CN101506629A - 流量测量诊断 - Google Patents
流量测量诊断 Download PDFInfo
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Abstract
本发明公开了一种用于测量过程流体的流量的流量计(16)。所述流量计(16)包括构造成提供传感器输出信号(78)的传感器(50)。传感器输出信号与所述过程流体的流量相关。在所述流量计中的电路(77)构造成确定与传感器输出信号有关的统计参数。诊断电路(76)基于所确定的统计参数和所述传感器输出信号(78)提供诊断输出(82)。
Description
技术领域
本发明涉及流体过程控制和监测系统。本发明尤其涉及用于这种系统的诊断。
背景技术
流体流量计被用于工业过程控制和环境监测中以测量流体流,并提供用于流指示器和控制器的流信号。理论上的流量计通过测量管道中的间断部位附近的压降来测量管中的流体流。所述间断部位(主元件)可以是管中的节流孔、喷嘴、文氏管、皮托管、涡旋阻件、某个目标或者甚至是一简单的弯曲。在所述间断部位周围的流造成了压降和湍流增加。所述压降由压力变送器(次元件)来感测,所述压力变送器位于所述管道的外侧,并经由脉冲线或者脉冲通路连接到管道中的流体。可靠性依赖于保持正确的校准。在所述主元件上的腐蚀和固体颗粒的累积可以改变所述校准。脉冲线可能会随时间的流逝而被堵塞,这将所述压力变送器与所述过程隔离,使得所述变送器不再能够追踪压力并对所述变送器的操作产生负面影响。
所述脉冲线的拆卸和检验是用于检测和修正所述线的阻塞的一种方法。用于检测阻塞的另一种已知的方法是从压力变送器将“检查脉冲”周期性地加入到测量信号中。所述检查脉冲使得与所述变送器相连的控制系统扰乱所述流。如果所述压力变送器不能精确地感测流的扰动,则产生警报信号以表示线阻塞。用于检测阻塞的另一种已知的方法是感测静压和差压。如果在静压和差压的振荡之间的相关性不充分,则产生表示线阻塞的警报信号。用于检测线阻塞的另一种已知的方法是感测静压,并让它们通过高通和低通滤波器。从所述滤波器获得的噪声信号与一阈值进行比较,且如果所述噪声的方差小于所述阈值,则警报信号表示所述线被阻塞。
发明内容
用于测量过程流体的流的流量计包括传感器,所述传感器构造为提供与所述过程流体相关的传感器输出信号。电路构造成确定与传感器输出信号有关的统计参数。基于所确定的统计参数和所述传感器输出信号提供诊断输出。
附图说明
图1是过程控制或监测系统的简化图;
图2是表示在图1中示出的变送器的横截面视图的简化的框图;
图3是差压信号的标准偏差与差压信号的曲线图;
图4是差压信号的标准偏差与差压信号的曲线图。
具体实施方式
图1是过程控制或监测系统10的简化视图,其中,过程管道12承载过程流体的流14。流变送器16构造成感测该流14,并提供与所述流14相关的输出。在如图1所示的示例中,所述输出经由双线过程控制环20被提供给控制室18。环20可以根据任何协议进行操作。示例的标准协议包括4-20mA信号、通信协议或现场总线协议。然而,本发明不限于包括无线技术的这种通信技术,并甚至可以在孤立的装置中操作。
过程变量变送器16采用任何合适的技术感测流。示例的技术包括测量在管道12中的约束上的差压、磁基技术、皮托管、振荡传感器等。
根据本发明,变送器16基于流14和传感器输出信号中的噪声而提供诊断输出。在一个具体的配置中,在传感器信号的标准偏差和该传感器输出信号之间的相关性被用于诊断。所述诊断输出可以被用于在变送器16内部,或者可以在外部提供,例如通过环20上的传输。
图2是如图1所示的变送器16的简化的框图。在图2中,变送器16示出为包括差压传感器。在这种配置中,压力P1和P2之差被应用于变送器16,并可以被应用于推知通过如图1所示的过程管道12的流14的流量。节流孔板47被置于该过程管道中,并包括形成在其中的节流孔49。节流孔板47产生差压,所述差压是流14被强迫流过受限的节流孔49时压力P1和P2之差。本发明不限于这种流量测量技术。
压力P1和P2通过过程连接53和55被分别被施加在隔离膜52和54。隔离膜52和54分别形成变送器16中的腔56和58。腔56和58被与所述过程流体隔离,并包含隔离流体。小毛细管60和62从各个腔56和58通向差压传感器50。毛细管60和62在将差压传感器50与所述过程流体隔离的同时,将来自于P1和P2所施加压力的压力转移到差压传感器50。
