TW202033704A - Adhesive tape - Google Patents
Adhesive tape Download PDFInfo
- Publication number
- TW202033704A TW202033704A TW108147493A TW108147493A TW202033704A TW 202033704 A TW202033704 A TW 202033704A TW 108147493 A TW108147493 A TW 108147493A TW 108147493 A TW108147493 A TW 108147493A TW 202033704 A TW202033704 A TW 202033704A
- Authority
- TW
- Taiwan
- Prior art keywords
- adhesive tape
- ultraviolet
- adhesive layer
- weight
- adhesive
- Prior art date
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- 239000002390 adhesive tape Substances 0.000 title claims abstract description 129
- 239000012790 adhesive layer Substances 0.000 claims abstract description 129
- 125000000524 functional group Chemical group 0.000 claims description 40
- -1 Polysiloxane Polymers 0.000 claims description 39
- 239000000758 substrate Substances 0.000 claims description 32
- 229920001296 polysiloxane Polymers 0.000 claims description 28
- 229920000642 polymer Polymers 0.000 claims description 23
- 150000002222 fluorine compounds Chemical class 0.000 claims description 21
- 238000010438 heat treatment Methods 0.000 claims description 21
- 238000004519 manufacturing process Methods 0.000 claims description 20
- 239000011347 resin Substances 0.000 claims description 13
- 229920005989 resin Polymers 0.000 claims description 13
- 238000002834 transmittance Methods 0.000 claims description 11
- 230000001678 irradiating effect Effects 0.000 claims description 8
- 239000003505 polymerization initiator Substances 0.000 claims description 8
- 125000000217 alkyl group Chemical group 0.000 claims description 7
- 230000004580 weight loss Effects 0.000 claims description 6
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 4
- 150000001408 amides Chemical class 0.000 claims description 4
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 229920006122 polyamide resin Polymers 0.000 claims description 4
- 125000003118 aryl group Chemical group 0.000 claims description 3
- 150000002170 ethers Chemical class 0.000 claims description 3
- 150000002576 ketones Chemical class 0.000 claims description 3
- 150000002466 imines Chemical class 0.000 claims description 2
- 239000000853 adhesive Substances 0.000 abstract description 64
- 230000001070 adhesive effect Effects 0.000 abstract description 64
- 238000000034 method Methods 0.000 abstract description 17
- 239000000463 material Substances 0.000 abstract description 11
- 230000008569 process Effects 0.000 abstract description 5
- 239000010408 film Substances 0.000 description 63
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 60
- 235000012431 wafers Nutrition 0.000 description 43
- 239000000178 monomer Substances 0.000 description 30
- 229920000058 polyacrylate Polymers 0.000 description 24
- 239000003431 cross linking reagent Substances 0.000 description 21
- 239000000945 filler Substances 0.000 description 21
- 239000007789 gas Substances 0.000 description 21
- 238000001723 curing Methods 0.000 description 20
- 238000003848 UV Light-Curing Methods 0.000 description 19
- 206010040844 Skin exfoliation Diseases 0.000 description 18
- 239000010410 layer Substances 0.000 description 18
- 239000003795 chemical substances by application Substances 0.000 description 17
- 238000005259 measurement Methods 0.000 description 17
- 239000004065 semiconductor Substances 0.000 description 16
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 15
- 229910052710 silicon Inorganic materials 0.000 description 15
- 239000010703 silicon Substances 0.000 description 15
- 150000001875 compounds Chemical class 0.000 description 12
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 12
- 239000011521 glass Substances 0.000 description 12
- 239000003504 photosensitizing agent Substances 0.000 description 11
- 238000006116 polymerization reaction Methods 0.000 description 10
- 238000011156 evaluation Methods 0.000 description 9
- 239000000203 mixture Substances 0.000 description 9
- 238000003860 storage Methods 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 239000003999 initiator Substances 0.000 description 8
- 239000007787 solid Substances 0.000 description 8
- 230000001186 cumulative effect Effects 0.000 description 7
- 238000012545 processing Methods 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 6
- 239000004677 Nylon Substances 0.000 description 6
- 239000000654 additive Substances 0.000 description 6
- 230000000052 comparative effect Effects 0.000 description 6
- 229920001778 nylon Polymers 0.000 description 6
- 238000010943 off-gassing Methods 0.000 description 6
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 6
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 5
- 238000001035 drying Methods 0.000 description 5
- 125000003700 epoxy group Chemical group 0.000 description 5
- 239000012948 isocyanate Substances 0.000 description 5
- 150000002513 isocyanates Chemical class 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
- FYRCDEARNUVZRG-UHFFFAOYSA-N 1,1,5-trimethyl-3,3-bis(2-methylpentan-2-ylperoxy)cyclohexane Chemical compound CCCC(C)(C)OOC1(OOC(C)(C)CCC)CC(C)CC(C)(C)C1 FYRCDEARNUVZRG-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 4
- 229920001646 UPILEX Polymers 0.000 description 4
- 125000003277 amino group Chemical group 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 238000007731 hot pressing Methods 0.000 description 4
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 4
- IQPQWNKOIGAROB-UHFFFAOYSA-N isocyanate group Chemical group [N-]=C=O IQPQWNKOIGAROB-UHFFFAOYSA-N 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 4
- 229910052753 mercury Inorganic materials 0.000 description 4
- 238000010992 reflux Methods 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 239000013585 weight reducing agent Substances 0.000 description 4
- KJUGUADJHNHALS-UHFFFAOYSA-N 1H-tetrazole Chemical compound C=1N=NNN=1 KJUGUADJHNHALS-UHFFFAOYSA-N 0.000 description 3
- 229920002799 BoPET Polymers 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000002708 enhancing effect Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- RBQRWNWVPQDTJJ-UHFFFAOYSA-N methacryloyloxyethyl isocyanate Chemical compound CC(=C)C(=O)OCCN=C=O RBQRWNWVPQDTJJ-UHFFFAOYSA-N 0.000 description 3
- 239000006082 mold release agent Substances 0.000 description 3
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000004014 plasticizer Substances 0.000 description 3
- 238000004080 punching Methods 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 230000000638 stimulation Effects 0.000 description 3
- 239000004094 surface-active agent Substances 0.000 description 3
- 238000005979 thermal decomposition reaction Methods 0.000 description 3
- 239000001993 wax Substances 0.000 description 3
- KWVGIHKZDCUPEU-UHFFFAOYSA-N 2,2-dimethoxy-2-phenylacetophenone Chemical compound C=1C=CC=CC=1C(OC)(OC)C(=O)C1=CC=CC=C1 KWVGIHKZDCUPEU-UHFFFAOYSA-N 0.000 description 2
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 2
- NLGDWWCZQDIASO-UHFFFAOYSA-N 2-hydroxy-1-(7-oxabicyclo[4.1.0]hepta-1,3,5-trien-2-yl)-2-phenylethanone Chemical class OC(C(=O)c1cccc2Oc12)c1ccccc1 NLGDWWCZQDIASO-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- YKBKKHIVVTUNAN-UHFFFAOYSA-N C(C(C)(C)C)(=O)O.C(CCCCC)OOCCCCCC Chemical group C(C(C)(C)C)(=O)O.C(CCCCC)OOCCCCCC YKBKKHIVVTUNAN-UHFFFAOYSA-N 0.000 description 2
- GAWIXWVDTYZWAW-UHFFFAOYSA-N C[CH]O Chemical group C[CH]O GAWIXWVDTYZWAW-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- 239000004386 Erythritol Substances 0.000 description 2
- UNXHWFMMPAWVPI-UHFFFAOYSA-N Erythritol Natural products OCC(O)C(O)CO UNXHWFMMPAWVPI-UHFFFAOYSA-N 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- 239000004952 Polyamide Substances 0.000 description 2
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 125000005250 alkyl acrylate group Chemical group 0.000 description 2
- 238000004873 anchoring Methods 0.000 description 2
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Chemical compound C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 description 2
- WPKYZIPODULRBM-UHFFFAOYSA-N azane;prop-2-enoic acid Chemical compound N.OC(=O)C=C WPKYZIPODULRBM-UHFFFAOYSA-N 0.000 description 2
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 2
- 239000012965 benzophenone Substances 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 239000007822 coupling agent Substances 0.000 description 2
- WNAHIZMDSQCWRP-UHFFFAOYSA-N dodecane-1-thiol Chemical compound CCCCCCCCCCCCS WNAHIZMDSQCWRP-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229940009714 erythritol Drugs 0.000 description 2
- 235000019414 erythritol Nutrition 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 2
- 229920002647 polyamide Polymers 0.000 description 2
- 229920000139 polyethylene terephthalate Polymers 0.000 description 2
- 239000005020 polyethylene terephthalate Substances 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 239000013464 silicone adhesive Substances 0.000 description 2
- QNODIIQQMGDSEF-UHFFFAOYSA-N (1-hydroxycyclohexyl)-phenylmethanone Chemical compound C=1C=CC=CC=1C(=O)C1(O)CCCCC1 QNODIIQQMGDSEF-UHFFFAOYSA-N 0.000 description 1
- VLTYTTRXESKBKI-UHFFFAOYSA-N (2,4-dichlorophenyl)-phenylmethanone Chemical compound ClC1=CC(Cl)=CC=C1C(=O)C1=CC=CC=C1 VLTYTTRXESKBKI-UHFFFAOYSA-N 0.000 description 1
- ZAMZCSIXTWIEDY-UHFFFAOYSA-N (2-propylphenyl)methanol Chemical compound CCCC1=CC=CC=C1CO ZAMZCSIXTWIEDY-UHFFFAOYSA-N 0.000 description 1
- 229920002818 (Hydroxyethyl)methacrylate Polymers 0.000 description 1
- YTLYLLTVENPWFT-UPHRSURJSA-N (Z)-3-aminoacrylic acid Chemical compound N\C=C/C(O)=O YTLYLLTVENPWFT-UPHRSURJSA-N 0.000 description 1
- BWZAUXRKSMJLMH-UHFFFAOYSA-N 1,1-diethoxyethylbenzene Chemical compound CCOC(C)(OCC)C1=CC=CC=C1 BWZAUXRKSMJLMH-UHFFFAOYSA-N 0.000 description 1
- QWQFVUQPHUKAMY-UHFFFAOYSA-N 1,2-diphenyl-2-propoxyethanone Chemical compound C=1C=CC=CC=1C(OCCC)C(=O)C1=CC=CC=C1 QWQFVUQPHUKAMY-UHFFFAOYSA-N 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- DKEGCUDAFWNSSO-UHFFFAOYSA-N 1,8-dibromooctane Chemical compound BrCCCCCCCCBr DKEGCUDAFWNSSO-UHFFFAOYSA-N 0.000 description 1
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 1
- AXTGDCSMTYGJND-UHFFFAOYSA-N 1-dodecylazepan-2-one Chemical compound CCCCCCCCCCCCN1CCCCCC1=O AXTGDCSMTYGJND-UHFFFAOYSA-N 0.000 description 1
- DCYGAPKNVCQNOE-UHFFFAOYSA-N 2,2,2-triphenylacetic acid Chemical compound C=1C=CC=CC=1C(C=1C=CC=CC=1)(C(=O)O)C1=CC=CC=C1 DCYGAPKNVCQNOE-UHFFFAOYSA-N 0.000 description 1
- GZBSIABKXVPBFY-UHFFFAOYSA-N 2,2-bis(hydroxymethyl)propane-1,3-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OCC(CO)(CO)CO GZBSIABKXVPBFY-UHFFFAOYSA-N 0.000 description 1
- BTJPUDCSZVCXFQ-UHFFFAOYSA-N 2,4-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC(CC)=C3SC2=C1 BTJPUDCSZVCXFQ-UHFFFAOYSA-N 0.000 description 1
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- QLIBJPGWWSHWBF-UHFFFAOYSA-N 2-aminoethyl methacrylate Chemical compound CC(=C)C(=O)OCCN QLIBJPGWWSHWBF-UHFFFAOYSA-N 0.000 description 1
- UGIJCMNGQCUTPI-UHFFFAOYSA-N 2-aminoethyl prop-2-enoate Chemical compound NCCOC(=O)C=C UGIJCMNGQCUTPI-UHFFFAOYSA-N 0.000 description 1
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 1
- WBJWXIQDBDZMAW-UHFFFAOYSA-N 2-hydroxynaphthalene-1-carbonyl chloride Chemical compound C1=CC=CC2=C(C(Cl)=O)C(O)=CC=C21 WBJWXIQDBDZMAW-UHFFFAOYSA-N 0.000 description 1
- DPNXHTDWGGVXID-UHFFFAOYSA-N 2-isocyanatoethyl prop-2-enoate Chemical compound C=CC(=O)OCCN=C=O DPNXHTDWGGVXID-UHFFFAOYSA-N 0.000 description 1
- YRNDGUSDBCARGC-UHFFFAOYSA-N 2-methoxyacetophenone Chemical compound COCC(=O)C1=CC=CC=C1 YRNDGUSDBCARGC-UHFFFAOYSA-N 0.000 description 1
- WLJVXDMOQOGPHL-PPJXEINESA-N 2-phenylacetic acid Chemical compound O[14C](=O)CC1=CC=CC=C1 WLJVXDMOQOGPHL-PPJXEINESA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- JHWGFJBTMHEZME-UHFFFAOYSA-N 4-prop-2-enoyloxybutyl prop-2-enoate Chemical compound C=CC(=O)OCCCCOC(=O)C=C JHWGFJBTMHEZME-UHFFFAOYSA-N 0.000 description 1
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 1
- JVERADGGGBYHNP-UHFFFAOYSA-N 5-phenylbenzene-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C(C(=O)O)=CC(C=2C=CC=CC=2)=C1C(O)=O JVERADGGGBYHNP-UHFFFAOYSA-N 0.000 description 1
- FIHBHSQYSYVZQE-UHFFFAOYSA-N 6-prop-2-enoyloxyhexyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCCOC(=O)C=C FIHBHSQYSYVZQE-UHFFFAOYSA-N 0.000 description 1
- WVAKWHJKGCYTRA-UHFFFAOYSA-N 9,10-dipropylanthracene Chemical compound C1=CC=C2C(CCC)=C(C=CC=C3)C3=C(CCC)C2=C1 WVAKWHJKGCYTRA-UHFFFAOYSA-N 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- NOWKCMXCCJGMRR-UHFFFAOYSA-N Aziridine Chemical compound C1CN1 NOWKCMXCCJGMRR-UHFFFAOYSA-N 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 229920002125 Sokalan® Polymers 0.000 description 1
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 1
- 239000003522 acrylic cement Substances 0.000 description 1
- 229920006243 acrylic copolymer Polymers 0.000 description 1
- PYHXGXCGESYPCW-UHFFFAOYSA-N alpha-phenylbenzeneacetic acid Natural products C=1C=CC=CC=1C(C(=O)O)C1=CC=CC=C1 PYHXGXCGESYPCW-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 239000002216 antistatic agent Substances 0.000 description 1
- 239000004760 aramid Substances 0.000 description 1
- 229920003235 aromatic polyamide Polymers 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000006229 carbon black Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000013522 chelant Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 125000004386 diacrylate group Chemical group 0.000 description 1
- 239000003480 eluent Substances 0.000 description 1
- ZYMKZMDQUPCXRP-UHFFFAOYSA-N fluoro prop-2-enoate Chemical compound FOC(=O)C=C ZYMKZMDQUPCXRP-UHFFFAOYSA-N 0.000 description 1
- 125000003709 fluoroalkyl group Chemical group 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 1
- 239000012760 heat stabilizer Substances 0.000 description 1
- 230000005764 inhibitory process Effects 0.000 description 1
- 239000011256 inorganic filler Substances 0.000 description 1
- 229910003475 inorganic filler Inorganic materials 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 125000005439 maleimidyl group Chemical group C1(C=CC(N1*)=O)=O 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 150000002734 metacrylic acid derivatives Chemical class 0.000 description 1
- 239000011859 microparticle Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920002601 oligoester Polymers 0.000 description 1
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920006111 poly(hexamethylene terephthalamide) Polymers 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920001470 polyketone Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 239000003643 water by type Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/16—Layered products comprising a layer of synthetic resin specially treated, e.g. irradiated
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J5/00—Manufacture of articles or shaped materials containing macromolecular substances
- C08J5/18—Manufacture of films or sheets
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J2377/00—Characterised by the use of polyamides obtained by reactions forming a carboxylic amide link in the main chain; Derivatives of such polymers
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/10—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet
- C09J2301/12—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers
- C09J2301/124—Additional features of adhesives in the form of films or foils characterized by the structural features of the adhesive tape or sheet by the arrangement of layers the adhesive layer being present on both sides of the carrier, e.g. double-sided adhesive tape
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/30—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
- C09J2301/312—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Polymers & Plastics (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Materials Engineering (AREA)
- Adhesive Tapes (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Dicing (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Laminated Bodies (AREA)
- Organic Insulating Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
本發明係關於一種黏著帶。The present invention relates to an adhesive tape.
