[go: up one dir, main page]

LU100945B1 - Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system - Google Patents

Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system Download PDF

Info

Publication number
LU100945B1
LU100945B1 LU100945A LU100945A LU100945B1 LU 100945 B1 LU100945 B1 LU 100945B1 LU 100945 A LU100945 A LU 100945A LU 100945 A LU100945 A LU 100945A LU 100945 B1 LU100945 B1 LU 100945B1
Authority
LU
Luxembourg
Prior art keywords
layer
rubber
rubber article
operating parameter
extruding
Prior art date
Application number
LU100945A
Other languages
German (de)
Inventor
Andre Louis
Arjan Ottink
Original Assignee
Apollo Tyres Global R & D Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Apollo Tyres Global R & D Bv filed Critical Apollo Tyres Global R & D Bv
Priority to LU100945A priority Critical patent/LU100945B1/en
Application granted granted Critical
Publication of LU100945B1 publication Critical patent/LU100945B1/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25—Component parts, details or accessories; Auxiliary operations
    • B29C48/92—Measuring, controlling or regulating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/022—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor characterised by the choice of material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92009—Measured parameter
    • B29C2948/92114—Dimensions
    • B29C2948/92152—Thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92323—Location or phase of measurement
    • B29C2948/92447—Moulded article
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92514—Pressure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/9258—Velocity
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/9258—Velocity
    • B29C2948/9259—Angular velocity
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/9258—Velocity
    • B29C2948/926—Flow or feed rate
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92704—Temperature
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92819—Location or phase of control
    • B29C2948/92857—Extrusion unit
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
    • B29K2007/00—Use of natural rubber as moulding material
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
    • B29L2009/00—Layered products
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29L—INDEXING SCHEME ASSOCIATED WITH SUBCLASS B29C, RELATING TO PARTICULAR ARTICLES
    • B29L2030/00—Pneumatic or solid tyres or parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Extrusion Moulding Of Plastics Or The Like (AREA)

Abstract

The present invention relates to a method for controlling a layer thickness of at least one layer (16, 18) of a layer-system based rubber article (14) by adjusting at least one operating parameter (v1, v2, T, p) of an extrusion device (12) for extruding said rubber article (14), wherein the current thickness (LT1, LT2) of the at least one layer (16, 18) is measured by use of a terahertz time-domain spectroscopic measurement and the at least one operating parameter (v1, v2, T, P) is adjusted as a function of the result of said terahertz time-domain spectroscopic measurement. The present invention further relates to a corresponding computer program product, a corresponding control device (20) and a corresponding extruding system (10) for extruding a layer- system based rubber article (14).

