GB1586230A - Semiconductor wafers for the production of highlyintegrated modules - Google Patents
Semiconductor wafers for the production of highlyintegrated modules Download PDFInfo
- Publication number
- GB1586230A GB1586230A GB39677/77A GB3967777A GB1586230A GB 1586230 A GB1586230 A GB 1586230A GB 39677/77 A GB39677/77 A GB 39677/77A GB 3967777 A GB3967777 A GB 3967777A GB 1586230 A GB1586230 A GB 1586230A
- Authority
- GB
- United Kingdom
- Prior art keywords
- cells
- basic
- sub
- circuits
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title claims description 26
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 235000012431 wafers Nutrition 0.000 title description 16
- 239000004020 conductor Substances 0.000 claims description 9
- 238000000034 method Methods 0.000 claims description 8
- 230000015572 biosynthetic process Effects 0.000 claims description 7
- 238000013461 design Methods 0.000 claims description 7
- 238000009792 diffusion process Methods 0.000 claims description 7
- 239000011159 matrix material Substances 0.000 claims description 6
- 230000002093 peripheral effect Effects 0.000 claims description 6
- 238000011161 development Methods 0.000 claims description 5
- 230000010354 integration Effects 0.000 claims description 5
- 238000012856 packing Methods 0.000 claims description 4
- 238000000926 separation method Methods 0.000 claims description 2
- 238000009472 formulation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/10—Integrated device layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Bipolar Transistors (AREA)
Description
(54) IMPROVEMENTS IN OR RELATING TO SEMICONDUCTOR WAFERS
FOR THE PRODUCTION OF HIGHLY-INTEGRATED MODULES
(71) We, SIEMENS AKTIENGESELLSCH
AFT, a German Company of Berlin and Munich, German Federal Republic, do hereby declare the invention, for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement :
The present invention relates to semiconductor wafers for the production of highly-integrated modules.
In the production of highly-integrated modules for use in data processing and control systems, attempts to attain ever higher degrees of integration have led, because of the combination of a very large number of individual functions in a single module, to such specialised integrated modules that each module type can be used only at a few points or even at only one point of a larger functional unit. The result is the need to produce a large number of different types of component each only requiring to be supplied in small numbers. However, two processes have already been proposed, the object of which is to maintain the development costs and the time elapsing between the formulation of a particular user's requirements and the manufacture of a module to satisfy them within viable limits. In the first process, which is referred to under the name of the "Masterslice Principle" (see German Patent Specification as open to inspection No. 2,334,405, and
Digest of the IEEE International Solid-State
Circuits Conference 1974, pages 62-63), a standardisation diffusion pattern is used. In this process, diffusion is used to form a large number of transistors and resistors in a semiconductor wafer, which, apart from a few exceptions; are not initially connected to one another. In addition to edge zones provided with connection elements by means of which the integrated circuit module can subsequently be externally connected, the basic structure-of the wafer comprises a plurality of discrete surface portions which are arranged iri the form of a matrix and which are mutually spaced from one another. These surface portions, which are generally referred to as "cells", possesses identical, subbasic structures produced by diffusion. The basic structure is independent of the final design of the integrated circuit module. Consequently, the diffusion masks used to form the basic structure need only be set up once.
The diffused basic structure is supplemented by conductor paths formed at different levels with insulating intermediate layers between the paths at adjacent levels to form a specific circuit module. The intermediate layers are so designed that electrically conductive connections can be established between the diffused basic structure and the conductor paths at different levels themselves.
The design of the wiring of the integrated module takes place in two stages. The internal basic circuit of the cell which is evolved by the module manufacturer is so designed that simple logic-linking elements, such as NAND or NOR-gates, are formed from the contents of transistors and resistors provided in each cell. It is possible for the manufacturere to provide the user with more complex functional elements as basic circuits.
The user now prepares the logic design of the circuit which is to be integrated in the module and supplies this design and generally a list of the connections between the cells, to the manufacturer. With the help of this information, the manufacturer prepares the specifications for the overall wiring and finally puts the module into production.
In the second process which is already known under the name of the "Mosaic process" (see Electronic Design for 15.3.1970, page 42), the semiconductor wafer similarly comprises a plurality of individual surface portions. However, the individual surface portions are in this case generally of different sizes and have different diffused basic structures. These basic structures and the associated wiring for the formation of specific functional units are previously designed by the manufacturer and stored in a computer library. The user can freely select the functional units he requires, such as for example flip-flops, multiplexers, counters and the like, and then informs the manufacturer of the arrangements and connections which he requires. He is thus able to proceed in a similar fashion to that followed in the handling of medium scale integrated circuits.
The application of principles outlined above to the development of integrated modules having a high degree of integration does indeed basically produce a considerable reduction in time and cost, in comparison with the development of a speialised integ- rated module, although as a rule, only a lower packing density can be achieved. This becomes particularly clear, if irregularly structured logic control circuits are functionally closely connected to regularly constructed storage circuits, registers and the like in a circuit arrangement which is to be integrated.
