KR20130122628A - 웨이퍼를 가공하기 위한 장치 및 방법 - Google Patents
웨이퍼를 가공하기 위한 장치 및 방법 Download PDFInfo
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- KR20130122628A KR20130122628A KR1020137010581A KR20137010581A KR20130122628A KR 20130122628 A KR20130122628 A KR 20130122628A KR 1020137010581 A KR1020137010581 A KR 1020137010581A KR 20137010581 A KR20137010581 A KR 20137010581A KR 20130122628 A KR20130122628 A KR 20130122628A
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- 238000012545 processing Methods 0.000 title claims abstract description 73
- 238000000034 method Methods 0.000 title claims abstract description 14
- 235000012431 wafers Nutrition 0.000 title description 43
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 238000011221 initial treatment Methods 0.000 claims abstract description 25
- 238000012805 post-processing Methods 0.000 claims abstract description 24
- 238000011282 treatment Methods 0.000 claims description 20
- 238000011144 upstream manufacturing Methods 0.000 claims description 3
- 239000011261 inert gas Substances 0.000 claims description 2
- 238000002203 pretreatment Methods 0.000 claims 1
- 238000007781 pre-processing Methods 0.000 description 7
- 238000011109 contamination Methods 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 4
- 238000007254 oxidation reaction Methods 0.000 description 4
- 238000009832 plasma treatment Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000004049 embossing Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000010583 slow cooling Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67201—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the load-lock chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/10—Methods of surface bonding and/or assembly therefor
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
도 1b는 도 1a로부터의 절단선 A-A를 따라 본 발명의 장치의 예시적인 단면도.
도 2a는 사전처리 모듈, 일차 처리 모듈 및 사후처리 모듈을 갖는 본 발명의 장치의 예시적인 평면도.
도 2b는 도 2a로부터의 절단선 A-A를 따라 본 발명의 장치의 예시적인 단면도.
도 2c는 도 2a로부터의 절단선 B-B를 따라 본 발명의 장치의 예시적인 단면도.
도 3은 기판을 가공하기 위한 본 발명의 방법의 압력/온도 그래프.
도 4는 사전처리 모듈, 일차 처리 모듈 및 사후처리 모듈을 갖는 본 발명의 장치의 예시적인 단면도.
2, 2': 사전처리 챔버
3, 3': 일차 처리 챔버
4, 4': 사후 처리 챔버
5: 제1 잠금 도어
6: 제1 일차 잠금 도어
7: 제2 일차 잠금 도어
8: 제2 잠금 도어
9: 사전처리 모듈
10: 일차 처리 모듈
11: 사후처리 모듈
12: 사전처리 공간
13: 일차 처리 공간
14: 사후처리 공간
15: 웨이퍼
16: 제1 로봇 암
17: 제2 로봇 암
18: 제1 측면
19: 제2 측면
Claims (9)
- 기판, 또는 기판 쌍, 특히 웨이퍼(15) 또는 웨이퍼 쌍을 가공하기 위한 장치로서,
-제1 잠금 도어(5)를 가지며 사전처리 공간(12)을 둘러싸고 진공에 노출될 수 있는 사전처리 챔버(2)를 갖는 하나 이상의 사전처리 모듈(9),
-일차 처리 공간(13)을 둘러싸고 사전처리 챔버(2)로부터 개별적으로 진공에 노출될 수 있는 일차 처리 챔버(3)를 갖는 하나 이상의 일차 처리 모듈(9),
-압력이 새지 않는 방식으로 일차 처리 챔버(3)에 사전처리 챔버(2)를 연결하는 제1 일차 잠금 도어(6) - 사전처리 모듈(9)은 기판을 일차 처리 챔버(3)에 적재하기 위한 잠금부로서 변환가능함 - ,
-제2 잠금 도어(8)를 가지며 사전처리 공간(14)을 둘러싸고 일차 처리 챔버(3)로부터 개별적으로 진공에 노출될 수 있는 사전처리 챔버(4)를 갖는 하나 이상의 사전처리 모듈(11), 및
-압력이 새지 않는 방식으로 사전처리 챔버(4)에 일차 처리 챔버(3)를 연결하는 제2 일차 잠금 도어(7) - 사전처리 모듈(11)은 일차 처리 챔버(3)로부터 기판을 제거하기 위한 잠금부로서 변환가능함 - , 를 포함하는 장치. - 제1항에 있어서, 일차 처리 챔버(3)는 기판이 적재되고 제거될 때 잠금부로서 변환가능한 장치.
