TWI699319B - Opening apparatus for electronic device handler - Google Patents
Opening apparatus for electronic device handler Download PDFInfo
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- TWI699319B TWI699319B TW107136924A TW107136924A TWI699319B TW I699319 B TWI699319 B TW I699319B TW 107136924 A TW107136924 A TW 107136924A TW 107136924 A TW107136924 A TW 107136924A TW I699319 B TWI699319 B TW I699319B
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- opening
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
本發明涉及一種電子部件分選機用開放裝置。根據本發明的電子部件分選機用開放裝置可以具有:開放機,具有相互之間的間距能夠變窄或變寬的第一開放棒和第二開放棒,從而能夠開放載體框架的裝載模組;或者支撐板及調整源,支撐高度較低的電子部件的下端,從而説明拾取裝置的卸載操作。根據本發明,開放裝置的通用性變高,從而具有能夠期望資源的循環利用、防止資源浪費、減少更換成本並提高運行率的效果。The invention relates to an opening device for an electronic component sorting machine. The opening device for an electronic component sorting machine according to the present invention may have: an opening machine having a first opening rod and a second opening rod whose distance between each other can be narrowed or widened, so that the loading module of the carrier frame can be opened ; Or the support plate and the adjustment source support the lower end of the electronic component with a lower height, thereby explaining the unloading operation of the pickup device. According to the present invention, the versatility of the opening device becomes high, and there is an effect that the recycling of resources can be expected, the prevention of waste of resources, the reduction of replacement costs, and the improvement of the operation rate.
Description
本發明涉及一種處理電子部件的分選機,尤其涉及一種用於開放能夠裝載電子部件的載體框架的開放裝置。The invention relates to a sorting machine for processing electronic components, in particular to an opening device for opening a carrier frame capable of loading electronic components.
模組IC(Module IC,或者模組RAM)是在基板的一側面或者兩個側面固定多個IC及其他元件而構成獨立的電路的部件,其為電子裝置的操作所需要的重要的電子部件,並且價格昂貴。Module IC (Module IC, or Module RAM) is a component that fixes multiple ICs and other components on one side or two sides of the substrate to form an independent circuit. It is an important electronic component required for the operation of electronic devices. , And expensive.
因此,在完成產品製造之後出貨之前必須要進行嚴格的性能測試。Therefore, strict performance testing must be carried out after the product is manufactured before shipment.
為了這種模組IC的測試,需要一種能夠將模組IC電連接到測試機的分選機。In order to test the module IC, a sorting machine capable of electrically connecting the module IC to the test machine is needed.
分選機執行如下的一系列動作:通過拾取裝置將模組IC裝載(loading)到載體框架而裝上之後,通過移送裝置而將裝載有模組IC的載體框架移送到測試腔室而支援裝載於載體框架的模組IC的測試,並利用另一個移送裝置而將完成裝載的模組IC的測試的載體框架移送到分揀(sorting)部,然後根據測試結果而將模組IC分類並卸載(Unloading)。The sorting machine executes a series of actions as follows: after loading the module IC to the carrier frame by the picking device and loading it, the carrier frame loaded with the module IC is transferred to the test chamber by the transfer device to support the loading Test the module IC of the carrier frame, and use another transfer device to transfer the tested carrier frame of the loaded module IC to the sorting section, and then sort and unload the module IC according to the test result (Unloading).
在如前述的一系列程序中,為了從載體框架卸載模組IC,必須要利用獨立的開放裝置而開放載體框架。因此,分選機必須構成有用於開放載體框架的開放裝置。In the above-mentioned series of procedures, in order to unload the module IC from the carrier frame, an independent opening device must be used to open the carrier frame. Therefore, the sorting machine must be constructed with an opening device for opening the carrier frame.
在韓國公開專利第10-2011-0136312號以及10-2014-0072847號中提到了與上述的開放裝置相關的技術(以下,稱之為「現有技術」)。Korean Patent Publication Nos. 10-2011-0136312 and 10-2014-0072847 mention technologies related to the above-mentioned open devices (hereinafter referred to as "prior art").