Description

AD 41799 (P075-THZ-P) + _1- LU100945 Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system The present invention relates to a method and a control system for controlling a layer thickness of at least one layer of a layer-system based rubber article by adjusting at least one operating parameter of an extrusion device for extruding said rubber article. The present invention further relates to a corresponding computer program product and a corresponding extruding system for extruding a layer-system based rubber article. Such layer-system based rubber articles are, e.g., intermediates in tire manufacture. Not only is the overall thickness of such rubber articles important, but also the thickness of the individual layers of the layer-system.
EP 2 376 902 B1 concerns a method and an apparatus for controlling the production of a moving product exciting from a manufacturing apparatus, wherein the moving product is made of an elastomeric material and has at least one layer, the method comprising a step of performing an NMR measurement of the moving product.
US 8 679 019 B2 concerns a method for measuring thicknesses of materials of multilayered structures using ultrasound technique.
EP 3 317 070 Al concerns a method for determining at least one layer property of a layer to be determined, in particular of a foam layer, in an extrusion process, wherein a feed material is at least partially foamed and an extrusion product having the foam layer is output.
WO02017/178009 Al discloses a terahertz measuring apparatus for measuring test objects with a THz transmission and reception unit. The test object might be, e.g., a tube-like test object from a material like rubber material.
The present invention has the object to provide improved measures for controlling a layer thickness of at least one layer of a layer-system based rubber article.
This object is achieved by a method for controlling a layer thickness according to claim 1, a computer program product according to claim 7, a control system according to claim 8 and a corresponding extruding system according to claim 12. Advantageous embodiments are the subject of dependent claims. They may be combined freely unless the context clearly indicates otherwise. Hence, a method for controlling a layer thickness of at least one layer of a layer-system based rubber article by adjusting at least one operating parameter of an extrusion device for extruding EEE |
AD 41799 (P075-THZ-P) ? -2- LU100945 said rubber article is provided, wherein the current thickness of the at least one layer is measured by use of a terahertz time-domain spectroscopic measurement and the at least one operating parameter is adjusted as a function of the result of said terahertz time-domain spectroscopic measurement.
By appropriate evaluation, the thickness of the individual layers as well as the total thickness of the layer-system can be determined from the THz signal in a relatively simple manner.
The rubber article consists essentially of rubber materials.
The rubber materials can e.g. be from the following group of rubber materials: styrene butadiene rubber (SBR), butadiene rubber (BR), isoprene rubber (IR), natural rubber (NR), liquid butadiene rubber, ethylene propylene diene rubber (EPDM) and solution styrene-butadiene rubber (SSBR). The method can be performed by use of a measuring device for performing terahertz time-domain spectroscopic measurements (short: terahertz measuring device) as a sensing element for an extrusion device where non ionizing radiation allows to measure layer thickness by runtime differences of the reflected echoes of the THz pulse si=(c*t)/(2*ni), where si is the layer thickness, c is the speed of light in vacuum and ni is he refractive index of the layer.
Preferably the terahertz time-domain spectroscopic measurement is a terahertz radiation pulse runtime measurement.
In physics, terahertz time-domain spectroscopy (THz-TDS) is a spectroscopic technique in which the properties of matter (in the present case: the rubber articles) are probed with short pulses of terahertz radiation.
The generation and detection scheme is sensitive to the sample's effect on both the amplitude and the phase of the terahertz radiation.
By measuring in the time-domain, the technique can provide more information than conventional Fourier- transform spectroscopy, which is only sensitive to the amplitude.
Since the time-domain, and consequently the frequency-domain, of the THz signal is available, the distorting effect of the diffraction can be mitigated and the resolution of the THz images can be enhanced substantially.
According to another embodiment of the method the terahertz time-domain spectroscopic measurement is performed by use of a measuring device for performing terahertz time-domain spectroscopic measurements by means of a transmitting unit and a receiving unit.
In another embodiment of the method at least one operating parameter is from the group of the following parameter types: an operating temperature of at least one component of the extrusion device, 77 Em es
AD 41799 (P075-THZ-P) 1 I 3 _ LU100945 an operating pressure used in the extrusion device, and an operating parameter linked to the supply velocity of at least one supply unit for supplying a component of the rubber article, especially a component for forming the layer or at least one of the layers.
According to just another embodiment of the method the rubber article is an intermediate in tire manufacture.
In another embodiment of the method the rubber material of the layers is from the group of the following materials: styrene butadiene rubber (SBR), butadiene rubber (BR), isoprene rubber (IR), natural rubber (NR), liquid butadiene rubber, ethylene propylene diene rubber (EPDM) and solution styrene-butadiene rubber (SSBR). The present invention is further directed towards a computer program product comprising computer-executable program code portions configured to execute the aforementioned method when loaded into a processor of a computer-based control device.
The present invention is further directed towards a control system for controlling a layer thickness of at least one layer of a layer-system based rubber article by adjusting at least one operating parameter of an extrusion device for extruding said rubber article, wherein the control system comprises: a measuring device for measuring the layer thickness of the at least one layer by use of terahertz time-domain spectroscopic measurements and a control device for adjusting the at least one operating parameter as a function of the result of said terahertz time-domain spectroscopic measurement.
The control device controls the extrusion device with corresponding output signals.
Said control device preferably is a computer-based control device.