- 제1항 또는 제2항에 있어서, 사전처리 챔버(2) 및/또는 일차 처리 챔버(3) 및/또는 사후처리 챔버(4)는 온도 노출 장치에 의해 개별적으로 가열 및/또는 냉각될 수 있는 장치.
- 제1항 내지 제3항 중 어느 한 항에 있어서, 이에 따라 제조된 그 외의 다른 사전처리 모듈이 잠금부로서 사전처리 모듈(9)의 업스트림에 연결될 수 있고 및/또는 이에 따라 제조된 그 외의 다른 사후처리 모듈은 잠금부로서 사후처리 모듈(11)의 다운스트림에 연결될 수 있는 장치.
- 제1항 내지 제6항 중 어느 한 항에 있어서, 잠금부는 압력 및/또는 온도 잠금부로서 제조되는 장치.
- 제1항 내지 제5항 중 어느 한 항에 있어서, 적재 및 제거 장치를 포함하고, 특히 일차 처리 챔버(3) 및/또는 사전처리 챔버(2) 및/또는 사후처리 챔버(4) 내/외로 기판을 적재 및 제거하기 위한 하나 이상의 로봇 암(16, 17)을 포함하는 장치.
- 제1항 내지 제6항 중 어느 한 항에 있어서, 일차 처리 챔버(3)는 사전처리 챔버(2)로부터 동시에 적재될 수 있고, 사후처리 챔버(4) 및/또는 사전처리 챔버(2) 내로 빼내질 수 있으며, 사후처리 챔버(4)는 제1 잠금 도어(5)를 통하여 동시에 적재될 수 있고 제2 잠금 도어(8)를 통하여 빼내질 수 있는 장치.
- 기판, 또는 기판 쌍, 특히 웨이퍼 또는 웨이퍼 쌍을 가공하기 위한 방법으로서,
-제1 잠금 도어(5)를 통하여 기판 또는 기판 쌍을 사전처리 챔버(2)에 적재하는 단계,
-압력 및/또는 온도에 대한 노출에 의해 사전처리 챔버(2) 내에서 기판을 사전처리하는 단계,
-진공에 노출될 수 있는 일차 처리 챔버(30 내로 제1 일차 도어 잠금부(6)를 통하여 사전처리 챔버(2)로부터 기판을 적재하는 단계,
-력 및/또는 온도에 대한 노출에 의해 일차 처리 챔버(3) 내에서 기판을 일차 처리하는 단계,
-사후처리 챔버(4) 내로 제2 일차 잠금 도어(7)를 통하여 일차 처리 챔버(3)로부터 기판을 빼내는 단계,
-사후처리 챔버(4) 내에서 기판을 사후처리하는 단계, 및
-제2 잠금 도어(8)를 통하여 사후처리 챔버(4)로부터 기판을 빼내는 단계를 포함하는 방법. - 제8항에 있어서, 일차 잠금 도어(6)의 각각의 개방 이전에 사전처리 챔버(2), 그리고 일차 잠금 도어(7)의 각각의 개방 이전에 사후처리 챔버(4)가 챔버(2, 3, 4) 외측에서의 대기 및/또는 주변 압력(pATM) 보다 낮은 압력(pV 또는 pN)에 노출되고 및/또는 정화, 특히 불활성 가스로 플러싱되는 방법.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102010048043A DE102010048043A1 (de) | 2010-10-15 | 2010-10-15 | Vorrichtung und Verfahren zur Prozessierung von Wafern |
DE102010048043.6 | 2010-10-15 | ||
PCT/EP2011/067405 WO2012049058A1 (de) | 2010-10-15 | 2011-10-05 | Vorrichtung und verfahren zur prozessierung von wafern |
Related Child Applications (2)
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KR1020137019497A Division KR20130114218A (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
KR1020187020824A Division KR101993106B1 (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
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KR20130122628A true KR20130122628A (ko) | 2013-11-07 |
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KR1020137010581A Ceased KR20130122628A (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
KR1020187020824A Active KR101993106B1 (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
KR1020137019497A Ceased KR20130114218A (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
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KR1020187020824A Active KR101993106B1 (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
KR1020137019497A Ceased KR20130114218A (ko) | 2010-10-15 | 2011-10-05 | 웨이퍼를 가공하기 위한 장치 및 방법 |
Country Status (8)
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US (2) | US9751698B2 (ko) |
EP (2) | EP2645410B1 (ko) |
JP (2) | JP2013542602A (ko) |
KR (3) | KR20130122628A (ko) |
CN (3) | CN103531438A (ko) |
DE (1) | DE102010048043A1 (ko) |
SG (1) | SG189240A1 (ko) |
WO (1) | WO2012049058A1 (ko) |
