KR100902766B1 - 절연성 세라믹 히트 싱크를 갖는 디스크리트 패키지 - Google Patents
절연성 세라믹 히트 싱크를 갖는 디스크리트 패키지 Download PDFInfo
- Publication number
- KR100902766B1 KR100902766B1 KR1020020058857A KR20020058857A KR100902766B1 KR 100902766 B1 KR100902766 B1 KR 100902766B1 KR 1020020058857 A KR1020020058857 A KR 1020020058857A KR 20020058857 A KR20020058857 A KR 20020058857A KR 100902766 B1 KR100902766 B1 KR 100902766B1
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- South Korea
- Prior art keywords
- lead frame
- frame pad
- ceramic film
- semiconductor chip
- discrete package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000000919 ceramic Substances 0.000 title claims abstract description 46
- 239000004065 semiconductor Substances 0.000 claims abstract description 35
- 239000012778 molding material Substances 0.000 claims abstract description 21
- 238000000034 method Methods 0.000 claims description 14
- 239000000853 adhesive Substances 0.000 claims description 6
- 230000001070 adhesive effect Effects 0.000 claims description 6
- 238000000465 moulding Methods 0.000 claims description 6
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 238000005476 soldering Methods 0.000 description 12
- 239000000758 substrate Substances 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 10
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 7
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 229920006336 epoxy molding compound Polymers 0.000 description 6
- 238000009413 insulation Methods 0.000 description 6
- 239000004593 Epoxy Substances 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 230000017525 heat dissipation Effects 0.000 description 4
- 229910000679 solder Inorganic materials 0.000 description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/433—Auxiliary members in containers characterised by their shape, e.g. pistons
- H01L23/4334—Auxiliary members in encapsulations
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- H—ELECTRICITY
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for individual devices of subclass H10D
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49171—Fan-out arrangements
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- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
- H01L2924/1815—Shape
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
Description
Claims (10)
- 제1 면 및 상기 제1 면과 반대의 제2 면을 갖는 리드 프레임 패드;상기 리드 프레임 패드의 일 측면에 연결된 리드;상기 리드 프레임 패드의 제1 면에 부착된 반도체 칩;상기 리드 프레임 패드의 제2 면에 직접 접촉되도록 배치된 세라믹막; 및상기 리드 프레임 패드, 상기 반도체 칩 및 상기 세라믹막의 일부를 둘러싸면서 상기 리드 및 상기 세라믹막의 상기 반도체 칩이 부착된 면의 반대면 만을 노출시키는 몰딩재를 포함하며,상기 몰딩제에 의해 상기 리드 프레임 패드와 상기 세라믹막 사이의 부착이 지지되는 것을 특징으로 하는 디스크리트 패키지.
- 제1항에 있어서,상기 리드와 상기 리드 프레임 패드는 단차를 갖는 것을 특징으로 하는 디스크리트 패키지.
- 제1항에 있어서,상기 반도체 칩과 상기 리드를 전기적으로 연결시키는 와이어를 더 구비하는 것을 특징으로 하는 디스크리트 패키지.
- 제1항에 있어서,상기 리드 프레임 패드이 두께는 0.5㎜인 것을 특징으로 하는 디스크리트 패키지.
- 제1항에 있어서,상기 리드 프레임 패드와 상기 반도체 칩 사이의 접착제를 더 구비하는 것을 특징으로 하는 디스크리트 패키지.
