DE69300064D1 - Speicher-Leseschaltung mit Vorladung und Ausgleichung vor dem Lesen. - Google Patents
Speicher-Leseschaltung mit Vorladung und Ausgleichung vor dem Lesen.Info
- Publication number
- DE69300064D1 DE69300064D1 DE69300064T DE69300064T DE69300064D1 DE 69300064 D1 DE69300064 D1 DE 69300064D1 DE 69300064 T DE69300064 T DE 69300064T DE 69300064 T DE69300064 T DE 69300064T DE 69300064 D1 DE69300064 D1 DE 69300064D1
- Authority
- DE
- Germany
- Prior art keywords
- charging
- memory read
- read circuit
- before reading
- equalization before
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/062—Differential amplifiers of non-latching type, e.g. comparators, long-tailed pairs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/26—Sensing or reading circuits; Data output circuits
- G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/067—Single-ended amplifiers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/06—Sense amplifier related aspects
- G11C2207/063—Current sense amplifiers
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9209199A FR2694119B1 (fr) | 1992-07-24 | 1992-07-24 | Circuit de lecture pour mémoire, avec recharge et équilibrage avant lecture. |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69300064D1 true DE69300064D1 (de) | 1995-03-23 |
DE69300064T2 DE69300064T2 (de) | 1995-06-22 |
Family
ID=9432266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69300064T Expired - Fee Related DE69300064T2 (de) | 1992-07-24 | 1993-07-19 | Speicher-Leseschaltung mit Vorladung und Ausgleichung vor dem Lesen. |
Country Status (5)
Country | Link |
---|---|
US (3) | US5581511A (de) |
EP (1) | EP0585150B1 (de) |
JP (1) | JP3398722B2 (de) |
DE (1) | DE69300064T2 (de) |
FR (1) | FR2694119B1 (de) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9423035D0 (en) * | 1994-11-15 | 1995-01-04 | Sgs Thomson Microelectronics | Voltage boost circuit for a memory device |
KR100276536B1 (ko) * | 1995-02-10 | 2001-01-15 | 로데릭 더블류 루이스 | 판독바이어싱회로,고속감지회로및감지방법 |
US6108237A (en) | 1997-07-17 | 2000-08-22 | Micron Technology, Inc. | Fast-sensing amplifier for flash memory |
US5663915A (en) * | 1995-06-07 | 1997-09-02 | United Memories, Inc. | Amplifier and method for sensing having a pre-bias or coupling step |
JPH09153285A (ja) * | 1995-11-29 | 1997-06-10 | Mitsubishi Electric Corp | 増幅回路および相補型増幅回路 |
WO1997030454A1 (fr) * | 1996-02-19 | 1997-08-21 | Citizen Watch Co., Ltd. | Memoire remanente a semi-conducteurs |
FR2752324B1 (fr) * | 1996-08-08 | 1998-09-18 | Sgs Thomson Microelectronics | Memoire non volatile en circuit-integre a lecture rapide |
FR2760888B1 (fr) * | 1997-03-11 | 1999-05-07 | Sgs Thomson Microelectronics | Circuit de lecture pour memoire adapte a la mesure des courants de fuite |
IT1298939B1 (it) * | 1998-02-23 | 2000-02-07 | Sgs Thomson Microelectronics | Amplificatore di rilevamento statico a retroazione per memorie non volatili |
US6370057B1 (en) | 1999-02-24 | 2002-04-09 | Kabushiki Kaisha Toshiba | Semiconductor memory device having plate lines and precharge circuits |
KR100287884B1 (ko) * | 1998-11-26 | 2001-05-02 | 김영환 | 반도체 메모리소자의 센싱회로 및 그를 이용한센싱방법 |
IT1307686B1 (it) * | 1999-04-13 | 2001-11-14 | St Microelectronics Srl | Circuito di lettura per celle di memoria non volatile senzalimitazioni della tensione di alimentazione. |
DE10019481C1 (de) * | 2000-04-19 | 2001-11-29 | Infineon Technologies Ag | Schaltungsanordnung zum Auslesen einer Speicherzelle mit einem ferroelektrischen Kondensator |
US6747892B2 (en) * | 2000-11-21 | 2004-06-08 | Sandisk Corporation | Sense amplifier for multilevel non-volatile integrated memory devices |
NL1016779C2 (nl) * | 2000-12-02 | 2002-06-04 | Cornelis Johannes Maria V Rijn | Matrijs, werkwijze voor het vervaardigen van precisieproducten met behulp van een matrijs, alsmede precisieproducten, in het bijzonder microzeven en membraanfilters, vervaardigd met een dergelijke matrijs. |
US7177181B1 (en) * | 2001-03-21 | 2007-02-13 | Sandisk 3D Llc | Current sensing method and apparatus particularly useful for a memory array of cells having diode-like characteristics |
JP2003085968A (ja) * | 2001-09-07 | 2003-03-20 | Canon Inc | 磁気メモリ装置の読み出し回路 |
JP2003085966A (ja) * | 2001-09-07 | 2003-03-20 | Canon Inc | 磁気メモリ装置の読み出し回路 |
US6600690B1 (en) * | 2002-06-28 | 2003-07-29 | Motorola, Inc. | Sense amplifier for a memory having at least two distinct resistance states |
US6590804B1 (en) * | 2002-07-16 | 2003-07-08 | Hewlett-Packard Development Company, L.P. | Adjustable current mode differential amplifier |
EP1505605A1 (de) * | 2003-08-06 | 2005-02-09 | STMicroelectronics S.r.l. | Verbesserte Leseanordnung für einen Halbleiterspeicher mit Bitleitungs-Vorladungs- und -Entladungsfunktionen |
JP4028840B2 (ja) * | 2003-12-17 | 2007-12-26 | シャープ株式会社 | 半導体読み出し回路 |
US7369450B2 (en) * | 2006-05-26 | 2008-05-06 | Freescale Semiconductor, Inc. | Nonvolatile memory having latching sense amplifier and method of operation |
JP5607870B2 (ja) * | 2008-04-25 | 2014-10-15 | ピーエスフォー ルクスコ エスエイアールエル | 電流センス回路及びこれを備えた半導体記憶装置 |
EP2299450B1 (de) * | 2009-09-18 | 2013-03-27 | STMicroelectronics Srl | Leseverstärkerschaltung für nichtflüchtige Speicher, die bei niedrigen Netzspannungen arbeiten |
CN102314951A (zh) * | 2010-06-30 | 2012-01-11 | 四川和芯微电子股份有限公司 | 电流检测方法 |
IT201700114539A1 (it) * | 2017-10-11 | 2019-04-11 | St Microelectronics Srl | Circuito e metodo di lettura con migliorate caratteristiche elettriche per un dispositivo di memoria non volatile |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2569054B1 (fr) * | 1984-08-10 | 1986-11-28 | Eurotechnique Sa | Dispositif de neutralisation de l'acces a une zone a proteger d'un circuit integre |
US4598389A (en) * | 1984-10-01 | 1986-07-01 | Texas Instruments Incorporated | Single-ended CMOS sense amplifier |
US4813023A (en) * | 1986-10-21 | 1989-03-14 | Brooktree Corporation | System employing negative feedback for decreasing the response time of a cell |
FR2611972B1 (fr) * | 1987-03-03 | 1989-05-19 | Thomson Semiconducteurs | Procede d'adressage d'elements redondants d'une memoire integree et dispositif permettant de mettre en oeuvre le procede |
US5058069A (en) * | 1987-03-03 | 1991-10-15 | Thomson Semiconducteurs | Device for addressing of redundant elements of an integrated circuit memory |
EP0312142B1 (de) * | 1987-10-12 | 1992-09-02 | Koninklijke Philips Electronics N.V. | Ausleseschaltung einer Verzögerungsschaltung |
FR2629248B1 (fr) * | 1988-03-25 | 1992-04-24 | Sgs Thomson Microelectronics | Procede de test de memoire a programmation unique et memoire correspondante |
US5204838A (en) * | 1988-10-28 | 1993-04-20 | Fuji Xerox Co., Ltd. | High speed readout circuit |
JPH0371495A (ja) * | 1989-08-11 | 1991-03-27 | Sony Corp | 紫外線消去型不揮発性メモリ装置 |
US5027003A (en) * | 1989-12-29 | 1991-06-25 | Texas Instruments Incorporated | Read/write switching circuit |
US5189322A (en) * | 1990-03-28 | 1993-02-23 | Advanced Micro Devices, Inc. | Low-power sense amplifier with feedback |
FR2670061B1 (fr) * | 1990-11-30 | 1996-09-20 | Bull Sa | Procede et dispositif de transfert de signaux binaires differentiels et application aux additionneurs a selection de retenue. |
FR2698998B1 (fr) * | 1992-12-09 | 1995-02-03 | Sgs Thomson Microelectronics | Mémoire eeprom organisée en mots de plusieurs bits. |
-
1992
- 1992-07-24 FR FR9209199A patent/FR2694119B1/fr not_active Expired - Fee Related
-
1993
- 1993-07-19 EP EP93401861A patent/EP0585150B1/de not_active Expired - Lifetime
- 1993-07-19 DE DE69300064T patent/DE69300064T2/de not_active Expired - Fee Related
- 1993-07-23 US US08/096,684 patent/US5581511A/en not_active Expired - Lifetime
- 1993-07-26 JP JP20359993A patent/JP3398722B2/ja not_active Expired - Fee Related
-
1995
- 1995-06-07 US US08/486,363 patent/US5638332A/en not_active Expired - Lifetime
- 1995-06-07 US US08/478,463 patent/US5544114A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69300064T2 (de) | 1995-06-22 |
US5581511A (en) | 1996-12-03 |
EP0585150A1 (de) | 1994-03-02 |
FR2694119A1 (fr) | 1994-01-28 |
FR2694119B1 (fr) | 1994-08-26 |
US5638332A (en) | 1997-06-10 |
JPH06215586A (ja) | 1994-08-05 |
EP0585150B1 (de) | 1995-02-15 |
JP3398722B2 (ja) | 2003-04-21 |
US5544114A (en) | 1996-08-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |