KR20010052994A - 방사선 이미지 센서 - Google Patents
방사선 이미지 센서 Download PDFInfo
- Publication number
- KR20010052994A KR20010052994A KR1020007014390A KR20007014390A KR20010052994A KR 20010052994 A KR20010052994 A KR 20010052994A KR 1020007014390 A KR1020007014390 A KR 1020007014390A KR 20007014390 A KR20007014390 A KR 20007014390A KR 20010052994 A KR20010052994 A KR 20010052994A
- Authority
- KR
- South Korea
- Prior art keywords
- scintillator
- film
- substrate
- imaging device
- image sensor
- Prior art date
Links
- 230000005855 radiation Effects 0.000 title claims description 25
- 238000003384 imaging method Methods 0.000 claims abstract description 41
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 229920005989 resin Polymers 0.000 claims abstract description 11
- 239000011347 resin Substances 0.000 claims abstract description 11
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000000034 method Methods 0.000 claims description 3
- 229920000052 poly(p-xylylene) Polymers 0.000 description 22
- 229910004298 SiO 2 Inorganic materials 0.000 description 12
- 239000000919 ceramic Substances 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 8
- -1 polyparaxylylene Polymers 0.000 description 7
- 125000006839 xylylene group Chemical group 0.000 description 6
- 238000001514 detection method Methods 0.000 description 5
- URLKBWYHVLBVBO-UHFFFAOYSA-N Para-Xylene Chemical group CC1=CC=C(C)C=C1 URLKBWYHVLBVBO-UHFFFAOYSA-N 0.000 description 4
- 229920002050 silicone resin Polymers 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910004261 CaF 2 Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 229910021607 Silver chloride Inorganic materials 0.000 description 1
- 229910006404 SnO 2 Inorganic materials 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- 229910003481 amorphous carbon Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 229920002545 silicone oil Polymers 0.000 description 1
- HKZLPVFGJNLROG-UHFFFAOYSA-M silver monochloride Chemical compound [Cl-].[Ag+] HKZLPVFGJNLROG-UHFFFAOYSA-M 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims (2)
- 신틸레이터 패널과 촬상 소자를 구비하는 방사선 이미지 센서에 있어서,상기 신틸레이터 패널은, 방사선 투과성의 기판과, 상기 기판상에 형성된 신틸레이터와, 상기 신틸레이터를 덮는 탄성을 가지는 유기막을 구비하고,상기 신틸레이터 패널과 상기 촬상 소자 사이에 광학 결합 재료를 개재시켜서 상기 신틸레이터 패널과 상기 촬상 소자를 중첩하고, 상기 신틸레이터 패널 및 상기 촬상 소자의 측벽부를 수지로 고착한 것을 특징으로 하는 방사선 이미지 센서.
- 제 1항에 있어서,상기 신틸레이터는 주상 구조를 갖는 것을 특징으로 하는 방사선 이미지 센서.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17308098A JP3789646B2 (ja) | 1998-06-19 | 1998-06-19 | 放射線イメージセンサ |
JP98-173080 | 1998-06-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20010052994A true KR20010052994A (ko) | 2001-06-25 |
KR100639845B1 KR100639845B1 (ko) | 2006-10-27 |
Family
ID=15953845
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020007014390A Expired - Lifetime KR100639845B1 (ko) | 1998-06-19 | 1999-06-18 | 방사선 이미지 센서 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6469305B2 (ko) |
EP (1) | EP1115011B1 (ko) |
JP (1) | JP3789646B2 (ko) |
KR (1) | KR100639845B1 (ko) |
CN (1) | CN1138157C (ko) |
AU (1) | AU4168099A (ko) |
DE (1) | DE69934126T2 (ko) |
WO (1) | WO1999066347A1 (ko) |
Families Citing this family (53)
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US7034306B2 (en) | 1998-06-18 | 2006-04-25 | Hamamatsu Photonics K.K. | Scintillator panel and radiation image sensor |
AU3168199A (en) | 1999-04-09 | 2000-11-14 | Hamamatsu Photonics K.K. | Scintillator panel and radiation ray image sensor |
JP2001074845A (ja) | 1999-09-03 | 2001-03-23 | Canon Inc | 半導体装置及びそれを用いた放射線撮像システム |
JP4197593B2 (ja) * | 2000-01-13 | 2008-12-17 | 浜松ホトニクス株式会社 | 放射線イメージセンサ及びシンチレータパネル |
