc. Substrate processing apparatus and semiconductor device producing method
WO2006099190A2 (en) * 2005-03-11 2006-09-21 Perkinelmer, Inc. Plasmas and methods of using them
US7780814B2 (en) * 2005-07-08 2010-08-24 Applied Materials, Inc. Wafer pre-clean reactor cable termination for selective suppression/reflection of source and bias frequency cross products
JP4674177B2 (ja) * 2006-03-15 2011-04-20 株式会社日立ハイテクノロジーズ プラズマ処理装置
US7524750B2 (en) 2006-04-17 2009-04-28 Applied Materials, Inc. Integrated process modulation (IPM) a novel solution for gapfill with HDP-CVD
US7939422B2 (en) * 2006-12-07 2011-05-10 Applied Materials, Inc. Methods of thin film process
US20080142483A1 (en) * 2006-12-07 2008-06-19 Applied Materials, Inc. Multi-step dep-etch-dep high density plasma chemical vapor deposition processes for dielectric gapfills
JP2009170509A (ja) * 2008-01-11 2009-07-30 Hitachi High-Technologies Corp ヒータ内蔵静電チャックを備えたプラズマ処理装置
JP5297048B2 (ja) * 2008-01-28 2013-09-25 三菱重工業株式会社 プラズマ処理方法及びプラズマ処理装置
US9324576B2 (en) 2010-05-27 2016-04-26 Applied Materials, Inc. Selective etch for silicon films
TWI554630B (zh) * 2010-07-02 2016-10-21 應用材料股份有限公司 減少沉積不對稱性的沉積設備及方法
US8741778B2 (en) 2010-12-14 2014-06-03 Applied Materials, Inc. Uniform dry etch in two stages
US10283321B2 (en) 2011-01-18 2019-05-07 Applied Materials, Inc. Semiconductor processing system and methods using capacitively coupled plasma
US8771539B2 (en) 2011-02-22 2014-07-08 Applied Materials, Inc. Remotely-excited fluorine and water vapor etch
US9064815B2 (en) 2011-03-14 2015-06-23 Applied Materials, Inc. Methods for etch of metal and metal-oxide films
US8999856B2 (en) 2011-03-14 2015-04-07 Applied Materials, Inc. Methods for etch of sin films
CN102820204A (zh) * 2011-06-07 2012-12-12 中国科学院微电子研究所 一种射频、介质阻挡常压辉光等离子体扫描去胶系统
US8497211B2 (en) 2011-06-24 2013-07-30 Applied Materials, Inc. Integrated process modulation for PSG gapfill
US8771536B2 (en) 2011-08-01 2014-07-08 Applied Materials, Inc. Dry-etch for silicon-and-carbon-containing films
US8679982B2 (en) 2011-08-26 2014-03-25 Applied Materials, Inc. Selective suppression of dry-etch rate of materials containing both silicon and oxygen
US8679983B2 (en) 2011-09-01 2014-03-25 Applied Materials, Inc. Selective suppression of dry-etch rate of materials containing both silicon and nitrogen
US8927390B2 (en) 2011-09-26 2015-01-06 Applied Materials, Inc. Intrench profile
US8808563B2 (en) 2011-10-07 2014-08-19 Applied Materials, Inc. Selective etch of silicon by way of metastable hydrogen termination
WO2013070436A1 (en) 2011-11-08 2013-05-16 Applied Materials, Inc. Methods of reducing substrate dislocation during gapfill processing
US9267739B2 (en) 2012-07-18 2016-02-23 Applied Materials, Inc. Pedestal with multi-zone temperature control and multiple purge capabilities
US9373517B2 (en) 2012-08-02 2016-06-21 Applied Materials, Inc. Semiconductor processing with DC assisted RF power for improved control
US8912976B2 (en) * 2012-09-12 2014-12-16 Varian Semiconductor Equipment Associates, Inc. Internal RF antenna with dielectric insulation
US9034770B2 (en) 2012-09-17 2015-05-19 Applied Materials, Inc. Differential silicon oxide etch