於半導體晶片之製造步驟中,為了使晶圓或半導體晶片之加工之操作變得容易且防止破損,而使用黏著帶。例如於將自高純度之矽單晶等切出之厚膜晶圓研磨至特定厚度而製成薄膜晶圓之情形時,於將黏著帶貼合於厚膜晶圓後進行研磨。In the manufacturing steps of semiconductor wafers, in order to facilitate the processing of wafers or semiconductor wafers and prevent damage, adhesive tapes are used. For example, when a thick film wafer cut from a high-purity silicon single crystal is polished to a specific thickness to make a thin film wafer, the adhesive tape is attached to the thick film wafer and then polished.
對於用於此種黏著帶之接著劑組成物,要求於加工步驟中具有可將晶圓或半導體晶片等被黏著體牢固地固定之程度之高接著性,並且於步驟結束後可被剝離而不損傷晶圓或半導體晶片等被黏著體(以下亦稱為「高接著易剝離」)。 作為實現高接著易剝離之接著劑組成物,於專利文獻1中揭示有一種使用了藉由照射紫外線等光進行硬化從而使黏著力降低之光硬化型黏著劑之黏著帶。藉由使用光硬化型黏著劑作為黏著劑,可於加工步驟中確實地固定被黏著體,並且可藉由照射紫外線等而容易地剝離。 先前技術文獻 專利文獻For the adhesive composition used for this kind of adhesive tape, it is required to have a high degree of adhesiveness that can firmly fix the adherend such as a wafer or a semiconductor chip during the processing step, and it can be peeled off after the step is finished. Damage to adherends such as wafers or semiconductor chips (hereinafter also referred to as "high adhesion and easy peeling"). As an adhesive composition that achieves high adhesion and easy peeling, Patent Document 1 discloses an adhesive tape using a photocurable adhesive that is cured by irradiating light such as ultraviolet rays to reduce the adhesive force. By using a light-curing adhesive as the adhesive, the adherend can be securely fixed during the processing steps, and it can be easily peeled off by irradiating ultraviolet rays or the like. Prior art literature Patent literature
專利文獻1:日本特開平5-32946號公報Patent Document 1: Japanese Patent Application Laid-Open No. 5-32946
[發明所欲解決之課題][The problem to be solved by the invention]
近年,因半導體製品之薄化、小型化,開始製造於晶圓上積層有多個半導體晶片之半導體元件。於此種積層有多個半導體晶片之半導體元件之製造中,於藉由黏著帶保護晶圓或半導體晶片之狀態下,藉由熱壓接合步驟將半導體晶片固定於晶圓或半導體晶片上。 本發明者等發現,於熱壓接合中施加超過260℃之習知之高溫處理之高溫,故而即便為習知之使用了硬化型黏著劑之黏著帶亦無法承受高溫處理之熱,黏著帶之基材膜收縮,因該收縮使得黏著劑層被拉伸,而導致黏著帶剝離。又,於熱壓接合中除高溫以外亦施加壓力,故而黏著劑容易過度接著,從而容易產生糊劑殘留。 進而,經過熱壓接合步驟之大多晶圓會於黏著帶之貼附面形成有凹凸較大之凸塊,若黏著劑進入至凹凸之深處部分,則會於剝離時破碎而成為糊劑殘留。In recent years, due to the thinning and miniaturization of semiconductor products, semiconductor devices with multiple semiconductor chips stacked on a wafer have begun to be manufactured. In the manufacture of such a semiconductor device with a plurality of semiconductor chips stacked, the semiconductor chip is fixed on the wafer or the semiconductor chip by a thermocompression bonding step while the wafer or the semiconductor chip is protected by an adhesive tape. The inventors of the present invention found that the high temperature of the conventional high-temperature treatment exceeding 260℃ is applied in the thermocompression bonding, so even the conventional adhesive tape using a hardening type adhesive cannot withstand the heat of the high-temperature treatment. The base material of the adhesive tape The film shrinks, and the adhesive layer is stretched due to the shrinkage, causing the adhesive tape to peel off. In addition, pressure is applied in addition to high temperature during thermocompression bonding, so the adhesive is likely to be excessively bonded, and paste residue is likely to occur. Furthermore, most of the wafers that have undergone the thermocompression bonding process will have large bumps on the sticking surface of the adhesive tape. If the adhesive enters the deep part of the bumps, it will be broken during peeling and become paste residue. .
本發明之目的在於提供一種即便於使用在伴隨達到260℃之高溫處理之步驟中之情形時亦可保護被黏著體,並且可無糊劑殘留地進行剝離之黏著帶。 [解決課題之技術手段]The object of the present invention is to provide an adhesive tape that can protect the adherend even when used in a step accompanied by high-temperature treatment up to 260°C, and can be peeled off without any paste residue. [Technical means to solve the problem]
本發明係一種具有基材膜與積層於上述基材膜之單面之紫外線硬化型黏著劑層之黏著帶,對上述黏著帶之上述基材膜側之表面照射3000 mJ/cm2 之405 nm之紫外線後之上述紫外線硬化型黏著層之凝膠分率為90%以上,將對上述黏著帶之上述基材膜側之表面照射3000 mJ/cm2 之上述405 nm之紫外線後之黏著帶於X℃下之拉伸彈性模數設為Et(X)時,Et(270)之值為1.0×107 Pa以上。 以下對本發明進行詳細敍述。The present invention is an adhesive tape having a substrate film and an ultraviolet-curing adhesive layer laminated on one side of the substrate film, and the surface of the substrate film side of the adhesive tape is irradiated with 3000 mJ/cm 2 of 405 nm The gel fraction of the ultraviolet-curable adhesive layer after ultraviolet rays is 90% or more. The adhesive tape is irradiated with 3000 mJ/cm 2 of the ultraviolet rays of 405 nm on the surface of the substrate film side of the adhesive tape. When the tensile modulus of elasticity at X°C is set to Et(X), the value of Et(270) is 1.0×10 7 Pa or more. The present invention will be described in detail below.
本發明之黏著帶具有積層於上述基材膜之單面之紫外線硬化型黏著劑層。 藉由使黏著帶具有紫外線硬化型黏著劑層,從而能以充分之黏著力貼附於被黏著體而保護被黏著體,並且藉由在貼附後使紫外線硬化型黏著劑層硬化,從而即便於進行高溫處理之情形時亦能夠保護被黏著體。又,於不需要保護後,可容易地無糊劑殘留地剝離黏著帶。The adhesive tape of the present invention has an ultraviolet-curable adhesive layer laminated on one side of the base film. The adhesive tape has an ultraviolet-curing adhesive layer, which can be attached to the adherend with sufficient adhesive force to protect the adherend, and by hardening the ultraviolet-curing adhesive layer after attachment, It can also protect the adherend during high temperature processing. In addition, after no protection is required, the adhesive tape can be easily peeled off without any paste remaining.
本發明之黏著帶於對上述黏著帶之上述基材膜側之表面照射3000 mJ/cm2 之405 nm之紫外線後之上述紫外線硬化型黏著層之凝膠分率為90%以上。 藉由使紫外線照射後之紫外線硬化型黏著劑層之凝膠分率為90%以上,從而即便於高溫下過度接著亦難以持續,故而於不需要保護後,可無糊劑殘留地剝離黏著帶。又,亦可提高黏著帶之耐化學品性。又,若可對上述基材膜側之表面照射紫外線使紫外線硬化型黏著劑層硬化,則可於將黏著帶與被黏著體貼合後使紫外線硬化型黏著劑層硬化。就進一步提高黏著帶之過度接著之抑制性與耐化學品性之觀點而言,紫外線照射後之上述紫外線硬化型黏著劑層之凝膠分率較佳為93%以上,更佳為95%以上,進而較佳為97%以上。 再者,紫外線照射後之上述紫外線硬化型黏著劑層之凝膠分率通常為100%以下。 再者,於本發明之黏著帶為於基材膜之另一面亦積層有黏著劑層等其他層之結構之情形時,上述基材膜側係指基材膜之積層有紫外線硬化型黏著劑層之面相反側之面。In the adhesive tape of the present invention, the gel fraction of the ultraviolet curable adhesive layer after irradiating 3000 mJ/cm 2 of 405 nm ultraviolet rays to the surface of the substrate film side of the adhesive tape is 90% or more. The gel fraction of the UV-curable adhesive layer after UV irradiation is 90% or more, so that it is difficult to continue the bonding even at high temperatures. Therefore, the adhesive tape can be peeled off without any paste residue after protection is not required. . In addition, the chemical resistance of the adhesive tape can also be improved. Furthermore, if ultraviolet rays can be irradiated to the surface of the base film side to harden the ultraviolet-curable adhesive layer, the ultraviolet-curable adhesive layer can be hardened after bonding the adhesive tape and the adherend. From the viewpoint of further improving the inhibition of excessive adhesion and chemical resistance of the adhesive tape, the gel fraction of the ultraviolet-curable adhesive layer after ultraviolet irradiation is preferably 93% or more, more preferably 95% or more , More preferably 97% or more. Furthermore, the gel fraction of the ultraviolet curable adhesive layer after ultraviolet irradiation is usually 100% or less. Furthermore, when the adhesive tape of the present invention has a structure in which other layers such as an adhesive layer are also laminated on the other side of the base film, the above-mentioned base film side means that the base film is laminated with an ultraviolet-curing adhesive The face on the opposite side of the layer.
本發明之黏著帶於將對上述黏著帶之上述基材膜側之表面照射3000 mJ/cm2 之上述405 nm之紫外線後之黏著帶於X℃下之拉伸彈性模數設為Et(X)時,Et(270)之值為1.0×107 Pa以上。 藉由使紫外線照射後之黏著帶於270℃下具有上述範圍之拉伸彈性模數,能夠製成耐熱性優異之黏著帶,即便進行達到260℃之高溫處理,黏著帶亦難以軟化、收縮,可抑制黏著帶之意外剝離。上述Et(270)之較佳之下限為3.0×107 Pa,更佳之下限為5.0×107 Pa,進而較佳之下限為1.0×108 Pa。上述Et(270)之上限並無特別限定,就黏著帶之操作性之觀點而言,較佳為1.0×109 Pa。 再者,上述黏著帶之拉伸彈性模數可利用以下方法進行測定。 藉由以累計強度成為3000 mJ/cm2 之方式自基材膜側之表面對紫外線硬化型黏著劑層照射405 nm之紫外線,從而使紫外線硬化型黏著劑層硬化。其次,以長邊與帶製造時之行進方向一致之方式使用衝壓刃進行衝壓,藉此製作5 mm×35 mm之試驗片。將所獲得之試驗片浸漬於液態氮而冷卻至-50℃,其後,使用黏彈性譜儀(DVA-200、IT Meter. and Control, Inc.製造,或其同等品),於定速升溫拉伸模式之10℃/分鐘、頻率10 Hz之條件下升溫至300℃,測定拉伸彈性模數。將於此時之溫度X℃下之拉伸彈性模數(E')之值設為Et(X)。即,於溫度270℃下之拉伸彈性模數(E')之值為Et(270)。For the adhesive tape of the present invention, the tensile elastic modulus of the adhesive tape at X°C after irradiating 3000 mJ/cm 2 of the 405 nm ultraviolet rays on the surface of the substrate film side of the adhesive tape is Et (X ), the value of Et (270) is 1.0×10 7 Pa or more. By making the UV-irradiated adhesive tape have a tensile elastic modulus in the above range at 270°C, an adhesive tape with excellent heat resistance can be made. Even if the high temperature treatment reaches 260°C, the adhesive tape is difficult to soften and shrink. Can prevent accidental peeling of the adhesive tape. The lower limit of the above-mentioned Et(270) is preferably 3.0×10 7 Pa, the lower limit is more preferably 5.0×10 7 Pa, and the lower limit is still more preferably 1.0×10 8 Pa. The upper limit of Et(270) is not particularly limited, but from the viewpoint of the operability of the adhesive tape, it is preferably 1.0×10 9 Pa. Furthermore, the tensile modulus of elasticity of the adhesive tape can be measured by the following method. The ultraviolet curable adhesive layer is irradiated with 405 nm ultraviolet rays from the surface of the base film side so that the cumulative intensity becomes 3000 mJ/cm 2 to harden the ultraviolet curable adhesive layer. Secondly, press with a punching blade in such a way that the long side is consistent with the direction of travel when the belt is manufactured, thereby making a test piece of 5 mm×35 mm. The obtained test piece was immersed in liquid nitrogen and cooled to -50°C. After that, a viscoelastic spectrometer (DVA-200, IT Meter. and Control, Inc., or its equivalent) was used to raise the temperature at a constant rate Raise the temperature to 300°C under the conditions of 10°C/min and 10 Hz in the tensile mode, and measure the tensile elastic modulus. Set the value of the tensile modulus (E') at the temperature X°C at this time as Et(X). That is, the value of the tensile modulus (E') at a temperature of 270°C is Et(270).
