JPS5633840A - Manufacture of semiconductor device - Google Patents
Manufacture of semiconductor deviceInfo
- Publication number
- JPS5633840A JPS5633840A JP10916479A JP10916479A JPS5633840A JP S5633840 A JPS5633840 A JP S5633840A JP 10916479 A JP10916479 A JP 10916479A JP 10916479 A JP10916479 A JP 10916479A JP S5633840 A JPS5633840 A JP S5633840A
- Authority
- JP
- Japan
- Prior art keywords
- film
- implanting
- emitter
- eliminated
- heat treatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Bipolar Transistors (AREA)
- Local Oxidation Of Silicon (AREA)
Abstract
PURPOSE:To prevent the occurence of contamination at an interface between a semiconductor substrate and an insulating film by consisting the insulating film with a predetermined pattern which is provided on the surface of the semiconductor substrate as a mask wherein heat treatment is done in oxidized atmosphere after implanting an impurity ion. CONSTITUTION:A thermal oxide film 2 is formed on a silicon substrate 6 formed a base rigion 3 and after etching the film 2 with a predetermined pattern, a P+ implantation region 4 for emitter and high density phosphorus ion implantation layer 1 are formed by implanting a phosphorus ion. Next, for example, an SiO2 film 5 containing phosphorus is formed by heat treatment which is made for an hour at a relatively low temperature of 700-900 deg.C in damp oxygen. In this way, unnecessary contamination will be eliminated as the SiO2 film 5 is formed with an emitter or the like by a continuous process. And a crystal damage section goes with ion implantation will be eliminated as oxidation is made in the region showing slow velocity of propagation of crystal defect.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10916479A JPS5633840A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10916479A JPS5633840A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5633840A true JPS5633840A (en) | 1981-04-04 |
Family
ID=14503266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10916479A Pending JPS5633840A (en) | 1979-08-29 | 1979-08-29 | Manufacture of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5633840A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5246686A (en) * | 1975-10-08 | 1977-04-13 | Japan Storage Battery Co Ltd | Device for igniting a dischrge lamp |
JPS60138972A (en) * | 1983-12-27 | 1985-07-23 | Fuji Electric Corp Res & Dev Ltd | Manufacturing method of insulated gate field effect transistor |
US5015593A (en) * | 1989-05-15 | 1991-05-14 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor device |
-
1979
- 1979-08-29 JP JP10916479A patent/JPS5633840A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5246686A (en) * | 1975-10-08 | 1977-04-13 | Japan Storage Battery Co Ltd | Device for igniting a dischrge lamp |
JPS60138972A (en) * | 1983-12-27 | 1985-07-23 | Fuji Electric Corp Res & Dev Ltd | Manufacturing method of insulated gate field effect transistor |
US5015593A (en) * | 1989-05-15 | 1991-05-14 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor device |
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