US9023734B2 (en) 2012-09-18 2015-05-05 Applied Materials, Inc. Radical-component oxide etch
US9390937B2 (en) 2012-09-20 2016-07-12 Applied Materials, Inc. Silicon-carbon-nitride selective etch
US9132436B2 (en) 2012-09-21 2015-09-15 Applied Materials, Inc. Chemical control features in wafer process equipment
US8765574B2 (en) 2012-11-09 2014-07-01 Applied Materials, Inc. Dry etch process
US8969212B2 (en) 2012-11-20 2015-03-03 Applied Materials, Inc. Dry-etch selectivity
US8980763B2 (en) 2012-11-30 2015-03-17 Applied Materials, Inc. Dry-etch for selective tungsten removal
US9064816B2 (en) 2012-11-30 2015-06-23 Applied Materials, Inc. Dry-etch for selective oxidation removal
US9111877B2 (en) 2012-12-18 2015-08-18 Applied Materials, Inc. Non-local plasma oxide etch
US8921234B2 (en) 2012-12-21 2014-12-30 Applied Materials, Inc. Selective titanium nitride etching
US10256079B2 (en) 2013-02-08 2019-04-09 Applied Materials, Inc. Semiconductor processing systems having multiple plasma configurations
US9362130B2 (en) 2013-03-01 2016-06-07 Applied Materials, Inc. Enhanced etching processes using remote plasma sources
US9040422B2 (en) 2013-03-05 2015-05-26 Applied Materials, Inc. Selective titanium nitride removal
US8801952B1 (en) 2013-03-07 2014-08-12 Applied Materials, Inc. Conformal oxide dry etch
US10170282B2 (en) 2013-03-08 2019-01-01 Applied Materials, Inc. Insulated semiconductor faceplate designs
US9209032B2 (en) 2013-03-15 2015-12-08 Tokyo Electron Limited Electric pressure systems for control of plasma properties and uniformity
US20140271097A1 (en) 2013-03-15 2014-09-18 Applied Materials, Inc. Processing systems and methods for halide scavenging
US8895449B1 (en) 2013-05-16 2014-11-25 Applied Materials, Inc. Delicate dry clean
US9114438B2 (en) 2013-05-21 2015-08-25 Applied Materials, Inc. Copper residue chamber clean
US9493879B2 (en) 2013-07-12 2016-11-15 Applied Materials, Inc. Selective sputtering for pattern transfer
US9773648B2 (en) 2013-08-30 2017-09-26 Applied Materials, Inc. Dual discharge modes operation for remote plasma
US8956980B1 (en) 2013-09-16 2015-02-17 Applied Materials, Inc. Selective etch of silicon nitride
US8951429B1 (en) 2013-10-29 2015-02-10 Applied Materials, Inc. Tungsten oxide processing
US9236265B2 (en) 2013-11-04 2016-01-12 Applied Materials, Inc. Silicon germanium processing
US9576809B2 (en) 2013-11-04 2017-02-21 Applied Materials, Inc. Etch suppression with germanium
US9520303B2 (en) 2013-11-12 2016-12-13 Applied Materials, Inc. Aluminum selective etch
US9245762B2 (en) 2013-12-02 2016-01-26 Applied Materials, Inc. Procedure for etch rate consistency
US9117855B2 (en) 2013-12-04 2015-08-25 Applied Materials, Inc. Polarity control for remote plasma
US9287095B2 (en) 2013-12-17 2016-03-15 Applied Materials, Inc. Semiconductor system assemblies and methods of operation
US9263278B2 (en) 2013-12-17 2016-02-16 Applied Materials, Inc. Dopant etch selectivity control
US9190293B2 (en) 2013-12-18 2015-11-17 Applied Materials, Inc. Even tungsten etch for high aspect ratio trenches
US9287134B2 (en) 2014-01-17 2016-03-15 Applied Materials, Inc. Titanium oxide etch
US9396989B2 (en) 2014-01-27 2016-07-19 Applied Materials, Inc. Air gaps between copper lines