本發明之黏著帶之Et(270)/Et(200)之值較佳為0.1以上。 藉由使紫外線照射後之黏著帶於270℃中之拉伸彈性模數與於200℃中之拉伸彈性模數之差較小,能夠製成耐熱性更優異之黏著帶,可進一步抑制黏著帶之意外剝離。就進一步抑制上述剝離之觀點而言,上述Et(270)/Et(200)之值更佳為0.2以上,進而較佳為0.3以上,特佳為0.5以上。上述Et(270)/Et(200)之值之上限並無特別限定,越接近1越好,通常為1以下,較佳為未達0.8。The value of Et(270)/Et(200) of the adhesive tape of the present invention is preferably 0.1 or more. By making the difference between the tensile elastic modulus at 270°C and 200°C of the adhesive tape after ultraviolet irradiation smaller, an adhesive tape with better heat resistance can be made, which can further inhibit adhesion Accidental peeling of the tape. From the viewpoint of further suppressing the peeling, the value of Et(270)/Et(200) is more preferably 0.2 or more, still more preferably 0.3 or more, and particularly preferably 0.5 or more. The upper limit of the value of Et(270)/Et(200) is not particularly limited. The closer to 1, the better, and it is usually less than 1, and preferably less than 0.8.
本發明之黏著帶於對上述黏著帶之上述基材膜側之表面照射3000 mJ/cm2 之上述405 nm之紫外線後,自25℃以5℃/min之速度升溫至280℃,於升溫後保持10分鐘時之重量減少率較佳為5%以下。 於280℃之高溫下之重量減少較少,即,於高溫下難以發生熱分解,藉此因熱分解而產生之脫氣量變少,可抑制聚集於被黏著體與黏著帶之界面之脫氣成為起點而剝離。就抑制於高溫下之剝離之觀點而言,上述重量減少率更佳為4%以下,進而較佳為3%以下,通常為0%以上。 再者,上述重量減少率可利用以下方法進行測定。 藉由以累計強度成為3000 mJ/cm2 之方式自基材膜側之表面對紫外線硬化型黏著劑層照射405 nm之紫外線,從而使紫外線硬化型黏著劑層硬化。其次,將黏著帶衝壓成5 mm之圓狀,製作測定樣本。測定所獲得之測定樣本之重量,使用示差熱熱重量同時測定裝置(TG-DTA;STA7200,日立高新技術科技股份有限公司製造,或其同等品)進行測定。將升溫速度設為5℃/min,自25℃升溫至280℃,測定於280℃之狀態下保持10分鐘之後之測定樣本之重量。能夠根據加熱前後之重量算出重量減少率。The adhesive tape of the present invention is irradiated with 3000 mJ/cm 2 of 405 nm ultraviolet rays on the surface of the substrate film side of the adhesive tape, and then heated from 25°C to 280°C at a rate of 5°C/min. The weight loss rate when kept for 10 minutes is preferably 5% or less. The weight loss is less at a high temperature of 280°C, that is, thermal decomposition is difficult to occur at high temperatures, thereby reducing the amount of outgassing due to thermal decomposition, which can inhibit the outgassing that gathers at the interface between the adherend and the adhesive tape Become a starting point and peel off. From the viewpoint of suppressing peeling at high temperatures, the weight reduction rate is more preferably 4% or less, still more preferably 3% or less, and usually 0% or more. In addition, the above-mentioned weight reduction rate can be measured by the following method. The ultraviolet curable adhesive layer is irradiated with 405 nm ultraviolet rays from the surface of the base film side so that the cumulative intensity becomes 3000 mJ/cm 2 to harden the ultraviolet curable adhesive layer. Secondly, stamp the adhesive tape into 5 mm round shape to make measurement samples. Measure the weight of the obtained measurement sample using a differential thermogravimetric simultaneous measurement device (TG-DTA; STA7200, manufactured by Hitachi High-Technology Co., Ltd., or its equivalent). The heating rate was set to 5°C/min, the temperature was raised from 25°C to 280°C, and the weight of the measurement sample after being kept at 280°C for 10 minutes was measured. The weight reduction rate can be calculated based on the weight before and after heating.
上述基材膜之405 nm之紫外線穿透率較佳為1%以上。 藉由使基材膜之405 nm之紫外線穿透率為1%以上,能夠隔著基材膜使紫外線硬化型黏著劑層硬化,易調整上述紫外線照射後之紫外線硬化型黏著層之凝膠分率。其結果,可抑制因過度接著而於被黏著體上產生之糊劑殘留。上述紫外線穿透率更佳為10%以上,進而較佳為50%以上,特佳為70%以上。因上述紫外線穿透率為該等下限以上,故而即便不使用光敏劑,亦可使紫外線硬化型黏著劑層充分地硬化。上述紫外線穿透率之上限並無特別限定,越高越好,通常為100%以下。 再者,紫外線穿透率可使用分光光度計(U-3900,日立製作所公司製造,或其同等品)進行測定。更具體而言,於800~200 nm之區域以掃描速度300 nm/min、狹縫間隔4 nm進行測定,能夠測定405 nm中之穿透率。The UV transmittance at 405 nm of the base film is preferably 1% or more. By making the ultraviolet light transmittance of 405 nm of the base film more than 1%, the ultraviolet curable adhesive layer can be cured through the base film, and it is easy to adjust the gel content of the ultraviolet curable adhesive layer after the above-mentioned ultraviolet irradiation. rate. As a result, the paste remaining on the adherend due to excessive bonding can be suppressed. The above-mentioned ultraviolet transmittance is more preferably 10% or more, still more preferably 50% or more, particularly preferably 70% or more. Since the above-mentioned ultraviolet transmittance is more than the lower limit, even if a photosensitizer is not used, the ultraviolet curable adhesive layer can be cured sufficiently. The upper limit of the ultraviolet transmittance is not particularly limited, the higher the better, and it is usually 100% or less. Furthermore, the UV transmittance can be measured using a spectrophotometer (U-3900, manufactured by Hitachi, Ltd., or its equivalent). More specifically, the measurement is performed in the region of 800-200 nm with a scanning speed of 300 nm/min and a slit interval of 4 nm, and the transmittance in 405 nm can be measured.
將於X℃下之拉伸彈性模數設為Ef(X)時,上述基材膜之Ef(270)之值較佳為5.0×107 Pa以上。 因上述基材膜於270℃下之拉伸彈性模數為上述範圍,故而可製成耐熱性更優異之黏著帶,可抑制因高溫處理中之基材膜之熱收縮或軟化而導致之剝離。上述Ef(270)之更佳之下限為1.0×108 Pa,進而較佳之下限為5.0×108 Pa,特佳之下限為1.0×109 Pa。上述Ef(270)之上限並無特別限定,就黏著帶之操作性之觀點而言,較佳為1.0×1010 Pa。 再者,上述基材膜之拉伸彈性模數可利用與上述黏著帶之拉伸彈性模數相同之方法進行測定。When the tensile elastic modulus at X°C is set to Ef(X), the value of Ef(270) of the above-mentioned base film is preferably 5.0×10 7 Pa or more. Since the tensile elastic modulus of the base film at 270°C is in the above range, an adhesive tape with better heat resistance can be made, and peeling caused by the heat shrinkage or softening of the base film during high temperature processing can be suppressed . A more preferable lower limit of the above-mentioned Ef(270) is 1.0×10 8 Pa, a still more preferable lower limit is 5.0×10 8 Pa, and a particularly preferable lower limit is 1.0×10 9 Pa. The upper limit of the Ef (270) is not particularly limited, but from the viewpoint of the operability of the adhesive tape, it is preferably 1.0×10 10 Pa. Furthermore, the tensile modulus of the base film can be measured by the same method as the tensile modulus of the adhesive tape.
上述基材膜只要所獲得之黏著帶滿足上述範圍之拉伸彈性模數及凝膠分率即可,並無特別限定,就耐熱性與強度優異之方面而言,較佳為上述基材膜含有於重複單位之主鏈骨架中具有選自由醯胺、醯亞胺、醚及酮所組成之群中之至少1種之樹脂。 作為上述於重複鍵結單位之主鏈骨架中具有選自由醯胺、醯亞胺、醚及酮所組成之群中之至少1種之樹脂,例如可列舉聚醯胺、聚醯亞胺、聚醚、聚酮等。其中,就於耐熱性與強度上更優異之方面而言,較佳為上述基材膜含有聚醯胺樹脂,進而就紫外線穿透性亦優異之方面而言,更佳為含有於重複單位之主鏈骨架中具有碳數為4以上且12以下之長鏈烷基或芳香族之聚醯胺樹脂。 作為上述於重複單位之主鏈骨架中具有碳數為4以上且12以下之長鏈烷基或芳香族之聚醯胺樹脂,例如可列舉尼龍9T、尼龍6T等。The above-mentioned base film is not particularly limited as long as the obtained adhesive tape satisfies the tensile modulus of elasticity and the gel fraction in the above-mentioned range. In terms of excellent heat resistance and strength, the above-mentioned base film is preferred. A resin containing at least one selected from the group consisting of amides, imines, ethers, and ketones in the main chain skeleton of the repeating unit. Examples of resins having at least one selected from the group consisting of amides, amides, ethers and ketones in the main chain skeleton of the repeating bonding unit include polyamides, polyimines, and polyamides. Ether, polyketone, etc. Among them, in terms of more excellent heat resistance and strength, it is preferable that the base film contains polyamide resin, and in terms of excellent ultraviolet light penetration, it is more preferable that it is contained in the repeating unit. The main chain skeleton has a long-chain alkyl group or aromatic polyamide resin having a carbon number of 4 or more and 12 or less. As the polyamide resin having a long-chain alkyl group or aromatic having a carbon number of 4 or more and 12 or less in the main chain skeleton of the repeating unit, for example, nylon 9T, nylon 6T, and the like can be cited.
上述基材膜之厚度並無特別限定,較佳之下限為25 μm,更佳之下限為50 μm,較佳之上限為250 μm,更佳之上限為125 μm。藉由使上述基材膜為該範圍內,可製成操作性優異之黏著帶。The thickness of the aforementioned substrate film is not particularly limited, and the lower limit is preferably 25 μm, the lower limit is more preferably 50 μm, the upper limit is preferably 250 μm, and the upper limit is more preferably 125 μm. By making the above-mentioned base film within this range, an adhesive tape excellent in handleability can be obtained.
構成上述紫外線硬化型黏著劑層之黏著劑只要為紫外線硬化型即可,並無特別限定,例如可列舉以聚合性聚合物為主成分,含有紫外線聚合起始劑作為聚合起始劑之紫外線硬化型黏著劑。作為上述聚合性聚合物,例如可列舉(甲基)丙烯酸聚合物、丙烯酸胺酯聚合物等。其中,就容易滿足上述凝膠分率與上述Et(270)之方面而言,較佳為(甲基)丙烯酸聚合物,更佳為於分子內具有自由基聚合性之不飽和鍵之(甲基)丙烯酸烷基酯系之聚合性聚合物。 上述(甲基)丙烯酸烷基酯系之聚合性聚合物例如可藉由如下方法而獲得:預先合成於分子內具有官能基之(甲基)丙烯酸系聚合物,使其和於分子內具有與上述官能基反應之官能基及自由基聚合性之不飽和鍵之化合物反應。再者,以下將「於分子內具有官能基之(甲基)丙烯酸系聚合物」之聚合物稱為「含官能基(甲基)丙烯酸系聚合物」,將「於分子內具有與上述之官能基反應之官能基及自由基聚合性之不飽和鍵之化合物」之化合物稱為「含官能基不飽和化合物」。The adhesive constituting the above-mentioned ultraviolet-curable adhesive layer is not particularly limited as long as it is an ultraviolet-curable adhesive. For example, an ultraviolet-curable polymer containing a polymerizable polymer as a main component and an ultraviolet polymerization initiator as a polymerization initiator can be mentioned. Type adhesive. As said polymerizable polymer, (meth)acrylic acid polymer, urethane acrylate polymer, etc. are mentioned, for example. Among them, in terms of easily satisfying the above-mentioned gel fraction and the above-mentioned Et(270), a (meth)acrylic polymer is preferred, and (a) having a radically polymerizable unsaturated bond in the molecule is more preferred. Base) Polymerizable polymer of alkyl acrylate series. The above-mentioned (meth)acrylic acid alkyl ester-based polymerizable polymer can be obtained, for example, by the following method: a (meth)acrylic polymer having a functional group in the molecule is synthesized in advance, and the The above-mentioned functional group reacts with the radical polymerizable unsaturated bond compound. Furthermore, hereinafter, the polymer of "(meth)acrylic polymer having functional group in the molecule" is referred to as "functional group-containing (meth)acrylic polymer", and the "(meth)acrylic polymer having functional group in the molecule" The compound of "functional group and radically polymerizable unsaturated bond compound" is called "functional group-containing unsaturated compound".
上述含官能基(甲基)丙烯酸系聚合物係藉由以烷基之碳數通常於2~18之範圍之丙烯酸烷基酯及/或甲基丙烯酸烷基酯為主要單體,藉由常規方法使其與含官能基單體、及進而視需要之可與該等共聚之其他改質用單體共聚而獲得者。上述含官能基(甲基)丙烯酸系聚合物之重量平均分子量通常為20萬~200萬左右。再者,於本說明書中,重量平均分子量通常可利用GPC法而決定,例如可於40℃中使用THF作為溶出液,使用HSPgel HR MB-M6.0×150 mm(Waters公司製造)作為管柱,藉由聚苯乙烯標準而決定。The functional group-containing (meth)acrylic polymer is based on alkyl acrylate and/or alkyl methacrylate whose alkyl group’s carbon number is usually in the range of 2-18 as the main monomer. It is obtained by copolymerizing it with functional group-containing monomers and, if necessary, other modifying monomers that can be copolymerized. The weight average molecular weight of the functional group-containing (meth)acrylic polymer is usually about 200,000 to 2 million. Furthermore, in this specification, the weight average molecular weight can usually be determined by the GPC method. For example, THF can be used as the eluent at 40°C and HSPgel HR MB-M 6.0×150 mm (manufactured by Waters) can be used as the column. , Determined by polystyrene standards.
作為上述含官能基單體,例如可列舉:含羧基單體、含羥基單體、含環氧基單體、含異氰酸基單體、及含胺基單體等。作為上述含羧基單體,可列舉:丙烯酸、甲基丙烯酸等。作為上述含羥基單體,可列舉:丙烯酸羥基乙酯、甲基丙烯酸羥基乙酯等。作為上述含環氧基單體,可列舉:丙烯酸縮水甘油酯、甲基丙烯酸縮水甘油酯等。作為上述含異氰酸基單體,可列舉:丙烯酸異氰酸酯基乙酯、甲基丙烯酸異氰酸酯基乙酯等。作為上述含胺基單體,可列舉:丙烯酸胺基乙酯、甲基丙烯酸胺基乙酯等。Examples of the functional group-containing monomers include carboxyl group-containing monomers, hydroxyl group-containing monomers, epoxy group-containing monomers, isocyanate group-containing monomers, and amine group-containing monomers. As said carboxyl group-containing monomer, acrylic acid, methacrylic acid, etc. are mentioned. As said hydroxyl-containing monomer, hydroxyethyl acrylate, hydroxyethyl methacrylate, etc. are mentioned. As said epoxy group-containing monomer, glycidyl acrylate, glycidyl methacrylate, etc. are mentioned. Examples of the above-mentioned isocyanate group-containing monomer include isocyanatoethyl acrylate, isocyanatoethyl methacrylate, and the like. As said amine group-containing monomer, amino ethyl acrylate, amino ethyl methacrylate, etc. are mentioned.
