TW200943521A - Semiconductor integrated circuit - Google Patents
Semiconductor integrated circuitInfo
- Publication number
- TW200943521A TW200943521A TW097141755A TW97141755A TW200943521A TW 200943521 A TW200943521 A TW 200943521A TW 097141755 A TW097141755 A TW 097141755A TW 97141755 A TW97141755 A TW 97141755A TW 200943521 A TW200943521 A TW 200943521A
- Authority
- TW
- Taiwan
- Prior art keywords
- transistor
- output signal
- integrated circuit
- semiconductor integrated
- axis
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/10—Integrated device layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/90—Masterslice integrated circuits
- H10D84/903—Masterslice integrated circuits comprising field effect technology
- H10D84/907—CMOS gate arrays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007317961A JP5126963B2 (ja) | 2007-12-10 | 2007-12-10 | 半導体集積回路 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200943521A true TW200943521A (en) | 2009-10-16 |
Family
ID=40720963
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW097141755A TW200943521A (en) | 2007-12-10 | 2008-10-30 | Semiconductor integrated circuit |
Country Status (4)
Country | Link |
---|---|
US (2) | US7843227B2 (zh) |
JP (1) | JP5126963B2 (zh) |
CN (1) | CN101459171B (zh) |
TW (1) | TW200943521A (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9373623B2 (en) | 2013-12-20 | 2016-06-21 | Taiwan Semiconductor Manufacturing Company Limited | Multi-layer semiconductor structures for fabricating inverter chains |
US9483600B2 (en) * | 2014-03-14 | 2016-11-01 | Qualcomm Incorporated | Multi supply cell arrays for low power designs |
JP6364271B2 (ja) * | 2014-07-25 | 2018-07-25 | ラピスセミコンダクタ株式会社 | 半導体集積回路および回路レイアウト方法 |
US10102327B2 (en) * | 2014-12-31 | 2018-10-16 | Stmicroelectronics, Inc. | Integrated circuit layout wiring for multi-core chips |
CN117765991A (zh) * | 2022-09-26 | 2024-03-26 | 华为技术有限公司 | 一种环形反相器、锁存器、存储电路、存储器及电子设备 |
US20250031456A1 (en) * | 2023-07-20 | 2025-01-23 | Samsung Electronics Co., Ltd. | Cell architecture of semiconductor device including semiconductor cells connected based on backside power distribution network |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3647323B2 (ja) * | 1999-07-30 | 2005-05-11 | 富士通株式会社 | 半導体集積回路 |
JP3526450B2 (ja) * | 2001-10-29 | 2004-05-17 | 株式会社東芝 | 半導体集積回路およびスタンダードセル配置設計方法 |
JP2003309178A (ja) * | 2003-04-11 | 2003-10-31 | Matsushita Electric Ind Co Ltd | 半導体装置のレイアウト構造およびレイアウト設計方法 |
JP2004319855A (ja) | 2003-04-17 | 2004-11-11 | Seiko Epson Corp | レイアウト設計方法、集積回路、及び電子機器 |
JP4778689B2 (ja) * | 2004-06-16 | 2011-09-21 | パナソニック株式会社 | 標準セル、標準セルライブラリおよび半導体集積回路 |
JP4633447B2 (ja) * | 2004-11-17 | 2011-02-16 | ルネサスエレクトロニクス株式会社 | 半導体装置及び半導体装置の製造方法 |
JP2007073709A (ja) * | 2005-09-06 | 2007-03-22 | Nec Electronics Corp | 半導体装置 |
TWI370678B (en) * | 2006-02-15 | 2012-08-11 | Sony Corp | Solid-state image-capturing device, driving method thereof, camera, electric charge transfer device, driving method and driving device for driving load, and electronic equipment |
JP2008153435A (ja) * | 2006-12-18 | 2008-07-03 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
-
2007
- 2007-12-10 JP JP2007317961A patent/JP5126963B2/ja not_active Expired - Fee Related
-
2008
- 2008-10-30 TW TW097141755A patent/TW200943521A/zh unknown
- 2008-11-24 CN CN2008101781370A patent/CN101459171B/zh not_active Expired - Fee Related
- 2008-12-09 US US12/331,051 patent/US7843227B2/en not_active Expired - Fee Related
-
2010
- 2010-10-29 US US12/916,175 patent/US8076957B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20110043292A1 (en) | 2011-02-24 |
JP5126963B2 (ja) | 2013-01-23 |
US20090146693A1 (en) | 2009-06-11 |
CN101459171B (zh) | 2013-11-06 |
US8076957B2 (en) | 2011-12-13 |
US7843227B2 (en) | 2010-11-30 |
CN101459171A (zh) | 2009-06-17 |
JP2009141238A (ja) | 2009-06-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
TW200943521A (en) | Semiconductor integrated circuit | |
WO2008116038A3 (en) | Cascode circuit employing a depletion-mode, gan-based fet | |
TW200705624A (en) | Laminated semiconductor package | |
TW200717773A (en) | Method for forming integrated circuit utilizing dual semiconductors | |
EP1533901A3 (en) | CMOS circuits with protection for a single event upset | |
JP2008543079A5 (zh) | ||
TW200634974A (en) | Semiconductor device and manufacturing method thereof | |
TW200710925A (en) | Method for optimising transistor performance in integrated circuits | |
TW200737383A (en) | Substrate with built-in chip and method for manufacturing substrate with built-in chip | |
TW200737699A (en) | Voltage level shift circuit and semiconductor integrated circuit | |
JP2007243946A5 (zh) | ||
HK1149644A1 (zh) | 低相位噪音放大器電路 | |
TW200715352A (en) | Exclusion zone for stress-sensitive circuit design | |
TW200727451A (en) | Cascode circuit | |
WO2009041304A8 (ja) | 発振回路 | |
WO2005027216A3 (en) | Electronic devices | |
EP2544367A3 (en) | Semiconductor integrated circuit | |
WO2009027468A3 (en) | Signal level converter | |
JP2007096036A5 (zh) | ||
WO2008147950A3 (en) | Low on resistance cmos transistor for integrated circuit applications | |
JP2011004309A5 (ja) | 差動信号受信回路 | |
TW200608567A (en) | High voltage tolerance output stage | |
TW200802869A (en) | Efficient transistor structure | |
TW200600999A (en) | Common-drain junction field effect transistor device of single chip and its application | |
TW200721437A (en) | Method of linearizing ESD capacitance |