現有技術具有如下的結構:在調整板上升時,調整板的引導棒被插入到位於載體框架(現有技術中被命名為「載體板」)的加壓部件的引導槽,並且將加壓部件推向一側,從而使載體框架開放。The prior art has the following structure: when the adjustment plate is raised, the guide rod of the adjustment plate is inserted into the guide groove of the pressing member located in the carrier frame (named "carrier plate" in the prior art), and the pressing member is pushed To one side, so that the carrier frame is open.
然而,上述的現有技術雖然在需要測試的電子部件的規格全部相同的情況下可以適當地採用,但是如下所述,其通用性較低,因此最終存在製造成本變高的問題。However, the above-mentioned prior art can be appropriately adopted when the specifications of the electronic components to be tested are all the same, but as described below, its versatility is low, and therefore, there is a problem that the manufacturing cost becomes high eventually.
第一,在需要測試具有與以往測試的電子部件不同的寬度的電子部件的情況下,引導棒的位置需要變更,因此必須要更換配備有引導棒的調整板。因此不具有資源的循環利用性,最終導致製造成本提高,並且更換時間的投入會帶來人力的浪費和運行率的下降。First, when it is necessary to test an electronic component having a different width from the electronic component tested in the past, the position of the guide rod needs to be changed, and therefore, the adjustment plate equipped with the guide rod must be replaced. Therefore, it does not have the recyclability of resources, which ultimately leads to an increase in manufacturing costs, and the investment in replacement time will lead to a waste of manpower and a drop in operation rate.
第二,在需要測試具有與以往測試的電子部件不同的高度的電子部件的情況下,實質上沒有其他的解決方案。尤其,如果需要裝載到載體框架的電子部件的高度比插槽(socket)的高度低,則存在著需要更換載體框架或者至少要更換插槽的困難。Second, when it is necessary to test an electronic component having a height different from the electronic component tested in the past, there is essentially no other solution. In particular, if the height of the electronic components to be loaded into the carrier frame is lower than the height of the socket, there is a difficulty in replacing the carrier frame or at least the socket.
本發明具有如下的目的。The present invention has the following objects.
本發明提供一種關於能夠適用於多樣的寬度的電子部件的開放裝置的技術。The present invention provides a technology related to an opening device that can be applied to electronic components of various widths.
本發明提供一種關於能夠適用於多樣的高度的電子部件的開放裝置的技術。The present invention provides a technology related to an open device that can be applied to electronic components of various heights.
根據本發明的第一形態的電子部件分選機用開放裝置包括:升降框架,能夠朝向可裝載電子部件的載體框架上升或向反方向下降;升降源,使所述升降框架升降;開放機,設置於所述升降框架,開放載體框架以能夠從載體框架卸載電子部件,其中所述開放機包括:第一開放棒和第二開放棒,用於開放由在載體框架配備成一對的第一裝載部件和第二裝載部件構成的裝載模組;及動力源,設置於所述升降框架,並且用於提供動力而使所述第一開放棒和第二開放棒之間的間距變寬,所述第一開放棒具有在所述升降框架上升時使第一裝載部件一次性地卡定的第一卡定端,所述第二開放棒具有在所述升降框架上升時使第二裝載部件一次性地卡定的第二卡定端,從而如果所述動力源運行,則第一開放棒和第二開放棒之間的間距變寬,並與此聯動地使第一裝載部件和第二裝載部件之間的間距變寬,最終開放裝載模組。The opening device for an electronic component sorting machine according to the first aspect of the present invention includes: an elevating frame capable of ascending or descending in the opposite direction toward the carrier frame on which electronic components can be loaded; an elevating source to raise and lower the elevating frame; and an opening machine, It is provided in the lifting frame, and the carrier frame is opened to be able to unload electronic components from the carrier frame, wherein the opening machine includes: a first opening rod and a second opening rod for opening the first load equipped in a pair in the carrier frame A loading module composed of a component and a second loading component; and a power source, which is provided in the lifting frame and used to provide power to widen the distance between the first open rod and the second open rod, the The first opening rod has a first locking end that locks the first loading member once when the lifting frame is raised, and the second opening rod has a first locking end that locks the second loading member once when the lifting frame is raised. The second locking end that is locked to the ground, so that if the power source runs, the distance between the first open rod and the second open rod is widened, and the first loading part and the second loading part The gap between them is widened, and the loading module is finally opened.
