TWI445922B - Roundness measuring device - Google Patents
Roundness measuring device Download PDFInfo
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- TWI445922B TWI445922B TW98112928A TW98112928A TWI445922B TW I445922 B TWI445922 B TW I445922B TW 98112928 A TW98112928 A TW 98112928A TW 98112928 A TW98112928 A TW 98112928A TW I445922 B TWI445922 B TW I445922B
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- rotating shaft
- hole
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- detecting device
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- 239000000523 sample Substances 0.000 claims description 8
- 230000000149 penetrating effect Effects 0.000 claims description 3
- 238000005096 rolling process Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
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- A Measuring Device Byusing Mechanical Method (AREA)
Description
本發明涉及一種圓度檢測裝置。 The present invention relates to a roundness detecting device.
目前測量圓形工件表面形狀誤差如圓度(又稱真圓度),一般需要用大型的精密圓度儀進行測量,然而大型精密圓度儀的結構複雜,成本高,不適合大量的配置。 At present, the measurement of the surface shape error of a circular workpiece such as roundness (also called roundness) is generally required to be measured by a large-scale precision roundness meter. However, the large-scale precision roundness meter has a complicated structure and high cost, and is not suitable for a large number of configurations.
有鑒於此,有必要提供一種低成本且結構簡單的圓度檢測裝置。 In view of the above, it is necessary to provide a roundness detecting device which is low in cost and simple in structure.
一種圓度檢測裝置,其包括一基座,一轉軸,一測微表,以及一定位裝置,所述轉軸可轉動地設置在所述基座上,所述測微表對應所述轉軸設置在所述基座上並與所述轉軸間隔一定距離,所述定位裝置設置在所述轉軸上以固定一待檢測工件。 A roundness detecting device includes a base, a rotating shaft, a micrometer, and a positioning device, wherein the rotating shaft is rotatably disposed on the base, and the micrometer is disposed corresponding to the rotating shaft The base is spaced apart from the rotating shaft by a distance, and the positioning device is disposed on the rotating shaft to fix a workpiece to be detected.
相較於先前技術,該圓度檢測裝置採用安裝在一轉軸上的定位裝置固定待檢測工件,並通過與所述轉軸對應設置的測微表檢測所述待檢測工件的圓度,其結構簡單,成本低。 Compared with the prior art, the roundness detecting device fixes the workpiece to be inspected by using a positioning device mounted on a rotating shaft, and detects the roundness of the workpiece to be detected through a micrometer corresponding to the rotating shaft, and has a simple structure. ,low cost.
100‧‧‧圓度檢測裝置 100‧‧‧ roundness detection device
110‧‧‧基座 110‧‧‧Base
112‧‧‧底板 112‧‧‧floor
114‧‧‧側壁 114‧‧‧ side wall
116‧‧‧收容空間 116‧‧‧ accommodating space
112a‧‧‧軸孔 112a‧‧‧Axis hole
114a‧‧‧通孔 114a‧‧‧through hole
120‧‧‧轉軸 120‧‧‧ shaft
130‧‧‧測微表 130‧‧‧Micrometer
132‧‧‧讀數計 132‧‧‧Reading meter
134‧‧‧桿體 134‧‧‧ rod body
136‧‧‧探頭 136‧‧‧ probe
140‧‧‧定位裝置 140‧‧‧ Positioning device
142‧‧‧彈簧 142‧‧ ‧ spring
144‧‧‧固定桿 144‧‧‧ fixed rod
146‧‧‧定位銷 146‧‧‧Locating pin
200‧‧‧待檢測工件 200‧‧‧Workpiece to be inspected
圖1係本發明圓度檢測裝置的立體示意圖;圖2係沿圖1的圓度檢測裝置II-II線所得的剖視圖;圖3係圖1圓度檢測裝置的使用狀態圖。 1 is a perspective view of a roundness detecting device of the present invention; FIG. 2 is a cross-sectional view taken along line II-II of the roundness detecting device of FIG. 1; and FIG. 3 is a view showing a state of use of the roundness detecting device of FIG. 1.
下面將結合附圖對本發明實施方式作進一步的詳細說明。 The embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.
請參閱圖1,本發明較佳實施方式提供的一種圓度檢測裝置100。該圓度檢測裝置100包括一基座110,一轉軸120,一測微表130,以及一定位裝置140。所述轉軸120可轉動地設置在所述基座110上。所述測微表130對應所述轉軸120設置在所述基座110上並與所述轉軸120間隔一定距離。所述定位裝置140設置在所述轉軸120上用以固定待檢測工件。 Please refer to FIG. 1 , which shows a roundness detecting device 100 according to a preferred embodiment of the present invention. The roundness detecting device 100 includes a base 110, a rotating shaft 120, a micrometer 130, and a positioning device 140. The rotating shaft 120 is rotatably disposed on the base 110. The micrometer 130 is disposed on the base 110 corresponding to the rotating shaft 120 and spaced apart from the rotating shaft 120 by a certain distance. The positioning device 140 is disposed on the rotating shaft 120 for fixing a workpiece to be inspected.