The features mentioned in connection with the aforementioned embodiments of the method also apply correspondingly to the control system.
In an embodiment of the control system the measuring device a measuring device for performing a terahertz radiation pulse runtime measurement.
According to another embodiment of the control system the measuring device is a measuring device for performing a terahertz radiation pulse runtime measurement. nice
AD 41799 (P075-THZ-P ? _ 4 _ LU100945 In another embodiment the measuring device comprises a transmitting unit and a receiving unit.
In another embodiment the at least one operating parameter is from the group of the following parameter types: an operating temperature of at least one component of the extrusion device , an operating pressure used in the extrusion device, especially at the extrusion die, and an operating parameter linked to the supply velocity of at least one supply unit for supplying a component of the rubber article, especially a component for forming the layer or at least one of the layers.
Finally, the present invention is further directed towards an extruding system for extruding a layer- system based rubber article with an adjustable layer thickness of at least one layer of said rubber article, wherein the extruding system comprises: an extrusion device arranged for determining the layer thickness of the at least one layer as a function of at least one operating parameter of said extrusion device and an aforementioned control system.
The present invention will be further described with reference to the following figures and examples without wishing to be limited by them.
FIG. 1 shows an extruding system for extruding a layer-system based rubber article, and FIG. 2 shows a measured THz signal with the detected echoes of a rubber article.
FIG. 1 shows an extruding system 10 in a schematic representation.
The central component of the extruding system 10 is an extrusion device 12 for extruding layer-system based rubber articles 12 as an extrusion product.
The extruding system 10 is an extruding system 10 for extruding layer-system based rubber articles 14 with adjustable layer thickness LT1, LT2 of one or more layers 16, 18 of said rubber article 12. For this purpose (and in addition to said extruding device 12) the extruding system 10 further comprises a control system 20 for controlling the layer thickness of the at least one layer 16, 18 of the layer-system based rubber article 14 extruded from said extrusion device 12. In the example shown in FIG.1 the layer-system of the rubber article 14 has only two layers 16, 18. The rubber articles in tire manufacture are mostly based on a layer system with 4 — 6 layers.
Such layer-system based rubber articles 12 are, e.g., intermediates in tire manufacture.
In tire manufacturing not only EEE |
AD 41799 (P075-THZ-P) : os.
LU100945 the overall thickness of such rubber articles is important, but also the thickness of the individual layers of the layer-based system.
The control system 20 comprises a measuring device 22 for measuring the layer thickness LTT, LT2 of the at least one layer 16, 18 by use of terahertz time-domain spectroscopic measurements and a control device 24 for adjusting the at least one operating parameter v1, v2, T, P of the extrusion device 12 as a function of the result of said terahertz time-domain spectroscopic measurement. The control device 24 controls the extrusion device 12 with corresponding output signals. The measuring device 22 comprises a transmitting unit 26 for transmitting short pulses of terahertz radiation and a receiving unit 28 for receiving the pulses reflected at the surfaces and/or interfaces of the layers 16, 18. The measuring process can be performed by use of the measuring device 22 for performing terahertz time-domain spectroscopic measurements (short: terahertz measuring device) as a sensing element for the extrusion device 12 where corresponding radiation allows to measure layer thickness by runtime differences of the reflected echoes of the THz pulse si=(c*t)/(2*ni), where si is the corresponding layer thickness LT1, LT2, c is the speed of light in vacuum and ni is he refractive index of the corresponding layer 16, 18. Preferably the terahertz time-domain spectroscopic measurement is a terahertz radiation pulse runtime measurement. Terahertz time-domain spectroscopy (THz-TDS) is a spectroscopic technique in which the properties of matter (in the present case: the rubber articles 14) are probed with short pulses of terahertz radiation. The generation and detection scheme is sensitive to the sample's effect on both the amplitude and the phase of the terahertz radiation. By measuring in the time-domain, the technique can provide more information than conventional Fourier-transform spectroscopy, which is only sensitive to the amplitude. Since the time-domain, and consequently the frequency-domain, of the THz signal is available, the distorting effect of the diffraction can be mitigated and the resolution of the THz images can be enhanced substantially. The extrusion device comprises different components like an extrusion die 30, two supply units 32, 34, each for supplying at least one component for forming a corresponding layer 16, 18 of the rubber article 14. The layer material for the layers 16, 18 is supported by the corresponding support unit 32, 34 with a support velocity v1, v2. There are various operating parameters for operating the extrusion device 12. The extrusion device 12 is arranged for determining the layer thickness LT1, LT2 of the at least one layer 16, 18 as a function of at least one of these operating parameters vl, v2, T, p. These are pressure p and ee
AD 41799 (P075-THZ-P) ? _ 6 _ LU100945 Temperature T of/within the extrusion device 12 and/or the support velocity v1, v2 of the corresponding supply unit 32, 34. An operating parameter linked to the supply velocity v1, v2 of at least one supply unit 30, 32 might be a number of revolutions of a transport roller 36 of the corresponding supply unit 32, 34.
FIG. 1 further shows a time-dependent representation of the corresponding terahertz time-domain spectrum measured with the measuring device 22. Clearly recognizable are the primary pulse PP and the echoes of the pulse PE. FIG. 2 shows a measured THz signal with the detected echoes of a rubber article 14. The echoes correspond to the individual layers 16, 18. All echoes have a sufficient amplitude so that the detection is reliable and the measurement precise.
SEE
AD 41799 (P075-THZ-P) , | 7 LU100945 Reference signs: extruding system 10 extrusion device 12 rubber article 14 layer 16, 18control system 20 measuring device 22 control device 24 transmitting unit 26receiving unit 28 extrusion die 30 supply unit 32,34 roller 36 operating parameter v1, v2, T, player thickness LT1, LT2 primary pulse PP pulse echo PE time t

