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JPS6373638A - Wafer bonding device - Google Patents

Wafer bonding device

Info

Publication number
JPS6373638A
JPS6373638A JP61220232A JP22023286A JPS6373638A JP S6373638 A JPS6373638 A JP S6373638A JP 61220232 A JP61220232 A JP 61220232A JP 22023286 A JP22023286 A JP 22023286A JP S6373638 A JPS6373638 A JP S6373638A
Authority
JP
Japan
Prior art keywords
substrate
semiconductor wafer
weight
wafer
wax
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61220232A
Other languages
Japanese (ja)
Inventor
Osamu Nakayama
修 中山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP61220232A priority Critical patent/JPS6373638A/en
Publication of JPS6373638A publication Critical patent/JPS6373638A/en
Pending legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)

Abstract

PURPOSE:To enable a wafer to be bonded onto a substrate in even thickness using a wax containing no bubbles by a method wherein the semiconductor wafer pressed down by a weight is held in a vacuum chamber. CONSTITUTION:A weight 5 with its bottom surface taking flat shape to abut against a semiconductor wafer 1 is to be pressed down by the weight 6 heated by a heater (hot plate) built-in or separately provided. The semiconductor wafer 1 pressed down by the weight 5 is mounted on a substrate 3 coated with wax 2 to be placed on a hotplate 4. Next, the whole body is covered with a vacuum chamber 6 to be held in vacuum state for several minutes. Later, the vacuum chamber 6 and the weight 5 are removed while the substrate 3 is taken out of the hot plate 4 to finish the bonding process of semiconductor wafer 1 onto the substrate 3.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、半導体ウェハをペレット状に切断する際、
あらかじめ基板にワックスを用いて張り合わせるウェハ
貼付装置に関するものである。
[Detailed Description of the Invention] [Industrial Application Field] This invention provides a method for cutting semiconductor wafers into pellets.
The present invention relates to a wafer bonding device that attaches a wafer to a substrate using wax in advance.

〔従来の技術〕[Conventional technology]

第2図は従来のウェハ貼付装置を示す断面図であり、図
において、1は半導体ウェハで、基板2上にワックス3
により張り合わされている。4はホットプレートを示す
FIG. 2 is a cross-sectional view showing a conventional wafer pasting device. In the figure, 1 is a semiconductor wafer, and wax 3 is placed on a substrate 2.
are bonded together. 4 indicates a hot plate.

次に、半導体ウェハ1の張り付は方法を簡単に説明する
。まず、基板2上により所定の溶融状態となったワック
ス3をハケまたは回転装置を用いて薄く塗布した後、そ
の上に半導体ウェハ1を合わせ、加熱されたホットプレ
ート4上にのせることにより、ワックス3をさらに溶か
し、両者を接着する方法であった。
Next, a method for attaching the semiconductor wafer 1 will be briefly explained. First, wax 3 in a predetermined molten state is applied thinly onto the substrate 2 using a brush or a rotating device, and then the semiconductor wafer 1 is placed on top of the wax 3 and placed on the heated hot plate 4. The method involved further melting wax 3 and bonding the two together.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

従来のウェハ貼付装置は、以上のように構成されている
ので、第3図に示すように、ワックス3の中に気泡7が
残り、また、第4図に示すように、半導体ウェハ1が加
熱により反るためワックス3の厚さが均一にならず、後
に半導体ウェハ1を切断する際に小さいサイズの半導体
ペレットが剥れたり、一部のペレットが下まで完全に切
断されずに残ったりするなどの問題点があった。
Since the conventional wafer pasting device is configured as described above, air bubbles 7 remain in the wax 3 as shown in FIG. 3, and the semiconductor wafer 1 is heated as shown in FIG. As a result, the thickness of the wax 3 is not uniform due to the warping, and when the semiconductor wafer 1 is later cut, small semiconductor pellets may peel off, or some pellets may remain without being completely cut to the bottom. There were problems such as:

