DE69824972D1 - Integrierter halbleiterschaltkreis - Google Patents
Integrierter halbleiterschaltkreisInfo
- Publication number
- DE69824972D1 DE69824972D1 DE69824972T DE69824972T DE69824972D1 DE 69824972 D1 DE69824972 D1 DE 69824972D1 DE 69824972 T DE69824972 T DE 69824972T DE 69824972 T DE69824972 T DE 69824972T DE 69824972 D1 DE69824972 D1 DE 69824972D1
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor circuit
- integrated semiconductor
- integrated
- circuit
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/10—Integrated device layouts
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
- G11C5/146—Substrate bias generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0008—Arrangements for reducing power consumption
- H03K19/0016—Arrangements for reducing power consumption by using a control or a clock signal, e.g. in order to apply power supply
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/859—Complementary IGFETs, e.g. CMOS comprising both N-type and P-type wells, e.g. twin-tub
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
- H10D84/903—Masterslice integrated circuits comprising field effect technology
- H10D84/907—CMOS gate arrays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Semiconductor Integrated Circuits (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP35927197A JP4109340B2 (ja) | 1997-12-26 | 1997-12-26 | 半導体集積回路装置 |
JP35927197 | 1997-12-26 | ||
PCT/JP1998/005770 WO1999034445A1 (fr) | 1997-12-26 | 1998-12-21 | Circuit integre semi-conducteur |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69824972D1 true DE69824972D1 (de) | 2004-08-12 |
DE69824972T2 DE69824972T2 (de) | 2005-07-14 |
Family
ID=18463648
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69824972T Expired - Lifetime DE69824972T2 (de) | 1997-12-26 | 1998-12-21 | Integrierter halbleiterschaltkreis |
Country Status (9)
Country | Link |
---|---|
US (8) | US6483374B1 (de) |
EP (1) | EP1043774B1 (de) |
JP (1) | JP4109340B2 (de) |
KR (1) | KR100625153B1 (de) |
CN (1) | CN1195324C (de) |
DE (1) | DE69824972T2 (de) |
MY (1) | MY118314A (de) |
TW (1) | TW426988B (de) |
WO (1) | WO1999034445A1 (de) |
Families Citing this family (87)
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JP4109340B2 (ja) * | 1997-12-26 | 2008-07-02 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
TW453032B (en) * | 1998-09-09 | 2001-09-01 | Hitachi Ltd | Semiconductor integrated circuit apparatus |
JP2009123235A (ja) * | 2000-06-16 | 2009-06-04 | Renesas Technology Corp | 半導体集積回路装置 |
JPWO2002029893A1 (ja) * | 2000-10-03 | 2004-02-19 | 株式会社ルネサステクノロジ | 半導体装置 |
JP2002313937A (ja) * | 2001-04-16 | 2002-10-25 | Sony Corp | 集積回路装置 |
US7180322B1 (en) | 2002-04-16 | 2007-02-20 | Transmeta Corporation | Closed loop feedback control of integrated circuits |
US7941675B2 (en) * | 2002-12-31 | 2011-05-10 | Burr James B | Adaptive power control |
US6734472B2 (en) * | 2002-04-25 | 2004-05-11 | Synplicity, Inc. | Power and ground shield mesh to remove both capacitive and inductive signal coupling effects of routing in integrated circuit device |
JP4401621B2 (ja) * | 2002-05-07 | 2010-01-20 | 株式会社日立製作所 | 半導体集積回路装置 |
US6933744B2 (en) * | 2002-06-11 | 2005-08-23 | The Regents Of The University Of Michigan | Low-leakage integrated circuits and dynamic logic circuits |
US6864539B2 (en) * | 2002-07-19 | 2005-03-08 | Semiconductor Technology Academic Research Center | Semiconductor integrated circuit device having body biasing circuit for generating forward well bias voltage of suitable level by using simple circuitry |