Claims (12)

AD 41799 (P075-THZ-P + - 8 - LU100945 Patent claims
1. A method for controlling a layer thickness of at least one layer (16, 18) of a layer-system based rubber article (14) by adjusting at least one operating parameter (vl, v2, T, p) of an extrusion device (12) for extruding said rubber article (14), wherein the current thickness (LT1, LT2) of the at least one layer (16, 18) is measured by use ofa terahertz time-domain spectroscopic measurement and the at least one operating parameter (vl, v2, T, P) is adjusted as a function of the result of said terahertz time-domain spectroscopic measurement.
2. The method according to claim 1, wherein the terahertz time-domain spectroscopic measurement is a terahertz radiation pulse runtime measurement.
3. The method according to claim 1 or 2, wherein the terahertz time-domain spectroscopic measurement is performed by use of a measuring device (22) for performing terahertz time-domain spectroscopic measurements by means of a transmitting unit (26) and a receiving unit (28).
4. The method according to one of the preceding claims, wherein the at least one operating parameter (v1, v2, T, p) is from the group of the following parameter types: an operating temperature (T) of at least one component (30 ,32, 34) of the extrusion device (12), an operating pressure (p) used in the extrusion device (12), especially at the extrusion die (30), and an operating parameter linked to the supply velocity (v1, v2) of at least one supply unit (32, 34) for supplying a component of the rubber article (14), especially a component for forming the layer or at least one of the layers (16, 18).
5. The method according to one of the preceding claims, wherein the rubber article (14) is an intermediate in tire manufacture.
6. The method according to one of the preceding claims, wherein the rubber material of the layers (16, 18) is from the group of the following materials: styrene butadiene rubber, butadiene rubber. isoprene rubber, natural rubber, liquid butadiene rubber, ethylene propylene diene rubber and solution styrene-butadiene rubber.
7. A computer program product comprising computer-executable program code portions having program code instructions configured to execute the method according to one of claims 1 to 6. EE.
AD 41799 (P075-THZ-P) * _ 9 _ LU100945
8. A control system (20) for controlling a layer thickness of at least one layer (16, 18) of a layer- system based rubber article (14) by adjusting at least one operating parameter (v1, v2, T, p) of an extrusion device (12) for extruding said rubber article (14), wherein the control system (20) comprises: a measuring device (22) for measuring the layer thickness (LT1, LT2) of the at least one layer (16, 18) by use of terahertz time-domain spectroscopic measurements and a control device (24) for adjusting the at least one operating parameter (v1, v2, T, p) as a function of the result of said terahertz time-domain spectroscopic measurement.
9. The control system (20) according to claim 8, wherein the measuring device (22) is a measuring device (22) for performing a terahertz radiation pulse runtime measurement.
10. The control system (20) according to claim 8 or 9, wherein the measuring device (22) comprises a transmitting unit (26) and a receiving unit (28).
11. The control system (20) according to one of claims 8 to 10, wherein the at least one operating parameter (v1, v2, T, P) is from the group of the following parameter types: an operating temperature (T) of at least one component (30 ‚32, 34) of the extrusion device (12), an operating pressure (p) used in the extrusion device (12), especially at the extrusion die (30), and an operating parameter linked to the supply velocity (v1, v2) of at least one supply unit (32, 34) for | supplying a component of the rubber article (14), especially a component for forming the layer or at least one of the layers (16, 18).
12. An extruding system (10) for extruding a layer-system based rubber article (14) with an adjustable layer thickness (LT1, LT2) of at least one layer (16, 18) of said rubber article (14), wherein the extruding system (10) comprises: an extrusion device (12) arranged for determining the layer thickness (LT1, LT2) of the at least one layer (16, 18) as a function of at least one operating parameter (v1, v2, T, P) of said extrusion device (12); and a control system according to one of claims 8 to 11.
LU100945A 2018-09-28 2018-09-28 Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system LU100945B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
LU100945A LU100945B1 (en) 2018-09-28 2018-09-28 Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
LU100945A LU100945B1 (en) 2018-09-28 2018-09-28 Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system

Publications (1)

Publication Number Publication Date
LU100945B1 true LU100945B1 (en) 2020-03-30

Family

ID=64477243

Family Applications (1)

Application Number Title Priority Date Filing Date
LU100945A LU100945B1 (en) 2018-09-28 2018-09-28 Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system

Country Status (1)

Country Link
LU (1) LU100945B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4331821A1 (en) * 2022-08-30 2024-03-06 The Goodyear Tire & Rubber Company Method and apparatus for terahertz characterization of a multi-layered tire tread
EP4335612A1 (en) * 2022-08-30 2024-03-13 The Goodyear Tire & Rubber Company Tire tread production line and method for manufacturing a tire tread