DE60144280D1 (en) * | 2000-05-19 | 2011-05-05 | Hamamatsu Photonics Kk | Lung |
JP4447752B2 (ja) * | 2000-08-03 | 2010-04-07 | 浜松ホトニクス株式会社 | 放射線検出器 |
WO2002037138A1 (fr) * | 2000-11-01 | 2002-05-10 | Hamamatsu Photonics K.K. | Detecteur de rayonnement |
DE10063907A1 (de) * | 2000-12-21 | 2002-07-04 | Philips Corp Intellectual Pty | Detektor zum Detektieren von elektromagnetischer Strahlung |
JP4587431B2 (ja) * | 2001-08-30 | 2010-11-24 | キヤノン株式会社 | 蛍光板の製造方法および放射線検出装置の製造方法 |
JP4593806B2 (ja) * | 2001-02-09 | 2010-12-08 | キヤノン株式会社 | 放射線検出装置の製造方法、蛍光板の製造方法及び放射線検出装置の製造装置 |
JP4789372B2 (ja) * | 2001-08-27 | 2011-10-12 | キヤノン株式会社 | 放射線検出装置、システム及びそれらに備えられるシンチレータパネル |
US7053381B2 (en) * | 2001-12-06 | 2006-05-30 | General Electric Company | Dual para-xylylene layers for an X-ray detector |
US6720561B2 (en) * | 2001-12-06 | 2004-04-13 | General Electric Company | Direct CsI scintillator coating for improved digital X-ray detector assembly longevity |
US7126130B2 (en) | 2001-12-06 | 2006-10-24 | General Electric Company | Direct scintillator coating for radiation detector assembly longevity |
WO2004079396A1 (ja) * | 2003-03-07 | 2004-09-16 | Hamamatsu Photonics K.K. | シンチレータパネルおよび放射線イメージセンサの製造方法 |
JP4289913B2 (ja) * | 2003-03-12 | 2009-07-01 | キヤノン株式会社 | 放射線検出装置及びその製造方法 |
US7355184B2 (en) * | 2003-04-07 | 2008-04-08 | Canon Kabushiki Kaisha | Radiation detecting apparatus and method for manufacturing the same |
US7112802B2 (en) * | 2003-04-11 | 2006-09-26 | Canon Kabushiki Kaisha | Scintillator panel, radiation detecting apparatus, and radiation detection system |
JP2005012049A (ja) * | 2003-06-20 | 2005-01-13 | Shimadzu Corp | 放射線検出器およびそれを備えた放射線撮像装置 |
US7193218B2 (en) | 2003-10-29 | 2007-03-20 | Canon Kabushiki Kaisha | Radiation detection device, method of producing the same, and radiation image pick-up system |
FR2888045B1 (fr) * | 2005-07-01 | 2007-10-19 | Thales Sa | Capteur d'image a resolution spatiale amelioree et procede de realisation du capteur |
US7772558B1 (en) | 2006-03-29 | 2010-08-10 | Radiation Monitoring Devices, Inc. | Multi-layer radiation detector and related methods |
US7828926B1 (en) | 2006-04-04 | 2010-11-09 | Radiation Monitoring Devices, Inc. | Selective removal of resin coatings and related methods |
EP1860463A1 (en) * | 2006-05-23 | 2007-11-28 | Agfa HealthCare NV | Radiation image phosphor or scintillator panel |
US7361901B1 (en) | 2006-06-02 | 2008-04-22 | Radiation Monitoring Devices, Inc. | Scintillator detector fabrication |
US7696482B1 (en) | 2006-06-02 | 2010-04-13 | Radiation Monitoring Devices, Inc. | High spatial resolution radiation detector |
JP5195424B2 (ja) * | 2006-06-28 | 2013-05-08 | コニカミノルタエムジー株式会社 | シンチレータパネル |
JP4670955B2 (ja) * | 2006-08-08 | 2011-04-13 | コニカミノルタエムジー株式会社 | フラットパネルディテクター |
JP5050572B2 (ja) | 2007-03-05 | 2012-10-17 | コニカミノルタエムジー株式会社 | 放射線画像検出器 |
JP4819163B2 (ja) | 2007-09-06 | 2011-11-24 | コニカミノルタエムジー株式会社 | フラットパネルディテクタ |
JP5124227B2 (ja) * | 2007-10-01 | 2013-01-23 | 浜松ホトニクス株式会社 | 放射線検出器 |
WO2009060349A2 (en) * | 2007-11-09 | 2009-05-14 | Koninklijke Philips Electronics N.V. | Protection of hygroscopic scintillators |
DE102008033759B4 (de) | 2008-07-18 | 2011-01-20 | Siemens Aktiengesellschaft | Szintillatorplatte |
US20120241637A1 (en) * | 2009-05-20 | 2012-09-27 | Simonetti John J | Scintillators And Subterranean Detectors |
JP2011017683A (ja) | 2009-07-10 | 2011-01-27 | Fujifilm Corp | 放射線画像検出器及びその製造方法 |
JP5493577B2 (ja) * | 2009-08-12 | 2014-05-14 | コニカミノルタ株式会社 | 放射線画像検出装置 |
US8384047B2 (en) * | 2009-12-21 | 2013-02-26 | Sensor Electronic Technology, Inc. | Fluorescence-based ultraviolet illumination |
CN101738631B (zh) * | 2009-12-29 | 2012-10-10 | 上海新漫传感技术研究发展有限公司 | 一种碘化锂闪烁探测器及其制备方法 |