US9293568B2 (en) 2014-01-27 2016-03-22 Applied Materials, Inc. Method of fin patterning
US9385028B2 (en) 2014-02-03 2016-07-05 Applied Materials, Inc. Air gap process
US9499898B2 (en) 2014-03-03 2016-11-22 Applied Materials, Inc. Layered thin film heater and method of fabrication
US9299575B2 (en) 2014-03-17 2016-03-29 Applied Materials, Inc. Gas-phase tungsten etch
US9299537B2 (en) 2014-03-20 2016-03-29 Applied Materials, Inc. Radial waveguide systems and methods for post-match control of microwaves
US9299538B2 (en) 2014-03-20 2016-03-29 Applied Materials, Inc. Radial waveguide systems and methods for post-match control of microwaves
US9136273B1 (en) 2014-03-21 2015-09-15 Applied Materials, Inc. Flash gate air gap
US9903020B2 (en) 2014-03-31 2018-02-27 Applied Materials, Inc. Generation of compact alumina passivation layers on aluminum plasma equipment components
US9269590B2 (en) 2014-04-07 2016-02-23 Applied Materials, Inc. Spacer formation
US9309598B2 (en) 2014-05-28 2016-04-12 Applied Materials, Inc. Oxide and metal removal
US9847289B2 (en) 2014-05-30 2017-12-19 Applied Materials, Inc. Protective via cap for improved interconnect performance
US9378969B2 (en) 2014-06-19 2016-06-28 Applied Materials, Inc. Low temperature gas-phase carbon removal
US9406523B2 (en) 2014-06-19 2016-08-02 Applied Materials, Inc. Highly selective doped oxide removal method
US9425058B2 (en) 2014-07-24 2016-08-23 Applied Materials, Inc. Simplified litho-etch-litho-etch process
JP6357436B2 (ja) 2014-07-25 2018-07-11 株式会社日立ハイテクノロジーズ プラズマ処理装置
US9159606B1 (en) 2014-07-31 2015-10-13 Applied Materials, Inc. Metal air gap
US9378978B2 (en) 2014-07-31 2016-06-28 Applied Materials, Inc. Integrated oxide recess and floating gate fin trimming
US9496167B2 (en) 2014-07-31 2016-11-15 Applied Materials, Inc. Integrated bit-line airgap formation and gate stack post clean
US9165786B1 (en) 2014-08-05 2015-10-20 Applied Materials, Inc. Integrated oxide and nitride recess for better channel contact in 3D architectures
US9659753B2 (en) 2014-08-07 2017-05-23 Applied Materials, Inc. Grooved insulator to reduce leakage current
US9553102B2 (en) 2014-08-19 2017-01-24 Applied Materials, Inc. Tungsten separation
US9355856B2 (en) 2014-09-12 2016-05-31 Applied Materials, Inc. V trench dry etch
US9478434B2 (en) 2014-09-24 2016-10-25 Applied Materials, Inc. Chlorine-based hardmask removal
US9368364B2 (en) 2014-09-24 2016-06-14 Applied Materials, Inc. Silicon etch process with tunable selectivity to SiO2 and other materials
US9613822B2 (en) 2014-09-25 2017-04-04 Applied Materials, Inc. Oxide etch selectivity enhancement
US9966240B2 (en) 2014-10-14 2018-05-08 Applied Materials, Inc. Systems and methods for internal surface conditioning assessment in plasma processing equipment
US9355922B2 (en) 2014-10-14 2016-05-31 Applied Materials, Inc. Systems and methods for internal surface conditioning in plasma processing equipment
US11637002B2 (en) 2014-11-26 2023-04-25 Applied Materials, Inc. Methods and systems to enhance process uniformity
US9299583B1 (en) 2014-12-05 2016-03-29 Applied Materials, Inc. Aluminum oxide selective etch