The separation into modules for logic-linking circuits and modules having storage functions which may be carried for this reason results in more interfaces which in turn gives rise to the need for connection lugs, larger housings and more output drive devices.
It is an object of the present invention to provide a semiconductor wafer by the use of which the packing density can be increased of modules having a high degree of integration.
According to the invention there is provided a semiconductor wafer for use in the production of highly-integrated modules having a basic structure formed by diffusion, comprising a peripheral zone having connection elements formed therein for external connection of a circuit formed in said wafer, and a plurality of semiconductor components arranged to form a plurality of individual cells located in a portion of the surface of said wafer within said peripheral zone, each said cell having a sub-basic diffused structure, a majority of said cells having identical subbasic structures and surface areas and the or each of the remaining cells having a sub-basic structure which is different from that of said majority of the cells, and a surface area which is greater than that of each individual one of said majority of cells. The basic structure of the modules (and thus of the sub-basic structures) will normally consist of transistors and resistors.
A preferred form of wafer according to the invention is one wherein the majority of cells having identical sub-basic structures are arranged in the form of a matrix mutually spaced from one another, and are provided with conductor paths for the formation of predetermined sub-basic circuits from the transistors and resistors of each sub-basic structure within the individual cells, and for the formation of an overall circuit composed of the basic sub-circuits in accordance with given requirements; and wherein the or each of the remaining cells has a different subbasic structure, the sub-basic structure of the or each remaining cell and the wiring pattern which is required to form a basic circuit therefrom being freely selectable from one or more different basic sub-circuits to meet a particular requirement.
The invention will now be further described with reference to the drawing, which is a schematic plan view of a semiconductor wafer according to the invention.
Referring to the drawing, a semiconductor wafer 1 is provided with an edge zone 2 which contains connection elements for subsequent connection of conductor paths forming internal connections to outwardly-directed connection pins on the finished module and output drive device. The region of the surface of the semiconductor wafer 1 which lies within the edge zone 2 is provided with a plurality of surface portions or cells mutually spaced from one another. A majority of these cells 3 are arranged in the form of a matrix and these cells all have the same dimensions.
The cells 3 also have identical, diffused subbasic structures, i.e. the number of transistors and resistors and their geometrical arrangements are identical in all the cells 3. The remaining cell 4 is larger than any of the cells 3 and has a different diffused sub-basic structure. The diffused sub-basic structure of the cell 4 is usually such that it is particularly suitable for forming a store complex or a data register. By the provision of suitable internal wiring of the cells using conductor paths at different levels (not shown), the diffused subbasic structures of the cells are transformed into basic sub-circuits. Fundamentally there are two different ways of carrying out the internal wiring of the cells 3. In one method (which is already known for this general purpose) all the cells 3 are connected in the same way to form simple logic-linking elements, such as AND-gates or NOR-gates.
It has already been proposed to provide different, pre-designed internal cell wiring patterns so that the user can have complex basic circuits made up of two or three cells for the logic design of the circuit to be integrated. For the cell 4 it is also possible to provide a variety of different possible wiring patterns which, even with the same diffused basic sub-structure, allow specific variations of the basic circuit of this cell to be achieved.
Thus, for example, when the cell 4 is to be used as a store complex, by changing the wiring pattern it is possible to alter the external organisation of the store complex within certain limits with respect to the number of words, or of bits per word. In place of a storage complex, other enclosed circuit complexes can be formed', in which case it will generally be desirable to adapt the diffused basic sub-structure to the particular use. More than one remaining cell corresponding to the cell 4 can, if desired, be accommodated in the semiconductor wafer 1.
WHAT WE CLAIM IS:
1. A semiconductor wafer for use in the
**WARNING** end of DESC field may overlap start of CLMS **.
Claims (5)
1. A semiconductor wafer for use in the
production of highly-integrated modules having a basic structure formed by diffusion, comprising a peripheral zone having connection elements formed therein for external connection of a circuit formed in said wafer, and a plurality of semi-conductor components arranged to form a plurality of individual cells located in a portion of the surface of said wafer within said peripheral zone, each said cell having a sub-basic diffused structure, a majority of said cells having identical subbasic structures and surface areas and the or each of the remaining cells having a subbasic structure which is different from that of said majority of the cells, and a surface area which is greater than that of each individual one of said majority of cells.
2. A semiconductor wafer as claimed in
Claim 1, wherein the basic structure of said modules consists of transistors and resistors.