優選地,所述動力源由能夠使第一開放棒和第二開放棒之間的間距多樣地變化的馬達構成,以使載體框架能夠裝載寬度彼此不同的多種規格的電子部件。Preferably, the power source is constituted by a motor capable of variously changing the distance between the first open rod and the second open rod, so that the carrier frame can be loaded with electronic components of various specifications with different widths.
所述開放裝置還可以包括:支撐板,當所述升降框架朝向載體框架上升時,支撐裝載於載體框架的電子部件;及調整源,調整所述支撐板的高度,以使所述支撐板能夠支撐高度彼此不同的多種規格的電子部件的下端。The opening device may further include: a support plate that supports the electronic components loaded on the carrier frame when the lifting frame rises toward the carrier frame; and an adjustment source that adjusts the height of the support plate so that the support plate can Supports the lower end of electronic components of various specifications with different heights.
根據本發明的第二形態的電子部件分選機用開放裝置包括:升降框架,能夠朝向可裝載電子部件的載體框架前進或者向反方向後退;升降源,使所述升降框架升降;開放機,設置於所述升降框架,並且開放載體框架以使電子部件能夠從載體框架被卸載;支撐板,當所述升降框架朝向載體框架上升時,支撐被裝載於載體框架的電子部件;及調整源,調整所述支撐板的高度以使所述電子部件能夠上升。The opening device for an electronic component sorting machine according to the second aspect of the present invention includes: an elevating frame capable of advancing toward or retreating in the opposite direction toward the carrier frame on which electronic components can be loaded; an elevating source for raising and lowering the elevating frame; and an opening machine, Is provided in the lifting frame, and the carrier frame is opened so that electronic components can be unloaded from the carrier frame; a support plate, when the lifting frame rises toward the carrier frame, supports the electronic components loaded on the carrier frame; and an adjustment source, Adjust the height of the support plate to enable the electronic component to rise.
根據本發明,由於無需進行部件的更換而處理具有多樣的寬度和高度的電子部件,因此提供通用性,從而與此對應地具有能夠期望資源的再利用、防止資源浪費、降低更換成本以及提高運行率的效果。According to the present invention, since electronic components with various widths and heights are handled without the need for component replacement, versatility is provided, and correspondingly, it is possible to expect resource reuse, prevent resource waste, reduce replacement costs, and improve operation. Rate effect.
參照附圖對根據本發明的優選實施例進行說明,在此,為了說明的簡潔性,儘量省略或壓縮針對重複或實質上相同的構成的說明。The preferred embodiments according to the present invention will be described with reference to the accompanying drawings. Here, for the sake of brevity of the description, the description of the repeated or substantially the same configuration is omitted or condensed as much as possible.
<< 針對載體框架的說明Instructions for the carrier frame >>
在對根據本發明的電子部件分選機用開放裝置(以下,簡稱為「開放裝置」)進行說明之前,對裝載電子部件的載體框架進行說明。Before describing the opening device for an electronic component sorting machine according to the present invention (hereinafter, simply referred to as “opening device”), a carrier frame on which electronic components are mounted will be described.
圖1是關於與根據本發明的開放裝置成對的載體框架的立體圖。Fig. 1 is a perspective view of a carrier frame paired with an opening device according to the present invention.
載體框架(carrier frame)CF可以被開放裝置開放為能夠卸載電子部件ED,或者可以被封閉為能夠保持被裝載的電子部件。The carrier frame CF may be opened by the opening device to be able to unload the electronic part ED, or may be closed to be able to hold the loaded electronic part.