US10224210B2 (en) 2014-12-09 2019-03-05 Applied Materials, Inc. Plasma processing system with direct outlet toroidal plasma source
US10573496B2 (en) 2014-12-09 2020-02-25 Applied Materials, Inc. Direct outlet toroidal plasma source
US9502258B2 (en) 2014-12-23 2016-11-22 Applied Materials, Inc. Anisotropic gap etch
US9343272B1 (en) 2015-01-08 2016-05-17 Applied Materials, Inc. Self-aligned process
US11257693B2 (en) 2015-01-09 2022-02-22 Applied Materials, Inc. Methods and systems to improve pedestal temperature control
US9373522B1 (en) 2015-01-22 2016-06-21 Applied Mateials, Inc. Titanium nitride removal
US9449846B2 (en) 2015-01-28 2016-09-20 Applied Materials, Inc. Vertical gate separation
US9728437B2 (en) 2015-02-03 2017-08-08 Applied Materials, Inc. High temperature chuck for plasma processing systems
US20160225652A1 (en) 2015-02-03 2016-08-04 Applied Materials, Inc. Low temperature chuck for plasma processing systems
US9881805B2 (en) 2015-03-02 2018-01-30 Applied Materials, Inc. Silicon selective removal
JP5874854B1 (ja) * 2015-06-12 2016-03-02 日新電機株式会社 プラズマ処理装置
US9691645B2 (en) 2015-08-06 2017-06-27 Applied Materials, Inc. Bolted wafer chuck thermal management systems and methods for wafer processing systems
US9741593B2 (en) 2015-08-06 2017-08-22 Applied Materials, Inc. Thermal management systems and methods for wafer processing systems
US9349605B1 (en) 2015-08-07 2016-05-24 Applied Materials, Inc. Oxide etch selectivity systems and methods
US10504700B2 (en) 2015-08-27 2019-12-10 Applied Materials, Inc. Plasma etching systems and methods with secondary plasma injection
US10522371B2 (en) 2016-05-19 2019-12-31 Applied Materials, Inc. Systems and methods for improved semiconductor etching and component protection
US10504754B2 (en) 2016-05-19 2019-12-10 Applied Materials, Inc. Systems and methods for improved semiconductor etching and component protection
US9865484B1 (en) 2016-06-29 2018-01-09 Applied Materials, Inc. Selective etch using material modification and RF pulsing
US10629473B2 (en) 2016-09-09 2020-04-21 Applied Materials, Inc. Footing removal for nitride spacer
US10062575B2 (en) 2016-09-09 2018-08-28 Applied Materials, Inc. Poly directional etch by oxidation
US9721789B1 (en) 2016-10-04 2017-08-01 Applied Materials, Inc. Saving ion-damaged spacers
US10062585B2 (en) 2016-10-04 2018-08-28 Applied Materials, Inc. Oxygen compatible plasma source
US9934942B1 (en) 2016-10-04 2018-04-03 Applied Materials, Inc. Chamber with flow-through source
US10546729B2 (en) 2016-10-04 2020-01-28 Applied Materials, Inc. Dual-channel showerhead with improved profile
US10062579B2 (en) 2016-10-07 2018-08-28 Applied Materials, Inc. Selective SiN lateral recess
US9947549B1 (en) 2016-10-10 2018-04-17 Applied Materials, Inc. Cobalt-containing material removal
US10163696B2 (en) 2016-11-11 2018-12-25 Applied Materials, Inc. Selective cobalt removal for bottom up gapfill
US9768034B1 (en) 2016-11-11 2017-09-19 Applied Materials, Inc. Removal methods for high aspect ratio structures
US10242908B2 (en) 2016-11-14 2019-03-26 Applied Materials, Inc. Airgap formation with damage-free copper
US10026621B2 (en) 2016-11-14 2018-07-17 Applied Materials, Inc. SiN spacer profile patterning