作為上述可共聚之其他改質用單體,例如可列舉乙酸乙烯酯、丙烯腈、苯乙烯等通常用於(甲基)丙烯酸系聚合物之各種單體。As the aforementioned other copolymerizable monomers for modification, for example, various monomers commonly used for (meth)acrylic polymers such as vinyl acetate, acrylonitrile, and styrene can be cited.
作為與上述含官能基(甲基)丙烯酸系聚合物反應之含官能基不飽和化合物,可根據上述含官能基(甲基)丙烯酸系聚合物之官能基而使用與上述含官能基單體相同者。例如,於上述含官能基(甲基)丙烯酸系聚合物之官能基為羧基之情形時,可使用含環氧基單體或含異氰酸基單體。於該官能基為羥基之情形時,可使用含異氰酸基單體。於該官能基為環氧基之情形時,可使用含羧基單體或丙烯醯胺等含醯胺基單體。於該官能基為胺基之情形時,可使用含環氧基單體。As the functional group-containing unsaturated compound that reacts with the above-mentioned functional group-containing (meth)acrylic polymer, the same as the above-mentioned functional group-containing monomer can be used according to the functional group of the above-mentioned functional group-containing (meth)acrylic polymer By. For example, when the functional group of the functional group-containing (meth)acrylic polymer is a carboxyl group, an epoxy group-containing monomer or an isocyanate group-containing monomer can be used. When the functional group is a hydroxyl group, an isocyanate group-containing monomer can be used. When the functional group is an epoxy group, an amine group-containing monomer such as a carboxyl group-containing monomer or acrylamide can be used. When the functional group is an amino group, an epoxy group-containing monomer can be used.
上述紫外線聚合起始劑,例如可列舉藉由照射200~410 nm之波長之紫外線而活化者。作為此種紫外線聚合起始劑,例如可列舉:苯乙酮衍生物化合物、或安息香醚系化合物、縮酮衍生物化合物、氧化膦衍生物化合物、雙(η5-環戊二烯基)二茂鈦衍生物化合物、二苯甲酮、米其勒酮、氯-9-氧硫 、十二烷基-9-氧硫 、二甲基-9-氧硫 、二乙基-9-氧硫 、α-羥基環己基苯基酮、2-羥基甲基苯基丙烷等。作為上述苯乙酮衍生物化合物,可列舉甲氧基苯乙酮等。作為上述安息香醚系化合物,可列舉安息香丙醚、安息香異丁醚等。作為上述縮酮衍生物化合物,苯偶醯二甲基縮酮、苯乙酮二乙基縮酮等。該等紫外線聚合起始劑可單獨使用,亦可併用2種以上。Examples of the above-mentioned ultraviolet polymerization initiator include those activated by irradiating ultraviolet rays with a wavelength of 200 to 410 nm. Examples of such ultraviolet polymerization initiators include acetophenone derivative compounds, benzoin ether compounds, ketal derivative compounds, phosphine oxide derivative compounds, and bis(η5-cyclopentadienyl) dicene Titanium derivative compounds, benzophenone, michelone, chloro-9-oxysulfur , Dodecyl-9-oxysulfur , Dimethyl-9-oxysulfur , Diethyl-9-oxysulfur , Α-hydroxycyclohexyl phenyl ketone, 2-hydroxymethyl phenyl propane, etc. As said acetophenone derivative compound, methoxyacetophenone etc. are mentioned. As said benzoin ether type compound, benzoin propyl ether, benzoin isobutyl ether, etc. are mentioned. As the aforementioned ketal derivative compound, benzil dimethyl ketal, acetophenone diethyl ketal, and the like. These ultraviolet polymerization initiators may be used alone or in combination of two or more kinds.
上述紫外線硬化型黏著劑層較佳為含有自由基聚合性之多官能低聚物或單體。藉由上述紫外線硬化型黏著劑層含有自由基聚合性之多官能低聚物或單體,使紫外線硬化性得以提高。 上述多官能低聚物或單體較佳為重量平均分子量為1萬以下者,更佳為其重量平均分子量為5000以下且分子內之自由基聚合性之不飽和鍵之數為2~20個者,以便高效率地完成藉由紫外線之照射進行之紫外線硬化型黏著劑層之三維網狀化。上述重量平均分子量例如可使用GPC測定法而決定。The ultraviolet-curable adhesive layer preferably contains a radically polymerizable polyfunctional oligomer or monomer. The ultraviolet curable adhesive layer contains radically polymerizable polyfunctional oligomers or monomers, so that the ultraviolet curability is improved. The above-mentioned multifunctional oligomer or monomer preferably has a weight average molecular weight of 10,000 or less, and more preferably has a weight average molecular weight of 5,000 or less and the number of radically polymerizable unsaturated bonds in the molecule is 2-20. In order to efficiently complete the three-dimensional meshing of the ultraviolet-curing adhesive layer by ultraviolet irradiation. The said weight average molecular weight can be determined using GPC measurement method, for example.
上述多官能低聚物或單體例如可列舉:三羥甲基丙烷三丙烯酸酯、四羥甲基甲烷四丙烯酸酯、新戊四醇三丙烯酸酯、新戊四醇四丙烯酸酯、二新戊四醇單羥基五丙烯酸酯、二新戊四醇六丙烯酸酯或與上述相同之甲基丙烯酸酯類等。此外,可列舉:1,4-丁二醇二丙烯酸酯、1,6-己二醇二丙烯酸酯、聚乙二醇二丙烯酸酯、市售之寡酯丙烯酸酯、與上述相同之甲基丙烯酸酯類等。該等多官能低聚物或單體可單獨使用,亦可併用2種以上。The above-mentioned multifunctional oligomers or monomers include, for example, trimethylolpropane triacrylate, tetramethylolmethane tetraacrylate, neopentyl erythritol triacrylate, neopentyl erythritol tetraacrylate, dineopentyl Tetraol monohydroxy pentaacrylate, dineopentaerythritol hexaacrylate, or the same methacrylates as above. In addition, examples include: 1,4-butanediol diacrylate, 1,6-hexanediol diacrylate, polyethylene glycol diacrylate, commercially available oligoester acrylate, and the same methacrylic acid as above Esters etc. These polyfunctional oligomers or monomers may be used alone or in combination of two or more kinds.
上述紫外線硬化型黏著劑層亦可含有以提高紫外線硬化型黏著劑之凝聚力為目的之交聯劑。 作為上述交聯劑,例如可列舉:異氰酸酯系交聯劑、環氧系交聯劑、氮丙啶系交聯劑、金屬螯合物系交聯劑等。其中,就進一步提高紫外線硬化型黏著劑之凝聚力之方面而言,較佳為異氰酸酯系交聯劑。The aforementioned ultraviolet-curable adhesive layer may also contain a crosslinking agent for the purpose of enhancing the cohesive force of the ultraviolet-curable adhesive. As said crosslinking agent, an isocyanate type crosslinking agent, an epoxy type crosslinking agent, an aziridine type crosslinking agent, a metal chelate type crosslinking agent etc. are mentioned, for example. Among them, in terms of further enhancing the cohesive force of the ultraviolet curable adhesive, an isocyanate-based crosslinking agent is preferred.
上述交聯劑較佳為於上述黏著劑層中含有0.1~20重量%。藉由使交聯劑處於上述範圍內,可適度地交聯紫外線硬化型黏著劑,維持較高之黏著力,並且進一步提高紫外線硬化型黏著劑之凝聚力。就維持較高之黏著力並且進一步提高紫外線硬化型黏著劑之凝聚力之觀點而言,上述交聯劑之含量之更佳之下限為0.5重量%,進而較佳之下限為1.0重量%,更佳之上限為15重量%,進而較佳之上限為10重量%。The crosslinking agent is preferably contained in the adhesive layer at 0.1 to 20% by weight. By keeping the cross-linking agent within the above range, the UV-curing adhesive can be appropriately cross-linked, maintaining a high adhesive force, and further improving the cohesion of the UV-curing adhesive. From the viewpoint of maintaining a higher adhesive force and further enhancing the cohesive force of the UV-curing adhesive, the lower limit of the content of the crosslinking agent is more preferably 0.5% by weight, and the lower limit is more preferably 1.0% by weight, and the upper limit is more preferably 15% by weight, and a more preferable upper limit is 10% by weight.
上述紫外線硬化型黏著劑層較佳為含有聚矽氧或氟化合物。 藉由使上述紫外線硬化型黏著劑層含有聚矽氧或氟化合物,於紫外線硬化型黏著劑層與被黏著體之界面處聚矽氧或氟化合物滲出,故而於處理結束後可容易地且無糊劑殘留地剝離黏著帶。作為上述聚矽氧或氟化合物,例如可列舉聚矽氧二丙烯酸酯、具有氟烷基之高分子(例如具有源自氟丙烯酸酯之結構單元之(甲基)丙烯酸系共聚物)等。The ultraviolet-curable adhesive layer preferably contains silicone or fluorine compound. By making the aforementioned UV-curing adhesive layer contain silicone or fluorine compound, the silicone or fluorine compound oozes out at the interface between the UV-curing adhesive layer and the adherend, so that it can be easily and freely after the treatment. The adhesive tape is peeled off with the paste remaining. As said polysiloxane or fluorine compound, for example, polysiloxane diacrylate, a polymer having a fluoroalkyl group (for example, a (meth)acrylic copolymer having a structural unit derived from a fluoroacrylate), and the like can be cited.
上述聚矽氧或氟化合物較佳為具有上述可與聚合性聚合物交聯之官能基。 藉由使上述聚矽氧或氟化合物具有上述可與聚合性聚合物交聯之官能基,藉由交聯劑或紫外線照射,聚矽氧或氟化合物能夠與聚合性聚合物發生化學反應,與聚合性聚合物鍵結。藉此,因聚矽氧或氟化合物附著於被黏著體而導致之污染得以抑制。 作為上述可與聚合性聚合物交聯之官能基,根據上述聚合性聚合物中所含之官能基進行適當選擇,例如可列舉:羧基、自由基聚合性之不飽和鍵、羥基、醯胺基、異氰酸基、環氧基等。其中,較佳為自由基聚合性之不飽和鍵。藉由使上述聚矽氧或氟化合物具有作為上述可與聚合性聚合物交聯之官能基之自由基聚合性之不飽和鍵,而利用紫外線照射可使聚矽氧或氟化合物與聚合性聚合物進行化學反應而被引入至聚合性聚合物中,故而因聚矽氧或氟化合物附著於被黏著體而導致之污染得到進一步抑制。 上述聚矽氧或氟化合物中之可交聯之官能度,例如為2~6,較佳為2~4,更佳為2。The polysiloxane or fluorine compound preferably has the above-mentioned functional group capable of being crosslinked with the polymerizable polymer. By making the polysiloxane or fluorine compound have the above-mentioned functional group that can be cross-linked with the polymerizable polymer, the polysiloxane or fluorine compound can chemically react with the polymerizable polymer by cross-linking agent or ultraviolet irradiation. Polymeric polymer bonding. Thereby, the pollution caused by the adhesion of silicone or fluorine compound to the adherend can be suppressed. The functional group that can be crosslinked with the polymerizable polymer is appropriately selected according to the functional group contained in the polymerizable polymer. Examples include carboxyl groups, radically polymerizable unsaturated bonds, hydroxyl groups, and amide groups. , Isocyanate, epoxy, etc. Among them, a radically polymerizable unsaturated bond is preferred. By making the polysiloxane or fluorine compound have a radically polymerizable unsaturated bond as the functional group that can be crosslinked with the polymerizable polymer, the polysiloxane or fluorine compound can be polymerized with the polymerizable polymer by ultraviolet irradiation The substance undergoes a chemical reaction and is incorporated into the polymerizable polymer. Therefore, the contamination caused by the adhesion of silicone or fluorine compound to the adherend is further suppressed. The cross-linkable functionality in the polysiloxane or fluorine compound is, for example, 2-6, preferably 2-4, more preferably 2.
作為上述可與聚合性聚合物交聯之官能基,根據上述聚合性聚合物中所含之官能基適當決定,例如於聚合性聚合物為於分子內具有自由基聚合性之不飽和鍵之(甲基)丙烯酸烷基酯系之情形時,較佳為選擇可與不飽和鍵交聯之官能基。 上述可與不飽和鍵交聯之官能基係具有不飽和雙鍵之官能基,具體而言,例如選擇含有乙烯基、(甲基)丙烯醯基、烯丙基、馬來醯亞胺基等之聚矽氧或氟化合物等。The functional group that can be cross-linked with the polymerizable polymer is appropriately determined according to the functional group contained in the polymerizable polymer. For example, the polymerizable polymer is one having radically polymerizable unsaturated bonds in the molecule ( In the case of an alkyl meth)acrylate system, it is preferable to select a functional group capable of crosslinking with an unsaturated bond. The functional group that can be crosslinked with the unsaturated bond is a functional group having an unsaturated double bond. Specifically, for example, it is selected to contain a vinyl group, a (meth)acrylic acid group, an allyl group, a maleimide group, etc. The silicone or fluorine compounds, etc.
於上述紫外線硬化型黏著劑層中之上述聚矽氧或氟化合物之含量,較佳之下限為2重量%,更佳之下限為5重量%,進而較佳之下限為10重量%,較佳之上限為40重量%,更佳之上限為35重量%,進而較佳之上限為30重量%。 藉由使上述聚矽氧或氟化合物之含量為上述範圍,能夠減少自黏著帶產生之脫氣量,能夠製成耐熱性與防糊劑殘留性能更優異之黏著帶。The content of the polysiloxane or fluorine compound in the ultraviolet curable adhesive layer preferably has a lower limit of 2% by weight, more preferably a lower limit of 5% by weight, still more preferably a lower limit of 10% by weight, and a more preferred upper limit of 40 % By weight, a more preferable upper limit is 35% by weight, and a more preferable upper limit is 30% by weight. By setting the content of the polysiloxane or fluorine compound in the above range, the amount of outgassing generated from the adhesive tape can be reduced, and an adhesive tape with better heat resistance and paste resistance can be made.
上述紫外線硬化型黏著劑層較佳為含有丙烯酸胺酯。 藉由使上述紫外線硬化型黏著劑層含有丙烯酸胺酯,可提高黏著帶之柔軟性,使所獲得之黏著帶不易破碎。The ultraviolet curable adhesive layer preferably contains urethane acrylate. By making the ultraviolet curable adhesive layer contain urethane acrylate, the flexibility of the adhesive tape can be improved, and the obtained adhesive tape is not easily broken.
