CN116679097A - Semiconductor test probe with overvoltage trigger - Google Patents

Abstract

The invention discloses a semiconductor test probe with an overvoltage trigger function, which includes an insulating needle tube, a first needle tube is arranged at one end of the insulating needle tube, and a first needle head and a first spring are arranged inside the first needle tube, so that The first spring is located between the tail of the first needle and the bottom of the first needle tube, the other end of the insulating needle tube is provided with a second needle tube, and the second needle tube is provided with a second needle head and a second spring, and the second needle tube is provided with a second needle tube and a second spring. The middle part of the two needles is provided with a limit step, the second spring is sleeved on the second needle and the second spring is located between one side of the limit step and the bottom of the second needle tube, and the tail of the second needle extends from the second needle tube Bottom pierces out. The semiconductor test probe with an overvoltage trigger function solves the problem that when the existing semiconductor test probe is used, the semiconductor test probe is easily crushed and then crushed due to excessive force and exceeding the set stroke during the test. Problems with the product under test.

Description

Semiconductor test probe with overvoltage trigger

technical field

The invention belongs to the technical field of semiconductor detection, and in particular relates to a semiconductor test probe with an overvoltage trigger function.

Background technique

Semiconductor test probes are widely used in technical fields such as mobile phones, automobiles, medical and aerospace, and are high-end electronic components.

The structure of a semiconductor test probe is usually composed of three parts: a needle shaft, a needle tube, and a spring. a whole structure. When in use, the needle shaft is forced to compress the spring into the needle tube. At this time, the elastic force generated by the spring withstands the needle shaft, and the needle shaft is in good contact with the tested piece for testing.

However, when the existing semiconductor test probes are used, due to the large size tolerance of the product to be tested and the exposed part of the active needle of the semiconductor test probe, the points to be tested and the test points of the semiconductor test probe are not collinear or have a large relative distance difference, resulting in Too short a preloading distance for large pitches or excessive preloading for small pitches will crush the semiconductor test probes and cause crushing of the product under test.

Contents of the invention

The purpose of the present invention is to provide a semiconductor test probe with an overvoltage trigger function to solve the problem that when the existing semiconductor test probe is used, the semiconductor test probe is easily crushed due to excessive force and exceeding the set stroke during the test. The needles in turn lead to the problem of crushing the product under test.

In order to solve the above technical problems, the present invention discloses a semiconductor test probe with an overvoltage trigger function, which includes an insulating needle tube, a first needle tube is arranged at one end of the insulating needle tube, and a first needle head is arranged inside the first needle tube and the first spring, the first spring is located between the tail of the first needle and the bottom of the first needle tube, the other end of the insulating needle tube is provided with a second needle tube, and the second needle tube is provided with the second needle and the first needle tube Two springs, the middle part of the second needle is provided with a limit step, the second spring is sleeved on the second needle and the second spring is located between one side of the limit step and the bottom of the second needle tube, the second needle The tail of the needle passes through the bottom of the second needle tube.

The technical scheme of the present invention also has the following characteristics:

As a preferred solution of the present invention, the insulating needle tube is provided with an insulating inner tube, and the two ends of the first needle tube and the second needle tube are respectively arranged at the two ends of the insulating inner tube.

As a preferred solution of the present invention, both ends of the insulating needle tube are formed with constrictions, and both the first needle tube and the second needle tube are restricted in the constriction.

As a preferred solution of the present invention, a constriction is formed at one end of the first needle tube, and the tail of the first needle is limited in the constriction.

As a preferred solution of the present invention, a constriction is formed at one end of the second needle tube, and the limiting step is limited in the constriction.

Compared with the prior art: a semiconductor test probe with an overvoltage trigger function of the present invention, in the process of use, only when an overvoltage occurs during the test process, it may cause triggering to generate a short-circuit current, and the short-circuit current signal is transmitted The device immediately stops the test and alarms, so it can ensure that the product under test will not be damaged due to overvoltage, and can also ensure the test performance of the semiconductor test probe under the premise of ensuring test accuracy.

Description of drawings

The accompanying drawings described here are used to provide a further understanding of the present invention, and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention, and do not constitute improper limitations to the present invention. In the attached picture:

FIG. 1 is a schematic structural diagram of a semiconductor test probe with an overvoltage trigger function according to the present invention.

In the figure: 1. The first needle tube, 2. The first spring, 3. The first needle head, 4. The second needle tube, 5. The limit step, 6. The insulating needle tube, 7. The second needle head, 8. The insulating inner tube, 9. Second spring.

Detailed ways

Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

In the description of the present invention, unless otherwise clearly defined, words such as setting, installation, and connection should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in the present invention in combination with the specific content of the technical solution.

Example 1

As shown in Figure 1, a semiconductor test probe with an overvoltage trigger function of the present invention includes an insulating needle tube 6, a first needle tube 1 is arranged at one end of the insulating needle tube 6, and a first needle head 3 is arranged inside the first needle tube 1 And the first spring 2, the first spring 2 is located between the tail of the first needle 3 and the bottom of the first needle tube 1, the other end of the insulating needle tube 6 is provided with a second needle tube 4, and the second needle tube 4 is provided with a second The needle 7 and the second spring 2, the middle part of the second needle 7 is provided with a limit step 5, the second spring 2 is sleeved on the second needle 7 and the second spring 2 is located on one side of the limit step 5 and the second needle tube 4 Between the bottoms of the second needle 7, the tail of the second needle 7 passes through the bottom of the second needle tube 4.

The first needle tube 1 is the carrier of the semiconductor trigger test probe, and is used to carry the first spring 2 and the first needle 3 .

The first spring 2 is installed inside the first needle tube 1 , one end is in contact with the bottom of the trigger first needle tube 1 , and the other end is in contact with the first needle 3 .