US10566206B2 (en) 2016-12-27 2020-02-18 Applied Materials, Inc. Systems and methods for anisotropic material breakthrough
US10431429B2 (en) 2017-02-03 2019-10-01 Applied Materials, Inc. Systems and methods for radial and azimuthal control of plasma uniformity
US10403507B2 (en) 2017-02-03 2019-09-03 Applied Materials, Inc. Shaped etch profile with oxidation
US10043684B1 (en) 2017-02-06 2018-08-07 Applied Materials, Inc. Self-limiting atomic thermal etching systems and methods
US10319739B2 (en) 2017-02-08 2019-06-11 Applied Materials, Inc. Accommodating imperfectly aligned memory holes
US10943834B2 (en) 2017-03-13 2021-03-09 Applied Materials, Inc. Replacement contact process
US10319649B2 (en) 2017-04-11 2019-06-11 Applied Materials, Inc. Optical emission spectroscopy (OES) for remote plasma monitoring
US11276559B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Semiconductor processing chamber for multiple precursor flow
US11276590B2 (en) 2017-05-17 2022-03-15 Applied Materials, Inc. Multi-zone semiconductor substrate supports
US10049891B1 (en) 2017-05-31 2018-08-14 Applied Materials, Inc. Selective in situ cobalt residue removal
US10497579B2 (en) 2017-05-31 2019-12-03 Applied Materials, Inc. Water-free etching methods
US10920320B2 (en) 2017-06-16 2021-02-16 Applied Materials, Inc. Plasma health determination in semiconductor substrate processing reactors
US10541246B2 (en) 2017-06-26 2020-01-21 Applied Materials, Inc. 3D flash memory cells which discourage cross-cell electrical tunneling
US10727080B2 (en) 2017-07-07 2020-07-28 Applied Materials, Inc. Tantalum-containing material removal
US10541184B2 (en) 2017-07-11 2020-01-21 Applied Materials, Inc. Optical emission spectroscopic techniques for monitoring etching
US10354889B2 (en) 2017-07-17 2019-07-16 Applied Materials, Inc. Non-halogen etching of silicon-containing materials
US10170336B1 (en) 2017-08-04 2019-01-01 Applied Materials, Inc. Methods for anisotropic control of selective silicon removal
US10043674B1 (en) 2017-08-04 2018-08-07 Applied Materials, Inc. Germanium etching systems and methods
US10297458B2 (en) 2017-08-07 2019-05-21 Applied Materials, Inc. Process window widening using coated parts in plasma etch processes
US10128086B1 (en) 2017-10-24 2018-11-13 Applied Materials, Inc. Silicon pretreatment for nitride removal
US10283324B1 (en) 2017-10-24 2019-05-07 Applied Materials, Inc. Oxygen treatment for nitride etching
US10256112B1 (en) 2017-12-08 2019-04-09 Applied Materials, Inc. Selective tungsten removal
US10903054B2 (en) 2017-12-19 2021-01-26 Applied Materials, Inc. Multi-zone gas distribution systems and methods
US11328909B2 (en) 2017-12-22 2022-05-10 Applied Materials, Inc. Chamber conditioning and removal processes
US10854426B2 (en) 2018-01-08 2020-12-01 Applied Materials, Inc. Metal recess for semiconductor structures
US10679870B2 (en) 2018-02-15 2020-06-09 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus
US10964512B2 (en) 2018-02-15 2021-03-30 Applied Materials, Inc. Semiconductor processing chamber multistage mixing apparatus and methods
TWI716818B (zh) 2018-02-28 2021-01-21 美商應用材料股份有限公司 形成氣隙的系統及方法