JPWO2011125383A1 (ja) | 2010-04-07 | 2013-07-08 | コニカミノルタ株式会社 | フラットパネルディテクタの製造方法 |
JP2012047487A (ja) * | 2010-08-24 | 2012-03-08 | Hamamatsu Photonics Kk | 放射線検出器 |
JP5178900B2 (ja) * | 2010-11-08 | 2013-04-10 | 富士フイルム株式会社 | 放射線検出器 |
US8558185B2 (en) | 2010-12-21 | 2013-10-15 | Carestream Health, Inc. | Digital radiographic detector array including spacers and methods for same |
US8569704B2 (en) | 2010-12-21 | 2013-10-29 | Carestream Health, Inc. | Digital radiographic detector array including spacers and methods for same |
JP5460572B2 (ja) * | 2010-12-27 | 2014-04-02 | 富士フイルム株式会社 | 放射線画像検出装置及びその製造方法 |
WO2013130038A1 (en) | 2012-02-28 | 2013-09-06 | Carestream Health, Inc. | Radiographic detector arrays including scintillators and methods for same |
JP5922518B2 (ja) * | 2012-07-20 | 2016-05-24 | 浜松ホトニクス株式会社 | シンチレータパネル及び放射線検出器 |
JP6262419B2 (ja) * | 2012-09-10 | 2018-01-17 | コニカミノルタ株式会社 | 放射線画像検出器及び放射線画像検出器の製造方法 |
JP6092568B2 (ja) * | 2012-10-11 | 2017-03-08 | キヤノン株式会社 | 放射線検出装置及び放射線検出システム |
EP2902126A1 (de) * | 2014-01-31 | 2015-08-05 | Primetals Technologies Austria GmbH | Verfahren und Vorrichtung zur Probennahme von Metallbändern |
JP6771981B2 (ja) | 2016-07-28 | 2020-10-21 | キヤノン株式会社 | シンチレータプレート及びこれを用いた放射線検出器 |
JP7080630B2 (ja) | 2017-12-21 | 2022-06-06 | キヤノン株式会社 | シンチレータプレート及びこれを用いた放射線検出器 |
JP6995666B2 (ja) | 2018-03-01 | 2022-01-14 | キヤノン株式会社 | 放射線撮像装置及び放射線撮像システム |
JP6701288B2 (ja) | 2018-09-06 | 2020-05-27 | キヤノン株式会社 | シンチレータプレート、放射線検出装置および放射線検出システム |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS63215987A (ja) * | 1987-03-04 | 1988-09-08 | Hamamatsu Photonics Kk | 高解像シンチレ−シヨンフアイバ−プレ−ト |
JPH01240887A (ja) * | 1988-03-23 | 1989-09-26 | Hitachi Ltd | 放射線検出器及びその製造方法 |
US5187369A (en) * | 1990-10-01 | 1993-02-16 | General Electric Company | High sensitivity, high resolution, solid state x-ray imaging device with barrier layer |
US5132539A (en) | 1991-08-29 | 1992-07-21 | General Electric Company | Planar X-ray imager having a moisture-resistant sealing structure |
JPH0721560A (ja) | 1993-06-30 | 1995-01-24 | Sony Corp | 磁気記録媒体の製造方法 |
JP3880094B2 (ja) * | 1996-02-22 | 2007-02-14 | キヤノン株式会社 | 放射線検出装置及びその製造方法 |
CN1133881C (zh) * | 1997-02-14 | 2004-01-07 | 浜松光子学株式会社 | 放射线检测元件及其制造方法 |
FR2774175B1 (fr) | 1998-01-27 | 2000-04-07 | Thomson Csf | Capteur electronique matriciel photosensible |
US6172371B1 (en) * | 1998-06-15 | 2001-01-09 | General Electric Company | Robust cover plate for radiation imager |
-
1998
- 1998-06-19 JP JP17308098A patent/JP3789646B2/ja not_active Expired - Fee Related
-
1999
- 1999-06-18 KR KR1020007014390A patent/KR100639845B1/ko not_active Expired - Lifetime
- 1999-06-18 EP EP99925376A patent/EP1115011B1/en not_active Expired - Lifetime
- 1999-06-18 DE DE69934126T patent/DE69934126T2/de not_active Expired - Lifetime
- 1999-06-18 WO PCT/JP1999/003263 patent/WO1999066347A1/ja active IP Right Grant
- 1999-06-18 CN CNB998073016A patent/CN1138157C/zh not_active Expired - Lifetime
- 1999-06-18 AU AU41680/99A patent/AU4168099A/en not_active Abandoned
-
2000
- 2000-12-18 US US09/739,425 patent/US6469305B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
AU4168099A (en) | 2000-01-05 |
WO1999066347A1 (fr) | 1999-12-23 |
US6469305B2 (en) | 2002-10-22 |
JP2000009845A (ja) | 2000-01-14 |
JP3789646B2 (ja) | 2006-06-28 |
US20010023924A1 (en) | 2001-09-27 |
EP1115011A1 (en) | 2001-07-11 |
DE69934126D1 (de) | 2007-01-04 |
DE69934126T2 (de) | 2007-09-20 |
CN1305594A (zh) | 2001-07-25 |
EP1115011B1 (en) | 2006-11-22 |
EP1115011A4 (en) | 2002-09-04 |
KR100639845B1 (ko) | 2006-10-27 |
CN1138157C (zh) | 2004-02-11 |
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