上述紫外線硬化型黏著劑層中之上述丙烯酸胺酯之含量較佳之上限為20重量%,更佳之上限為15重量%,進而較佳之上限為10重量%。藉由使上述丙烯酸胺酯之含量為上述範圍內,能夠製成於耐熱性與糊劑殘留抑制性能上更優異之黏著帶。上述丙烯酸胺酯之含量之下限並無特別限定,就進一步使黏著帶不易破碎並抑制糊劑殘留之觀點而言,較佳為1重量%。The upper limit of the content of the urethane acrylate in the ultraviolet curable adhesive layer is preferably 20% by weight, more preferably 15% by weight, and still more preferably 10% by weight. By making the content of the above amine acrylate within the above range, it is possible to produce an adhesive tape with more excellent heat resistance and paste residue suppression performance. The lower limit of the content of the above amine acrylate is not particularly limited, but from the viewpoint of further preventing the adhesive tape from being broken and suppressing the residue of the paste, it is preferably 1% by weight.
上述紫外線硬化型黏著劑層中之上述聚矽氧或氟化合物、與上述丙烯酸胺酯之合計含量較佳為50重量%以下。 藉由使上述聚矽氧或氟化合物與上述丙烯酸胺酯之合計含量為上述範圍內,能夠抑制因該等成分之熱分解而產生之脫氣量,故而能夠提高耐熱性,並且抑制因脫氣而導致之意外剝離。就進一步抑制上述剝離之觀點而言,上述聚矽氧或氟化合物、與上述丙烯酸胺酯之合計含量之更佳之上限為40重量%,進而較佳之上限為25重量%。The total content of the polysiloxane or fluorine compound and the urethane acrylate in the ultraviolet curable adhesive layer is preferably 50% by weight or less. By making the total content of the polysiloxane or fluorine compound and the urethane acrylate within the above range, the amount of outgassing due to the thermal decomposition of these components can be suppressed, so the heat resistance can be improved, and the occurrence of outgassing can be suppressed. Caused accidental peeling. From the viewpoint of further suppressing the peeling, a more preferable upper limit of the total content of the polysiloxane or fluorine compound and the urethane acrylate is 40% by weight, and a more preferable upper limit is 25% by weight.
上述紫外線硬化型黏著劑層較佳為含有填料。 藉由使上述紫外線硬化型黏著劑層含有填料,使彈性模數得以提高,故而能夠提高黏著帶之耐熱性。作為上述填料之材料,例如可列舉:二氧化矽、氧化鋁、碳黑、鈣、硼、鎂、氧化鋯等。其中,就進一步提高耐熱性之方面而言,較佳為二氧化矽。The ultraviolet curable adhesive layer preferably contains a filler. The above-mentioned ultraviolet-curable adhesive layer contains a filler to increase the modulus of elasticity, so that the heat resistance of the adhesive tape can be improved. Examples of the material of the above-mentioned filler include silica, alumina, carbon black, calcium, boron, magnesium, and zirconia. Among them, in terms of further improving heat resistance, silicon dioxide is preferred.
上述填料之平均粒子徑並無特別限定,較佳之下限為0.06 μm,更佳之下限為0.07 μm,較佳之上限為2 μm,更佳之上限為1 μm。藉由使填料之平均粒子徑為上述範圍內,能夠進一步提高對紫外線硬化型黏著劑之分散性。The average particle diameter of the aforementioned filler is not particularly limited, and the lower limit is preferably 0.06 μm, the lower limit is more preferably 0.07 μm, the upper limit is preferably 2 μm, and the upper limit is more preferably 1 μm. By making the average particle diameter of the filler within the above-mentioned range, the dispersibility to the ultraviolet curable adhesive can be further improved.
上述紫外線硬化型黏著劑層中之上述填料之含量較佳之下限為1重量%,更佳之下限為3重量%,較佳之上限為18重量%,更佳之上限為12重量%。 藉由使上述填料之含量為上述範圍內,能夠製成耐熱性更優異之黏著帶。The lower limit of the content of the filler in the ultraviolet curable adhesive layer is preferably 1% by weight, the lower limit is more preferably 3% by weight, the upper limit is preferably 18% by weight, and the upper limit is more preferably 12% by weight. By setting the content of the filler within the above range, an adhesive tape with more excellent heat resistance can be produced.
上述紫外線硬化型黏著劑層較佳為含有藉由刺激而產生氣體之氣體產生劑。 藉由使上述紫外線硬化型黏著劑層含有氣體產生劑,於步驟結束後施以刺激產生氣體,藉此於被黏著體與黏著帶之間產生因氣體而導致之間隙,故而可更容易地剝離黏著帶。 上述氣體產生劑並無特別限定,就可使用於高溫處理步驟中之方面而言,較佳為藉由光而產生氣體之氣體產生劑。其中,就對伴隨加熱之處理之耐性優異之方面而言,較佳為苯乙酸、二苯乙酸、三苯乙酸等羧酸化合物或其鹽、或1H-四唑、5-苯基-1H-四唑、5,5-偶氮雙-1H-四唑等四唑化合物或其鹽等。此種氣體產生劑一方面藉由照射紫外線等光而產生氣體,另一方面具有即便於260℃左右之高溫下亦不會分解之較高之耐熱性。The ultraviolet-curable adhesive layer preferably contains a gas generating agent that generates gas by stimulation. By making the above-mentioned ultraviolet curable adhesive layer contain a gas generating agent, it is stimulated to generate gas after the step is completed, thereby generating a gap due to gas between the adherend and the adhesive tape, so that it can be peeled more easily Adhesive tape. The above-mentioned gas generating agent is not particularly limited, and it is preferably a gas generating agent that generates gas by light in terms of being usable in a high-temperature processing step. Among them, in terms of excellent resistance to treatment accompanied by heating, carboxylic acid compounds such as phenylacetic acid, diphenylacetic acid, and triphenylacetic acid or salts thereof, or 1H-tetrazole, 5-phenyl-1H- Tetrazole, 5,5-azobis-1H-tetrazole and other tetrazole compounds or their salts. On the one hand, this gas generating agent generates gas by irradiating light such as ultraviolet rays, and on the other hand, it has high heat resistance that does not decompose even at a high temperature of about 260°C.
上述紫外線硬化型黏著劑層亦可含有光敏劑。藉由含有上述光敏劑,即便於上述基材膜之405 nm之紫外線穿透率為較低之情形時,亦可充分地使紫外線硬化型黏著劑層硬化。又,上述光敏劑因具有放大光對上述氣體產生劑之刺激之效果,故而可藉由照射更少之光來釋出氣體。又,可藉由更廣之波長區域之光來釋出氣體。 作為上述光敏劑,例如可列舉2,4-二乙基-9-氧硫 等9-氧硫 系化合物、或二丁基蒽、二丙基蒽等蒽系化合物等。又,亦可列舉2,2-二甲氧基-1,2-二苯乙烷-1-酮、二苯甲酮、2,4-二氯二苯甲酮、o-苯甲醯苯甲酸甲酯、4,4'-雙(二甲胺基)二苯甲酮、4-苯甲醯基-4'甲基二苯硫醚等。該等光敏劑可單獨使用,亦可組合2種以上使用。再者,上述光敏劑於高溫下熱分解而產生脫氣,使紫外線硬化型黏著劑層發泡,故而若大量使用,則存在導致糊劑殘留或意外剝離之情況。因此,較佳為儘可能減少上述光敏劑之使用量。The ultraviolet curable adhesive layer may contain a photosensitizer. By containing the above-mentioned photosensitizer, even when the ultraviolet light transmittance of 405 nm of the above-mentioned base film is low, the ultraviolet-curable adhesive layer can be sufficiently hardened. In addition, since the photosensitizer has the effect of amplifying the stimulation of the light on the gas generating agent, it can release gas by irradiating less light. In addition, gas can be released by light of a wider wavelength range. As the aforementioned photosensitizer, for example, 2,4-diethyl-9-oxysulfur 9-oxysulfur -Based compounds, or anthracene-based compounds such as dibutylanthracene and dipropylanthracene. In addition, 2,2-dimethoxy-1,2-diphenylethane-1-one, benzophenone, 2,4-dichlorobenzophenone, o-benzoic acid Methyl ester, 4,4'-bis(dimethylamino)benzophenone, 4-benzyl-4'methyl diphenyl sulfide, etc. These photosensitizers may be used alone or in combination of two or more kinds. Furthermore, the above-mentioned photosensitizer is thermally decomposed at a high temperature to generate outgassing and foam the ultraviolet-curing adhesive layer. Therefore, if it is used in large amounts, it may cause the paste to remain or accidentally peel off. Therefore, it is preferable to reduce the usage amount of the aforementioned photosensitizer as much as possible.
上述紫外線硬化型黏著劑層亦可含有塑化劑、樹脂、界面活性劑、蠟等公知之添加劑。該等添加劑可單獨使用,亦可組合多個使用。The aforementioned ultraviolet-curable adhesive layer may also contain well-known additives such as plasticizers, resins, surfactants, and waxes. These additives can be used alone or in combination of multiple.
上述紫外線硬化型黏著劑層之紫外線照射前之儲存彈性模數G'並無特別限定,較佳為於23℃中之儲存彈性模數G'為5.0×103 Pa以上、1.0×105 Pa以下。藉由使紫外線照射前之紫外線硬化型黏著劑層於23℃中之儲存彈性模數G'為上述範圍內,則能以充分之黏著力來保護被黏著體。紫外線照射前之紫外線硬化型黏著劑層於23℃中之儲存彈性模數G'可根據構成紫外線硬化型黏著劑層之黏著劑之種類、填料之種類及量等進行調節。 上述紫外線硬化型黏著劑層於23℃中之紫外線照射前之儲存彈性模數G'係可使用黏彈性譜儀(例如DVA-200、IT Meter. and Control, Inc.製造),於定速升溫剪切模式、升溫速度10℃/分鐘、頻率10 Hz之條件下測定儲存彈性模數而求出。The storage elastic modulus G'of the above-mentioned ultraviolet curable adhesive layer before ultraviolet irradiation is not particularly limited. Preferably, the storage elastic modulus G'at 23°C is 5.0×10 3 Pa or more, 1.0×10 5 Pa the following. By making the storage elastic modulus G'of the ultraviolet curable adhesive layer before ultraviolet irradiation at 23° C. within the above range, the adherend can be protected with sufficient adhesive force. The storage elastic modulus G'of the UV-curing adhesive layer at 23°C before UV irradiation can be adjusted according to the type of adhesive constituting the UV-curing adhesive layer and the type and amount of filler. The storage elastic modulus G'of the above-mentioned UV-curing adhesive layer before UV irradiation at 23°C can use a viscoelastic spectrometer (such as DVA-200, manufactured by IT Meter. and Control, Inc.) and increase the temperature at a constant rate. It is determined by measuring the storage elastic modulus under the conditions of shear mode, heating rate 10°C/min, and frequency 10 Hz.
上述紫外線硬化型黏著劑層之厚度並無特別限定,較佳為下限為5 μm,上限為100 μm。若上述紫外線硬化型黏著劑層之厚度為上述範圍內,則能以充分之黏著力保護被黏著體,進而亦可抑制剝離時之糊劑殘留。就進一步提高黏著力並且進一步抑制剝離時之糊劑殘留之觀點而言,上述紫外線硬化型黏著劑層之厚度之更佳之下限為10 μm,更佳之上限為60 μm。The thickness of the ultraviolet-curable adhesive layer is not particularly limited, but the lower limit is preferably 5 μm and the upper limit is 100 μm. If the thickness of the ultraviolet-curable adhesive layer is within the above-mentioned range, the adherend can be protected with sufficient adhesive force, and the paste residue during peeling can also be suppressed. From the viewpoint of further improving the adhesive force and further suppressing the paste residue during peeling, the lower limit of the thickness of the ultraviolet curable adhesive layer is more preferably 10 μm, and the upper limit is more preferably 60 μm.
本發明之黏著帶較佳為於上述基材膜之積層有上述紫外線硬化型黏著劑層之面相反側之面具有黏著劑層。 藉由使本發明之黏著帶為於基材膜之單面具有紫外線硬化型黏著劑層、於另一面具有黏著劑層之雙面黏著帶,能夠經由雙面黏著帶接著玻璃等支持體與被黏著體,故而能夠進行使用有支持體之半導體元件之製造步驟。The adhesive tape of the present invention preferably has an adhesive layer on the surface opposite to the surface on which the ultraviolet-curable adhesive layer is laminated on the base film. By making the adhesive tape of the present invention a double-sided adhesive tape with an ultraviolet-curable adhesive layer on one side of the base film and an adhesive layer on the other side, it is possible to bond a support such as glass to a substrate through the double-sided adhesive tape. Adhesive, so it can be used in the manufacturing process of the semiconductor device with the support.
構成上述黏著劑層之黏著劑並無特別限定,例如可列舉:丙烯酸系黏著劑、聚矽氧系黏著劑、胺酯系黏著劑等。其中,就耐熱性優異之方面而言,較佳為丙烯酸系或聚矽氧系黏著劑。 又,作為構成上述黏著劑層之黏著劑,亦能夠使用如上述之紫外線硬化型黏著劑。藉由使用上述紫外線硬化型黏著劑,能夠利用充分之黏著力保持支持體,於支持體為透明支持體之情形時,於貼附後使由上述紫外線硬化型黏著劑所構成之黏著劑層硬化,從而,即便於進行高溫處理之情形時,亦能夠保持支持體。又,於不需要支持體後,可容易地除去支持體。The adhesive constituting the adhesive layer is not particularly limited, and examples thereof include acrylic adhesives, silicone adhesives, and urethane adhesives. Among them, in terms of excellent heat resistance, acrylic or silicone adhesives are preferred. In addition, as the adhesive constituting the adhesive layer, the ultraviolet curable adhesive as described above can also be used. By using the above-mentioned ultraviolet-curable adhesive, the support can be held with sufficient adhesive force. When the support is a transparent support, the adhesive layer composed of the above-mentioned ultraviolet-curable adhesive is cured after sticking. Therefore, even in the case of high-temperature treatment, the support can be maintained. In addition, after the support is unnecessary, the support can be easily removed.
上述黏著劑層較佳為含有藉由刺激而產生氣體之氣體產生劑。 藉由使上述黏著劑層含有氣體產生劑,於步驟結束後施以刺激而產生氣體,藉此可容易地將支持體與黏著帶剝離。 上述氣體產生劑可使用與上述紫外線硬化型黏著劑層之氣體產生劑相同者。The adhesive layer preferably contains a gas generating agent that generates gas by stimulation. By making the above-mentioned adhesive layer contain a gas generating agent, after the step is completed, a stimulus is applied to generate gas, whereby the support and the adhesive tape can be easily peeled off. The gas generating agent may be the same as the gas generating agent of the ultraviolet curable adhesive layer.
上述黏著劑層之厚度並無特別限定,較佳為下限為5μm,上限為30 μm。若上述黏著劑層之厚度為上述範圍內,則能以充分之黏著力與支持體接著。就進一步提高與支持體之接著力之觀點而言,上述黏著劑層之厚度之更佳之下限為10 μm,更佳之上限為20 μm。The thickness of the adhesive layer is not particularly limited, but the lower limit is preferably 5 μm and the upper limit is 30 μm. If the thickness of the adhesive layer is within the above range, it can be adhered to the support with sufficient adhesive force. From the viewpoint of further improving the adhesion to the support, the lower limit of the thickness of the adhesive layer is more preferably 10 μm, and the upper limit is more preferably 20 μm.
