[go: up one dir, main page]

JPS5796767A - Polishing device - Google Patents

Polishing device

Info

Publication number
JPS5796767A
JPS5796767A JP55166710A JP16671080A JPS5796767A JP S5796767 A JPS5796767 A JP S5796767A JP 55166710 A JP55166710 A JP 55166710A JP 16671080 A JP16671080 A JP 16671080A JP S5796767 A JPS5796767 A JP S5796767A
Authority
JP
Japan
Prior art keywords
wafers
base plate
seats
plate
adhesive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55166710A
Other languages
Japanese (ja)
Inventor
Narikazu Suzuki
Hiroshi Kataoka
Tomokazu Murayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP55166710A priority Critical patent/JPS5796767A/en
Publication of JPS5796767A publication Critical patent/JPS5796767A/en
Pending legal-status Critical Current

Links

Landscapes

  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE:To prevent warping of work at the time of applying adhesive by providing cavities or penetration holes, to release excessive adhesive, to the base plate which holds work of thin plate by virtue of adhesive. CONSTITUTION:Seats 23 to stick wafers 2 on at equal intervals are located on the flat surface 22 of a disc type base plate 21. A number of penetration holes 24 are provided to the seat 23. Before wafers 2 are placed, the base plate 21 is put on a heating plate 32, heated, and paraffin is applied to the seats. On each seat a silicon wafer 2 is placed and then a pressing plate 36 is pressed down from above via a cushion 35. The subsequent cooling process establishes the adhesion of silicon wafers 2 to the seats 23. The base plate 21 is then mounted on a lapping machine where the wafers 2 are polished.
JP55166710A 1980-11-28 1980-11-28 Polishing device Pending JPS5796767A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55166710A JPS5796767A (en) 1980-11-28 1980-11-28 Polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55166710A JPS5796767A (en) 1980-11-28 1980-11-28 Polishing device

Publications (1)

Publication Number Publication Date
JPS5796767A true JPS5796767A (en) 1982-06-16

Family

ID=15836316

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55166710A Pending JPS5796767A (en) 1980-11-28 1980-11-28 Polishing device

Country Status (1)

Country Link
JP (1) JPS5796767A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61100371A (en) * 1984-10-23 1986-05-19 Toshiba Ceramics Co Ltd Wafer cambering method in time of polishing
JPS63180469A (en) * 1987-01-19 1988-07-25 Nippon Telegr & Teleph Corp <Ntt> Method and device for uniform pressing/bonding
JPH09166526A (en) * 1995-12-14 1997-06-24 Nec Corp Preparation od sample for transmission type electron microscope
WO2001056742A1 (en) * 2000-01-31 2001-08-09 Shin-Etsu Handotai Co., Ltd. Polishing device and method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61100371A (en) * 1984-10-23 1986-05-19 Toshiba Ceramics Co Ltd Wafer cambering method in time of polishing
JPS63180469A (en) * 1987-01-19 1988-07-25 Nippon Telegr & Teleph Corp <Ntt> Method and device for uniform pressing/bonding
JPH09166526A (en) * 1995-12-14 1997-06-24 Nec Corp Preparation od sample for transmission type electron microscope
WO2001056742A1 (en) * 2000-01-31 2001-08-09 Shin-Etsu Handotai Co., Ltd. Polishing device and method
EP1614505A1 (en) * 2000-01-31 2006-01-11 Shin-Etsu Handotai Company Limited Polishing device and method
KR100729022B1 (en) * 2000-01-31 2007-06-14 신에쯔 한도타이 가부시키가이샤 Polishing apparatus and method
US7513819B2 (en) 2000-01-31 2009-04-07 Shin-Eisu Handotai Co., Ltd Polishing apparatus and method

Similar Documents

Publication Publication Date Title
US5964646A (en) Grinding process and apparatus for planarizing sawed wafers
GB1423490A (en) Method of shaping semi conductor workpieces
EP0870576A3 (en) Polishing Apparatus
EP0454362A3 (en) Backing pad, method for precision surface machining thereof, and method for polishing semiconductor wafer by use of the backing pad
JP2001353656A (en) Stacked type polishing pad
JPS5796767A (en) Polishing device
JPH081898B2 (en) Wafer sticker
GB1231416A (en)
JPS56140632A (en) Method for giving strain to semiconductor wafer
US3924361A (en) Method of shaping semiconductor workpieces
TW374039B (en) Wafer processing apparatus
US7156933B2 (en) Configuration and method for mounting a backing film to a polish head
JPS642857A (en) Method and device for polishing wafer
GB1505488A (en) Cementing semiconductor discs to carrier plates
GB2170042B (en) Method of making integrated circuit silicon die composite having hot melt adhesive on its silicon base
JPS5538024A (en) Manufacturing of semiconductor device
JPS6373638A (en) Wafer bonding device
JPS5548571A (en) Machining equipment
GB2193158A (en) Applying heat-release transfers
JPS639406Y2 (en)
JPS6464772A (en) Tacky sheet for polishing
JPS6464771A (en) Method for polishing semiconductor wafer
JPS63123645A (en) Manufacture of semi-conductor device
JPS57147241A (en) Bonding method for crystal wafer
JPS6319309B2 (en)