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KR101166839B1 - 액정패널 검사 장치 - Google Patents

액정패널 검사 장치 Download PDF

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Publication number
KR101166839B1
KR101166839B1 KR1020050133975A KR20050133975A KR101166839B1 KR 101166839 B1 KR101166839 B1 KR 101166839B1 KR 1020050133975 A KR1020050133975 A KR 1020050133975A KR 20050133975 A KR20050133975 A KR 20050133975A KR 101166839 B1 KR101166839 B1 KR 101166839B1
Authority
KR
South Korea
Prior art keywords
liquid crystal
crystal panel
heating chamber
cassette
panel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020050133975A
Other languages
English (en)
Korean (ko)
Other versions
KR20070070937A (ko
Inventor
심창보
Original Assignee
엘지디스플레이 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지디스플레이 주식회사 filed Critical 엘지디스플레이 주식회사
Priority to KR1020050133975A priority Critical patent/KR101166839B1/ko
Priority to DE102006023968A priority patent/DE102006023968B4/de
Priority to FR0604953A priority patent/FR2895799B1/fr
Priority to TW095121288A priority patent/TWI312862B/zh
Priority to JP2006171713A priority patent/JP4352063B2/ja
Priority to GB0612734A priority patent/GB2433824B/en
Priority to US11/477,820 priority patent/US7777828B2/en
Priority to CNB2006100943487A priority patent/CN100507641C/zh
Publication of KR20070070937A publication Critical patent/KR20070070937A/ko
Application granted granted Critical
Publication of KR101166839B1 publication Critical patent/KR101166839B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2817—Environmental-, stress-, or burn-in tests
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
KR1020050133975A 2005-12-29 2005-12-29 액정패널 검사 장치 Active KR101166839B1 (ko)

Priority Applications (8)

Application Number Priority Date Filing Date Title
KR1020050133975A KR101166839B1 (ko) 2005-12-29 2005-12-29 액정패널 검사 장치
DE102006023968A DE102006023968B4 (de) 2005-12-29 2006-05-22 Inspektionsvorrichtung für Flüssigkristallanzeigepaneel
FR0604953A FR2895799B1 (fr) 2005-12-29 2006-06-02 Appareil d'inspection de panneaux d'affichage a cristaux liquides.
TW095121288A TWI312862B (en) 2005-12-29 2006-06-14 Inspection apparatus for liquid crystal display panels
JP2006171713A JP4352063B2 (ja) 2005-12-29 2006-06-21 液晶パネル検査装置
GB0612734A GB2433824B (en) 2005-12-29 2006-06-27 Inspection apparatus for liquid crystal display panels
US11/477,820 US7777828B2 (en) 2005-12-29 2006-06-30 Inspection apparatus for liquid crystal display panels
CNB2006100943487A CN100507641C (zh) 2005-12-29 2006-06-30 用于液晶显示板的检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050133975A KR101166839B1 (ko) 2005-12-29 2005-12-29 액정패널 검사 장치

Publications (2)

Publication Number Publication Date
KR20070070937A KR20070070937A (ko) 2007-07-04
KR101166839B1 true KR101166839B1 (ko) 2012-07-19

Family

ID=38213826

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020050133975A Active KR101166839B1 (ko) 2005-12-29 2005-12-29 액정패널 검사 장치

Country Status (2)

Country Link
KR (1) KR101166839B1 (zh)
CN (1) CN100507641C (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102165325B (zh) * 2008-12-16 2013-05-29 株式会社岛津制作所 液晶阵列检查装置、系统、以及其抽真空方法
CN105044951B (zh) * 2015-08-18 2018-01-16 昆山龙腾光电有限公司 基板组立方法
KR102497417B1 (ko) * 2021-01-07 2023-02-08 박병옥 온도를 제어하여 열화 성능을 검사하는 검사 시스템

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW533319B (en) * 1999-11-19 2003-05-21 De & T Co Ltd LCD testing system
JP4163435B2 (ja) * 2002-03-29 2008-10-08 株式会社日本マイクロニクス 被検査基板の検査装置
JP3745750B2 (ja) * 2003-06-27 2006-02-15 東芝テリー株式会社 表示パネルの検査装置および検査方法
JP4490066B2 (ja) * 2003-09-18 2010-06-23 株式会社日本マイクロニクス 表示用パネルの検査装置
JP2005315798A (ja) * 2004-04-30 2005-11-10 Micronics Japan Co Ltd 検査装置

Also Published As

Publication number Publication date
KR20070070937A (ko) 2007-07-04
CN1991445A (zh) 2007-07-04
CN100507641C (zh) 2009-07-01

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