US7739624B2 (en) | 2002-07-29 | 2010-06-15 | Synopsys, Inc. | Methods and apparatuses to generate a shielding mesh for integrated circuit devices |
US7943436B2 (en) | 2002-07-29 | 2011-05-17 | Synopsys, Inc. | Integrated circuit devices and methods and apparatuses for designing integrated circuit devices |
JP2004152975A (ja) * | 2002-10-30 | 2004-05-27 | Renesas Technology Corp | 半導体装置の製造方法および半導体装置 |
US7053692B2 (en) * | 2002-12-19 | 2006-05-30 | United Memories, Inc. | Powergate control using boosted and negative voltages |
US7953990B2 (en) | 2002-12-31 | 2011-05-31 | Stewart Thomas E | Adaptive power control based on post package characterization of integrated circuits |
US7228242B2 (en) | 2002-12-31 | 2007-06-05 | Transmeta Corporation | Adaptive power control based on pre package characterization of integrated circuits |
JP4708716B2 (ja) * | 2003-02-27 | 2011-06-22 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置、半導体集積回路装置の設計方法 |
JP4342833B2 (ja) | 2003-05-16 | 2009-10-14 | Necエレクトロニクス株式会社 | 容量セルと半導体装置及びその製造方法 |
US7219324B1 (en) * | 2003-06-02 | 2007-05-15 | Virage Logic Corporation | Various methods and apparatuses to route multiple power rails to a cell |
US7250807B1 (en) * | 2003-06-05 | 2007-07-31 | National Semiconductor Corporation | Threshold scaling circuit that minimizes leakage current |
JP2005109179A (ja) * | 2003-09-30 | 2005-04-21 | National Institute Of Advanced Industrial & Technology | 高速低消費電力論理装置 |
US7129771B1 (en) * | 2003-12-23 | 2006-10-31 | Transmeta Corporation | Servo loop for well bias voltage source |
US7649402B1 (en) | 2003-12-23 | 2010-01-19 | Tien-Min Chen | Feedback-controlled body-bias voltage source |
US7012461B1 (en) | 2003-12-23 | 2006-03-14 | Transmeta Corporation | Stabilization component for a substrate potential regulation circuit |
US7692477B1 (en) | 2003-12-23 | 2010-04-06 | Tien-Min Chen | Precise control component for a substrate potential regulation circuit |
US7026843B1 (en) * | 2004-01-16 | 2006-04-11 | Spansion Llc | Flexible cascode amplifier circuit with high gain for flash memory cells |
US7033883B2 (en) * | 2004-06-04 | 2006-04-25 | Faraday Technology Corp. | Placement method for decoupling capacitors |
JP4894014B2 (ja) * | 2004-06-15 | 2012-03-07 | エスティー‐エリクソン、ソシエテ、アノニム | 集積回路のための電源の適応制御 |
US7562233B1 (en) | 2004-06-22 | 2009-07-14 | Transmeta Corporation | Adaptive control of operating and body bias voltages |
US7774625B1 (en) | 2004-06-22 | 2010-08-10 | Eric Chien-Li Sheng | Adaptive voltage control by accessing information stored within and specific to a microprocessor |
US7319357B2 (en) * | 2004-08-24 | 2008-01-15 | Texas Instruments Incorporated | System for controlling switch transistor performance |
JP2006173492A (ja) * | 2004-12-17 | 2006-06-29 | Matsushita Electric Ind Co Ltd | 半導体装置 |
JP2006217540A (ja) * | 2005-02-07 | 2006-08-17 | Fujitsu Ltd | 半導体集積回路および半導体集積回路の制御方法 |
US7508256B2 (en) * | 2005-05-13 | 2009-03-24 | Mosaid Technologies Corporation | Integrated circuit with signal bus formed by cell abutment of logic cells |
JP2007027314A (ja) * | 2005-07-14 | 2007-02-01 | Nec Electronics Corp | 半導体集積回路装置 |
JP2007148952A (ja) * | 2005-11-30 | 2007-06-14 | Renesas Technology Corp | 半導体集積回路 |
US20070152745A1 (en) * | 2005-12-30 | 2007-07-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for reducing leakage current of an integrated circuit |
JP2007201236A (ja) * | 2006-01-27 | 2007-08-09 | Renesas Technology Corp | 半導体集積回路 |
JP5092263B2 (ja) * | 2006-03-31 | 2012-12-05 | 富士通セミコンダクター株式会社 | デカップリングコンデンサ及び半導体集積回路装置 |
JP2008103569A (ja) * | 2006-10-19 | 2008-05-01 | Nec Electronics Corp | 半導体装置 |