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JP5941589B1 (ja) * | 2015-09-14 | 2016-06-29 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法、プログラム及び記録媒体 |
CN108842143A (zh) * | 2018-07-09 | 2018-11-20 | 上海新昇半导体科技有限公司 | 外延炉冷却系统及冷却方法 |
CN109378287B (zh) * | 2018-11-15 | 2024-12-03 | 盛合晶微半导体(江阴)有限公司 | 半导体封装装置 |
CN112501574B (zh) * | 2020-10-27 | 2022-10-25 | 东兴华鸿光学科技有限公司 | 太阳镜片镀膜设备 |
WO2025116359A1 (ko) * | 2023-11-29 | 2025-06-05 | 주식회사 제우스 | 기판 처리장치 |
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US5044871A (en) * | 1985-10-24 | 1991-09-03 | Texas Instruments Incorporated | Integrated circuit processing system |
US4764076A (en) * | 1986-04-17 | 1988-08-16 | Varian Associates, Inc. | Valve incorporating wafer handling arm |
JPS63157870A (ja) * | 1986-12-19 | 1988-06-30 | Anelva Corp | 基板処理装置 |
JP2648638B2 (ja) | 1990-11-30 | 1997-09-03 | 三菱マテリアル株式会社 | ウェーハの接着方法およびその装置 |
KR0155572B1 (ko) * | 1991-05-28 | 1998-12-01 | 이노우에 아키라 | 감압처리 시스템 및 감압처리 방법 |
JPH04349929A (ja) | 1991-05-28 | 1992-12-04 | Tokyo Electron Ltd | 真空装置 |
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2010
- 2010-10-15 DE DE102010048043A patent/DE102010048043A1/de not_active Ceased
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2011
- 2011-10-05 KR KR1020137010581A patent/KR20130122628A/ko not_active Ceased
- 2011-10-05 CN CN201310387123.0A patent/CN103531438A/zh active Pending
- 2011-10-05 US US13/878,570 patent/US9751698B2/en active Active
- 2011-10-05 EP EP13174234.8A patent/EP2645410B1/de active Active
- 2011-10-05 KR KR1020187020824A patent/KR101993106B1/ko active Active
- 2011-10-05 JP JP2013533151A patent/JP2013542602A/ja active Pending
- 2011-10-05 SG SG2013024666A patent/SG189240A1/en unknown
- 2011-10-05 CN CN201711338294.9A patent/CN107978544A/zh active Pending
- 2011-10-05 KR KR1020137019497A patent/KR20130114218A/ko not_active Ceased
- 2011-10-05 CN CN201180049666.0A patent/CN103168350B/zh active Active
- 2011-10-05 EP EP11764566.3A patent/EP2609619B1/de active Active
- 2011-10-05 WO PCT/EP2011/067405 patent/WO2012049058A1/de active Application Filing
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Also Published As
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US9771223B2 (en) | 2017-09-26 |
DE102010048043A1 (de) | 2012-04-19 |
EP2645410A1 (de) | 2013-10-02 |
EP2609619A1 (de) | 2013-07-03 |
JP2013225706A (ja) | 2013-10-31 |
WO2012049058A1 (de) | 2012-04-19 |
CN103168350A (zh) | 2013-06-19 |
SG189240A1 (en) | 2013-05-31 |
US20130240113A1 (en) | 2013-09-19 |
US20130309046A1 (en) | 2013-11-21 |
JP2013542602A (ja) | 2013-11-21 |
EP2609619B1 (de) | 2020-05-27 |
KR20180085071A (ko) | 2018-07-25 |
KR20130114218A (ko) | 2013-10-16 |
EP2645410B1 (de) | 2021-03-03 |
US9751698B2 (en) | 2017-09-05 |
CN103531438A (zh) | 2014-01-22 |
CN107978544A (zh) | 2018-05-01 |
CN103168350B (zh) | 2018-02-13 |
JP5635162B2 (ja) | 2014-12-03 |
KR101993106B1 (ko) | 2019-06-25 |
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