如同在圖2中詳細示出,在載體框架CF配備有用於裝載電子部件ED的多個裝載模組LM。這種裝載模組LM的開放和封閉最終意味著載體框架CF的開放和封閉。As shown in detail in FIG. 2, the carrier frame CF is equipped with a plurality of loading modules LM for loading electronic components ED. The opening and closing of this loading module LM ultimately means the opening and closing of the carrier frame CF.
各個裝載模組LM具有第一裝載部件L1和第二裝載部件L2,並且第一裝載部件L1抓持電子部件ED的一側(附圖中為左側),第二裝載部件L2抓持電子部件ED的另一側(附圖中為右側)。即,如果第一裝載部件L1和第二裝載部件L2之間的間距由於開放裝置而張開,則裝載模組LM會開放,並且如果第一裝載部件L1和第二裝載部件L2之間的間距縮小,則裝載模組LM會被封閉,從而電子部件ED的兩側被抓持。在此,在第一裝載部件L1和第二裝載部件L2形成有可以卡定在後述的開放棒的卡定台J,以能夠通過開放裝置實現開放,並且為了封閉裝載模組LM,第一裝載部件L1和第二裝載部件L2通過彈簧S而沿彼此之間的間距變窄的方向被彈性支撐。Each loading module LM has a first loading part L1 and a second loading part L2, and the first loading part L1 grips one side of the electronic part ED (the left side in the drawing), and the second loading part L2 grips the electronic part ED On the other side (right side in the picture). That is, if the distance between the first loading part L1 and the second loading part L2 is opened due to the opening device, the loading module LM will be opened, and if the distance between the first loading part L1 and the second loading part L2 If it is reduced, the loading module LM will be closed, so that both sides of the electronic component ED are grasped. Here, the first loading part L1 and the second loading part L2 are formed with a locking table J that can be locked to an opening rod described later so that the opening can be realized by an opening device, and in order to close the loading module LM, the first loading The part L1 and the second loading part L2 are elastically supported by the spring S in a direction in which the distance between each other is narrowed.
<< 針對開放裝置的說明Instructions for open devices >>
圖3是關於根據本發明的電子部件分選機用開放裝置(以下,簡稱為「開放裝置」)100的立體圖。3 is a perspective view of an opening device (hereinafter, simply referred to as "opening device") 100 for an electronic component sorting machine according to the present invention.
開放裝置100包括升降框架110、升降源120、開放機130、支撐板140以及調整源150。The
升降框架110配備成能夠朝向載體框架CF而上升或者與此相反地下降。The elevating
升降源120可以由氣缸構成,並使升降框架110升降。The
開放機130設置於升降框架110,並且開放載體框架CF,以能夠從載體框架CF卸載電子部件ED。為此,如圖4的局部圖所示,開放機130包括第一開放棒131、第二開放棒132、間距調整帶133以及動力源134。The
第一開放棒131和第二開放棒132佈置成彼此對向,並且結合於間距調整帶133而能夠向彼此反方向移動,進而,當動力源134運行時,通過引導軌道GL的引導,彼此之間的間距會變寬或變窄。在此,第一開放棒131具有用於使第一裝載部件L1的卡定台J一次性地卡定的第一卡定端131a,第二開放棒132具有用於使第二裝載部件L2的卡定台J一次性地卡定的第二卡定端132a。The first
間距調整帶133通過將主動滑輪DP和被動滑輪PP作為旋轉轉向點(Turning point)而進行正反旋轉,從而向第一開放棒131和第二開放棒132傳遞動力源134的驅動力。The
動力源134提供用於使第一開放棒131和第二開放棒132之間的間距變大的動力,並且配備成能夠與寬度彼此不同的不同規格的多樣的電子部件ED的寬度對應地對第一開放棒131和第二開放棒132之間的張開的間距的程度進行調整的馬達。因此,根據作為動力源134的馬達的旋轉量,第一開放棒131和第二開放棒132之間的間距可以實現多樣的變化。The