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020058857A KR100902766B1 (ko) | 2002-09-27 | 2002-09-27 | 절연성 세라믹 히트 싱크를 갖는 디스크리트 패키지 |
US10/672,346 US20040061206A1 (en) | 2002-09-27 | 2003-09-26 | Discrete package having insulated ceramic heat sink |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020058857A KR100902766B1 (ko) | 2002-09-27 | 2002-09-27 | 절연성 세라믹 히트 싱크를 갖는 디스크리트 패키지 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040027110A KR20040027110A (ko) | 2004-04-01 |
KR100902766B1 true KR100902766B1 (ko) | 2009-06-15 |
Family
ID=32026096
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020058857A Expired - Fee Related KR100902766B1 (ko) | 2002-09-27 | 2002-09-27 | 절연성 세라믹 히트 싱크를 갖는 디스크리트 패키지 |
Country Status (2)
Country | Link |
---|---|
US (1) | US20040061206A1 (ko) |
KR (1) | KR100902766B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20220011512A (ko) | 2020-07-21 | 2022-01-28 | 주식회사 세미파워렉스 | 양면냉각형 전력반도체 디스크리트 패키지 |
US11721615B2 (en) | 2020-08-12 | 2023-08-08 | Jmj Korea Co., Ltd. | Coupled semiconductor package |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070013053A1 (en) * | 2005-07-12 | 2007-01-18 | Peter Chou | Semiconductor device and method for manufacturing a semiconductor device |
US8269338B2 (en) * | 2006-08-10 | 2012-09-18 | Vishay General Semiconductor Llc | Semiconductor device having improved heat dissipation capabilities |
EP1936683A1 (en) * | 2006-12-22 | 2008-06-25 | ABB Technology AG | Base plate for a heat sink and electronic device with a base plate |
CN201011655Y (zh) * | 2007-01-10 | 2008-01-23 | 上海凯虹科技电子有限公司 | 一种大功率半导体器件的框架 |
US7740066B2 (en) * | 2008-01-25 | 2010-06-22 | Halliburton Energy Services, Inc. | Additives for high alumina cements and associated methods |
DE102008001413A1 (de) * | 2008-04-28 | 2009-10-29 | Robert Bosch Gmbh | Elektrische Leistungseinheit |
US8455987B1 (en) * | 2009-06-16 | 2013-06-04 | Ixys Corporation | Electrically isolated power semiconductor package with optimized layout |
EP2485256A3 (en) * | 2011-02-08 | 2018-01-03 | ABB Research Ltd. | A semiconductor device |
US9397018B2 (en) * | 2013-01-16 | 2016-07-19 | Infineon Technologies Ag | Chip arrangement, a method for manufacturing a chip arrangement, integrated circuits and a method for manufacturing an integrated circuit |
US9230889B2 (en) | 2013-01-16 | 2016-01-05 | Infineon Technologies Ag | Chip arrangement with low temperature co-fired ceramic and a method for forming a chip arrangement with low temperature co-fired ceramic |
US9385111B2 (en) | 2013-11-22 | 2016-07-05 | Infineon Technologies Austria Ag | Electronic component with electronic chip between redistribution structure and mounting structure |
WO2015104914A1 (ja) * | 2014-01-09 | 2015-07-16 | 日立オートモティブシステムズ株式会社 | 半導体装置並びにそれを用いた電力変換装置 |
US20160088720A1 (en) * | 2014-09-24 | 2016-03-24 | Hiq Solar, Inc. | Transistor thermal and emi management solution for fast edge rate environment |
EP3125290A1 (en) * | 2015-07-31 | 2017-02-01 | Nxp B.V. | Electronic device |
DE102015120396B8 (de) | 2015-11-25 | 2025-04-10 | Infineon Technologies Austria Ag | Halbleiterchip-Package umfassend Seitenwandkennzeichnung |
CN106920781A (zh) * | 2015-12-28 | 2017-07-04 | 意法半导体有限公司 | 半导体封装体和用于形成半导体封装体的方法 |
US10457001B2 (en) * | 2017-04-13 | 2019-10-29 | Infineon Technologies Ag | Method for forming a matrix composite layer and workpiece with a matrix composite layer |
US10622274B2 (en) | 2017-10-06 | 2020-04-14 | Industrial Technology Research Institute | Chip package |
EP3872851B1 (en) | 2020-02-27 | 2025-04-30 | Infineon Technologies Austria AG | Protection cap for package with thermal interface material |
US12224233B2 (en) | 2021-01-27 | 2025-02-11 | Wolfspeed, Inc. | Packaged electronic devices having dielectric substrates with thermally conductive adhesive layers |
JP7528042B2 (ja) * | 2021-09-17 | 2024-08-05 | 株式会社東芝 | 半導体装置 |
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2002
- 2002-09-27 KR KR1020020058857A patent/KR100902766B1/ko not_active Expired - Fee Related
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2003
- 2003-09-26 US US10/672,346 patent/US20040061206A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100218291B1 (ko) * | 1991-12-11 | 1999-09-01 | 구본준 | 세라믹 패들을 이용한 반도체 패키지 및 그 제작방법 |
JPH06209068A (ja) * | 1992-12-29 | 1994-07-26 | Sumitomo Kinzoku Ceramics:Kk | Icパッケージ |
KR20000073868A (ko) * | 1999-05-14 | 2000-12-05 | 마이클 디. 오브라이언 | 반도체 패키지의 열방출장치 |
KR100335658B1 (ko) * | 2000-07-25 | 2002-05-06 | 장석규 | 플라스틱 패캐지의 베이스 및 그 제조방법 |
KR20020048315A (ko) * | 2002-03-16 | 2002-06-22 | 김영선 | 이미지 센서 시스템을 위한 반도체 모듈 패캐지 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20220011512A (ko) | 2020-07-21 | 2022-01-28 | 주식회사 세미파워렉스 | 양면냉각형 전력반도체 디스크리트 패키지 |
US11721615B2 (en) | 2020-08-12 | 2023-08-08 | Jmj Korea Co., Ltd. | Coupled semiconductor package |
Also Published As
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US20040061206A1 (en) | 2004-04-01 |
KR20040027110A (ko) | 2004-04-01 |
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