この発明は、上記のような問題点を解決するためになさ
れたもので、半導体ウェハを基板に厚さが均一で、しか
も気泡の混在していないワックスで貼り付けることがで
きるウェハ貼付装置を得ることを目的とする。
This invention was made in order to solve the above-mentioned problems, and provides a wafer sticking device that can stick a semiconductor wafer to a substrate with wax that has a uniform thickness and does not contain bubbles. The purpose is to

〔問題点を解決するための手段〕[Means for solving problems]

この発明にかかるウェハ貼付装置は、基板を加熱するホ
ットプレートと、半導体ウェハを上から加圧するヒータ
により加熱された重りと、これらを覆う真空チャンバと
を具備したものである。
A wafer bonding apparatus according to the present invention includes a hot plate that heats a substrate, a weight heated by a heater that pressurizes a semiconductor wafer from above, and a vacuum chamber that covers these.

〔作用〕[Effect]

この発明におけるウェハ貼付装置は、加熱した重りを半
導体ウェハの上にのせることにより、半導体ウェハの熱
をうばうことなく常に安定した状態で、しかも均一な厚
さのワックスが得られ、また、真空チャンバを併用する
ことにより、ワックス内の気泡を除去することができる
The wafer bonding device of the present invention is capable of obtaining wax with a uniform thickness in a stable state at all times without dissipating heat from the semiconductor wafer by placing a heated weight on top of the semiconductor wafer. By using a chamber in combination, air bubbles in the wax can be removed.

〔実施例〕〔Example〕

以下、この発明の一実施例を第1図について説明する。 An embodiment of the present invention will be described below with reference to FIG.

第1図において、第2図と同じ符号は同じものを示し、
5は前記半導体ウェハ1の上にのせる重りで、下面、す
なわち、半導体ウェハ1と当接する面が平面状に形成さ
れ、かつ内蔵されるか、別途設けられたヒータ(図示せ
ず)によって加熱された状態で半導体ウェハ1を加圧す
るようになっている。6は全体を覆うための真空チャン
バを示す。
In Figure 1, the same symbols as in Figure 2 indicate the same things,
Reference numeral 5 denotes a weight placed on the semiconductor wafer 1, whose lower surface, that is, the surface that comes into contact with the semiconductor wafer 1, is flat and heated by a built-in or separately provided heater (not shown). The semiconductor wafer 1 is pressurized in this state. 6 indicates a vacuum chamber for covering the whole.

まず、従来と同様の方法で、基板2にワックス3を塗布
した後、これに半導体ウェハ1を合わせ、その上に加熱
された重り5をのせ、これらをホットプレート4の上に
載置する0次に、全体を覆うための真空チャンバ6をか
ぶせ、中を真空状態にし、数分間保持する。その後、真
空チャンバ6および重り5を除去し、基板2をホットプ
レート4から取り外すことにより半導体ウェハ1の基板
2への張り付けが完了する。
First, wax 3 is applied to substrate 2 in the same manner as in the conventional method, semiconductor wafer 1 is placed on it, heated weight 5 is placed on top of this, and these are placed on hot plate 4. Next, a vacuum chamber 6 is placed to cover the whole, and the inside is brought into a vacuum state, which is maintained for several minutes. Thereafter, the vacuum chamber 6 and the weight 5 are removed, and the substrate 2 is removed from the hot plate 4, thereby completing the attachment of the semiconductor wafer 1 to the substrate 2.