差压传感器50可以根据任何技术进行操作。一种示例的技术采用可偏转的膜,所述膜形成可变电容。差压传感器50连接到变送器电路70,并给变送器电路70提供传感器输出。变送器电路70可以包括任何类型的电路结构。典型地,变送器电路70包括存储器72以及微处理器或其他的数字控制器。存储器72存储程序指令、结构信息、临时变量等。变送器电路70包括测量电路74,所述测量电路74提供与所述过程流体流相关的输出。所述流可以采用任何合适的技术来确定。诊断电路76也在变送器电路70中实现。诊断电路76包括用于确定与传感器输出信号78相关的统计参数的电路77。所述统计参数可以指示传感器输出信号78中的噪声,在一个具体的实施例中,所述统计参数包括标准偏差。输出电路86接收流信号,并依照所需的信号和协议而在双线过程控制环20上提供输出。
在如图2所示的配置中,诊断电路76接收来自测量电路74的流信号以及来自传感器50的传感器输出78。正如这里所使用的,所述流信号和传感器信号可以在被诊断电路76接收之前被处理。基于流信号80和传感器输出78,诊断电路76提供诊断输出82。诊断输出82可以本地地为变送器16所使用,并可以对外提供,例如通过在双线过程控制环20上的传输。所述诊断输出表示变送器16的至少一个部件或连接到如图1所示的工业过程10的其它部件的状况。例如,诊断输出82可以提供过程连接53和55中的一个被阻塞的指示。该信息可以被单独使用,或者与其它线阻塞诊断结合使用,以确定过程连接53、55的阻塞。另一个示例的诊断可表示用于产生差压的限制性节流孔板中的磨损。该磨损可能造成所述板中的边缘腐蚀而导致流测量不精确。类似地,可以检测在毛细管60、62和腔56、58中承载的隔离填充流体的损失。诊断输出82还可以表示流过如图1所示的管12的过程流体的成分。由于流体的不同、成分的变化,例如由于固体的分解或添加等导致的流体中的污染物,可能发生变化。
可以根据需要选择用于将传感器信号和流信号与诊断输出相关联的特定的算法。在一个示例的实施例中,诊断电路76辨识传感器输出信号中的噪声,并基于该噪声和所测量的流量提供诊断输出。尤其,在稳态流情况下的流量和在传感器信号中的噪声水平之间的关系被用于提供诊断输出82。标准偏差表示传感器输出信号中的噪声。图3是差压传感器输出的标准偏差与流量的曲线图。在该示例中,所述过程流体包括在大致室温下的水。
图4是类似的采用不同尺寸的节流孔板形成差压的曲线图。在图3和图4两者的情况下,在所述差压信号的标准偏差和差压信号自身之间存在近似线性的关系。例如,随着差压由于流量的改变而增加20%,所述标准偏差也增加大约20%。注意到,在流量范围内的差压和标准偏差之间的变化存在一定变化,尤其在低流量情况下,随着基线噪声在总噪声中所占比重的增加,更是如此。然而,通常,该标准偏差的增加或减少小于差压均值的增加或减少。在一些应用中,标准偏差和传感器信号之间的关系可以由更复杂的关系来表征,例如具有附加项的多项式。
在所述传感器信号的标准偏差和所述传感器信号自身之间的特定关系可以针对特定的流测量技术来确定。一旦所述关系针对名义操作条件而确定,则所述关系可以被监测以辨识特定的诊断条件。
在一个特定的实施例中,被提供给诊断电路76的信号80是传感器输出信号78,或者直接与传感器输出信号78相关。可以采用任何技术进行噪声判定,且并不限于以上所讨论的标准偏差。然而,在一个特定的实施例中,基于所述标准偏差来确定该噪声。这种结构是有优势的,这是因为计算相对简单。典型地,感兴趣的噪声是在从大约1Hz到大约30Hz的范围内的。比这低的噪声信号可能由于过程中的缓慢变化而难于辨识。在另一种示例的技术中,诊断电路76包括高通滤波器79,以在计算标准偏差之前对过程变量进行滤波。可以采用任何合适的技术来确定传感器信号中的噪声。示例包括数字带通滤波器,所述数字带通滤波器提供之后可以与平均的传感器信号相关的噪声的RMS值。用于确定噪声的另一种示例的技术包括采用快速傅立叶变换(FFT)、小波等。
在操作过程中,在噪声信号和传感器输出信号之间的名义关系可以被存储在存储器中。所述关系可以通过观察在名义条件下的变送器16的操作来经验性地确定,或者可以在制造过程中确定并存储在存储器72中。一旦变送器16被置于名义操作下,诊断电路76就计算在传感器信号中的噪声,并采用该信息以及传感器输出信号,完成与存储在存储器72中的关系的比较。存储在存储器72中的关系可以例如是多项式等式、数据点表等。该信息还可以在过程控制环20上或者通过其它编程技术来更新。
基于诊断输出82,所述诊断信息可以在过程控制环20上被传送。在另一个示例中,诊断输出用于提供局部警报、修正在从变送器16输出的过程变量的测量值、用于安排维修等。所述诊断输出还可以与其它诊断技术结合使用,以提供更精确的诊断信息。