上述黏著劑層亦可含有光敏劑、塑化劑、樹脂、界面活性劑、蠟、微粒子填充劑等公知之添加劑。該等添加劑可單獨使用,亦可組合多個使用。The adhesive layer may also contain well-known additives such as photosensitizers, plasticizers, resins, surfactants, waxes, and microparticle fillers. These additives can be used alone or in combination of multiple.
本發明之黏著帶亦可於上述基材膜與上述紫外線硬化型黏著劑層之間具有錨定層。 若於上述基材膜與上述紫外線硬化型黏著劑層之間具有錨定層,則於紫外線硬化型黏著劑層含有聚矽氧或氟化合物之情形時,能夠抑制聚矽氧或氟化合物向基材膜側滲出而使紫外線硬化型黏著劑層自基材膜剝離。The adhesive tape of the present invention may also have an anchor layer between the base film and the ultraviolet curable adhesive layer. If there is an anchor layer between the base film and the ultraviolet-curable adhesive layer, when the ultraviolet-curable adhesive layer contains polysiloxane or fluorine compound, it can suppress the polysiloxane or fluorine compound The material film side oozes and the ultraviolet-curable adhesive layer is peeled from the base film.
作為上述錨定層,例如可列舉丙烯酸系黏著劑、胺酯系黏著劑等。其中,就錨定性能優異之方面而言,較佳為丙烯酸系黏著劑。Examples of the anchor layer include acrylic adhesives, urethane adhesives, and the like. Among them, an acrylic adhesive is preferred in terms of excellent anchoring performance.
上述錨定層視需要亦可含有無機填充劑、熱穩定劑、抗氧化劑、抗靜電劑、塑化劑、樹脂、界面活性劑、蠟等公知之添加劑。該等添加劑可單獨使用,亦可組合多個使用。If necessary, the anchor layer may contain well-known additives such as inorganic fillers, heat stabilizers, antioxidants, antistatic agents, plasticizers, resins, surfactants, waxes, and the like. These additives can be used alone or in combination of multiple.
上述錨定層之厚度並無特別限定,較佳之下限為1 μm,較佳之上限為30 μm。若上述錨定層之厚度為該範圍內,則可進一步提高上述紫外線硬化型黏著劑層與基材膜之錨定力。就進一步提高上述紫外線硬化型黏著劑層與基材膜之錨定力之觀點而言,上述錨定層之厚度之更佳之下限為3 μm,更佳之上限為10 μm。The thickness of the anchor layer is not particularly limited, and the preferred lower limit is 1 μm, and the preferred upper limit is 30 μm. If the thickness of the anchor layer is within this range, the anchor force between the ultraviolet curable adhesive layer and the base film can be further improved. From the viewpoint of further improving the anchoring force between the ultraviolet curable adhesive layer and the substrate film, the lower limit of the thickness of the anchor layer is more preferably 3 μm, and the upper limit is more preferably 10 μm.
製造本發明之黏著帶之方法並無特別限定,可使用習知公知之方法。例如能夠藉由將上述紫外線硬化型黏著劑成分之溶液塗佈於實施了脫模處理之膜上並使其乾燥而形成紫外線硬化型黏著劑層,與基材膜貼合而進行製造。又,於本發明之黏著帶具有上述黏著劑層之情形時,能夠藉由使用構成上述黏著劑層之黏著劑之溶液,以與上述紫外線硬化型黏著劑層相同之方法形成黏著劑層,並將其貼合於基材膜之貼合有上述紫外線硬化型黏著劑層之面相反側之面而進行製造。The method of manufacturing the adhesive tape of the present invention is not particularly limited, and conventionally known methods can be used. For example, it can manufacture by apply|coating the solution of the said ultraviolet-curable adhesive component on the film which performed a mold release process, and drying to form an ultraviolet-curable adhesive layer, and bonding it with a base film. In addition, when the adhesive tape of the present invention has the adhesive layer, the adhesive layer can be formed by using a solution of the adhesive constituting the adhesive layer by the same method as the ultraviolet curable adhesive layer, and It is manufactured by bonding this to the surface of the base film on the opposite side to the surface to which the ultraviolet-curable adhesive layer is bonded.
本發明之黏著帶之用途並無特別限定,即便於如高溫且施加壓力之嚴酷之環境下使用之情形時,亦可保護被黏著體且無糊劑殘留地剝離,故而於電子零件之製造中,可特別適合用作用以保護晶圓或半導體晶片等之保護帶。 作為製造此種電子零件之方法,例如可列舉如以下之電子零件之製造方法。即為依序包含以下步驟之方法:基板貼附步驟,其將本發明之黏著帶自紫外線硬化型黏著劑層貼附到基板;硬化步驟,其照射紫外線使上述紫外線硬化型黏著劑層硬化;熱處理步驟,其將上述基板於260℃以上之高溫下進行處理;及剝離步驟,其將上述基板自本發明之黏著帶剝離。 又,亦可列舉如下電子零件之製造方法,該電子零件之製造方法使用了作為本發明之一實施態樣之於上述基材膜之積層有上述紫外線硬化型黏著劑層之面相反側之面具有黏著劑層之黏著帶。即為依序包含以下步驟之方法:基板貼附步驟,其將黏著帶自紫外線硬化型黏著劑層貼附至基板;支持體貼附步驟,其將支持體貼附於上述黏著劑層上;硬化步驟,其照射紫外線使上述紫外線硬化型黏著劑層硬化;熱處理步驟,其將上述基板於260℃以上之高溫下進行處理;及剝離步驟,其將上述基板自黏著帶剝離。又,為依序包含以下步驟之方法:基板貼附步驟,其將黏著帶自紫外線硬化型黏著劑層貼附至基板;硬化步驟,其照射紫外線使上述紫外線硬化型黏著劑層硬化;支持體貼附步驟,其將支持體貼附於上述黏著劑層上;熱處理步驟,其將上述基板於260℃以上之高溫下進行處理;及剝離步驟,其將上述基板自黏著帶剝離。The application of the adhesive tape of the present invention is not particularly limited. Even when used in a harsh environment such as high temperature and pressure, it can protect the adherend and peel off without paste residue, so it is used in the manufacture of electronic parts , Can be particularly suitable as a protective tape for protecting wafers or semiconductor chips. As a method of manufacturing such electronic components, for example, the following manufacturing methods of electronic components can be cited. It is a method including the following steps in sequence: a substrate attaching step, which attaches the adhesive tape of the present invention from an ultraviolet-curable adhesive layer to the substrate; a curing step, which irradiates ultraviolet rays to harden the aforementioned ultraviolet-curable adhesive layer; A heat treatment step, which processes the above-mentioned substrate at a high temperature above 260°C; and a peeling step, which peels the above-mentioned substrate from the adhesive tape of the present invention. In addition, the following manufacturing method of electronic parts can also be cited. The manufacturing method of the electronic parts uses the surface opposite to the surface on which the ultraviolet-curable adhesive layer is laminated on the base film as one embodiment of the present invention Adhesive tape with adhesive layer. It is a method that sequentially includes the following steps: a substrate attaching step, which attaches the adhesive tape from the ultraviolet-curing adhesive layer to the substrate; a support attaching step, which attaches the support to the adhesive layer; hardening step , Which irradiates ultraviolet rays to harden the ultraviolet-curable adhesive layer; a heat treatment step, which treats the substrate at a high temperature above 260° C.; and a peeling step, which peels the substrate from the adhesive tape. In addition, it is a method that sequentially includes the following steps: a substrate attaching step, which attaches the adhesive tape from an ultraviolet-curable adhesive layer to the substrate; a curing step, which irradiates ultraviolet rays to harden the ultraviolet-curable adhesive layer; support body attaching The attaching step, which attaches the support to the adhesive layer; the heat treatment step, which processes the substrate at a high temperature above 260°C; and the peeling step, which peels the substrate from the adhesive tape.
上述基板並無特別限定,例如可列舉矽晶圓、半導體晶圓、半導體晶片等。 上述支持體並無特別限定,例如可列舉玻璃、聚醯亞胺膜、玻璃環氧化物基板等。 上述於260℃以上之高溫下進行處理之熱處理步驟之溫度上限並無特別限定,例如為400℃,較佳為300℃。 上述於260℃以上之高溫下進行處理之熱處理步驟並無特別限定,例如可列舉基板製造步驟、晶片安裝步驟、熱壓接合步驟、回焊步驟等。更具體而言,例如可列舉將黏著帶於數十秒~1分鐘之間左右加熱至260℃以上之熱壓接合步驟或回焊步驟等。 [發明之效果]The above-mentioned substrate is not particularly limited, and examples thereof include silicon wafers, semiconductor wafers, and semiconductor wafers. The said support is not specifically limited, For example, glass, a polyimide film, a glass epoxy substrate, etc. are mentioned. The upper limit of the temperature of the heat treatment step of performing the treatment at a high temperature of 260°C or higher is not particularly limited, for example, 400°C, preferably 300°C. The above-mentioned heat treatment step for processing at a high temperature of 260° C. or higher is not particularly limited, and examples thereof include a substrate manufacturing step, a wafer mounting step, a thermocompression bonding step, and a reflow step. More specifically, for example, a thermocompression bonding step or a reflow step in which the adhesive tape is heated to 260°C or higher in about tens of seconds to 1 minute. [Effects of Invention]
根據本發明,提供一種即便於使用在伴隨達到260℃之高溫處理之步驟中之情形時,亦可保護被黏著體並且可無糊劑殘留地剝離之黏著帶。According to the present invention, there is provided an adhesive tape that can protect an adherend and can be peeled off without a paste residue even when it is used in a step accompanied by a high-temperature treatment up to 260°C.
以下舉出實施例對本發明之態樣進一步進行詳細說明,但本發明並不僅限定於該等實施例。The following examples are given to further describe the aspects of the present invention in detail, but the present invention is not limited to these examples.
(實施例1) (紫外線硬化型黏著劑A之製造) 準備具備溫度計、攪拌機、冷卻管之反應器,向該反應器內添加作為(甲基)丙烯酸烷基酯之丙烯酸-2-乙基己酯94重量份、作為含官能基單體之甲基丙烯酸羥基乙酯6重量份、月桂硫醇0.01重量份、及乙酸乙酯80重量份之後,對反應器進行加熱而開始回流。繼而,向上述反應器內添加作為聚合起始劑之1,1-雙(三級己基過氧基)-3,3,5-三甲基環己烷0.01重量份,於回流下開始聚合。其次,於聚合開始起1小時後及2小時後,亦各添加1,1-雙(三級己基過氧基)-3,3,5-三甲基環己烷0.01重量份,進而,於聚合開始起4小時後添加過氧化特戊酸三級己酯0.05重量份使聚合反應繼續進行。並且,於自聚合開始起8小時後,獲得固形物成分55重量%、重量平均分子量60萬之含官能基(甲基)丙烯酸系聚合物之乙酸乙酯溶液。 對所獲得之含有含官能基(甲基)丙烯酸系聚合物之乙酸乙酯溶液之樹脂固形物成分100重量份添加作為含官能基不飽和化合物之甲基丙烯酸2-異氰酸酯基乙酯3.5重量份進行反應,獲得聚合性聚合物(丙烯酸聚合物)A。其後,對所獲得之丙烯酸聚合物A之乙酸乙酯溶液之樹脂固形物成分100重量份混合脫模劑(聚矽氧)20重量份、填料3重量份、丙烯酸胺酯10重量份、交聯劑0.2重量份、光聚合起始劑1重量份,獲得紫外線硬化型黏著劑A之乙酸乙酯溶液。再者,脫模劑(聚矽氧)、填料、丙烯酸胺酯、交聯劑、光聚合起始劑使用了以下類型。 脫模劑(聚矽氧):聚矽氧二丙烯酸酯、EBECRYL 350、DAICEL-ALLNEX公司製造、重量平均分子量1000 填料:二氧化矽填料、Reolosil MT-10、德山化學公司製造 丙烯酸胺酯:UN-5500、根上工業公司製造 交聯劑:異氰酸酯系交聯劑、Coronate L、日本聚胺酯公司製造 光聚合起始劑:Esacure ONE、日本SiberHegner公司製造(Example 1) (Manufacturing of ultraviolet curing adhesive A) Prepare a reactor equipped with a thermometer, a stirrer, and a cooling tube, and add 94 parts by weight of 2-ethylhexyl acrylate as an alkyl (meth)acrylate and methacrylic acid as a functional group-containing monomer to the reactor After 6 parts by weight of hydroxyethyl, 0.01 parts by weight of lauryl mercaptan, and 80 parts by weight of ethyl acetate, the reactor was heated to start reflux. Then, 0.01 parts by weight of 1,1-bis(tertiary hexylperoxy)-3,3,5-trimethylcyclohexane as a polymerization initiator was added to the above-mentioned reactor, and polymerization was started under reflux. Next, after 1 hour and 2 hours from the start of the polymerization, 0.01 parts by weight of 1,1-bis(tertiary hexylperoxy)-3,3,5-trimethylcyclohexane were also added, and further, After 4 hours from the start of polymerization, 0.05 parts by weight of tertiary hexyl peroxide pivalate was added to continue the polymerization reaction. And 8 hours after the start of the polymerization, an ethyl acetate solution of a functional group-containing (meth)acrylic polymer with a solid content of 55% by weight and a weight average molecular weight of 600,000 was obtained. To 100 parts by weight of the resin solid content of the ethyl acetate solution containing a functional group-containing (meth)acrylic polymer, 3.5 parts by weight of 2-isocyanatoethyl methacrylate as a functional group-containing unsaturated compound were added The reaction proceeds to obtain a polymerizable polymer (acrylic polymer) A. Thereafter, 100 parts by weight of the resin solid content of the ethyl acetate solution of the acrylic polymer A obtained were mixed with 20 parts by weight of a release agent (polysiloxane), 3 parts by weight of filler, 10 parts by weight of urethane acrylate, and 0.2 parts by weight of the coupling agent and 1 part by weight of the photopolymerization initiator were used to obtain an ethyl acetate solution of the ultraviolet-curing adhesive A. In addition, the following types were used for mold release agents (polysiloxane), fillers, urethane acrylates, crosslinking agents, and photopolymerization initiators. Release agent (polysiloxane): Polysiloxane diacrylate, EBECRYL 350, manufactured by DAICEL-ALLNEX, weight average molecular weight 1000 Filler: Silica filler, Reolosil MT-10, manufactured by Tokuyama Chemical Company Amino acrylate: UN-5500, manufactured by Negami Industry Co., Ltd. Crosslinking agent: isocyanate-based crosslinking agent, Coronate L, manufactured by Japan Polyurethane Company Photopolymerization initiator: Esacure ONE, manufactured by SiberHegner, Japan
(黏著劑層用黏著劑A之製造) 對紫外線硬化型黏著劑A之製造中所獲得之丙烯酸聚合物A之乙酸乙酯溶液之樹脂固形物成分100重量份混合脫模劑(聚矽氧)10重量份、填料12重量份、丙烯酸胺酯20重量份、交聯劑1.2重量份、光聚合起始劑1重量份、氣體產生劑10重量份,獲得黏著劑層用黏著劑A之乙酸乙酯溶液。再者,脫模劑(聚矽氧)、填料、丙烯酸胺酯、交聯劑及光聚合起始劑使用了與紫外線硬化型黏著劑之製造中相同之類型。氣體產生劑使用了以下式(A)所表示之雙四唑化合物之鹽。(Manufacture of Adhesive A for Adhesive Layer) 100 parts by weight of the resin solid content of the ethyl acetate solution of the acrylic polymer A obtained in the manufacture of the ultraviolet curing adhesive A mixed with 10 parts by weight of the release agent (polysiloxane), 12 parts by weight of the filler, and acrylic amine 20 parts by weight of ester, 1.2 parts by weight of crosslinking agent, 1 part by weight of photopolymerization initiator, and 10 parts by weight of gas generating agent, to obtain an ethyl acetate solution of adhesive A for adhesive layer. Furthermore, the mold release agent (polysiloxane), filler, urethane acrylate, cross-linking agent, and photopolymerization initiator are the same types used in the manufacture of UV-curing adhesives. The gas generating agent used a salt of a bistetrazole compound represented by the following formula (A).
