CN1530725A - 平板显示器中使用的薄膜晶体管的新颖导电元件 - Google Patents
平板显示器中使用的薄膜晶体管的新颖导电元件 Download PDFInfo
- Publication number
- CN1530725A CN1530725A CNA2004100287328A CN200410028732A CN1530725A CN 1530725 A CN1530725 A CN 1530725A CN A2004100287328 A CNA2004100287328 A CN A2004100287328A CN 200410028732 A CN200410028732 A CN 200410028732A CN 1530725 A CN1530725 A CN 1530725A
- Authority
- CN
- China
- Prior art keywords
- layer
- tft
- thin film
- film transistor
- aluminium alloy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 25
- 239000004065 semiconductor Substances 0.000 claims abstract description 44
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 41
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 41
- 239000010936 titanium Substances 0.000 claims abstract description 35
- 229910000838 Al alloy Inorganic materials 0.000 claims abstract description 32
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 21
- NRTOMJZYCJJWKI-UHFFFAOYSA-N Titanium nitride Chemical compound [Ti]#N NRTOMJZYCJJWKI-UHFFFAOYSA-N 0.000 claims description 25
- 238000009792 diffusion process Methods 0.000 claims description 23
- 239000000758 substrate Substances 0.000 claims description 17
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 11
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 6
- 239000010949 copper Substances 0.000 claims description 6
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 5
- 229910052779 Neodymium Inorganic materials 0.000 claims description 5
- 229910052802 copper Inorganic materials 0.000 claims description 5
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 claims description 5
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 239000004411 aluminium Substances 0.000 claims 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims 1
- 238000007669 thermal treatment Methods 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 abstract description 28
- 230000015572 biosynthetic process Effects 0.000 abstract description 14
- 238000000034 method Methods 0.000 abstract description 7
- 230000008569 process Effects 0.000 abstract description 6
- 230000007547 defect Effects 0.000 abstract description 5
- 239000004973 liquid crystal related substance Substances 0.000 description 15
- 239000000463 material Substances 0.000 description 10
- 230000004888 barrier function Effects 0.000 description 9
- 239000000470 constituent Substances 0.000 description 8
- 229910010038 TiAl Inorganic materials 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 6
- 229910010272 inorganic material Inorganic materials 0.000 description 6
- 239000011147 inorganic material Substances 0.000 description 6
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 229910010039 TiAl3 Inorganic materials 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 238000000137 annealing Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 230000005283 ground state Effects 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- -1 CaCa2S4 and SrCa2S4 Chemical class 0.000 description 1
- AGVJBLHVMNHENQ-UHFFFAOYSA-N Calcium sulfide Chemical class [S-2].[Ca+2] AGVJBLHVMNHENQ-UHFFFAOYSA-N 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- XCJYREBRNVKWGJ-UHFFFAOYSA-N copper(II) phthalocyanine Chemical compound [Cu+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 XCJYREBRNVKWGJ-UHFFFAOYSA-N 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 230000005281 excited state Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- RBTKNAXYKSUFRK-UHFFFAOYSA-N heliogen blue Chemical compound [Cu].[N-]1C2=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=NC([N-]1)=C(C=CC=C3)C3=C1N=C([N-]1)C3=CC=CC=C3C1=N2 RBTKNAXYKSUFRK-UHFFFAOYSA-N 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 229910052976 metal sulfide Inorganic materials 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 150000002910 rare earth metals Chemical class 0.000 description 1
- 238000005546 reactive sputtering Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
- H10D30/6739—Conductor-insulator-semiconductor electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
- Electrodes Of Semiconductors (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR15357/03 | 2003-03-12 | ||
KR15357/2003 | 2003-03-12 | ||
KR1020030015357A KR100669688B1 (ko) | 2003-03-12 | 2003-03-12 | 박막트랜지스터 및 이를 구비한 평판표시소자 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1530725A true CN1530725A (zh) | 2004-09-22 |
CN100351691C CN100351691C (zh) | 2007-11-28 |
Family
ID=32768636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100287328A Expired - Lifetime CN100351691C (zh) | 2003-03-12 | 2004-03-12 | 平板显示器中使用的薄膜晶体管的新颖导电元件 |