接著,參照圖5的局部圖來說明支撐板140和調整源150。Next, the
支撐板140支撐裝在載體框架CF的電子部件ED。在所述支撐板140中形成有用於與所需要支撐的電子部件ED的數量對應地抓持電子部件ED的下端的抓持槽141。The
調整源150調整支撐板140的升降高度,以使支撐板140能夠支撐不同高度的多種規格的電子部件ED的下端。所述調整源150可以配備成氣缸,但是優選配備成馬達,以能夠調整支撐板140的升降高度而有利於進行借助後述的拾取裝置的電子部件ED的抓持或抓持解除。The
接著,對如前述的開放裝置100的操作進行說明。Next, the operation of the
作為參考,在將電子部件ED裝載到載體框架CF時,拾取裝置將電子部件ED裝載到裝載模組LM。此時,從圖6的狀態到圖7的狀態實現電子部件的裝載,從而借助於拾取裝置PA的下降力,構成裝載模組LM的第一裝載部件L1和第二裝載部件L2將會因克服彈簧S的彈性力而被強行裝載的電子部件ED向圖7的箭頭方向張開,並且當電子部件ED的裝載完畢時,借助被壓縮的彈簧S而向第一裝載部件L1和第二裝載部件L2之間的間距變窄的方向施加彈性力,從而裝載模組LM會被封閉。因此,拾取裝置PA將電子部件ED裝載到載體框架CF的動作(裝載動作)可以與開放裝置100無關地實現。
For reference, when loading the electronic component ED to the carrier frame CF, the pickup device loads the electronic component ED to the loading module LM. At this time, the electronic components are loaded from the state of FIG. 6 to the state of FIG. 7, so that the first loading part L1 and the second loading part L2 constituting the loading module LM will be overcome by the descending force of the pickup device PA. The electronic component ED forcibly loaded by the elastic force of the spring S expands in the direction of the arrow in FIG. 7, and when the loading of the electronic component ED is completed, the compressed spring S is applied to the first loading part L1 and the second loading part. Elastic force is applied in the direction in which the spacing between L2 becomes narrow, so that the loading module LM is closed. Therefore, the action (loading action) of the pickup device PA loading the electronic component ED to the carrier frame CF can be realized independently of the
1.關於卸載的第一運行例--電子部件的高度高的情況1. Regarding the first operation example of unloading-the case where the height of the electronic component is high
如圖6和圖7所示,在電子部件ED的高度高的情況下,即使在電子部件ED裝載於裝載模組LM的狀態下,拾取裝置PA也能夠抓持電子部件ED,因此不要求運行支撐板140和調整源150。
As shown in FIGS. 6 and 7, when the height of the electronic component ED is high, even in the state where the electronic component ED is loaded on the loading module LM, the pickup device PA can grasp the electronic component ED, so operation is not required The
在本運行例中,如果升降框架110朝向載體框架CF上升,則如圖8所示,第一開放棒131的卡定端131a位於可卡接到第一裝載部件L1的卡定台J的高度,第二開放棒132的卡定端132a位於可卡接到第二裝載部件L2的卡定台J的高度。並且,在圖8的狀態下,開放機130進行操作,從而使第一開放棒131和第二開放棒132之間
的間距變寬,從而開放裝載模組LM,在此狀態下,拾取裝置PA卸載電子部件ED。
In this operating example, if the
2.關於卸載的第二運行例--電子部件的高度低的情況2. Regarding the second operation example of unloading-the case where the height of the electronic components is low
在電子部件ED的高度低的情況下,拾取裝置PA抓持的區域不足。因此要求運行支撐板140和調整源150。
When the height of the electronic component ED is low, the area gripped by the pickup device PA is insufficient. Therefore, the