(錨定層用黏著劑之製造) 對丙烯酸聚合物之乙酸乙酯溶液之樹脂固形物成分100重量份混合填料12重量份、交聯劑5重量份,獲得錨定層用黏著劑之乙酸乙酯溶液。再者,丙烯酸聚合物、填料、交聯劑使用了以下物質。 丙烯酸聚合物:SK Dyne1604N、綜研化學公司製造 填料:二氧化矽填料、Reolosil MT-10、德山化學公司製造 交聯劑:異氰酸酯系交聯劑、Coronate L、日本聚胺酯公司製造(Manufacture of adhesive for anchor layer) To 100 parts by weight of the resin solid content of the ethyl acetate solution of acrylic polymer, 12 parts by weight of filler and 5 parts by weight of crosslinking agent were mixed to obtain an ethyl acetate solution of the adhesive for anchor layer. In addition, the following materials were used for the acrylic polymer, filler, and crosslinking agent. Acrylic polymer: SK Dyne1604N, manufactured by Soken Chemical Co., Ltd. Filler: Silica filler, Reolosil MT-10, manufactured by Tokuyama Chemical Company Crosslinking agent: isocyanate-based crosslinking agent, Coronate L, manufactured by Japan Polyurethane Company
(黏著帶之製造) 以乾燥後黏著劑層之厚度成為130 μm之方式將所獲得之紫外線硬化型黏著劑A之乙酸乙酯溶液塗佈於厚度50 μm之經過脫模處理之聚對苯二甲酸乙二酯(PET)膜之脫模處理面上之後,於100℃乾燥10分鐘形成紫外線硬化型黏著劑層。 另一方面,以乾燥後黏著劑層之厚度成為20 μm之方式將所獲得之黏著劑層用黏著劑A之乙酸乙酯溶液塗佈於另一厚度50 μm之經過脫模處理之PET膜之脫模處理面上之後,於110℃乾燥5分鐘形成黏著劑層。 進而,以乾燥後黏著劑層之厚度成為10 μm之方式將所獲得之錨定層用黏著劑之乙酸乙酯溶液塗佈於另一厚度50 μm之經過脫模處理之PET膜之脫模處理面上之後,於110℃乾燥5分鐘形成錨定層。 其次,準備由在雙面經過電暈處理之厚度25 μm之尼龍9T(UNIAMIDE,Unitika公司製造)所構成之膜(尼龍9T膜)作為基材膜,將所製作之錨定層層壓於尼龍9T膜之單面,剝離PET膜而於基材膜上形成錨定層。其後,將所獲得之紫外線硬化型黏著劑層貼合於尼龍9T膜之形成有錨定層之面上,將所獲得之黏著劑層貼合於尼龍9T膜之形成有錨定層之面相反側之面上,獲得具有紫外線硬化型黏著劑層/錨定層/基材膜/黏著劑層之構造之黏著帶。(Manufacture of adhesive tape) After drying, the thickness of the adhesive layer becomes 130 μm, and the obtained ethyl acetate solution of ultraviolet curable adhesive A is applied to 50 μm thick polyethylene terephthalate (PET ) After the release treatment surface of the film, dry it at 100°C for 10 minutes to form an ultraviolet-curing adhesive layer. On the other hand, the obtained adhesive layer is coated with an ethyl acetate solution of adhesive A on another 50 μm thick PET film after the release treatment so that the thickness of the adhesive layer becomes 20 μm. After the mold release treatment surface, it was dried at 110°C for 5 minutes to form an adhesive layer. Furthermore, after drying, the thickness of the adhesive layer becomes 10 μm, and the obtained ethyl acetate solution of the adhesive for the anchor layer is applied to another PET film with a thickness of 50 μm after the release treatment. After the surface, it was dried at 110°C for 5 minutes to form an anchor layer. Next, prepare a film (nylon 9T film) composed of nylon 9T (UNIAMIDE, manufactured by Unitika) with a thickness of 25 μm that has been corona treated on both sides as a base film, and the anchor layer produced is laminated on the nylon On one side of the 9T film, peel off the PET film to form an anchor layer on the base film. After that, the obtained ultraviolet-curing adhesive layer was attached to the surface of the nylon 9T film where the anchor layer was formed, and the obtained adhesive layer was attached to the surface of the nylon 9T film where the anchor layer was formed On the opposite side, an adhesive tape with a structure of ultraviolet-curing adhesive layer/anchor layer/base film/adhesive layer is obtained.
(基材膜之紫外線穿透率之測定) 使用分光光度計(U-3900,日立製作所公司製造),測定基材膜之405 nm處之紫外線之穿透率。(Measurement of the UV transmittance of the base film) Using a spectrophotometer (U-3900, manufactured by Hitachi, Ltd.), measure the transmittance of ultraviolet rays at 405 nm of the substrate film.
(Ef(270)之測定) 以長邊與基材膜製造時之行進方向一致之方式使用衝壓刃將基材膜衝壓成5×35 mm之尺寸,藉此獲得測定樣本。將所獲得之測定樣本浸漬於液態氮中冷卻至-50℃,其後,使用黏彈性譜儀(DVA-200,IT Meter. and Control, Inc.製造),於定速升溫拉伸模式、升溫速度10℃/分鐘、頻率10 Hz之條件下進行拉伸彈性模數之測定,測定基材膜於270℃下之拉伸彈性模數。(Determination of Ef(270)) Use a punching blade to punch the base film into a size of 5×35 mm in such a way that the long side is consistent with the direction of travel of the base film during manufacture, thereby obtaining a measurement sample. The obtained measurement sample was immersed in liquid nitrogen and cooled to -50°C. After that, a viscoelastic spectrometer (DVA-200, manufactured by IT Meter. and Control, Inc.) was used to increase the temperature in a constant-rate heating and stretching mode. The tensile modulus of elasticity was measured at a speed of 10°C/min and a frequency of 10 Hz, and the tensile modulus of elasticity of the base film at 270°C was measured.
(紫外線照射前之儲存彈性模數G'之測定) 對紫外線硬化型黏著層使用黏彈性譜儀(DVA-200、IT Meter. and Control, Inc.製造),於定速升溫剪切模式、升溫速度10℃/分鐘、頻率10 Hz之條件下進行儲存彈性模數之測定,求出紫外線照射前之紫外線硬化型黏著劑層於23℃下之儲存彈性模數G'。(Measurement of storage elastic modulus G'before UV irradiation) Use a viscoelastic spectrometer (DVA-200, IT Meter. and Control, Inc.) for the UV-curing adhesive layer, and store it under the conditions of constant-rate heating shear mode, heating rate 10℃/min, and frequency 10 Hz For the measurement of elastic modulus, obtain the storage elastic modulus G'of the UV-curing adhesive layer at 23°C before UV irradiation.
(紫外線照射後之凝膠分率之測定) 使用高壓水銀紫外線照射機,以累計強度成為3000 mJ/cm2 之方式自所獲得之黏著帶之基材膜側對黏著帶表面照射405 nm之紫外線,使紫外線硬化型黏著劑層交聯、硬化。其次,只刮取0.1 g之硬化後之紫外線硬化型黏著劑層,浸漬於乙酸乙酯50 ml中,利用振盪機於溫度23度、120 rpm之條件下振盪24小時(以下,將刮取之紫外線硬化型黏著劑層稱為黏著劑組成物)。振盪後,使用金屬網(網眼#200網),將乙酸乙酯與吸收乙酸乙酯而膨潤後之黏著劑組成物分離。使分離後之黏著劑組成物於110℃之條件下乾燥1小時。測定乾燥後之包含金屬網之黏著劑組成物之重量,利用下式算出紫外線照射後之凝膠分率。 凝膠分率(%)=100×(W1 -W2 )/W0 (W0 :黏著劑組成物初始重量,W1 :乾燥後之包含金屬網之黏著劑組成物重量,W2 :金屬網之初始重量)(Measurement of gel fraction after ultraviolet irradiation) Using a high-pressure mercury ultraviolet irradiation machine, irradiate 405 nm ultraviolet rays on the surface of the adhesive tape from the base film side of the adhesive tape so that the cumulative intensity becomes 3000 mJ/cm 2 , To cross-link and harden the UV-curing adhesive layer. Secondly, scrape only 0.1 g of the cured UV-curable adhesive layer, immerse it in 50 ml of ethyl acetate, and shake it for 24 hours at a temperature of 23 degrees and 120 rpm (below, the The ultraviolet curable adhesive layer is called an adhesive composition). After shaking, use a metal mesh (mesh#200 mesh) to separate ethyl acetate from the adhesive composition that has absorbed ethyl acetate and swelled. The separated adhesive composition is dried at 110°C for 1 hour. The weight of the adhesive composition containing the metal mesh after drying was measured, and the gel fraction after ultraviolet irradiation was calculated using the following formula. Gel fraction (%)=100×(W 1 -W 2 )/W 0 (W 0 : initial weight of adhesive composition, W 1 : weight of adhesive composition including metal mesh after drying, W 2 : The initial weight of the metal mesh)
(Et(270)之測定) 使用高壓水銀紫外線照射機,以累計強度成為3000 mJ/cm2 之方式自所獲得之黏著帶之基材膜側對黏著帶表面照射405 nm之紫外線,使紫外線硬化型黏著劑層交聯、硬化。其次,以長邊與黏著帶製造時之行進方向一致之方式使用衝壓刃進行衝壓,藉此製作5 mm×35 mm之試驗片。將所獲得之試驗片浸漬於液態氮中,冷卻至-50℃,其後,使用黏彈性譜儀(DVA-200、IT Meter. and Control, Inc.製造),於定速升溫拉伸模式、升溫速度10℃/分鐘、頻率10 Hz之條件升溫至300℃,測定拉伸彈性模數。將此時於溫度X℃下之拉伸彈性模數(E')之值設為Et(X)。即,將於溫度270℃下之拉伸彈性模數(E')之值設為Et(270)。(Measurement of Et(270)) Using a high-pressure mercury ultraviolet irradiation machine, irradiate 405 nm of ultraviolet rays on the surface of the adhesive tape from the base film side of the adhesive tape so that the cumulative intensity becomes 3000 mJ/cm 2 to harden the ultraviolet rays Type adhesive layer is cross-linked and hardened. Secondly, press with a punching blade in such a way that the long side is consistent with the direction of travel when the adhesive tape is manufactured, thereby making a 5 mm×35 mm test piece. The obtained test piece was immersed in liquid nitrogen and cooled to -50°C. After that, a viscoelastic spectrometer (DVA-200, manufactured by IT Meter. and Control, Inc.) was used in a constant-rate heating and stretching mode, The temperature is raised to 300°C under the conditions of a heating rate of 10°C/min and a frequency of 10 Hz, and the tensile elastic modulus is measured. The value of the tensile modulus (E') at the temperature X°C at this time is set to Et(X). That is, the value of the tensile modulus (E') at a temperature of 270°C is set to Et(270).
(Et(270)/Et(200)之算出) 對所獲得之黏著帶利用與Et(270)相同之方法,測定於200℃下之黏著帶之拉伸彈性模數(Et(200))。根據所獲得之Et(270)及Et(200)之結果算出Et(270)/Et(200)。(Calculation of Et(270)/Et(200)) Using the same method as Et (270) for the obtained adhesive tape, the tensile elastic modulus (Et (200)) of the adhesive tape at 200°C was measured. Calculate Et(270)/Et(200) based on the obtained Et(270) and Et(200) results.
(重量減少率之測定) 使用高壓水銀紫外線照射機,以累計強度成為3000 mJ/cm2 之方式自所獲得之黏著帶之基材膜側對黏著帶表面照射405 nm之紫外線,使紫外線硬化型黏著劑層交聯、硬化。其次,將黏著帶衝壓成5 mm之圓狀而獲得測定樣本。測定所獲得之測定樣本之重量,使用示差熱熱重量同時測定裝置(TG-DTA;STA7200,日立高新技術科技股份有限公司製造),測定以升溫速度5℃/min自25℃升溫至280℃後保持10分鐘後之重量減少量。根據加熱前後之重量算出重量減少率。(Measurement of weight loss rate) Using a high-pressure mercury ultraviolet irradiation machine, 405 nm ultraviolet rays are irradiated to the surface of the adhesive tape from the base film side of the obtained adhesive tape so that the cumulative intensity becomes 3000 mJ/cm 2 to make the ultraviolet hardening type The adhesive layer is cross-linked and hardened. Secondly, stamp the adhesive tape into 5 mm round shape to obtain a measurement sample. Measure the weight of the obtained measurement sample using a differential thermogravimetric simultaneous measurement device (TG-DTA; STA7200, manufactured by Hitachi High-Technology Co., Ltd.), and measure the temperature from 25°C to 280°C at a heating rate of 5°C/min The weight loss after keeping for 10 minutes. Calculate the weight loss rate based on the weight before and after heating.
