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SG119174A1 - Method and apparatus for inspecting display base plate - Google Patents

Method and apparatus for inspecting display base plate

Info

Publication number
SG119174A1
SG119174A1 SG200301150A SG200301150A SG119174A1 SG 119174 A1 SG119174 A1 SG 119174A1 SG 200301150 A SG200301150 A SG 200301150A SG 200301150 A SG200301150 A SG 200301150A SG 119174 A1 SG119174 A1 SG 119174A1
Authority
SG
Singapore
Prior art keywords
base plate
display base
inspecting display
inspecting
plate
Prior art date
Application number
SG200301150A
Inventor
Anzai Masayuki
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of SG119174A1 publication Critical patent/SG119174A1/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
SG200301150A 2002-11-18 2003-03-05 Method and apparatus for inspecting display base plate SG119174A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002333450A JP2004170495A (en) 2002-11-18 2002-11-18 Display substrate inspection method and apparatus

Publications (1)

Publication Number Publication Date
SG119174A1 true SG119174A1 (en) 2006-02-28

Family

ID=32588052

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200301150A SG119174A1 (en) 2002-11-18 2003-03-05 Method and apparatus for inspecting display base plate

Country Status (5)

Country Link
JP (1) JP2004170495A (en)
KR (1) KR20040044071A (en)
CN (1) CN1249426C (en)
SG (1) SG119174A1 (en)
TW (1) TW571079B (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100722223B1 (en) * 2004-12-11 2007-05-29 주식회사 매크론 Apparatus for inspecting back light unit
JP4884738B2 (en) * 2005-09-26 2012-02-29 株式会社日本マイクロニクス LCD panel inspection equipment
JP5051874B2 (en) * 2006-01-11 2012-10-17 日東電工株式会社 Laminated film manufacturing method, laminated film defect detection method, laminated film defect detection apparatus
KR100783309B1 (en) * 2006-02-15 2007-12-10 주식회사 동진쎄미켐 Inspection system of flat panel display
TWI409450B (en) * 2006-05-04 2013-09-21 Au Optronics Corp Optical metrology mechanism
JP4842034B2 (en) * 2006-07-12 2011-12-21 株式会社日本マイクロニクス Liquid crystal panel inspection method and image processing apparatus
KR100834730B1 (en) * 2006-09-04 2008-06-05 케이 이엔지(주) Defect Inspection System of Liquid Crystal Display Panel Using Vision Sensor System
JP4960161B2 (en) * 2006-10-11 2012-06-27 日東電工株式会社 Inspection data processing apparatus and inspection data processing method
KR101286534B1 (en) 2008-02-29 2013-07-16 엘지디스플레이 주식회사 inspection apparatus of Liquid crystal display apparatus and inspection method using the same
TWI376500B (en) 2008-03-28 2012-11-11 Ind Tech Res Inst System for detecting defect of panel device
CN101825781B (en) * 2009-03-06 2012-02-29 北京京东方光电科技有限公司 Optical testing device
CN102914889B (en) * 2012-11-15 2016-05-04 昆山迈致治具科技有限公司 LCD measurement jig
TWI502186B (en) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method
KR102250032B1 (en) * 2014-12-29 2021-05-12 삼성디스플레이 주식회사 Detecting device of display device and detecting method of display device
CN105806850A (en) * 2016-03-10 2016-07-27 惠州高视科技有限公司 LCD (Liquid Crystal Display) glass defect detection device and LCD (Liquid Crystal Display) glass defect detection method
CN106444105A (en) * 2016-10-18 2017-02-22 凌云光技术集团有限责任公司 Method, device and system for detecting defects of liquid crystal screen
CN107515222A (en) * 2017-09-20 2017-12-26 哈尔滨工程大学 An ice microstructure observation device
JP6834903B2 (en) * 2017-10-20 2021-02-24 トヨタ自動車株式会社 Inspection equipment and inspection equipment failure confirmation method
CN108267453B (en) * 2017-12-20 2021-05-25 张家港康得新光电材料有限公司 Defect detection method of switchable 3D module
JP7051445B2 (en) * 2018-01-10 2022-04-11 日東電工株式会社 Continuous inspection method and continuous inspection device for optical display panel, and continuous manufacturing method and continuous manufacturing system for optical display panel.
CN109632829B (en) * 2018-12-26 2021-09-24 江苏宏芯亿泰智能装备有限公司 Glass substrate macroscopic inspection device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03217817A (en) * 1990-01-24 1991-09-25 Nippon Maikuronikusu:Kk Method and device for inspecting liquid crystal dpsplay panel
JPH09257641A (en) * 1996-03-26 1997-10-03 Seiko Epson Corp Method and apparatus for inspecting display surface of liquid crystal panel
US5734158A (en) * 1995-04-24 1998-03-31 Advantest Corp. LCD panel test apparatus
WO1998015871A1 (en) * 1996-10-07 1998-04-16 Hitachi, Ltd. Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method
JPH10160628A (en) * 1996-11-29 1998-06-19 Advantest Corp Image quality inspection device for lcd panel
JP2000010064A (en) * 1998-06-25 2000-01-14 Seiko Epson Corp Liquid crystal display panel inspection apparatus and liquid crystal display panel inspection method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61178648A (en) * 1985-02-04 1986-08-11 Seiko Epson Corp Liquid crystal display element inspection equipment
JPH07146253A (en) * 1993-11-25 1995-06-06 Sekisui Chem Co Ltd Tester for adhesive polarizing film

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03217817A (en) * 1990-01-24 1991-09-25 Nippon Maikuronikusu:Kk Method and device for inspecting liquid crystal dpsplay panel
US5734158A (en) * 1995-04-24 1998-03-31 Advantest Corp. LCD panel test apparatus
JPH09257641A (en) * 1996-03-26 1997-10-03 Seiko Epson Corp Method and apparatus for inspecting display surface of liquid crystal panel
WO1998015871A1 (en) * 1996-10-07 1998-04-16 Hitachi, Ltd. Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method
JPH10160628A (en) * 1996-11-29 1998-06-19 Advantest Corp Image quality inspection device for lcd panel
JP2000010064A (en) * 1998-06-25 2000-01-14 Seiko Epson Corp Liquid crystal display panel inspection apparatus and liquid crystal display panel inspection method

Also Published As

Publication number Publication date
CN1501073A (en) 2004-06-02
JP2004170495A (en) 2004-06-17
TW571079B (en) 2004-01-11
TW200408800A (en) 2004-06-01
CN1249426C (en) 2006-04-05
KR20040044071A (en) 2004-05-27

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