在本運行例中,如果升降框架110朝向載體框架CF上升,則如圖9所示,第一開放棒131的卡定端131a位於可卡接到第一裝載部件L1的卡定台J的高度,第二開放棒132的卡定端132a位於可卡接到第二裝載部件L2的卡定台J的高度。並且,開放機130進行操作而使第一開放棒131和第二開放棒132之間的間距變寬,從而如圖10所示地,裝載模組LM被開放,在此狀態下,如圖11所示地運行調整源150而使支撐板140上升。據此,拾取裝置PA成為可抓持電子部件ED的上側的端的狀態,並且在此狀態下實現借助拾取裝置PA的卸載操作。
In this operation example, if the
作為參考,在本例中僅考慮了拾取裝置PA從載體框架CF卸載電子部件ED的情形。但是,根據實施形態,為了進行將電子部件ED裝載到載體框架CF的裝載動作,也可充分考慮在裝載區域應用開放裝置。例如,可以優選地考慮在裝載區域配備開放裝置100,並通過開放裝置100而使第一裝載部件L1和第二裝載部件L2之間的間距變寬,之後裝載電子部件ED。此時,電子部件ED具有將位於第一裝載部件L1和第二裝載部件L2的沿上下方向形成的引導槽部分作為引導軌道而被對準位置並下降的流。在此,各個裝載部件L1、L2的下端構成為能夠支撐電子部件ED的下部邊角中的外殼側下端。當然,還可以優選考慮如下的方式:在進行電子部件ED的裝載時,在電子部件ED因拾取裝置PA對電子部件ED的抓持被解除而降落時,支撐板140預先上升而在預定的位置預先接住電子部件ED,之後使支撐板140下降,從而使電子部件ED能夠穩定地裝載到裝載模組LM。For reference, in this example, only the case where the pickup device PA unloads the electronic component ED from the carrier frame CF is considered. However, according to the embodiment, in order to perform the loading operation of loading the electronic component ED on the carrier frame CF, it is also possible to fully consider applying an opening device in the loading area. For example, it may be preferable to provide an
作為參考,在裝載時也可能存在如圖11所示的狀態,在此情況下,如果拾取裝置PA解除對電子部件ED的抓持,則電子部件ED會進行自由下落,此時,使裝載部件L1、L2之間的間距稍微變寬,從而使裝載部件L1、L2具有能夠引導電子部件ED的下降移動的程度的間距。其原因在於,如果裝載部件L1、L2之間的間距過於寬,則裝載部件L1、L2無法引導電子部件ED的下降,因此電子部件ED可能會脫離到其他位置,或者可能會倒下,降落的衝擊也可能會過大。因此,優選地,通過使形成於裝載部件L1、L2的彼此面對的面的引導槽能夠引導電子部件ED的下降運動,從而實現電子部件ED的穩定的裝載和下降衝擊最小化。當然,可通過圖9至圖11而充分理解,上述的使裝載部件L1、L2之間的間距變寬的程度在卸載時也同樣適用。For reference, the state shown in FIG. 11 may also exist during loading. In this case, if the pickup device PA releases the grip of the electronic component ED, the electronic component ED will fall freely. At this time, the loading component The pitch between L1 and L2 is slightly widened, so that the mounting components L1 and L2 have a pitch that can guide the downward movement of the electronic component ED. The reason is that if the distance between the loading parts L1 and L2 is too wide, the loading parts L1 and L2 cannot guide the lowering of the electronic part ED, so the electronic part ED may be separated from other positions, or may fall down and fall. The impact may also be too large. Therefore, it is preferable that the guide grooves formed on the faces of the loading parts L1 and L2 that face each other can guide the descending movement of the electronic part ED, thereby achieving stable loading of the electronic part ED and minimizing the descending impact. Of course, it can be fully understood from FIGS. 9 to 11 that the above-mentioned degree of widening the distance between the loading parts L1 and L2 is also applicable during unloading.