The first needle 3 is installed inside the first needle tube 1, and one end is in contact with the first spring 2, and is restricted in the first needle tube 1 by wrapping the needle tube.

The second needle tube 4 is the carrier of the test probe, used to carry the first spring 2 and the second needle 7 .

The second needle 7 is installed inside the second needle tube 4, one end is in contact with the second spring 10, and is limited in the second needle tube 4 by way of the needle tube wrapping;

The insulating needle tube 6 is the carrier of the semiconductor test probe with the overvoltage trigger function of the present invention, and is used for the first needle tube 1 and the second needle tube 4 .

The first spring 2 and the first needle 3 are installed in the first needle tube 1, and are fastened by wrapping the first needle tube 1; the first spring 2 and the second needle 7 are installed in the second needle tube 4, and used the second The needle tube 4 is fastened by wrapping; the first needle head 3 and the second needle head 7 are installed at both ends of the insulating needle tube 6 . When in use, the first needle 3 is in contact with the outgoing end, and the second needle 5 is in contact with the product to be tested when it is close to the product to be tested. Since the test point of the product to be tested is not the same as the distance between the end surfaces of the second needle 5, the The test process may have a relatively close distance, and the above-mentioned situation may cause overvoltage in the test process. Therefore, when some test points appear overvoltage, the test will be stopped immediately and an alarm will be issued. Because the semiconductor test probe of the present invention has an overvoltage trigger function, so it can ensure that all points can achieve reliable contact within the specified press-in range, protect the product under test and the test fixture, and provide more accurate test results.

Example 2

As shown in Figure 1, different from Embodiment 1, in a semiconductor test probe with an overvoltage trigger function of the present invention, an insulating inner tube 8 is arranged in the insulating needle tube 6, and the first needle tube 1 and the second The two ends of the needle tube 4 are respectively arranged on the two ends of the insulating inner tube 8 .

The insulating inner tube 8 is used as an installation platform in the insulating needle tube 6, and mainly plays the role of setting the first needle tube 1 and the second needle tube 4 at both ends of the insulating inner tube 8, which is convenient for fast and accurate assembly and positioning, and the operation is more convenient .

Example 3

As shown in Figure 1, different from Embodiment 1, in a semiconductor test probe with an overvoltage trigger function of the present invention, the two ends of the insulating needle tube 6 are formed with constrictions, the first needle tube 1 and the second The needle tubes 4 are all limited in the constriction, which facilitates the fast and stable assembly of the first needle tube 1 and the second needle tube 4 in the insulating needle tube 6 .

Example 4

As shown in Figure 1, the difference from Embodiment 1 is that in a semiconductor test probe with an overvoltage trigger function of the present invention, one end of the first needle tube 1 is formed with a constriction, and the tail of the first needle 3 is limited. Located in the constriction, it is convenient to quickly and stably assemble the first needle 3 in the first needle tube 1 .

Example 5

As shown in Figure 1, different from Embodiment 1, in a semiconductor test probe with an overvoltage trigger function of the present invention, one end of the second needle tube 4 is formed with a constriction, and the limit step 5 is limited to the constriction. In the mouth, it is convenient to quickly and stably assemble the second needle 7 in the first needle tube 4 .

Therefore, compared with the prior art, a semiconductor test probe with an overvoltage trigger function of the present invention may cause a trigger to generate a short-circuit current only when an overvoltage occurs in the test process during use, and the short-circuit current When the signal is transmitted to the equipment, the test will be stopped immediately and an alarm will be issued, so that the product under test will not be damaged due to overvoltage, and the test performance of the semiconductor test probe can be well guaranteed under the premise of ensuring test accuracy.

The above description shows and describes several preferred embodiments of the invention, but as previously stated, it should be understood that the invention is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other embodiments. Combinations, modifications and circumstances, and can be modified within the scope of the inventive concept described herein, by the above teachings or by skill or knowledge in the relevant field. However, changes and changes made by those skilled in the art do not depart from the spirit and scope of the invention, and should be within the protection scope of the appended claims of the invention.

Claims (5)

1. The utility model provides a semiconductor test probe with overvoltage triggering function, its characterized in that, including insulating needle tubing (6), the one end of insulating needle tubing (6) is provided with first needle tubing (1), be provided with first syringe needle (3) and first spring (2) in first needle tubing (1), first spring (2) are located between the afterbody of first syringe needle (3) and the bottom of first needle tubing (1), and the other end of insulating needle tubing (6) is provided with second needle tubing (4), the interior of second needle tubing (4) is provided with second syringe needle (7) and second spring (2), the middle part of second syringe needle (7) is provided with spacing step (5), second spring (2) cover is established on second syringe needle (7) and second spring (9) are located between one side of spacing step (5) and the bottom of second needle tubing (4), and the afterbody of second syringe needle (7) is worn out from the bottom of second needle tubing (4).

2. The semiconductor test probe with the overvoltage triggering function according to claim 1, wherein an insulating inner tube (8) is arranged in the insulating needle tube (6), and two ends of the first needle tube (1) and the second needle tube (4) are respectively arranged at two ends of the insulating inner tube (8).

3. The semiconductor test probe with the overvoltage triggering function according to claim 2, wherein a shrinkage opening is formed at both ends of the insulating needle tube (6), and the first needle tube (1) and the second needle tube (4) are both limited in the shrinkage opening.

4. A semiconductor test probe with an overpressure triggering function according to claim 3, characterized in that one end of the first needle tube (1) is formed with a constriction, and the tail of the first needle head (3) is limited in the constriction.

5. The semiconductor test probe with the overvoltage triggering function according to claim 4, wherein a necking is formed at one end of the second needle tube (4), and the limit step (5) is limited in the necking.