尽管已经参照优选实施例描述了本发明,但是本领域的普通技术人员应当理解,可以在不背离本发明的精神和范围的情况下,进行形式和细节上的改变。可以将任何类型的流测量技术与变送器16结合使用,所述变送器包括磁性流量计、基于涡流或科里奥利的量计等。例如,传感器50可以包括用于磁性流量计的磁性传感器、基于振动的传感器等。
Claims (25)
1.一种用于测量过程流体的流量的流量计,包括:
传感器,所述传感器构造成提供与所述过程流体的流量相关的传感器输出信号;
电路,所述电路构造成确定与传感器输出信号相关的统计参数;以及
诊断电路,所述诊断电路构造成基于所确定的统计参数和所述传感器输出信号来提供诊断输出。
2.根据权利要求1所述的设备,其中所述诊断电路确定所述传感器输出信号中的噪声。
3.根据权利要求2所述的设备,其中所述噪声基于所述传感器输出信号的标准偏差来确定。
4.根据权利要求1所述的设备,其中所述诊断电路确定在大致稳态流情况下的噪声。
5.根据权利要求1所述的设备,其中所述传感器包括差压传感器。
6.根据权利要求1所述的设备,其中所述传感器包括磁性传感器或磁性流量计。
7.根据权利要求1所述的设备,其中所述传感器包括涡流或科里奥利流量计的振动传感器。
8.根据权利要求1所述的设备,包括存储器,所述存储器构造成存储所述统计参数和所述传感器输出之间的名义关系。
9.根据权利要求8所述的设备,其中所述诊断输出基于当前统计参数和当前传感器输出之间的比较以及所存储的名义关系。
10.根据权利要求1所述的设备,包括在过程控制环上传输所述传感器输出。
11.根据权利要求1所述的设备,其中所述传感器输出与过程连接的阻塞相关。
12.根据权利要求1所述的设备,其中所述诊断输出与节流孔板的状况相关。
13.根据权利要求1所述的设备,其中所述诊断输出与所述过程流体的成分相关。
14.根据权利要求1所述的设备,其中所述传感器输出表示过程控制环的状况。
15.根据权利要求1所述的设备,其中所述诊断电路采用带通滤波器确定所述传感器输出信号中的噪声。
16.根据权利要求1所述的设备,其中所述诊断电路采用高通滤波器确定所述传感器输出信号中的噪声。
17.根据权利要求1所述的设备,其中所述诊断电路通过确定所述传感器输出信号的均方根值来确定所述传感器输出信号中的噪声。
18.根据权利要求1所述的设备,其中所述诊断电路采用所述传感器信号的傅里叶变换来确定所述传感器输出信号中的噪声。
19.根据权利要求8所述的设备,其中所述名义关系在所述流量计的制造过程中被确定。
20.根据权利要求8所述的设备,其中所述名义关系在所述流量计的操作过程中被确定。
21.一种诊断用于测量过程流体的流量的流量计的操作的方法,所述方法包括:
获得与所述过程流体的流量相关的信号;
确定与所述的与所述过程流体的流量相关的信号相关的统计参数;以及
基于所述的与所述过程流体的流量相关的信号以及所确定的统计参数,提供诊断输出。
22.根据权利要求21所述的方法,其中所述统计参数与所述传感器输出信号中的噪声相关。
23.根据权利要求22所述的方法,其中基于所述传感器输出信号的标准偏差来确定所述噪声。
24.根据权利要求21所述的方法,其中所述信号与差压传感器相关。
25.根据权利要求21所述的方法,包括:包含当前统计参数、当前传感器输出和所存储的名义关系。
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Also Published As
Publication number | Publication date |
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WO2008021017A3 (en) | 2008-05-29 |
CN101506629B (zh) | 2013-11-06 |
JP5208943B2 (ja) | 2013-06-12 |
US20060277000A1 (en) | 2006-12-07 |
US8290721B2 (en) | 2012-10-16 |
JP2010500690A (ja) | 2010-01-07 |
WO2008021017A2 (en) | 2008-02-21 |
EP2052223A2 (en) | 2009-04-29 |
EP2052223B1 (en) | 2019-11-27 |
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