並且,在本示例中,具有電子部件ED以兩列裝載於載體框架CF的結構,但是可充分理解的是,在電子部件ED以一列裝載於載體框架CF的情況或者以三列以上被裝載的情況下,本發明也能夠同樣被適用。In addition, in this example, there is a structure in which the electronic components ED are loaded on the carrier frame CF in two rows, but it is fully understood that when the electronic components ED are loaded on the carrier frame CF in one row or in three or more rows In this case, the present invention can be similarly applied.
並且,雖然在背景技術中將模組IC作為一例進行了說明,但是在本發明中,除了模組IC以外還可以充分應用於能夠處理基板形態的電子部件ED的其他分選機。In addition, although the module IC has been described as an example in the background art, in the present invention, in addition to the module IC, it can be sufficiently applied to other sorting machines capable of processing electronic components ED in the form of a substrate.
如前述,已根據參照附圖說明的實施例而進行了針對本發明的具體的說明,然而,上述實施例僅僅將本發明的優選實施例作為一例而進行了說明,因此,本發明不應被理解為局限於上述的實施例,本發明的權利範圍應被理解為申請專利範圍的範圍及與此等同的範圍。As mentioned above, the specific description of the present invention has been given based on the embodiments described with reference to the drawings. However, the above-mentioned embodiments only describe the preferred embodiments of the present invention as an example. Therefore, the present invention should not be It is understood that it is limited to the above-mentioned embodiments, and the scope of rights of the present invention should be understood as the scope of the patent application and the scope equivalent thereto.
100‧‧‧電子部件分選機用開放裝置110‧‧‧升降框架120‧‧‧升降源130‧‧‧開放機131‧‧‧第一開放棒132‧‧‧第二開放棒131a‧‧‧第一卡定端132a‧‧‧第二卡定端100‧‧‧Opening device for electronic
134:動力源 134: Power Source
140:支撐板 140: support plate
150:調整源 150: adjust source
ED:電子部件 ED: electronic components
CF:載體框架 CF: Carrier Frame
L1:第一裝載部件 L1: First loading part
L2:第二裝載部件 L2: Second loading part
LM:裝載模組 LM: Load module
圖1是關於與根據本發明的開放裝置成對的載體框架的立體圖。 圖2是關於應用到圖1的載體框架的裝載模組的立體圖。 圖3是關於根據本發明的電子部件分選機用開放裝置的立體圖。 圖4是關於應用到圖3的開放裝置的開放機的局部立體圖。 圖5是關於應用到圖3的開放裝置的支撐板和調整源的局部立體圖。 圖6及圖7是用於說明將電子部件裝入裝載模組的操作的參照圖。 圖8是用於說明在處理高度較高的電子部件時的裝載模組的開放前的狀態的參照圖。 圖9是用於說明在處理高度較低的電子部件時的裝載模組的開放前的狀態的參照圖。 圖10是用於說明圖9之後的裝載模組被開放的狀態的參照圖。 圖11是用於說明支撐板和調整源的操作的參照圖。Fig. 1 is a perspective view of a carrier frame paired with an opening device according to the present invention. Fig. 2 is a perspective view of a loading module applied to the carrier frame of Fig. 1. Fig. 3 is a perspective view of an opening device for an electronic component sorting machine according to the present invention. Fig. 4 is a partial perspective view of an opening machine applied to the opening device of Fig. 3. Fig. 5 is a partial perspective view of a supporting plate and an adjustment source applied to the opening device of Fig. 3. 6 and 7 are reference diagrams for explaining the operation of loading electronic components into the loading module. FIG. 8 is a reference diagram for explaining a state before the opening of the loading module when processing electronic components with a high height. FIG. 9 is a reference diagram for explaining a state before the opening of the loading module when electronic components with a low height are processed. Fig. 10 is a reference diagram for explaining a state where the loading module after Fig. 9 is opened. Fig. 11 is a reference diagram for explaining the operation of the support plate and the adjustment source.
