KR100568466B1 - 웨이퍼전사장치 - Google Patents
웨이퍼전사장치 Download PDFInfo
- Publication number
- KR100568466B1 KR100568466B1 KR1019990033526A KR19990033526A KR100568466B1 KR 100568466 B1 KR100568466 B1 KR 100568466B1 KR 1019990033526 A KR1019990033526 A KR 1019990033526A KR 19990033526 A KR19990033526 A KR 19990033526A KR 100568466 B1 KR100568466 B1 KR 100568466B1
- Authority
- KR
- South Korea
- Prior art keywords
- wafer
- tape
- transfer
- unit
- protective tape
- Prior art date
Links
- 230000001681 protective effect Effects 0.000 claims abstract description 89
- 238000007789 sealing Methods 0.000 claims abstract 2
- 238000000034 method Methods 0.000 claims description 18
- 239000000853 adhesive Substances 0.000 claims description 15
- 230000001070 adhesive effect Effects 0.000 claims description 14
- 238000003860 storage Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims description 7
- 230000004927 fusion Effects 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 abstract description 179
- 239000000969 carrier Substances 0.000 abstract description 4
- 238000001179 sorption measurement Methods 0.000 description 33
- 238000003780 insertion Methods 0.000 description 8
- 230000037431 insertion Effects 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 5
- 239000004820 Pressure-sensitive adhesive Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 240000006394 Sorghum bicolor Species 0.000 description 2
- 235000011684 Sorghum saccharatum Nutrition 0.000 description 2
- 230000001154 acute effect Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
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- 239000002699 waste material Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 240000006829 Ficus sundaica Species 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- -1 polyethylene terephthalate Polymers 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000008542 thermal sensitivity Effects 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67132—Apparatus for placing on an insulating substrate, e.g. tape
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2221/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
- H01L2221/67—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
- H01L2221/683—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L2221/68304—Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L2221/68381—Details of chemical or physical process used for separating the auxiliary support from a device or wafer
- H01L2221/68386—Separation by peeling
- H01L2221/6839—Separation by peeling using peeling wedge or knife or bar
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/141—Associated with semiconductor wafer handling includes means for gripping wafer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/17—Surface bonding means and/or assemblymeans with work feeding or handling means
- Y10T156/1702—For plural parts or plural areas of single part
- Y10T156/1705—Lamina transferred to base from adhered flexible web or sheet type carrier
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T156/00—Adhesive bonding and miscellaneous chemical manufacture
- Y10T156/19—Delaminating means
- Y10T156/1978—Delaminating bending means
- Y10T156/1983—Poking delaminating means
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Dicing (AREA)
- Die Bonding (AREA)
Abstract
Description
Claims (7)
- 다수의 칩으로 분할되고, 표면에 보호테이프가 붙여진 웨이퍼를 링프레임에 전사테이프를 통하여 붙이는웨이퍼전사장치(wafer transfer apparatus)로서,상기 보호테이프가 붙여진 웨이퍼를 위치결정테이블상에 재치하고, 종횡방향 및 회전방향으로 위치조정하여 기준위치에 웨이퍼를 위치결정하는 위치결정유닛과,상기 위치결정유닛에 있어서 소정의 기준위치에 위치결정된 보호테이프가 붙여진 웨이퍼를 전사테이프마운트테이블상에 재치하고, 전사테이프를 해당 웨이퍼의 외주부에 재치된 링프레임과 웨이퍼이면에 동시에 붙여서 링프레임과 일체화하는 전사테이프마운트유닛과,상기 전사테이프마운트유닛에 있어서 웨이퍼이면에 전사테이프가 붙여진 링프레임과 일체로 된 웨이퍼를 보호테이프박리테이블상에 재치하고, 박리테이프의 일단을 웨이퍼표면측의 보호테이프의 일단에 접착하고, 박리테이프를 끌어당김으로써 보호테이프를 웨이퍼표면으로부터 박리하는 보호테이프박리유닛을 구비하고,또한 상기 각 유닛간에서 웨이퍼를 반송하는 반송수단이 웨이퍼 전체면을 흡착하여 반송하도록 구성되어 있는 것을 특징으로 하는 웨이퍼전사장치.
- 제 1 항에 있어서,상기 보호테이프가 자외선경화형의 점착제를 갖는 보호테이프이며, 상기 보호테이프박리유닛에 의해 웨이퍼표면으로부터 보호테이프를 박리하기 전에 보호테이프에 대하여 자외선을 조사하는 자외선조사유닛을 추가로 구비하는 것을 특징으 로 하는 웨이퍼전사장치.
- 제 2 항에 있어서,상기 자외선조사유닛은 웨이퍼가 전사테이프에 붙여지기 전에 자외선조사가 이루어지도록 설치되어 있는 것을 특징으로 하는 웨이퍼전사장치.
- 제 1 항에 있어서,상기 전사테이프가 자외선경화형의 점착제를 갖는 전사테이프이며, 웨이퍼가 링프레임에 전사테이프를 통하여 붙여진 후에 전사테이프에 대하여 자외선을 조사하는 자외선조사유닛을 추가로 구비하는 것을 특징으로 하는 웨이퍼전사장치.
