DE10331335C5 - Leistungs-Halbleitervorrichtung - Google Patents
Leistungs-Halbleitervorrichtung Download PDFInfo
- Publication number
- DE10331335C5 DE10331335C5 DE2003131335 DE10331335A DE10331335C5 DE 10331335 C5 DE10331335 C5 DE 10331335C5 DE 2003131335 DE2003131335 DE 2003131335 DE 10331335 A DE10331335 A DE 10331335A DE 10331335 C5 DE10331335 C5 DE 10331335C5
- Authority
- DE
- Germany
- Prior art keywords
- main surface
- heat spreader
- heat
- power semiconductor
- resin housing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title claims description 73
- 229920005989 resin Polymers 0.000 claims description 78
- 239000011347 resin Substances 0.000 claims description 78
- 239000000463 material Substances 0.000 claims description 34
- 238000000465 moulding Methods 0.000 claims description 9
- 230000002093 peripheral effect Effects 0.000 claims description 5
- 229920001187 thermosetting polymer Polymers 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 2
- 229910052751 metal Inorganic materials 0.000 description 15
- 239000002184 metal Substances 0.000 description 15
- 230000005855 radiation Effects 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000005476 soldering Methods 0.000 description 6
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 229920000647 polyepoxide Polymers 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000005350 fused silica glass Substances 0.000 description 2
- 239000004519 grease Substances 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 1
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052770 Uranium Inorganic materials 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 238000005549 size reduction Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
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- H01L25/00—Assemblies consisting of a plurality of semiconductor or other solid state devices
- H01L25/03—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of semiconductor or other solid state devices all the devices being of a type provided for in a single subclass of subclasses H10B, H10F, H10H, H10K or H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
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- H01L23/00—Details of semiconductor or other solid state devices
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- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
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- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
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- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
- H01L2224/48139—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate with an intermediate bond, e.g. continuous wire daisy chain
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- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49111—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
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- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H01L2924/01005—Boron [B]
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- H01L2924/01013—Aluminum [Al]
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- H01L2924/01014—Silicon [Si]
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- H01L2924/01074—Tungsten [W]
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
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- H01L2924/13—Discrete devices, e.g. 3 terminal devices
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- H01L2924/1305—Bipolar Junction Transistor [BJT]
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002-329243 | 2002-11-13 | ||
JP2002329243A JP3740117B2 (ja) | 2002-11-13 | 2002-11-13 | 電力用半導体装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
DE10331335A1 DE10331335A1 (de) | 2004-06-09 |
DE10331335B4 DE10331335B4 (de) | 2008-10-16 |
DE10331335C5 true DE10331335C5 (de) | 2014-11-20 |
Family
ID=32212020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE2003131335 Expired - Lifetime DE10331335C5 (de) | 2002-11-13 | 2003-07-10 | Leistungs-Halbleitervorrichtung |
Country Status (5)
Country | Link |
---|---|
US (1) | US6903457B2 (ja) |
JP (1) | JP3740117B2 (ja) |
KR (1) | KR100709278B1 (ja) |
CN (1) | CN1284233C (ja) |
DE (1) | DE10331335C5 (ja) |