國內寄存資訊 (請依寄存機構、日期、號碼順序註記) 無Domestic hosting information (please note in the order of hosting organization, date and number)
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100‧‧‧電子部件分選機用開放裝置 100‧‧‧Open device for electronic component sorting machine
110‧‧‧升降框架 110‧‧‧Lifting frame
120‧‧‧升降源 120‧‧‧Lifting source
130‧‧‧開放機 130‧‧‧Open machine
140‧‧‧支撐板 140‧‧‧Support plate
150‧‧‧調整源 150‧‧‧Adjustment source
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??10-2017-0155892 | 2017-11-21 | ||
KR10-2017-0155892 | 2017-11-21 |
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TW201925065A TW201925065A (en) | 2019-07-01 |
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CN (1) | CN109807084B (en) |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201024191A (en) * | 2008-12-31 | 2010-07-01 | Tech Wing Co Ltd | Pick-and-place apparatus of test handler |
KR20110136312A (en) * | 2010-06-14 | 2011-12-21 | (주)테크윙 | Module IC Handler |
TWM469293U (en) * | 2013-08-07 | 2014-01-01 | Chroma Ate Inc | Transfer device to adjust the width |
KR20140072847A (en) * | 2014-05-14 | 2014-06-13 | (주)테크윙 | Pressurizing apparatus for handler and handler |
TW201431764A (en) * | 2010-06-15 | 2014-08-16 | Tech Wing Co Ltd | Pushing apparatus for handler and handler |
TW201728515A (en) * | 2016-02-02 | 2017-08-16 | 泰克元有限公司 | Transfer device |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10291140A (en) * | 1997-04-17 | 1998-11-04 | Sanyu Kikai Seisakusho:Kk | Part supply device using endless belt |
KR100232260B1 (en) * | 1997-11-13 | 1999-12-01 | 윤종용 | Test socket and apparatus for testing module using the same |
KR100689972B1 (en) * | 2006-01-26 | 2007-03-12 | 미래산업 주식회사 | Module IC test handler |
KR101505955B1 (en) * | 2009-11-17 | 2015-03-27 | (주)테크윙 | Opening apparatus for test handler |
CN205325058U (en) * | 2015-12-28 | 2016-06-22 | 常州市第一橡塑设备有限公司 | H steel positioning group clamping utensil |
KR102650702B1 (en) * | 2016-03-04 | 2024-03-25 | (주)테크윙 | Cart of supplying tray for supplying electronic components and handler of processing electronic components |
CN205946509U (en) * | 2016-08-28 | 2017-02-08 | 中山市鸿菊自动化设备制造有限公司 | Novel PCB of chip mounter business turn over trigger constructs |
CN106935897B (en) * | 2017-03-14 | 2023-09-19 | 深圳市联赢激光股份有限公司 | Compatible fixture |
-
2017
- 2017-11-21 KR KR1020170155892A patent/KR102289103B1/en active Active
-
2018
- 2018-09-26 CN CN201811122542.0A patent/CN109807084B/en active Active
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-
2021
- 2021-07-09 KR KR1020210090088A patent/KR102438462B1/en active Active
-
2022
- 2022-08-25 KR KR1020220107158A patent/KR102624971B1/en active Active
-
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- 2024-01-09 KR KR1020240003797A patent/KR102670140B1/en active Active
- 2024-05-23 KR KR1020240067297A patent/KR102706410B1/en active Active
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201024191A (en) * | 2008-12-31 | 2010-07-01 | Tech Wing Co Ltd | Pick-and-place apparatus of test handler |
KR20110136312A (en) * | 2010-06-14 | 2011-12-21 | (주)테크윙 | Module IC Handler |
TW201431764A (en) * | 2010-06-15 | 2014-08-16 | Tech Wing Co Ltd | Pushing apparatus for handler and handler |
TWM469293U (en) * | 2013-08-07 | 2014-01-01 | Chroma Ate Inc | Transfer device to adjust the width |
KR20140072847A (en) * | 2014-05-14 | 2014-06-13 | (주)테크윙 | Pressurizing apparatus for handler and handler |
TW201728515A (en) * | 2016-02-02 | 2017-08-16 | 泰克元有限公司 | Transfer device |
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