所述基座110包括一底板112以及一由該底板112邊緣沿垂直於該底板112的方向延伸出的側壁114。本實施方式中,所述底板112為圓形,所述側壁114環繞所述底板112形成一圓形的收容空間116。在所述底板112中心位置設置有一軸孔112a,用以使轉軸120容置於其中。所述側壁114上開設有一垂直於該側壁114並貫穿該側壁114的通孔114a。所述通孔114a用以設置所述測微表130。 The base 110 includes a bottom plate 112 and a side wall 114 extending from an edge of the bottom plate 112 in a direction perpendicular to the bottom plate 112. In this embodiment, the bottom plate 112 is circular, and the side wall 114 forms a circular receiving space 116 around the bottom plate 112. A shaft hole 112a is disposed at a center of the bottom plate 112 for receiving the rotating shaft 120 therein. A through hole 114a perpendicular to the sidewall 114 and extending through the sidewall 114 is defined in the sidewall 114. The through hole 114a is used to set the micrometer 130.
所述轉軸120的一端可轉動地設置在所述基座110的軸孔112a內,用以通過定位裝置140帶動待檢測工件轉動。可以理解,為了降低所述轉軸120與軸孔112a的側壁之間的摩擦對測量結果造成的影響,可在所述轉軸120與所述軸孔112a的側壁之間設置一滾動軸承(圖未示)。 One end of the rotating shaft 120 is rotatably disposed in the shaft hole 112a of the base 110 for driving the workpiece to be detected to rotate by the positioning device 140. It can be understood that, in order to reduce the influence of the friction between the rotating shaft 120 and the sidewall of the shaft hole 112a on the measurement result, a rolling bearing (not shown) may be disposed between the rotating shaft 120 and the sidewall of the shaft hole 112a. .
所述測微表130設置在所述基座110的側壁114上,其包括一讀數計132,一桿體134以及一探頭136。所述讀數計132用以讀取待檢測工件表面變化的數值,該讀數計132內設置有計量裝置。所述桿體134連接在所述讀數計132上,並穿過所述通孔114a固設在所 述基座110的側壁114上,所述桿體134為一中空的桿狀物。所述探頭136與讀數計132內的計量裝置相連接,並由所述桿體134的端部伸出,測量時該探頭136直接抵持在待檢測工件的表面上,以探測待檢測工件表面的變化,並將該變化直接傳輸至讀數計132由所述讀數計132將其轉化為具體的變化數值顯現給使用者。 The micrometer 130 is disposed on the sidewall 114 of the susceptor 110 and includes a reading meter 132, a rod 134 and a probe 136. The meter 132 is used to read the value of the surface change of the workpiece to be inspected, and the meter 132 is provided with a metering device. The rod body 134 is connected to the reading meter 132 and is fixed in the through hole 114a. On the side wall 114 of the base 110, the rod 134 is a hollow rod. The probe 136 is coupled to the metering device in the meter 132 and extends from the end of the rod 134. The probe 136 directly abuts against the surface of the workpiece to be inspected to detect the surface of the workpiece to be inspected. The change is transmitted directly to the meter 132 by the meter 132 to convert it to a particular change value for presentation to the user.
所述定位裝置140設置在所述轉軸120鄰近所述基座110的一端用以支撐待檢測工件。請參閱圖1及圖2,本實施方式中,所述定位裝置140包括多個彈簧142以及多個固定桿144以及可伸縮地設置在所述固定桿144內的定位銷146。所述固定桿144等間隔地螺接在所述轉軸120上,所述定位銷146可伸縮的設置在所述固定桿144的外端。所述彈簧142套設在所述固定桿144上,並抵持在所述定位銷146的端部及所述轉軸120上。 The positioning device 140 is disposed at an end of the rotating shaft 120 adjacent to the base 110 for supporting a workpiece to be inspected. Referring to FIGS. 1 and 2 , in the present embodiment, the positioning device 140 includes a plurality of springs 142 and a plurality of fixing rods 144 and positioning pins 146 that are telescopically disposed in the fixing rods 144 . The fixing rods 144 are screwed onto the rotating shaft 120 at equal intervals, and the positioning pins 146 are telescopically disposed at the outer ends of the fixing rods 144. The spring 142 is sleeved on the fixing rod 144 and is abutted on the end of the positioning pin 146 and the rotating shaft 120.