US10593560B2 (en) 2018-03-01 2020-03-17 Applied Materials, Inc. Magnetic induction plasma source for semiconductor processes and equipment
US10319600B1 (en) 2018-03-12 2019-06-11 Applied Materials, Inc. Thermal silicon etch
US10497573B2 (en) 2018-03-13 2019-12-03 Applied Materials, Inc. Selective atomic layer etching of semiconductor materials
US10573527B2 (en) 2018-04-06 2020-02-25 Applied Materials, Inc. Gas-phase selective etching systems and methods
US10490406B2 (en) 2018-04-10 2019-11-26 Appled Materials, Inc. Systems and methods for material breakthrough
US10699879B2 (en) 2018-04-17 2020-06-30 Applied Materials, Inc. Two piece electrode assembly with gap for plasma control
US10886137B2 (en) 2018-04-30 2021-01-05 Applied Materials, Inc. Selective nitride removal
US11037765B2 (en) * 2018-07-03 2021-06-15 Tokyo Electron Limited Resonant structure for electron cyclotron resonant (ECR) plasma ionization
US10872778B2 (en) 2018-07-06 2020-12-22 Applied Materials, Inc. Systems and methods utilizing solid-phase etchants
US10755941B2 (en) 2018-07-06 2020-08-25 Applied Materials, Inc. Self-limiting selective etching systems and methods
US10672642B2 (en) 2018-07-24 2020-06-02 Applied Materials, Inc. Systems and methods for pedestal configuration
US11049755B2 (en) 2018-09-14 2021-06-29 Applied Materials, Inc. Semiconductor substrate supports with embedded RF shield
US10892198B2 (en) 2018-09-14 2021-01-12 Applied Materials, Inc. Systems and methods for improved performance in semiconductor processing
US11062887B2 (en) 2018-09-17 2021-07-13 Applied Materials, Inc. High temperature RF heater pedestals
US11417534B2 (en) 2018-09-21 2022-08-16 Applied Materials, Inc. Selective material removal
US11682560B2 (en) 2018-10-11 2023-06-20 Applied Materials, Inc. Systems and methods for hafnium-containing film removal
US11121002B2 (en) 2018-10-24 2021-09-14 Applied Materials, Inc. Systems and methods for etching metals and metal derivatives
US11437242B2 (en) 2018-11-27 2022-09-06 Applied Materials, Inc. Selective removal of silicon-containing materials
US11721527B2 (en) 2019-01-07 2023-08-08 Applied Materials, Inc. Processing chamber mixing systems
US10920319B2 (en) 2019-01-11 2021-02-16 Applied Materials, Inc. Ceramic showerheads with conductive electrodes
JP7202641B2 (ja) * 2019-03-26 2023-01-12 株式会社プラズマイオンアシスト プラズマ処理装置およびプラズマ処理方法
US20200395199A1 (en) * 2019-06-14 2020-12-17 Asm Ip Holding B.V. Substrate treatment apparatus and method of cleaning inside of chamber

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0558072A (ja) * 1991-09-05 1993-03-09 Oji Paper Co Ltd 直描型平版印刷版材料
JP3195427B2 (ja) * 1992-07-15 2001-08-06 富士通株式会社 データ変換/逆変換装置
JPH06275600A (ja) * 1993-03-23 1994-09-30 Anelva Corp 薄膜作製方法および装置
JPH0718433A (ja) * 1993-06-30 1995-01-20 Kobe Steel Ltd Icpスパッタリング処理装置
US5531834A (en) * 1993-07-13 1996-07-02 Tokyo Electron Kabushiki Kaisha Plasma film forming method and apparatus and plasma processing apparatus
JPH0740468A (ja) * 1993-07-27 1995-02-10 Futaba:Kk 製袋用切断装置及び融着装置
JPH07254500A (ja) * 1994-03-14 1995-10-03 Kokusai Electric Co Ltd プラズマ処理装置
JPH09111460A (ja) * 1995-10-11 1997-04-28 Anelva Corp チタン系導電性薄膜の作製方法

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