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JP4905553B2 (ja) | 2007-06-20 | 2012-03-28 | 富士通株式会社 | 情報処理装置および制御方法 |
JP5142686B2 (ja) * | 2007-11-30 | 2013-02-13 | ルネサスエレクトロニクス株式会社 | 半導体集積回路 |
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KR100223770B1 (ko) * | 1996-06-29 | 1999-10-15 | 김영환 | 반도체 장치의 문턱전압 제어회로 |
US5786724A (en) * | 1996-12-17 | 1998-07-28 | Texas Instruments Incorporated | Control of body effect in MOS transistors by switching source-to-body bias |
JP3732914B2 (ja) * | 1997-02-28 | 2006-01-11 | 株式会社ルネサステクノロジ | 半導体装置 |
KR100273208B1 (ko) * | 1997-04-02 | 2000-12-15 | 김영환 | 반도체메모리장치의고효율전하펌프회로 |
JP3814385B2 (ja) * | 1997-10-14 | 2006-08-30 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
JP4109340B2 (ja) * | 1997-12-26 | 2008-07-02 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
US6191615B1 (en) * | 1998-03-30 | 2001-02-20 | Nec Corporation | Logic circuit having reduced power consumption |
JP4390304B2 (ja) * | 1998-05-26 | 2009-12-24 | 株式会社ルネサステクノロジ | 半導体集積回路装置 |
TW453032B (en) * | 1998-09-09 | 2001-09-01 | Hitachi Ltd | Semiconductor integrated circuit apparatus |
US6198340B1 (en) * | 1999-02-08 | 2001-03-06 | Etron Technology, Inc. | High efficiency CMOS pump circuit |
-
1997
- 1997-12-26 JP JP35927197A patent/JP4109340B2/ja not_active Expired - Lifetime
-
1998
- 1998-12-09 TW TW087120452A patent/TW426988B/zh not_active IP Right Cessation
- 1998-12-19 MY MYPI98005761A patent/MY118314A/en unknown
- 1998-12-21 CN CNB988126702A patent/CN1195324C/zh not_active Expired - Fee Related
- 1998-12-21 DE DE69824972T patent/DE69824972T2/de not_active Expired - Lifetime
- 1998-12-21 WO PCT/JP1998/005770 patent/WO1999034445A1/ja active IP Right Grant
- 1998-12-21 KR KR1020007007127A patent/KR100625153B1/ko not_active Expired - Fee Related
- 1998-12-21 US US09/582,485 patent/US6483374B1/en not_active Expired - Lifetime
- 1998-12-21 EP EP98961441A patent/EP1043774B1/de not_active Expired - Lifetime
-
2000
- 2000-01-27 US US09/492,506 patent/US6337593B1/en not_active Expired - Lifetime
-
2002
- 2002-09-20 US US10/247,525 patent/US6600360B2/en not_active Expired - Lifetime
-
2003
- 2003-05-22 US US10/443,018 patent/US6707334B2/en not_active Expired - Lifetime
-
2004
- 2004-01-29 US US10/765,923 patent/US6987415B2/en not_active Expired - Lifetime
-
2005
- 2005-06-06 US US11/144,695 patent/US7046075B2/en not_active Expired - Lifetime
-
2006
- 2006-04-04 US US11/396,543 patent/US7321252B2/en not_active Expired - Fee Related
-
2007
- 2007-11-27 US US11/987,073 patent/US7598796B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20030016076A1 (en) | 2003-01-23 |
US20040183585A1 (en) | 2004-09-23 |
EP1043774B1 (de) | 2004-07-07 |
JPH11191611A (ja) | 1999-07-13 |
JP4109340B2 (ja) | 2008-07-02 |
EP1043774A1 (de) | 2000-10-11 |
US6483374B1 (en) | 2002-11-19 |
US7321252B2 (en) | 2008-01-22 |
KR20010033614A (ko) | 2001-04-25 |
US20030206049A1 (en) | 2003-11-06 |
US7598796B2 (en) | 2009-10-06 |
US20060176101A1 (en) | 2006-08-10 |
US6987415B2 (en) | 2006-01-17 |
US20080136502A1 (en) | 2008-06-12 |
US6600360B2 (en) | 2003-07-29 |
EP1043774A4 (de) | 2002-01-02 |
DE69824972T2 (de) | 2005-07-14 |
CN1283308A (zh) | 2001-02-07 |
US7046075B2 (en) | 2006-05-16 |
WO1999034445A1 (fr) | 1999-07-08 |
CN1195324C (zh) | 2005-03-30 |
US6707334B2 (en) | 2004-03-16 |
US20050218965A1 (en) | 2005-10-06 |
KR100625153B1 (ko) | 2006-09-20 |
MY118314A (en) | 2004-09-30 |
TW426988B (en) | 2001-03-21 |
US6337593B1 (en) | 2002-01-08 |
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