- 제 1 항에서 제 4 항 중 어느 한 항에 있어서,상기 보호테이프박리유닛에 의해 웨이퍼표면으로부터 보호테이프를 박리한, 링프레임과 일체로 된 웨이퍼를 프레임카세트내에 수납하는 수납유닛을 추가로 구비하는 것을 특징으로 하는 웨이퍼전사장치.
- 제 1 항에 있어서,상기 보호테이프박리유닛에서 이용하는 박리테이프가 열융착테이프이며, 박리테이프의 일단을 웨이퍼표면측의 보호테이프의 일단에 열융착에 의해 접착하고, 박리테이프를 끌어당김으로써 보호테이프를 웨이퍼표면으로부터 박리하도록 구성한 것을 특징으로 하는 웨이퍼전사장치.
- 삭제
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23160898A JP3560823B2 (ja) | 1998-08-18 | 1998-08-18 | ウェハ転写装置 |
JP231608/1998 | 1998-08-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20000017308A KR20000017308A (ko) | 2000-03-25 |
KR100568466B1 true KR100568466B1 (ko) | 2006-04-10 |
Family
ID=16926189
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019990033526A KR100568466B1 (ko) | 1998-08-18 | 1999-08-14 | 웨이퍼전사장치 |
Country Status (7)
Country | Link |
---|---|
US (1) | US6238515B1 (ko) |
EP (1) | EP0982762B1 (ko) |
JP (1) | JP3560823B2 (ko) |
KR (1) | KR100568466B1 (ko) |
CN (1) | CN1189916C (ko) |
DE (1) | DE69924680T8 (ko) |
TW (1) | TW418436B (ko) |
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JP2019220513A (ja) * | 2018-06-15 | 2019-12-26 | リンテック株式会社 | シート貼付装置および貼付方法 |
US10796940B2 (en) | 2018-11-05 | 2020-10-06 | Lam Research Corporation | Enhanced automatic wafer centering system and techniques for same |
JP2022527940A (ja) | 2019-03-29 | 2022-06-07 | ラム リサーチ コーポレーション | インデックス付きマルチステーション処理チャンバにおけるウエハ載置の補正 |
US11889742B2 (en) * | 2020-11-04 | 2024-01-30 | Samsung Display Co., Ltd. | Apparatus of manufacturing display device and method of manufacturing display device |
CN118906483B (zh) * | 2024-08-09 | 2025-01-28 | 国华(青岛)智能装备有限公司 | 一种用于提高罗伯特夹上料组装稳定性的装置 |
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GB2157193B (en) * | 1984-04-10 | 1987-08-19 | Nitto Electric Ind Co | Process for peeling protective film off a thin article |
JPS6443458A (en) * | 1987-08-11 | 1989-02-15 | Nitto Denko Corp | Stick cutter for tacky tape with respect to thin board |
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JPH0281456A (ja) * | 1988-09-16 | 1990-03-22 | Nitto Denko Corp | 保護フィルムの剥離方法 |
JPH04336428A (ja) * | 1991-05-13 | 1992-11-24 | Nitto Denko Corp | ウエハのテープ貼合わせ剥離装置 |
JPH05335411A (ja) | 1992-06-02 | 1993-12-17 | Toshiba Corp | ペレットの製造方法 |
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- 1998-08-18 JP JP23160898A patent/JP3560823B2/ja not_active Expired - Lifetime
-
1999
- 1999-08-14 KR KR1019990033526A patent/KR100568466B1/ko active IP Right Grant
- 1999-08-17 TW TW088114000A patent/TW418436B/zh not_active IP Right Cessation
- 1999-08-18 US US09/376,996 patent/US6238515B1/en not_active Expired - Lifetime
- 1999-08-18 CN CNB991179641A patent/CN1189916C/zh not_active Expired - Lifetime
- 1999-08-18 DE DE69924680T patent/DE69924680T8/de active Active
- 1999-08-18 EP EP99306523A patent/EP0982762B1/en not_active Expired - Lifetime
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EP0848415A1 (en) * | 1995-08-31 | 1998-06-17 | Nitto Denko Corporation | Method and apparatus for peeling protective adhesive tape from semiconductor wafer |
Also Published As
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EP0982762A2 (en) | 2000-03-01 |
JP2000068293A (ja) | 2000-03-03 |
CN1189916C (zh) | 2005-02-16 |
DE69924680T8 (de) | 2006-06-08 |
JP3560823B2 (ja) | 2004-09-02 |
EP0982762B1 (en) | 2005-04-13 |
KR20000017308A (ko) | 2000-03-25 |
CN1246433A (zh) | 2000-03-08 |
TW418436B (en) | 2001-01-11 |
EP0982762A3 (en) | 2001-08-16 |
US6238515B1 (en) | 2001-05-29 |
DE69924680D1 (de) | 2005-05-19 |
DE69924680T2 (de) | 2006-03-02 |
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