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009117826A1 (en) * 2008-03-27 2009-10-01 Robert John Rayzak Determining characteristics of electric cables using terahertz radiation
EP2538200A1 (en) * 2010-02-26 2012-12-26 Aisin Seiki Kabushiki Kaisha Coating film inspection apparatus and inspection method
EP2568277A1 (en) * 2011-09-09 2013-03-13 Philipps-Universität Marburg Method for determining the composition of a plasticised elastomer mixture based on at least one polar or non-polar rubber
EP2752287A1 (en) * 2013-01-02 2014-07-09 Proton Products International Limited Apparatus for measuring industrial products manufactured by extrusion techniques
JP6238245B2 (en) * 2015-03-03 2017-11-29 学校法人早稲田大学 Polymer foreign matter inspection method and power cable manufacturing method
EP3266582A1 (en) * 2016-07-04 2018-01-10 Continental Reifen Deutschland GmbH Method for determining material layer thickness in the production of tyre components
EP3311147A1 (en) * 2015-06-19 2018-04-25 Vrije Universiteit Brussel Characterization of multilayer structures

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009117826A1 (en) * 2008-03-27 2009-10-01 Robert John Rayzak Determining characteristics of electric cables using terahertz radiation
EP2538200A1 (en) * 2010-02-26 2012-12-26 Aisin Seiki Kabushiki Kaisha Coating film inspection apparatus and inspection method
EP2568277A1 (en) * 2011-09-09 2013-03-13 Philipps-Universität Marburg Method for determining the composition of a plasticised elastomer mixture based on at least one polar or non-polar rubber
EP2752287A1 (en) * 2013-01-02 2014-07-09 Proton Products International Limited Apparatus for measuring industrial products manufactured by extrusion techniques
JP6238245B2 (en) * 2015-03-03 2017-11-29 学校法人早稲田大学 Polymer foreign matter inspection method and power cable manufacturing method
EP3311147A1 (en) * 2015-06-19 2018-04-25 Vrije Universiteit Brussel Characterization of multilayer structures
EP3266582A1 (en) * 2016-07-04 2018-01-10 Continental Reifen Deutschland GmbH Method for determining material layer thickness in the production of tyre components

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4331821A1 (en) * 2022-08-30 2024-03-06 The Goodyear Tire & Rubber Company Method and apparatus for terahertz characterization of a multi-layered tire tread
EP4335612A1 (en) * 2022-08-30 2024-03-13 The Goodyear Tire & Rubber Company Tire tread production line and method for manufacturing a tire tread

Similar Documents

Publication Publication Date Title
LU100945B1 (en) Method and control system for controlling a layer thickness of at least one layer of a layer-system based rubber article and corresponding extruding system
EP2815206B1 (en) Caliper coating measurement on continuous non-uniform web using thz sensor
EP4325205A3 (en) Method and system for measuring coating thickness
Peters et al. Terahertz spectroscopy for rubber production testing
US20160047753A1 (en) Method and device for testing a tire
CA3017393C (en) Methods and systems for thickness measurement of multilayer structures
CN101514888B (en) Apparatus and method of measuring film thickness
JPH11194089A (en) Determining method of road surface condition
US9797703B2 (en) Non-invasive thickness measurement using resonant frequency shift
RU2011101312A (en) DEVICE FOR PRESSURE MEASUREMENT CONTAINING A MICROELECTROMECHANICAL SYSTEM
WO2010037472A3 (en) Method and system for determining a lithographic process parameter
EP2671044A1 (en) Method and device for determining optical properties by simultaneous measurement of intensities at thin layers using light of several wavelengths
JP5540236B2 (en) Method for measuring weight per unit area and in-plane uniformity
TWI603053B (en) Method for measuring an film thickness measurement apparatus
WO2007130295A3 (en) Method and apparatus for accurate calibration of a reflectometer by using a relative reflectance measurement
Jin et al. Combining point and distributed strain sensor for complementary data-fusion: A multi-fidelity approach
WO2018226449A2 (en) Non-invasive thickness measurement using fixed frequency
US9952081B2 (en) System and method for measuring liquid levels having a fiber with a strain layer around a Bragg grating
GB2488019A (en) Measuring the condition of a carriageway
EP4371627A3 (en) Predictive maintenance of exercise machines with time-of-flight sensors
van Mechelen An industrial THz killer application?
US5837897A (en) Testing vehicle tires
US20230065547A1 (en) Method and apparatus for tread measurement system
US20230288189A1 (en) Thz measurement method and thz measurement device for measuring a measurement object
CA2553339A1 (en) Method for determining colour perception in multi-layer systems

Legal Events

Date Code Title Description
FG Patent granted

Effective date: 20200330