KR20120037464A - 전자파 장애로부터 기판을 차폐하는 방법 - Google Patents
전자파 장애로부터 기판을 차폐하는 방법 Download PDFInfo
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- KR20120037464A KR20120037464A KR1020127000939A KR20127000939A KR20120037464A KR 20120037464 A KR20120037464 A KR 20120037464A KR 1020127000939 A KR1020127000939 A KR 1020127000939A KR 20127000939 A KR20127000939 A KR 20127000939A KR 20120037464 A KR20120037464 A KR 20120037464A
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Abstract
Description
도 2는 시트 저항 대 본 발명의 구현예에서 코팅물의 차폐 유효성의 산포도(scatter plot)이다.
Claims (30)
- 전자파 장애로부터 기판을 차폐(shielding)하는 방법으로서, 상기 방법이 기판을 제공하는 단계, 상기 기판에 전자파 장애(EMI) 차폐 조성물을 제공하는 단계를 포함하고, 여기에서 상기 전자파 장애 차폐 조성물이 경화 프로세스 중에 전도성 경로를 형성하도록 자가-어셈블링(self-assembling)될 수 있는 충전된, 경화성 재료를 포함하는 방법.
- 제 1항에 있어서, 상기 경화성 재료가 경화성 유기 화합물 및 충전제를 포함하는 방법.
- 제 2항에 있어서, 상기 충전제 및 유기 화합물이 상기 유기 화합물의 경화 중에 상호 작용을 나타내며, 상기 상호 작용이 상기 충전제를 전도성 경로 내로 자가-어셈블링하도록 유발하는 방법.
- 제 1항에 있어서, 상기 조성물이 경화됨에 따라 조성물을 통해 전도성 경로를 형성하는 방법.
- 제 1항에 있어서, 경화성 조성물이 에폭시 수지, 에폭시 경화제, 및 지방산 코팅된 전도성 충전제를 포함하는 방법.
- 제 5항에 있어서, 상기 에폭시 수지가 비스페놀 F의 디글리시딜 에테르를 포함하는 방법.
- 제 5항에 있어서, 상기 에폭시 경화제가 프탈산 무수물 및 디에틸렌트리아민 사이의 반응을 기초로 하는 폴리아민 무수물 부가물을 포함하는 방법.
- 제 1항에 있어서, 상기 조성물이 전기 전도성 충전제를 포함하는 방법.
- 제 1항에 있어서, 상기 충전제가 무-극성 코팅물(non-polar coating)로 코팅되는 방법.
- 제 9항에 있어서, 상기 무-극성 코팅물이 스테아르산을 포함하는 방법.
- 제 1항에 있어서, 경화물(cure)을 경화시키는 자가-어셈블링 후에 소결된 전도성 경로를 형성하기 위해 충전제 입자들이 소결 가능한(sinterable) 방법.
- 제 1항에 있어서, 상기 조성물이 상기 기판에 사전-정의된 선 두께 및 사전-정의된 개구(aperture) 크기를 포함하는 예정된(predetermined) 패턴으로 적용되는 방법.
- 제 12항에 있어서, 상기 기판에 적용된 조성물이 광학적으로 투명한 방법.
- 제 1항에 있어서, 상기 조성물이 약 1MHz 내지 약 40GHz에서 20dB 이상의 차폐 유효성을 갖는 방법.
- 제 1항에 있어서, 상기 조성물이 약 1MHz 내지 약 40GHz에서 약 80dB 이상의 차폐 유효성을 제공하는 방법.
- 제 1항에 있어서, 상기 조성물이 40부피% 미만의 전도성 충전제를 포함하는 방법.
- 제 1항에 있어서, 상기 조성물이 15부피% 미만의 전도성 충전제를 포함하는 방법.
- 제 1항에 있어서, 상기 조성물이 전자기 펄스(electromagnetic pulses)로부터 추가적 차단(protection)을 제공하는 방법.
- 제 1항에 있어서, 상기 기판이 전자 장치를 수용하는(housing) 인클로저(enclosure)를 한 부분 이상 포함하는 방법.