(實施例2~10、比較例1~4) 除如表1所示變更基材膜之材料及厚度、紫外線硬化型黏著劑層之組成以外,以與實施例1相同之方式獲得黏著帶,進行各測定。將各材料之詳細示於以下。再者,於實施例5中,使用以下所示之紫外線硬化型黏著劑B。 (1)基材膜之材料 EXPEEK:芳香族聚醚醚酮、Kurabo公司製造 Upilex:聯苯四羧酸二酐與對苯二胺之共聚物、宇部興產公司製造 Torcena:特殊聚酯、Kurabo公司製造 Kapton:均苯四甲酸二酐與二胺基二苯醚之共聚物、東麗杜邦公司製造(Examples 2 to 10, Comparative Examples 1 to 4) Except that the material and thickness of the base film, and the composition of the ultraviolet-curing adhesive layer were changed as shown in Table 1, an adhesive tape was obtained in the same manner as in Example 1, and each measurement was performed. The details of each material are shown below. Furthermore, in Example 5, the ultraviolet curable adhesive B shown below was used. (1) Material of base film EXPEEK: Aromatic polyether ether ketone, manufactured by Kurabo Upilex: Copolymer of biphenyltetracarboxylic dianhydride and p-phenylenediamine, manufactured by Ube Industries Co., Ltd. Torcena: Special polyester, manufactured by Kurabo Kapton: Copolymer of pyromellitic dianhydride and diaminodiphenyl ether, manufactured by Toray DuPont
(2)紫外線硬化型黏著劑B (紫外線硬化型黏著劑B之製造) 準備具備溫度計、攪拌機、冷卻管之反應器,向該反應器內添加作為(甲基)丙烯酸烷基酯之丙烯酸-2-乙基己酯94重量份、作為含官能基單體之甲基丙烯酸羥基乙酯6重量份、月桂硫醇0.01重量份、及乙酸乙酯80重量份之後,對反應器進行加熱而開始回流。繼而,向上述反應器內添加作為聚合起始劑之1,1-雙(三級己基過氧基)-3,3,5-三甲基環己烷0.01重量份,於回流下開始聚合。其次,於聚合開始起1小時後及2小時後,均各添加1,1-雙(三級己基過氧基)-3,3,5-三甲基環己烷0.01重量份,進而,於聚合開始起4小時後添加過氧化特戊酸三級己酯0.05重量份使聚合反應繼續進行。並且,於自聚合開始起8小時後,獲得固形物成分55重量%、重量平均分子量60萬之含官能基(甲基)丙烯酸系聚合物之乙酸乙酯溶液。 對所獲得之含有含官能基(甲基)丙烯酸系聚合物之乙酸乙酯溶液之樹脂固形物成分100重量份添加作為含官能基不飽和化合物之甲基丙烯酸2-異氰酸酯基乙酯1.0重量份進行反應,獲得聚合性聚合物(丙烯酸聚合物)B。其後,對所獲得之丙烯酸聚合物B之乙酸乙酯溶液之樹脂固形物成分100重量份混合脫模劑(聚矽氧)20重量份、填料3重量份、丙烯酸胺酯10重量份、交聯劑0.2重量份、光聚合起始劑1重量份,獲得紫外線硬化型黏著劑B之乙酸乙酯溶液。再者,脫模劑(聚矽氧)、填料、丙烯酸胺酯、交聯劑、光聚合起始劑使用了與紫外線硬化型黏著劑A同種類之物質。(2) Ultraviolet curing adhesive B (Manufacture of UV-curing adhesive B) Prepare a reactor equipped with a thermometer, a stirrer, and a cooling tube, and add 94 parts by weight of 2-ethylhexyl acrylate as an alkyl (meth)acrylate and methacrylic acid as a functional group-containing monomer to the reactor After 6 parts by weight of hydroxyethyl, 0.01 parts by weight of lauryl mercaptan, and 80 parts by weight of ethyl acetate, the reactor was heated to start reflux. Then, 0.01 parts by weight of 1,1-bis(tertiary hexylperoxy)-3,3,5-trimethylcyclohexane as a polymerization initiator was added to the above-mentioned reactor, and polymerization was started under reflux. Next, after 1 hour and 2 hours from the start of the polymerization, 0.01 parts by weight of 1,1-bis(tertiary hexylperoxy)-3,3,5-trimethylcyclohexane were added each, and further, After 4 hours from the start of polymerization, 0.05 parts by weight of tertiary hexyl peroxide pivalate was added to continue the polymerization reaction. And 8 hours after the start of the polymerization, an ethyl acetate solution of a functional group-containing (meth)acrylic polymer with a solid content of 55% by weight and a weight average molecular weight of 600,000 was obtained. To 100 parts by weight of the resin solid content of the ethyl acetate solution containing a functional group-containing (meth)acrylic polymer, 1.0 part by weight of 2-isocyanatoethyl methacrylate was added as a functional group-containing unsaturated compound The reaction proceeds to obtain a polymerizable polymer (acrylic polymer) B. Thereafter, 100 parts by weight of the resin solid content of the ethyl acetate solution of acrylic polymer B obtained were mixed with 20 parts by weight of release agent (polysiloxane), 3 parts by weight of filler, 10 parts by weight of urethane acrylate, and 0.2 parts by weight of the coupling agent and 1 part by weight of the photopolymerization initiator were used to obtain an ethyl acetate solution of the ultraviolet-curing adhesive B. In addition, the mold release agent (polysiloxane), filler, urethane acrylate, crosslinking agent, and photopolymerization initiator are the same types of UV-curing adhesive A.
(3)其他 光敏劑:KAYACURE DETX-S、日本化藥公司製造(3) Other Photosensitizer: KAYACURE DETX-S, manufactured by Nippon Kayaku
<評價> 對實施例及比較例中所獲得之黏著帶,藉由以下方法進行了評價。將結果示於表1。<Evaluation> The adhesive tapes obtained in Examples and Comparative Examples were evaluated by the following methods. The results are shown in Table 1.
(耐熱性之評價) 將切斷成直徑20 cm之圓形之黏著帶之紫外線硬化型黏著劑層側貼附於直徑20 cm、厚度約750 μm之矽晶圓。其次,將黏著帶之黏著劑層側貼附於直徑20 cm、厚度0.6 mm之玻璃晶圓(Tempax、SCHOTT公司製造)。貼附後,於利用濾波器截斷365 nm以下之波長之狀態下,以累計強度成為3000 mJ/cm2 之方式自玻璃晶圓面側對紫外線硬化型黏著劑層照射405 nm之波長之紫外線光,使紫外線硬化型黏著劑層及黏著劑層交聯、硬化。將所獲得之矽晶圓/黏著帶/玻璃晶圓之積層體以矽晶圓側朝下之方式載置於設定為280℃之加熱板(NINOSND-3H、AZONE公司製造)上,測定直至產生黏著帶之剝離之時間。(Evaluation of heat resistance) The ultraviolet-curable adhesive layer side of the adhesive tape cut into a circle with a diameter of 20 cm is attached to a silicon wafer with a diameter of 20 cm and a thickness of about 750 μm. Next, attach the adhesive layer side of the adhesive tape to a glass wafer with a diameter of 20 cm and a thickness of 0.6 mm (manufactured by Tempax, SCHOTT). After attaching, irradiate the UV-curing adhesive layer with 405 nm wavelength ultraviolet light from the glass wafer surface side with the filter to cut off the wavelength below 365 nm with a cumulative intensity of 3000 mJ/cm 2 , Cross-link and harden the UV-curing adhesive layer and adhesive layer. Place the obtained laminate of silicon wafer/adhesive tape/glass wafer with the silicon wafer side down on a heating plate (NINOSND-3H, manufactured by AZONE) set at 280°C, and measure until it is produced The peeling time of the adhesive tape.
(剝離性之評價) 將黏著帶之紫外線硬化型黏著劑層側與直徑20 cm、厚度約750 μm之矽晶圓貼合,進而,將黏著劑層側貼於附直徑20 cm、厚度0.6 mm之玻璃晶圓,獲得積層體。其次,使用高壓水銀紫外線照射機,自玻璃晶圓側照射30秒405 nm之紫外線,調節照度以使對黏著帶之黏著帶表面之照射強度成為100 mW/cm2 ,使紫外線硬化型黏著劑層及黏著劑層交聯、硬化。其後,以矽晶圓側朝下之方式將積層體載置於設定為280℃之加熱板上,進行10分鐘之熱處理並冷卻。冷卻後,將黏著帶自矽晶圓剝離。將於剝離時能夠容易剝離黏著帶之情形標記為「○」,將無法剝離之情形標記為「×」,以此評價剝離性。再者,黏著帶於10分鐘以內剝離之情形時,於剝離之階段停止熱處理,對冷卻後之剝離性進行評價。(Evaluation of peelability) The UV-curable adhesive layer side of the adhesive tape was bonded to a silicon wafer with a diameter of 20 cm and a thickness of approximately 750 μm, and the adhesive layer side was attached to the adhesive tape with a diameter of 20 cm and a thickness of 0.6 mm Of the glass wafers to obtain a laminate. Secondly, use a high-pressure mercury ultraviolet irradiation machine to irradiate 405 nm ultraviolet rays from the glass wafer side for 30 seconds, adjust the illuminance so that the irradiation intensity on the adhesive tape surface of the adhesive tape becomes 100 mW/cm 2 , and the ultraviolet-curing adhesive layer And the adhesive layer is cross-linked and hardened. After that, the laminate was placed on a hot plate set at 280°C with the silicon wafer side facing down, and heat-treated for 10 minutes and cooled. After cooling, the adhesive tape is peeled from the silicon wafer. The case where the adhesive tape can be easily peeled off is marked as "○", and the case where it cannot be peeled is marked as "×" to evaluate the peelability. In addition, when the adhesive tape is peeled within 10 minutes, the heat treatment is stopped during the peeling stage, and the peelability after cooling is evaluated.
(糊劑殘留之評價) 於剝離性之評價中,利用光學顯微鏡觀察黏著帶剝離後之矽晶圓,將糊劑殘留之面積未達矽晶圓全體之5%之情形標記為「◎」,將糊劑殘留之面積為5%以上未達20%之情形標記為「○」、將糊劑殘留之面積為20%以上且未達50%之情形標記為「△」,將糊劑殘留之面積為50%以上之情形標記為「×」,從而評價糊劑殘留。(Evaluation of paste residue) In the evaluation of peelability, observe the silicon wafer after the adhesive tape has been peeled off with an optical microscope. Mark the case where the area of the paste remains less than 5% of the total silicon wafer as "◎", and the area of the paste remains as If 5% or more and less than 20% are marked as "○", if the area of paste remaining is 20% or more and less than 50% is marked as "△", if the area of paste remaining is more than 50% It is marked with "×" to evaluate the paste residue.
(熱壓合時之剝離性之評價) 將切斷成直徑20cm之圓形之黏著帶之紫外線硬化型黏著劑層側貼附於直徑20cm、厚度50 μm之附凸塊之矽晶圓(凸塊直徑=20 μm、凸塊間距離30 μm、凸塊高度45 μm)之形成有凸塊之面。其次,將黏著帶之黏著劑層側貼附於直徑20 cm、厚度0.6 mm之玻璃晶圓(Tempax、SCHOTT公司製造)。貼附後,於利用濾波器截斷365 nm以下之波長之狀態下,以累計強度成為3000 mJ/cm2 之方式自玻璃晶圓面側對紫外線硬化型黏著劑層照射405 nm之波長之紫外線光,使紫外線硬化型黏著劑層及黏著劑層交聯、硬化。利用設定為200℃之烘箱將所獲得之矽晶圓/黏著帶/玻璃晶圓之積層體以玻璃晶圓側朝下之方式靜置1小時,進行加熱處理。 加熱處理後,使用倒裝芯片接合機(FC6000,SHIBAURA MECHATRONICS CORPORATION製造),將厚度50 μm之單晶矽薄晶圓晶片積層於恢復至常溫之積層體之矽晶圓上。具體而言,於設定為80℃之SUS載置台上,以矽晶圓面朝上之方式吸附積層體,使用頭部尺寸10 mm×10 mm之陶瓷工具積層單晶矽薄晶圓晶片(附有9.8 mm×9.8 mm、厚度50 μm、表面粗糙度未達0.1 μm、厚度25 μm之接合膜)。將積層時之頭部之溫度設為280℃,壓力設為300 N,積層時間設為90秒。 積層單晶矽薄晶圓晶片之後,將黏著帶自矽晶圓剝離。將於剝離時能夠容易剝離黏著帶之情形標記為「○」,將無法剝離之情形標記為「×」,以此評價熱壓合時之剝離性。(Evaluation of peelability during thermocompression bonding) The UV-curable adhesive layer side of the adhesive tape cut into a circle with a diameter of 20 cm is attached to a bumped silicon wafer (convex) with a diameter of 20 cm and a thickness of 50 μm. Block diameter = 20 μm, distance between bumps 30 μm, bump height 45 μm) on the surface where bumps are formed. Next, attach the adhesive layer side of the adhesive tape to a glass wafer with a diameter of 20 cm and a thickness of 0.6 mm (manufactured by Tempax, SCHOTT). After attaching, irradiate the UV-curing adhesive layer with 405 nm wavelength ultraviolet light from the glass wafer surface side with the filter to cut off the wavelength below 365 nm with a cumulative intensity of 3000 mJ/cm 2 , Cross-link and harden the UV-curing adhesive layer and adhesive layer. In an oven set at 200°C, the obtained laminated body of silicon wafer/adhesive tape/glass wafer was allowed to stand for 1 hour with the glass wafer side facing down, and heat treatment was performed. After the heat treatment, using a flip chip bonding machine (FC6000, manufactured by SHIBAURA MECHATRONICS CORPORATION), a single crystal silicon thin wafer with a thickness of 50 μm is laminated on the laminated silicon wafer that is restored to normal temperature. Specifically, on a SUS mounting table set at 80℃, the laminated body is adsorbed with the silicon wafer facing up, and a ceramic tool with a head size of 10 mm×10 mm is used to laminate single crystal silicon thin wafers (attached There are bonding films of 9.8 mm×9.8 mm, thickness 50 μm, surface roughness less than 0.1 μm, thickness 25 μm). Set the temperature of the head during lamination to 280°C, the pressure to 300 N, and the lamination time to 90 seconds. After laminating single-crystal silicon thin wafers, the adhesive tape is peeled from the silicon wafers. The case where the adhesive tape can be easily peeled off during peeling is marked as "○", and the case where it cannot be peeled off is marked as "×" to evaluate the peelability during thermal compression bonding.
(熱壓合時之糊劑殘留之評價) 於熱壓合時之剝離性之評價中,利用光學顯微鏡觀察黏著帶剝離後之矽晶圓。於500 μm見方之範圍內存在之凸塊中,將有糊劑殘留之凸塊為5%以下之情形標記為「◎」,將有糊劑殘留之凸塊多於5%且為20%以下之情形標記為「〇」,將有糊劑殘留之凸塊多於20%且為50%以下之情形標記為「△」,將有糊劑殘留之凸塊多於50%之情形標記為「×」,以此評價熱壓合時之糊劑殘留。(Evaluation of paste residue during hot pressing) In the evaluation of the peelability during thermal compression bonding, an optical microscope was used to observe the silicon wafer after the adhesive tape was peeled off. Among the bumps in the 500 μm square, the bumps with paste residue below 5% are marked as "◎", the bumps with paste residue are more than 5% and less than 20% The situation is marked as "〇", the situation where there are more than 20% of the paste residue and less than 50% is marked as "△", and the situation where the paste residue is more than 50% is marked as " ×" to evaluate the paste residue during hot pressing.
[表1]
根據本發明,能夠提供一種即便於使用在伴隨達到260℃之高溫處理之步驟中之情形時,亦可保護被黏著體,並且可無糊劑殘留地剝離之黏著帶。According to the present invention, it is possible to provide an adhesive tape that can protect an adherend even when it is used in a step accompanied by a high-temperature treatment up to 260° C. and can be peeled off without a paste residue.
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