なお、上記実施例では、重り5を半導体ウェハ1の上に
のせた状態で、ホットプレート4の上にのせたが、ホッ
トプレート4の上に半導体ウェハ1をのせた後重り5を
のせても同一の効果が得られる。
In the above embodiment, the weight 5 was placed on the semiconductor wafer 1 and then placed on the hot plate 4, but even if the weight 5 is placed on the hot plate 4 after the semiconductor wafer 1 is placed on it, The same effect can be obtained.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明は、基板と、この基板と
ワックスにより張り合わされる半導体ウェハとをホット
プレート上に載置し、前記半導体ウェハを上から加圧す
る重りをのせてこれら全体を真空チャンバ内に保持する
構成としたので、構造が簡単で、しかも自動化し易く、
安定した状態で半導体ウェハの張り付けができる利点が
ある。
As explained above, the present invention involves placing a substrate and a semiconductor wafer bonded to the substrate with wax on a hot plate, placing a weight that pressurizes the semiconductor wafer from above, and moving the entire substrate into a vacuum chamber. The structure is simple, and it is easy to automate.
It has the advantage that semiconductor wafers can be attached in a stable state.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例のウェハ貼付装置の構成を
示す断面図、第2図は従来のウェハ貼付装置を示す断面
図、第3図、第4図は従来のウェハ貼付装置を用いて張
り付けた半導体ウェハと基板の断面図である。 図において、1は半導体ウェハ、2は基板、3はワック
ス、4はホットプレート、5は重り、6は真空チャンバ
である。 なお、各図中の同一符号は同一または相当部分を示す。
FIG. 1 is a sectional view showing the configuration of a wafer sticking device according to an embodiment of the present invention, FIG. 2 is a sectional view showing a conventional wafer sticking device, and FIGS. 3 and 4 are sectional views showing a conventional wafer sticking device. FIG. 2 is a cross-sectional view of a semiconductor wafer and a substrate attached together. In the figure, 1 is a semiconductor wafer, 2 is a substrate, 3 is wax, 4 is a hot plate, 5 is a weight, and 6 is a vacuum chamber. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (2)

【特許請求の範囲】[Claims] (1)半導体ウェハと基板とをワックスを用いて張り合
わせる装置において、前記基板が載置され、この基板を
加熱するホットプレートと、前記基板上にワックスを介
して載置された前記半導体ウェハを上から加圧するため
の重りと、これらを覆い真空中に保持する真空チャンバ
とを備えたことを特徴とするウェハ貼付装置。
(1) An apparatus for bonding a semiconductor wafer and a substrate together using wax, which includes a hot plate on which the substrate is placed and heats the substrate, and a hot plate that heats the substrate, and a hot plate that heats the semiconductor wafer placed on the substrate via wax. A wafer pasting device characterized by comprising a weight for applying pressure from above and a vacuum chamber that covers the weights and holds them in a vacuum.
(2)重りは、下面が平面状に形成され、かつヒータに
より加熱された状態で半導体ウェハを加圧するものであ
る特許請求の範囲第(1)項記載のウェハ貼付装置。
(2) The wafer bonding apparatus according to claim (1), wherein the weight has a flat bottom surface and pressurizes the semiconductor wafer while being heated by a heater.
JP61220232A 1986-09-17 1986-09-17 Wafer bonding device Pending JPS6373638A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61220232A JPS6373638A (en) 1986-09-17 1986-09-17 Wafer bonding device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61220232A JPS6373638A (en) 1986-09-17 1986-09-17 Wafer bonding device

Publications (1)

Publication Number Publication Date
JPS6373638A true JPS6373638A (en) 1988-04-04

Family

ID=16747955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61220232A Pending JPS6373638A (en) 1986-09-17 1986-09-17 Wafer bonding device

Country Status (1)

Country Link
JP (1) JPS6373638A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0600392A3 (en) * 1992-11-26 1994-08-24 Sumitomo Electric Industries Process for reinforcing a semiconductor wafer and a reinforced semiconductor wafer.
CN106990543A (en) * 2017-03-23 2017-07-28 张家港康得新光电材料有限公司 The preparation method of 3D display devices

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0600392A3 (en) * 1992-11-26 1994-08-24 Sumitomo Electric Industries Process for reinforcing a semiconductor wafer and a reinforced semiconductor wafer.
US5445692A (en) * 1992-11-26 1995-08-29 Sumitomo Electric Industries, Ltd. Process for reinforcing a semiconductor wafer
CN106990543A (en) * 2017-03-23 2017-07-28 张家港康得新光电材料有限公司 The preparation method of 3D display devices

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