- 제 19항에 있어서, 상기 인클로저가 마이크로전자 회로(microelectronic circuit)를 포함하는 방법.
- 제 19항에 있어서, 상기 인클로저가 비히클(vehicle)을 포함하는 방법.
- 제 1항에 있어서, 자가-어셈블링된 재료가 하나 이상의 전기 장치를 위해 지면(ground)에 통로를 추가로 제공하는 방법.
- 제 1항에 있어서, 상기 조성물이 분무 적용되는 방법.
- 제 1항에 있어서, 상기 기판에 적용하기에 앞서 상기 조성물이 B-스테이지화된 필름(B-staged film)으로 형성되는 방법.
- 제 1항에 있어서, EMI 차폐 조성물을 기판에 제공하는 단계가,
하나 이상의 불연속적인 전도성 경로를 포함하는 EMI 차폐 시스템의 손상된 부분을 확인하는 단계;
EMI 차폐 조성물을 상기 손상된 부분 상에 증착시키는 단계; 및
상기 손상된 구역에 하나 이상의 불연속적인 전도성 경로를 완성하는 하나 이상의 자가-어셈블링된 전도성 경로를 제공하기 위해 증착된 조성물을 경화시키는 단계를 포함하는 방법. - 제 25항에 있어서, EMI 차단 시스템이 전도성 시트 금속, 금속 박, 금속 메쉬, 탄소-금속 섬유 공-직물(co-weaves), 금속화 탄소, 또는 충전된 전도성 중합체 중 하나 이상을 포함하는 방법.
- 제 25항에 있어서, EMI 차폐 시스템이 경화 프로세스 중에 전도성 경로를 형성하도록 자가-어셈블링될 수 있는 충전된, 경화성 재료를 포함하는 방법.
- EMI 차폐 재료의 비-파괴 검사 방법으로서, 상기 방법이,
EMI 차폐를 제공할 수 있는 전기 전도성 조성물을 제공하는 단계;
조성물의 전기적 특성을 측정하는 단계; 및
복합재의 열화도(degree of degradation)를 결정하기 위해 조성물의 측정된 전기적 특성을 조성물의 사전 열화된(degraded) 샘플의 전기 전도도와 동일시하는(equating) 단계를 포함하는 방법. - 제 28항에 있어서, 상기 조성물이 경화 프로세스 중에 전도성 경로를 형성하도록 자가-어셈블링될 수 있는 경화성 재료를 포함하는 방법.
- 제 28항에 있어서, 전기적 특성이 전기 저항률을 포함하는 방법.
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BR112012000203B1 (pt) * | 2009-06-12 | 2020-01-28 | Lord Corp | método para proteção de um substrato contra relâmpagos |
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- 2010-06-11 CN CN201080025953.3A patent/CN102803405B/zh active Active
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- 2010-06-11 BR BRPI1010855A patent/BRPI1010855A2/pt not_active IP Right Cessation
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EP2440623A1 (en) | 2012-04-18 |
JP5744015B2 (ja) | 2015-07-01 |
JP2012530359A (ja) | 2012-11-29 |
CN102803406B (zh) | 2015-10-14 |
CN102803406A (zh) | 2012-11-28 |
EP2440623B1 (en) | 2016-10-05 |
EP2440622B1 (en) | 2016-08-31 |
EP2440622A1 (en) | 2012-04-18 |
US20160362565A1 (en) | 2016-12-15 |
BRPI1010855A2 (pt) | 2016-04-05 |
WO2010144770A1 (en) | 2010-12-16 |
JP2012529978A (ja) | 2012-11-29 |
US20100315105A1 (en) | 2010-12-16 |
BR112012000203B1 (pt) | 2020-01-28 |
BR112012000203A2 (pt) | 2016-11-22 |
WO2010144762A1 (en) | 2010-12-16 |
KR20120046164A (ko) | 2012-05-09 |
CN102803405A (zh) | 2012-11-28 |
US20170226351A9 (en) | 2017-08-10 |
CN102803405B (zh) | 2016-06-08 |
US20110014356A1 (en) | 2011-01-20 |
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