JPS5568634A - Manufacture of mask for x-ray exposure - Google Patents
Manufacture of mask for x-ray exposureInfo
- Publication number
- JPS5568634A JPS5568634A JP14310678A JP14310678A JPS5568634A JP S5568634 A JPS5568634 A JP S5568634A JP 14310678 A JP14310678 A JP 14310678A JP 14310678 A JP14310678 A JP 14310678A JP S5568634 A JPS5568634 A JP S5568634A
- Authority
- JP
- Japan
- Prior art keywords
- opening
- film
- substrate
- layer
- mask pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
PURPOSE: To correct the warp of a mask pattern carrier film, by diffusing boron into a substrate through an opening of a protective film on one side of the substrate and then etching both the sides of the substrate.
CONSTITUTION: SiO2 films 2, 11 are produced on both the sides of an Si substrate. An opening 12 is provided in the film 11 in a position corresponding to a mask pattern carrier film to make a boron-diffused layer 3. Another opening 7 is provided in the other film 2 to correspond to the former opening 12. An X-ray-permeable resinforced layer 4 is then coated on the film 11. Thin layers 5 of titanium and gold are laminated on the layer 4. Patterning and etching are effected by using a resist. The gold layer is used as an electrode to plate gold to make a mask pattern 6. Selective etching is performed through the opening 7 by a mixed liquid consisting of etchylenediamine, pyrocatechol and water to make an opening 8 and leave the SiO2 and the boron-diffused layer which are hard to dissolve. According to the present method, the warp of the mask pattern carrier surface is corrected flat and an exposure pattern of high accuracy is made.
COPYRIGHT: (C)1980,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14310678A JPS5568634A (en) | 1978-11-20 | 1978-11-20 | Manufacture of mask for x-ray exposure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14310678A JPS5568634A (en) | 1978-11-20 | 1978-11-20 | Manufacture of mask for x-ray exposure |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5568634A true JPS5568634A (en) | 1980-05-23 |
Family
ID=15331039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14310678A Pending JPS5568634A (en) | 1978-11-20 | 1978-11-20 | Manufacture of mask for x-ray exposure |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5568634A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57198461A (en) * | 1981-05-18 | 1982-12-06 | Philips Nv | Radiant lithographic mask and manufacture thereof |
JPH0334412A (en) * | 1989-06-30 | 1991-02-14 | Agency Of Ind Science & Technol | X-ray mask and manufacture thereof |
-
1978
- 1978-11-20 JP JP14310678A patent/JPS5568634A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57198461A (en) * | 1981-05-18 | 1982-12-06 | Philips Nv | Radiant lithographic mask and manufacture thereof |
JPH0319690B2 (en) * | 1981-05-18 | 1991-03-15 | Fuiritsupusu Furuuiranpenfuaburiken Nv | |
JPH0334412A (en) * | 1989-06-30 | 1991-02-14 | Agency Of Ind Science & Technol | X-ray mask and manufacture thereof |
JPH063791B2 (en) * | 1989-06-30 | 1994-01-12 | 工業技術院長 | X-ray mask and method of manufacturing the same |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS561533A (en) | Method of photoetching | |
JPS5637635A (en) | Manufacture of semiconductor device | |
JPS5568634A (en) | Manufacture of mask for x-ray exposure | |
JPS5321576A (en) | Mask for x-ray exposure | |
JPS5492061A (en) | Micropattern forming method | |
EP0098922A3 (en) | Process for selectively generating positive and negative resist patterns from a single exposure pattern | |
JPS52119172A (en) | Forming method of fine pattern | |
JPS57160127A (en) | Manufacture of transcribe mask for x-ray exposure | |
JPS5299072A (en) | Mask for x-ray exposure | |
JPS5469090A (en) | Manufacture of semiconductor device | |
JPS5461478A (en) | Chromium plate | |
JPS53120527A (en) | Forming method of positive type radiation sensitive material layer | |
JPS5619045A (en) | Electron beam sensitive inorganic resist | |
JPS5680130A (en) | Manufacture of semiconductor device | |
JPS5317076A (en) | Silicon mask for x-ray exposure and its production | |
JPS5742043A (en) | Photosensitive material | |
JPS5317075A (en) | Production of silicon mask for x-ray exposure | |
JPS5437579A (en) | Chrome plate | |
JPS5776546A (en) | Transfer mask for x-ray exposure | |
JPS53105982A (en) | Micropattern formation method | |
JPS5651738A (en) | Minute pattern forming method | |
JPS5673435A (en) | Manufacture of semiconductor device | |
JPS56110232A (en) | Pattern formation with soft x-ray | |
JPS5397374A (en) | Mask producing method | |
JPS56108880A (en) | Selectively etching method for silicon oxide film |