JPS55162240A - Semiconductor device and its manufacture - Google Patents
Semiconductor device and its manufactureInfo
- Publication number
- JPS55162240A JPS55162240A JP6900179A JP6900179A JPS55162240A JP S55162240 A JPS55162240 A JP S55162240A JP 6900179 A JP6900179 A JP 6900179A JP 6900179 A JP6900179 A JP 6900179A JP S55162240 A JPS55162240 A JP S55162240A
- Authority
- JP
- Japan
- Prior art keywords
- region
- substrate
- type
- donors
- porous
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 8
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 abstract 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract 2
- 229910052681 coesite Inorganic materials 0.000 abstract 1
- 229910052906 cristobalite Inorganic materials 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 229910021426 porous silicon Inorganic materials 0.000 abstract 1
- 239000000377 silicon dioxide Substances 0.000 abstract 1
- 235000012239 silicon dioxide Nutrition 0.000 abstract 1
- 229910052682 stishovite Inorganic materials 0.000 abstract 1
- 239000002344 surface layer Substances 0.000 abstract 1
- 229910052905 tridymite Inorganic materials 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
- H01L21/7627—Vertical isolation by full isolation by porous oxide silicon, i.e. FIPOS techniques
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/7624—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using semiconductor on insulator [SOI] technology
- H01L21/76264—SOI together with lateral isolation, e.g. using local oxidation of silicon, or dielectric or polycristalline material refilled trench or air gap isolation regions, e.g. completely isolated semiconductor islands
- H01L21/76281—Lateral isolation by selective oxidation of silicon
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Thin Film Transistor (AREA)
- Local Oxidation Of Silicon (AREA)
- Bipolar Transistors (AREA)
- Element Separation (AREA)
Abstract
PURPOSE:To obtain a substrate suitable for use in a semiconductor device to operate at high speed with low power consumption by the method wherein, when a P-type region is formed on a P-type Si substrate, the sides and the bottom or the entire surface of this region is electrically separated by a porous Si oxide. CONSTITUTION:Protons which are to become donors are injected into a specified region of main surface 5 of P-type Si substrate 1 and this is heat treated, and thereby N-type region 20 is formed. The temperature for the heat treatment at this time is set below 500 deg.C and thereby the decrease or loss of donors is prevented. In this way, N-type region 20 is provided. Substrate 1 is put into a solution of hydrofluoric acid, and with substrate 1 made as an anode, anodic reaction is operated. By utilizing the phonomenon that N-type Si does not become porous, a greater part of substrate 1 is made into porous region 22, and region 20 is surrounded by this. Subsequently, substrate 1 is heat-treated at 800-1100 deg.C, and thereby the donors are made to disappear; and region 24 which has returned to the P-type and a region consisting of SiO2 film 25 covering this surface are obtained on the surface layer of P-type substrate 1, and here a desired element is formed.
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6900179A JPS55162240A (en) | 1979-06-04 | 1979-06-04 | Semiconductor device and its manufacture |
GB7934894A GB2038548B (en) | 1978-10-27 | 1979-10-08 | Isolating semiconductor device by porous silicon oxide |
CA337,192A CA1130014A (en) | 1978-10-27 | 1979-10-09 | Semiconductor devices and method of manufacturing the same |
NL7907715A NL7907715A (en) | 1978-10-27 | 1979-10-19 | SEMICONDUCTOR DEVICES AND METHOD FOR MANUFACTURING THEM. |
FR7926657A FR2440080A1 (en) | 1978-10-27 | 1979-10-26 | SEMICONDUCTOR DEVICES AND METHOD FOR MANUFACTURING A SEMICONDUCTOR COMPRISING POROUS SILICON REGIONS MADE BY ANODINATION |
DE2943435A DE2943435C2 (en) | 1978-10-27 | 1979-10-26 | Semiconductor structure and process for its manufacture |
US06/329,759 US4393577A (en) | 1978-10-27 | 1981-12-11 | Semiconductor devices and method of manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6900179A JPS55162240A (en) | 1979-06-04 | 1979-06-04 | Semiconductor device and its manufacture |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55162240A true JPS55162240A (en) | 1980-12-17 |
JPS5741824B2 JPS5741824B2 (en) | 1982-09-04 |
Family
ID=13389916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6900179A Granted JPS55162240A (en) | 1978-10-27 | 1979-06-04 | Semiconductor device and its manufacture |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55162240A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02104966A (en) * | 1988-10-12 | 1990-04-17 | Nissan Motor Co Ltd | Internal combustion engine fuel supply system |
JPH05102471A (en) * | 1991-10-03 | 1993-04-23 | Sharp Corp | Manufacture of semiconductor device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51278A (en) * | 1974-06-18 | 1976-01-05 | Matsushita Electric Ind Co Ltd | HANDOTAISHUSEKIKAIROKITAINO SEIZOHOHO |
JPS5559735A (en) * | 1978-10-27 | 1980-05-06 | Nippon Telegr & Teleph Corp <Ntt> | Substrate body for semiconductor integrated circuit and its preparation |
JPS5559736A (en) * | 1978-10-27 | 1980-05-06 | Nippon Telegr & Teleph Corp <Ntt> | Substrate body for semiconductor integrated circuit and its preparation |
JPS55156335A (en) * | 1979-05-24 | 1980-12-05 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor device and its manufacture |
-
1979
- 1979-06-04 JP JP6900179A patent/JPS55162240A/en active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51278A (en) * | 1974-06-18 | 1976-01-05 | Matsushita Electric Ind Co Ltd | HANDOTAISHUSEKIKAIROKITAINO SEIZOHOHO |
JPS5559735A (en) * | 1978-10-27 | 1980-05-06 | Nippon Telegr & Teleph Corp <Ntt> | Substrate body for semiconductor integrated circuit and its preparation |
JPS5559736A (en) * | 1978-10-27 | 1980-05-06 | Nippon Telegr & Teleph Corp <Ntt> | Substrate body for semiconductor integrated circuit and its preparation |
JPS55156335A (en) * | 1979-05-24 | 1980-12-05 | Nippon Telegr & Teleph Corp <Ntt> | Semiconductor device and its manufacture |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02104966A (en) * | 1988-10-12 | 1990-04-17 | Nissan Motor Co Ltd | Internal combustion engine fuel supply system |
JPH05102471A (en) * | 1991-10-03 | 1993-04-23 | Sharp Corp | Manufacture of semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
JPS5741824B2 (en) | 1982-09-04 |
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