3. A semiconductor wafer as claimed in
Claim 2, wherein the cells of said majority having identical sub-basic structures are arranged in the form of a matrix mutually spaced from one another, and are provided with conductor paths for the formation of predetermined sub-basic circuits from the transistors and resistors of each sub-basic structure within the individual cells, and for the formation of an overall circuit composed of the basic sub-circuits in accordance with given requirements; and wherein the or each of said remaining cells has a different subbasic structure, the sub-basic structure of the or each said remaining cell and the wiring pattern which is required to form a basic circuit therefrom being freely selectable from one or more different basic sub-circuits to meet a particular requirement.
4. A semiconductor wafer substantially as hereinbefore described with reference to and as schematically illustrated in the drawing.
5. A highly-integrated module produced using a semi-conductor wafer as claimed in any one of Claims 1 to 4.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19762643482 DE2643482A1 (en) | 1976-09-27 | 1976-09-27 | SEMI-CONDUCTOR PLATE FOR MANUFACTURING HIGHLY INTEGRATED COMPONENTS |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1586230A true GB1586230A (en) | 1981-03-18 |
Family
ID=5988974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB39677/77A Expired GB1586230A (en) | 1976-09-27 | 1977-09-23 | Semiconductor wafers for the production of highlyintegrated modules |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS5342578A (en) |
DE (1) | DE2643482A1 (en) |
FR (1) | FR2365883A1 (en) |
GB (1) | GB1586230A (en) |
NL (1) | NL7710490A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4675849A (en) * | 1982-07-26 | 1987-06-23 | Tokyo Shibaura Denki Kabushiki Kaisha | Semiconductor device |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4249193A (en) * | 1978-05-25 | 1981-02-03 | International Business Machines Corporation | LSI Semiconductor device and fabrication thereof |
FR2443185A1 (en) * | 1978-11-30 | 1980-06-27 | Ibm | TOPOLOGY OF INTEGRATED SEMICONDUCTOR CIRCUITS AND METHOD FOR OBTAINING THIS TOPOLOGY |
JPS5578561A (en) * | 1978-12-08 | 1980-06-13 | Fujitsu Ltd | Master-slice lsi circuit device |
JPS5591853A (en) * | 1978-12-29 | 1980-07-11 | Fujitsu Ltd | Semiconductor device |
DE3177305T2 (en) * | 1980-05-29 | 1994-06-16 | Texas Instruments Inc | Modular I / O system. |
JPS57100758A (en) * | 1980-12-16 | 1982-06-23 | Nec Corp | Semiconductor device |
JPS57124463A (en) * | 1981-01-26 | 1982-08-03 | Nec Corp | Semiconductor device |
JPS57149762A (en) * | 1981-03-11 | 1982-09-16 | Matsushita Electronics Corp | Large scale integrated circuit |
JPS57176744A (en) * | 1981-04-22 | 1982-10-30 | Nec Corp | Semiconductor device |
JPS5954255A (en) * | 1982-09-21 | 1984-03-29 | Nec Corp | Large scale integrated circuit |
JPS6017932A (en) * | 1983-07-09 | 1985-01-29 | Fujitsu Ltd | gate array |
JPS6032340A (en) * | 1983-08-02 | 1985-02-19 | Nec Corp | Semiconductor integrated circuit device |
US5124776A (en) * | 1989-03-14 | 1992-06-23 | Fujitsu Limited | Bipolar integrated circuit having a unit block structure |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1277172A (en) * | 1969-07-04 | 1972-06-07 | Hitachi Ltd | Method of making a large integrated circuit |
US3742254A (en) * | 1971-01-27 | 1973-06-26 | Texas Instruments Inc | Automatic mos grounding circuit |
US3981070A (en) * | 1973-04-05 | 1976-09-21 | Amdahl Corporation | LSI chip construction and method |
US3968478A (en) * | 1974-10-30 | 1976-07-06 | Motorola, Inc. | Chip topography for MOS interface circuit |
FR2296967A1 (en) * | 1974-12-30 | 1976-07-30 | Ibm | LARGE DENSITY LOGICAL NETWORK |
US4006492A (en) * | 1975-06-23 | 1977-02-01 | International Business Machines Corporation | High density semiconductor chip organization |
-
1976
- 1976-09-27 DE DE19762643482 patent/DE2643482A1/en active Pending
-
1977
- 1977-09-21 FR FR7728427A patent/FR2365883A1/en active Pending
- 1977-09-23 GB GB39677/77A patent/GB1586230A/en not_active Expired
- 1977-09-26 NL NL7710490A patent/NL7710490A/en not_active Application Discontinuation
- 1977-09-27 JP JP11601077A patent/JPS5342578A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4675849A (en) * | 1982-07-26 | 1987-06-23 | Tokyo Shibaura Denki Kabushiki Kaisha | Semiconductor device |
Also Published As
Publication number | Publication date |
---|---|
NL7710490A (en) | 1978-03-29 |
DE2643482A1 (en) | 1978-03-30 |
JPS5342578A (en) | 1978-04-18 |
FR2365883A1 (en) | 1978-04-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |