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JPS59232432A - 混成集積回路の製造方法 - Google Patents

混成集積回路の製造方法

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Publication number
JPS59232432A
JPS59232432A JP58107126A JP10712683A JPS59232432A JP S59232432 A JPS59232432 A JP S59232432A JP 58107126 A JP58107126 A JP 58107126A JP 10712683 A JP10712683 A JP 10712683A JP S59232432 A JPS59232432 A JP S59232432A
Authority
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Japan
Prior art keywords
layer
integrated circuit
hybrid integrated
bonding
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP58107126A
Other languages
English (en)
Inventor
Giichi Saito
斉藤 義一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
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Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP58107126A priority Critical patent/JPS59232432A/ja
Publication of JPS59232432A publication Critical patent/JPS59232432A/ja
Pending legal-status Critical Current

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  • Engineering & Computer Science (AREA)
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  • Manufacturing & Machinery (AREA)
  • Wire Bonding (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。

Description

【発明の詳細な説明】 (a)発明の技術分野 本発明は混成集積回路の製造方法、 ll?にボンディ
ング強度を高めるボンティングパッド形成法に関する。
(b)技術の背景 基板上Vζ回路素子を形成及び搭載してなる混成集積回
路において、半導体回路素子や外部接続用リード端子等
の搭載及び搭載回路素子の電極を形成回路素子に接続す
る手段として、熱圧着やワイヤボンディングが一般に行
われており、前記基板上にはそのだめのボンティングパ
ッドが形成されている。
(c)  従来技術と問題点 第1図は従来方法で形成されたタンタル薄膜混成集積回
路のボンティングパッドに外部リード端子を接続した部
分の側面図である。
第1図において、1はアルミナ基板、2は基板1の表面
に被着したTaxN層、3はTazN層2の上にパター
ン形成しだNi−0r層、4はNi−Cr層3の上に蒸
着形成したAu層(パッド基層)5はAl1層4の上に
めっき形成しブjAu層であり。
Auめっきした金属細線(又はAu細線)VCてなるリ
ード端子6の一端がAu層5の上に熱圧着法でボンディ
ングされている。
このように構成されたパッドのAu層5は、細線6との
All相互拡散を確保するため、一般に3 tr m〜
5 /1mの均一厚さに被着している。従って。
多数のボンディングパラi・有する集積回路を多数個製
造するとき、高価であり有限の天然資源である金(八U
)の消費量は極めて大量になるとともに、ボンディング
強度を高める技術的努力が限界に達しており、それらの
新規対策が望まれていた・(d、)  発明の目的 本発明の目的は、上記問題点に鑑みてAllの消費量を
低減させ、同時にボンティング強度を高めることである
6 (el  発明の溝成 上記目的は、ボンディングパラt′のクシ、くとも表面
を平面視網目状の凹凸に分割形成することを特徴とした
混成集積回路の製造方法により達成される。
(f+  発明の実施例  ・ 以下5図面を用いて本発明方法の実施例を説明する。
第2図は本発明方法の一実施例に係わりタンタル薄膜混
成集積回路のボンディングパソド(C外部リード端子を
接続した部分の側面図、第3図は外部リード端子を接続
してない前記)Z・ノドの平面図第4図は前記パッドの
ΔUめつき層を被着する実施例を説明するだめの側面図
でるる。
第1図と共通可能な部分に同一符号(1,2,3,4)
を用いた第2図において、基板10所定部上面に積層さ
れたTalN層2とtyt−crJ13と蒸着AuJf
i 4の上にめっき形成されたAl1層15は第3図に
示す如く、角柱形状の突起15a が多数個(図は36
個)配列された網目状であり、その上にAllめっきし
た金属細線(又(、」、Au細線)Kてなるリード端子
16の一端が熱圧着法でボンディングきれている。ただ
し、リード端子16の凹部16aj:jボンテイングウ
エツンで押しつぶされてできたものでらり1凹部168
の近傍の下方に位置する突起15aは、リード端子16
の表面となじむように塑性変形し、リード端子16にボ
ンディングされている。従って、第1図のリード端子6
と第2図のリード端子J6とを同じ条件でボンディング
したとき、リード端子6かAu層5に接続される面積よ
りも、リード端子16とAul鱗工5とが接続される面
積の方が大きくなる。
第3図において、蒸着Au層4の上ycめつき升成され
突起15aの断面寸法はW X Wとし、そオらの列方
向及び行方向間隔は1,7・である。セしてνと、υは
1例えばリード端子】6の直径(又は幅)が200 t
ノmのときそれぞれ50 a m VCするが如く五定
される 第4図において、基板1及び蒸着Au層4の−・に被着
;g7’L/jし/ストIf<17.1.7 aは、複
数個QAll突起15IL(Aulψ115)  をめ
っき形成さ→るためのものであり、それらは各突起15
aにヌ向する網目状パターンが設けられたマスクを用し
たフォトリソグラクイ技術により形成されてい2そして
突起15aは、レジスト層17と17aQ間隙を埋めて
、Al11け4の上((めっき被着され2なか2、ト記
実施例では基板−Fのパッドに外部引続用リード端子を
ごム圧着法で搭載しメこ一例であ2が、他の回路素子の
搭載例えは半導体素子を・フコ−ツボ/ティングすると
き、及び超音波法などイ1の方法での搭載等にも本発明
方法が適用されることをイτ1記する。
多  (g)発明の効果 t    以上説明した如く本発明によれし11.カミ
ンテインl   グバツFが相手の面になじみ易く、そ
のことによ−ってボンティング面積が拡がる等に」:す
、γFンティング強度は従来のものよ!710〜20係
強くなったのみたらず、被着するAuの月が減少するた
ヒ   め混成集積回路のコス(・が低減し、さらに網
目状、   のバク−/を設けたマスクを用いて本発明
方法にセ   係わるレジスト層を形成することにより
、工程をづ   増すことなく本発明が製品に適用され
る効イは大きい・・ 5゜ 4、図面の簡単な説明 、    第1図は従来方法で形成されたタンクルジ薄
11J(混成集積回路のパッドに外部リード端子をポン
ティ良   ングしだ部分の側面図、第2図は本発明方
法の一実施例に係わりタンタル薄膜混成集積回路のツク
′ノドに外部リード端子をボンティングL7だ部分の側
は   面図、第3図は第2図に示しだツクノドの前記
7にンデインク前におりる平面図、第4図は8¥2図及
び第3図に示(〜だパッドのAl1めつ@層を被着する
実施例を説明するだめの’It”II面図である、図に
ふいて、1は基板、21<l、TaxN層、3はN 1
−Cr層、4i+:蒸着Aul済、5.15に!、めっ
きAl1層、15e、ItよAu層J5を構成するAu
突起、17゜178(弓しジストパターンヲ示ス・ 代理人 弁理士 松岡宏四西−「I?、1.j(+、−
,・′l11

Claims (2)

    【特許請求の範囲】
  1. (1)ボンディングバットの少なくとも表面を平面視網
    目状の凹凸に分割形成することを特徴とした混成集積回
    路の製造方法。
  2. (2)前記網目状にパターン形成されたマスクを用いて
    パッド基層の上に網状のレジストハターンを形成し、該
    レンストパターンの網目間隙を埋めるめっき層を被着す
    ることを4?徴とした前記特許請求の範囲第1項に記載
    した混成集積回路の製造方法・
JP58107126A 1983-06-15 1983-06-15 混成集積回路の製造方法 Pending JPS59232432A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58107126A JPS59232432A (ja) 1983-06-15 1983-06-15 混成集積回路の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58107126A JPS59232432A (ja) 1983-06-15 1983-06-15 混成集積回路の製造方法

Publications (1)

Publication Number Publication Date
JPS59232432A true JPS59232432A (ja) 1984-12-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP58107126A Pending JPS59232432A (ja) 1983-06-15 1983-06-15 混成集積回路の製造方法

Country Status (1)

Country Link
JP (1) JPS59232432A (ja)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6087756A (en) * 1997-08-11 2000-07-11 Murata Manufacturing Co., Ltd. Surface acoustic wave
US6414415B1 (en) 1999-02-18 2002-07-02 Murata Manufacturing Co., Ltd. Surface acoustic wave device and method for manufacturing the same
US7102461B2 (en) * 2003-07-28 2006-09-05 Tdk Corporation Surface acoustic wave element, surface acoustic wave device, surface acoustic wave duplexer, and method of manufacturing surface acoustic wave element

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6087756A (en) * 1997-08-11 2000-07-11 Murata Manufacturing Co., Ltd. Surface acoustic wave
US6414415B1 (en) 1999-02-18 2002-07-02 Murata Manufacturing Co., Ltd. Surface acoustic wave device and method for manufacturing the same
US7102461B2 (en) * 2003-07-28 2006-09-05 Tdk Corporation Surface acoustic wave element, surface acoustic wave device, surface acoustic wave duplexer, and method of manufacturing surface acoustic wave element

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