Families Citing this family (38)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3988607B2 (ja) * | 2002-10-01 | 2007-10-10 | 株式会社デンソー | ハウジング |
US7436060B2 (en) * | 2004-06-09 | 2008-10-14 | Lsi Corporation | Semiconductor package and process utilizing pre-formed mold cap and heatspreader assembly |
JP4583122B2 (ja) * | 2004-09-28 | 2010-11-17 | 三菱電機株式会社 | 半導体装置及びその製造方法 |
CN100420049C (zh) * | 2005-02-02 | 2008-09-17 | 银河制版印刷有限公司 | 发光二极管模块的基板结构 |
CN101032849B (zh) * | 2006-03-08 | 2010-06-09 | 深圳富泰宏精密工业有限公司 | 定位治具的成型方法 |
DE102006013017B4 (de) * | 2006-03-20 | 2014-11-06 | R. Stahl Schaltgeräte GmbH | Gehäuse mit Wärmebrücke |
KR101391925B1 (ko) * | 2007-02-28 | 2014-05-07 | 페어차일드코리아반도체 주식회사 | 반도체 패키지 및 이를 제조하기 위한 반도체 패키지 금형 |
JP5288161B2 (ja) | 2008-02-14 | 2013-09-11 | 東芝ライテック株式会社 | 発光モジュール及び照明装置 |
US7821141B2 (en) * | 2008-02-22 | 2010-10-26 | Infineon Technologies Ag | Semiconductor device |
US7919854B2 (en) * | 2008-08-15 | 2011-04-05 | Infineon Technologies Ag | Semiconductor module with two cooling surfaces and method |
DE102009002993B4 (de) * | 2009-05-11 | 2012-10-04 | Infineon Technologies Ag | Leistungshalbleitermodul mit beabstandeten Schaltungsträgern |
US8482904B2 (en) * | 2010-05-25 | 2013-07-09 | Lear Corporation | Power module with current sensing |
JP5380376B2 (ja) | 2010-06-21 | 2014-01-08 | 日立オートモティブシステムズ株式会社 | パワー半導体装置 |
JP5569400B2 (ja) * | 2011-01-07 | 2014-08-13 | 株式会社デンソー | 半導体モジュール |
US8878483B2 (en) | 2011-01-14 | 2014-11-04 | Lear Corporation | Electronics unit with current sensing |
CN102306637A (zh) * | 2011-08-31 | 2012-01-04 | 昆山锦泰电子器材有限公司 | 带有三极管的组装散热片 |
JP5843539B2 (ja) * | 2011-09-16 | 2016-01-13 | 三菱電機株式会社 | 半導体装置及び当該半導体装置の製造方法 |
US8970020B2 (en) | 2011-09-30 | 2015-03-03 | Rohm Co., Ltd. | Semiconductor device |
JP5988882B2 (ja) * | 2013-01-17 | 2016-09-07 | 三菱電機株式会社 | 半導体装置 |
JP6065978B2 (ja) * | 2013-07-04 | 2017-01-25 | 三菱電機株式会社 | 半導体装置の製造方法、半導体装置 |
JP5700092B2 (ja) | 2013-09-06 | 2015-04-15 | トヨタ自動車株式会社 | 半導体装置 |
JP2016012709A (ja) * | 2014-06-30 | 2016-01-21 | サンケン電気株式会社 | 半導体装置 |
JP6327140B2 (ja) * | 2014-12-15 | 2018-05-23 | 株式会社デンソー | 電子装置 |
JP6365322B2 (ja) * | 2015-01-23 | 2018-08-01 | 三菱電機株式会社 | 半導体装置 |
DE102015112450B3 (de) * | 2015-07-30 | 2016-12-29 | Danfoss Silicon Power Gmbh | Leistungshalbleiterbaugruppe und Verfahren zum Herstellen eines Leistungsmoduls und der Leistungshalbleiterbaugruppe |
CN108886036B (zh) * | 2016-04-04 | 2022-06-24 | 三菱电机株式会社 | 功率模块、功率半导体装置及功率模块制造方法 |
JP2017224788A (ja) * | 2016-06-17 | 2017-12-21 | ミヨシ電子株式会社 | 電子回路装置 |
WO2019011890A1 (en) | 2017-07-12 | 2019-01-17 | Abb Schweiz Ag | POWER SEMICONDUCTOR MODULE |
EP3444839A1 (en) * | 2017-08-18 | 2019-02-20 | Infineon Technologies Austria AG | Assembly and method for mounting an electronic component to a substrate |
EP3682475A1 (en) | 2017-09-15 | 2020-07-22 | Finar Module Sagl | Packaging method and joint technology for an electronic device |
DE102018217456B4 (de) * | 2018-10-11 | 2020-07-09 | Conti Temic Microelectronic Gmbh | Elektronische Steuervorrichtung und Verfahren zur Herstellung einer elektronischen Steuervorrichtung |
EP3660896A1 (en) * | 2018-11-30 | 2020-06-03 | Infineon Technologies AG | Semiconductor arrangement |
DE102019111367A1 (de) * | 2019-05-02 | 2020-11-05 | Danfoss Silicon Power Gmbh | Leistungselektronik-Modul mit verbesserter Kühlung |
DE102019111366B3 (de) | 2019-05-02 | 2020-05-14 | Fachhochschule Kiel | Kompaktes Leistungselektronik-Modul mit vergrößerter Kühlfläche |
JP7149907B2 (ja) | 2019-09-04 | 2022-10-07 | 三菱電機株式会社 | 半導体装置および半導体素子 |
JP2022010604A (ja) * | 2020-06-29 | 2022-01-17 | 日本電産サンキョー株式会社 | 電子機器 |
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CN112864113A (zh) * | 2021-02-10 | 2021-05-28 | 华为技术有限公司 | 功率器件、功率器件组件与相关装置 |
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Also Published As
Publication number | Publication date |
---|---|
CN1284233C (zh) | 2006-11-08 |
US20040089931A1 (en) | 2004-05-13 |
KR20040042793A (ko) | 2004-05-20 |
DE10331335B4 (de) | 2008-10-16 |
JP2004165406A (ja) | 2004-06-10 |
JP3740117B2 (ja) | 2006-02-01 |
DE10331335A1 (de) | 2004-06-09 |
CN1501484A (zh) | 2004-06-02 |
KR100709278B1 (ko) | 2007-04-19 |
US6903457B2 (en) | 2005-06-07 |
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