Country Status (5)
Country | Link |
---|---|
US (2) | US20040183072A1 (zh) |
EP (1) | EP1458030A3 (zh) |
JP (1) | JP2004282066A (zh) |
KR (1) | KR100669688B1 (zh) |
CN (1) | CN100351691C (zh) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7492028B2 (en) | 2005-02-18 | 2009-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and manufacturing method of the same, and a semiconductor device |
CN104685635A (zh) * | 2012-10-01 | 2015-06-03 | 夏普株式会社 | 半导体装置 |
CN106531768A (zh) * | 2016-12-07 | 2017-03-22 | 厦门天马微电子有限公司 | 一种有机电致发光显示面板及其制备方法 |
CN109671717A (zh) * | 2017-10-17 | 2019-04-23 | 三星显示有限公司 | 金属线和薄膜晶体管 |
CN111490076A (zh) * | 2019-01-25 | 2020-08-04 | 三星显示有限公司 | 导线、包括导线的显示装置和制造显示装置的方法 |
CN111529048A (zh) * | 2013-12-18 | 2020-08-14 | 诺服塞尔有限公司 | 汽化组织的设备及方法 |
Families Citing this family (17)
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JP4038485B2 (ja) * | 2003-03-12 | 2008-01-23 | 三星エスディアイ株式会社 | 薄膜トランジスタを備えた平板表示素子 |
US7683370B2 (en) | 2005-08-17 | 2010-03-23 | Kobe Steel, Ltd. | Source/drain electrodes, transistor substrates and manufacture methods, thereof, and display devices |
KR100799824B1 (ko) * | 2005-08-17 | 2008-01-31 | 가부시키가이샤 고베 세이코쇼 | 소스/드레인 전극, 트랜지스터 기판 및 그의 제조 방법, 및표시 디바이스 |
KR101251351B1 (ko) | 2005-12-28 | 2013-04-05 | 삼성디스플레이 주식회사 | 박막트랜지스터 기판, 이의 제조방법 및 이를 갖는표시패널 |
KR100774950B1 (ko) * | 2006-01-19 | 2007-11-09 | 엘지전자 주식회사 | 전계발광소자 |
WO2007125801A1 (ja) * | 2006-04-27 | 2007-11-08 | Ulvac, Inc. | 表示装置、複合表示装置 |
JP5214858B2 (ja) | 2006-06-22 | 2013-06-19 | 三菱電機株式会社 | Tftアレイ基板及びその製造方法 |
AT509633A1 (de) * | 2010-03-29 | 2011-10-15 | Ctr Carinthian Tech Res Ag | Hochtemperaturbeständige, elektrisch leitfähige dünnschichten |
JP5016712B2 (ja) * | 2010-09-21 | 2012-09-05 | 三井金属鉱業株式会社 | 電極箔および有機デバイス |
US8841733B2 (en) * | 2011-05-17 | 2014-09-23 | United Microelectronics Corp. | Semiconductor device and method of fabricating the same |
JP2013084907A (ja) * | 2011-09-28 | 2013-05-09 | Kobe Steel Ltd | 表示装置用配線構造 |
EP2993963A4 (en) * | 2013-05-01 | 2016-12-14 | Konica Minolta Inc | ORGANIC ELECTROLUMINESCENT ELEMENT |
TWI535034B (zh) * | 2014-01-29 | 2016-05-21 | 友達光電股份有限公司 | 畫素結構及其製作方法 |
US9548349B2 (en) | 2014-06-25 | 2017-01-17 | International Business Machines Corporation | Semiconductor device with metal extrusion formation |
CN104241392B (zh) * | 2014-07-14 | 2017-07-14 | 京东方科技集团股份有限公司 | 一种薄膜晶体管及其制备方法、显示基板和显示设备 |
JP7294851B2 (ja) | 2019-01-17 | 2023-06-20 | 三星ディスプレイ株式會社 | 表示装置およびその製造方法 |
KR102819170B1 (ko) * | 2019-02-18 | 2025-06-12 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 제조 방법 |
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2004
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- 2004-02-18 EP EP04250862A patent/EP1458030A3/en not_active Withdrawn
- 2004-03-09 JP JP2004066092A patent/JP2004282066A/ja active Pending
- 2004-03-12 CN CNB2004100287328A patent/CN100351691C/zh not_active Expired - Lifetime
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2005
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US7492028B2 (en) | 2005-02-18 | 2009-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and manufacturing method of the same, and a semiconductor device |
US7936037B2 (en) | 2005-02-18 | 2011-05-03 | Semiconductor Energy Laboratory Co., Ltd. | Photoelectric conversion device and manufacturing method of the same, and a semiconductor device |
CN1832207B (zh) * | 2005-02-18 | 2011-05-18 | 株式会社半导体能源研究所 | 光电转换器件及其制造方法、以及半导体器件 |
CN102176488B (zh) * | 2005-02-18 | 2013-04-03 | 株式会社半导体能源研究所 | 光电转换器件及其制造方法、以及半导体器件 |
CN104685635A (zh) * | 2012-10-01 | 2015-06-03 | 夏普株式会社 | 半导体装置 |
CN104685635B (zh) * | 2012-10-01 | 2017-05-17 | 夏普株式会社 | 半导体装置 |
CN111529048A (zh) * | 2013-12-18 | 2020-08-14 | 诺服塞尔有限公司 | 汽化组织的设备及方法 |
CN111529048B (zh) * | 2013-12-18 | 2024-03-26 | 诺服塞尔有限公司 | 汽化组织的设备及方法 |
CN106531768A (zh) * | 2016-12-07 | 2017-03-22 | 厦门天马微电子有限公司 | 一种有机电致发光显示面板及其制备方法 |
CN109671717A (zh) * | 2017-10-17 | 2019-04-23 | 三星显示有限公司 | 金属线和薄膜晶体管 |
CN111490076A (zh) * | 2019-01-25 | 2020-08-04 | 三星显示有限公司 | 导线、包括导线的显示装置和制造显示装置的方法 |
CN111490076B (zh) * | 2019-01-25 | 2025-05-13 | 三星显示有限公司 | 导线、包括导线的显示装置和制造显示装置的方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1458030A2 (en) | 2004-09-15 |
KR20040080531A (ko) | 2004-09-20 |
US20060011914A1 (en) | 2006-01-19 |
EP1458030A3 (en) | 2006-03-15 |
CN100351691C (zh) | 2007-11-28 |
US20040183072A1 (en) | 2004-09-23 |
JP2004282066A (ja) | 2004-10-07 |
KR100669688B1 (ko) | 2007-01-18 |
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