請參閱圖3,使用時,將一環形的待檢測工件200通過所述定位裝置140定位在所述轉軸120的端部並容置在所述基座110的收容空間116內,其中,所述定位裝置140的定位銷146在所述彈簧142的作用下抵持在所述環形待檢測工件200的內壁上,由於所述定位裝置140的定位銷146可以在所述固定桿144內滑動,因此所述定位銷146與所述彈簧142一同構成一自定心結構,可以對所述環形待檢測工件200進行自動定心。當所述待檢測工件200定位完畢後,調整所述測微表130使所述測微表130的探頭136抵持在所述待檢測工件200的外表面上。接著,旋轉所述轉軸120帶動所述待檢測工件200轉動,在轉動過程中,所述待檢測工件200表面形狀的變化便可通過所述測微表130讀出,從而可方便的測量所述待檢測工件200的圓度。 Referring to FIG. 3 , in use, an annular workpiece to be inspected 200 is positioned at the end of the rotating shaft 120 through the positioning device 140 and received in the receiving space 116 of the base 110 . The positioning pin 146 of the positioning device 140 is abutted against the inner wall of the annular workpiece to be inspected by the spring 142. Since the positioning pin 146 of the positioning device 140 can slide within the fixing rod 144, Therefore, the positioning pin 146 together with the spring 142 constitutes a self-centering structure, and the ring-shaped workpiece to be inspected 200 can be automatically centered. After the positioning of the workpiece to be inspected 200 is completed, the micrometer 130 is adjusted to cause the probe 136 of the micrometer 130 to abut on the outer surface of the workpiece 200 to be inspected. Then, the rotation of the rotating shaft 120 drives the workpiece 200 to be detected to rotate. During the rotation, the change of the surface shape of the workpiece 200 to be detected can be read by the micrometer 130, so that the measurement can be conveniently performed. The roundness of the workpiece 200 to be inspected.
本發明圓度檢測裝置100結構簡單,可方便的對環形待檢測工件進行圓度測量,此外,該圓度檢測裝置100還可對環形待檢測工件的表面粗糙度進行測量。 The roundness detecting device 100 of the present invention has a simple structure, and can conveniently measure the roundness of the workpiece to be detected. Further, the roundness detecting device 100 can also measure the surface roughness of the workpiece to be detected.
可以理解,在所述定位裝置140的定位銷146的端部可設置一摩擦片,以增大定位銷146與待檢測工件之間的摩擦力。 It can be understood that a friction plate can be disposed at the end of the positioning pin 146 of the positioning device 140 to increase the friction between the positioning pin 146 and the workpiece to be inspected.
可以理解,為了防止所述測微表130在測量時自身發生位移,可以在所述基座110的側壁114的頂端設置一垂直貫穿至所述通孔114a的螺栓孔(圖未示),並在該螺栓孔中設置螺栓抵持在所述測微表130的桿體134上,從而固定所述測微表130。 It can be understood that, in order to prevent the micrometer 130 from being displaced during the measurement, a bolt hole (not shown) penetrating perpendicularly to the through hole 114a may be disposed at a top end of the sidewall 114 of the base 110, and A bolt is placed in the bolt hole to abut against the rod 134 of the micrometer 130, thereby fixing the micrometer 130.
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述者僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士爰依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。 In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
100‧‧‧圓度檢測裝置 100‧‧‧ roundness detection device
110‧‧‧基座 110‧‧‧Base
112‧‧‧底板 112‧‧‧floor
114‧‧‧側壁 114‧‧‧ side wall
116‧‧‧收容空間 116‧‧‧ accommodating space
112a‧‧‧軸孔 112a‧‧‧Axis hole
114a‧‧‧通孔 114a‧‧‧through hole
120‧‧‧轉軸 120‧‧‧ shaft
130‧‧‧測微表 130‧‧‧Micrometer
132‧‧‧讀數計 132‧‧‧Reading meter
134‧‧‧桿體 134‧‧‧ rod body
136‧‧‧探頭 136‧‧‧ probe
140‧‧‧定位裝置 140‧‧‧ Positioning device
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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TW98112928A TWI445922B (en) | 2009-04-17 | 2009-04-17 | Roundness measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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TW98112928A TWI445922B (en) | 2009-04-17 | 2009-04-17 | Roundness measuring device |
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Publication Number | Publication Date |
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TW201038916A TW201038916A (en) | 2010-11-01 |
TWI445922B true TWI445922B (en) | 2014-07-21 |
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TW98112928A TWI445922B (en) | 2009-04-17 | 2009-04-17 | Roundness measuring device |
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TW (1) | TWI445922B (en) |
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