KR970021370A - 플라즈마 cvd장치 및 방법과 드라이에칭장치 및 방법 - Google Patents
플라즈마 cvd장치 및 방법과 드라이에칭장치 및 방법 Download PDFInfo
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- KR970021370A KR970021370A KR1019960038776A KR19960038776A KR970021370A KR 970021370 A KR970021370 A KR 970021370A KR 1019960038776 A KR1019960038776 A KR 1019960038776A KR 19960038776 A KR19960038776 A KR 19960038776A KR 970021370 A KR970021370 A KR 970021370A
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- 238000000034 method Methods 0.000 title claims abstract 15
- 238000005268 plasma chemical vapour deposition Methods 0.000 title claims description 33
- 238000001312 dry etching Methods 0.000 title claims 9
- 239000003990 capacitor Substances 0.000 claims abstract 16
- 239000010408 film Substances 0.000 claims 12
- 238000005530 etching Methods 0.000 claims 6
- 238000000151 deposition Methods 0.000 claims 5
- 239000000758 substrate Substances 0.000 claims 4
- 239000000463 material Substances 0.000 claims 3
- 239000010409 thin film Substances 0.000 claims 2
- 239000004020 conductor Substances 0.000 claims 1
- 239000012530 fluid Substances 0.000 claims 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 abstract 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 abstract 1
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 abstract 1
- 229910001873 dinitrogen Inorganic materials 0.000 abstract 1
- 239000007789 gas Substances 0.000 abstract 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/505—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
- C23C16/509—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
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Abstract
Description
Claims (35)
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항에 있어서, 상기 전극전위제어기구는 제1콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항에 있어서, 상기 전극전위제어기구는 상기 다른쪽 단자와 어스 사이에 접속된 제1콘덴서와, 상기 다른쪽 단자와 상기 제1콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항에 있어서, 상기 내벽전위제어기구는 제2콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항에 있어서, 상기 내벽전위제어기구는 처리실과 어스 사이에 접속된 제2콘덴서와, 처리실과 상기 제2콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리 실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제6항에 있어서, 상기 전극전위제어기구는 제1콘덴서를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 제6항에 있어서, 상기 전극전위제어기구는 상기 다른쪽 단자와 어스 사이에 접속된 제1콘덴서와, 상기 다른쪽 단자와 상기 제1콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 원료가스를 처리실에 도입하는 가스 도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 퇴적시키는 플라즈마 CVD장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제9항에 있어서, 상기 내벽전위제어기구는 제2콘덴서를 구비하는 것을 특징으로 하는 플라즈아 CVD장치.
- 제9항에 있어서, 상기 내벽전위제어기구는 처리실과 어스 사이에 접속된 제2콘덴서와, 처리실과 상기제2콘덴서 사이의 접속점과 어스 사이에 접속된 인덕터와 직류전원의 직렬회로를 구비하는 것을 특징으로 하는 플라즈마 CVD장치.
- 제2항, 제3항, 제7항 및 제8항중의 어느 1항에 있어서, 상기 제1콘덴서의 정전용량은 100pF∼10μF인 것을 특징으로 하는 플라즈마 CVD장치.
- 제2항, 제3항, 제7항 및 제8항중의 어느 1항에 있어서, 상기 제1콘덴서는 가변콘덴서인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면은 도전체인 것을 특징으로하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 실질적으로 1턴의 코일인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1주 이상 감긴코일인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1평면내에서 와류형상으로 감겨있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1개의 직선상 막대인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 2개 이상의 직선상 막대를 병렬로 나열한 것임을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 1매의 평판상 판인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극은 그 내부가 유체로 냉각되는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면재질이 기체상에 퇴적할 박막 재질과 같은 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 플라즈마발생전극의 표면재질이 기체상에 퇴적할 박막 조성의 일부인 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 멀티커스프자장을 상기 처리실 내부에 발생시킬 수 있는 멀티커스프 자장발생기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 배기기구가 상기 처리실내의 압력을 일정하게 제어하는 압력제어기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 제1항 내지 제11항중의 어느 1항에 있어서, 상기 기체에 바이어스전압을 인가하기 위한 바이어스인가기구를 구비하고 있는 것을 특징으로 하는 플라즈마 CVD장치.
- 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
- 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
- 처리실에 원료가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 도전성 막을 퇴적시키는 플라즈마 CVD방법에 있어서, 상기 플라즈마발생 전극은 두 단자를 구비하고, 한쪽 단자는 고주파 전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 플라즈마 CVD방법.
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하며 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
- 처리실, 처리실내를 진공으로 배기하는 배기기구, 처리용가스를 처리실에 도입하는 가스도입기구, 및 처리실내에 배치된 플라즈마발생전극을 구비하고, 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상에 막을 에칭하는 드라이에칭장치에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭장치.
- 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭방법.
- 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 전극전위제어기구를 통하여 접지되고, 상기 처리실이 접지되어 있는 것을 특징으로 하는 드라이에칭방법.
- 처리실에 처리용가스를 도입하고 처리실내에 배치된 플라즈마발생전극에 전력을 공급하여 플라즈마를 발생시킴으로써 처리실내의 기체상의 막을 에칭하는 드라이에칭방법에 있어서, 상기 플라즈마발생전극은 두개의 단자를 구비하고, 한쪽 단자는 고주파전력공급원에 접속되고, 다른쪽 단자는 접지되고, 또한 상기 처리실이 내벽전위제어기구를 통하여 접지되어 있는 것을 특징으로 하는 드라이에칭방법.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
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JPH0558072A (ja) * | 1991-09-05 | 1993-03-09 | Oji Paper Co Ltd | 直描型平版印刷版材料 |
JP3195427B2 (ja) * | 1992-07-15 | 2001-08-06 | 富士通株式会社 | データ変換/逆変換装置 |
JPH06275600A (ja) * | 1993-03-23 | 1994-09-30 | Anelva Corp | 薄膜作製方法および装置 |
JPH0718433A (ja) * | 1993-06-30 | 1995-01-20 | Kobe Steel Ltd | Icpスパッタリング処理装置 |
US5531834A (en) * | 1993-07-13 | 1996-07-02 | Tokyo Electron Kabushiki Kaisha | Plasma film forming method and apparatus and plasma processing apparatus |
JPH0740468A (ja) * | 1993-07-27 | 1995-02-10 | Futaba:Kk | 製袋用切断装置及び融着装置 |
JPH07254500A (ja) * | 1994-03-14 | 1995-10-03 | Kokusai Electric Co Ltd | プラズマ処理装置 |
JPH09111460A (ja) * | 1995-10-11 | 1997-04-28 | Anelva Corp | チタン系導電性薄膜の作製方法 |
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- 1996-09-07 KR KR1019960038776A patent/KR100232040B1/ko not_active IP Right Cessation
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