JP7354534B2 - Probe pins and inspection fixtures - Google Patents

Description

The present disclosure relates to probe pins and inspection jigs.

Electronic component modules are generally subjected to continuity tests, operating characteristic tests, and the like during their manufacturing process. These tests are performed by using probe pins to connect terminals for connection to the main body board installed in the electronic component module and terminals of the testing device.

As such a probe pin, there is one described in Patent Document 1. The probe pin includes a pair of contacts that can respectively contact electrode terminals of an electronic component and an electrode terminal of a connected electronic component, and a meandering portion interposed between the pair of contacts and connecting the pair of contacts. There is. The probe pin is configured such that the meandering portion expands and contracts along the arrangement direction in which the pair of contacts are connected, and each contact moves back and forth along this arrangement direction.

Japanese Patent Application Publication No. 2002-134202

By the way, with the diversification of inspection devices and objects to be inspected in recent years, some inspection devices and objects to be inspected are configured to be connected to a probe pin via a conductor portion of an electric wire.

The probe pin is configured such that each contact contacts an electrode terminal of the electromagnetic component and an electrode terminal of the connected electronic component in the arrangement direction, thereby connecting the electromagnetic component and the connected electronic component. . For this reason, for example, if one or both of the electromagnetic component and the connected electronic component are configured so that they cannot be connected to the probe pin without using the conductor part of the electric wire, using the probe pin will cause the electromagnetic It may not be possible to connect the component to the connected electronic component.

An object of the present disclosure is to provide a probe pin to which a conductor portion of an electric wire can be connected, and an inspection jig equipped with the probe pin.

A probe pin according to an example of the present disclosure includes:
an elastic part that is elastically deformable along the first direction;
and a connecting portion provided at one end of the elastic portion in the first direction and to which a conductor portion of an electric wire can be connected.

Further, an inspection jig according to an example of the present disclosure includes:
the probe pin;
and a housing having a housing portion in which the probe pin is housed so that the connection portion is exposed to the outside.

The probe pin includes an elastic part that can be elastically deformed along the first direction, and a connecting part that is provided at one end of the elastic part in the first direction and can be connected to the conductor part of the electric wire. With this connection part, a probe pin to which a conductor part of an electric wire can be connected can be realized.

According to the inspection jig, even if the probe pin is configured such that one or both of the inspection device and the object to be inspected cannot be connected to each other except through the conductor portion of the electric wire, the inspection device and An inspection jig to which an object to be inspected can be connected can be realized.

FIG. 1 is a perspective view showing an inspection jig according to a first embodiment of the present disclosure. A sectional view taken along the II-II line in FIG. 1. FIG. 1 is a perspective view showing a probe pin according to a first embodiment of the present disclosure. FIG. 4 is a plan view of the probe pin in FIG. 3; FIG. 2 is a plan view showing a first modification of the inspection jig shown in FIG. 1; FIG. 2 is a plan view showing a second modification of the inspection jig shown in FIG. 1; FIG. 7 is a perspective view showing an inspection jig according to a second embodiment of the present disclosure. A sectional view taken along the line VIII-VIII in FIG. 7. FIG. 7 is a perspective view showing a probe pin according to a second embodiment of the present disclosure. 10 is a plan view of the probe pin of FIG. 9. FIG.

An example of the present disclosure will be described below with reference to the accompanying drawings. In the following explanation, terms indicating specific directions or positions (for example, terms including "top," "bottom," "right," and "left") will be used as necessary. These terms are intended to facilitate understanding of the present disclosure with reference to the drawings, and the technical scope of the present disclosure is not limited by the meanings of these terms. Further, the following description is essentially only an example, and is not intended to limit the present disclosure, its applications, or its uses. Furthermore, the drawings are schematic, and the ratio of each dimension does not necessarily match the reality.

(First embodiment)
The probe pin 10 according to the first embodiment of the present disclosure is used while being housed in a housing 100, for example, as shown in FIGS. 1 and 2, and together with the housing 100 constitutes an inspection jig 1. As an example, the inspection jig 1 accommodates a plurality of elongated thin plate-shaped conductive probe pins 10.

As shown in FIG. 1, the housing 100 has, for example, a substantially square column shape. As shown in FIG. 2, inside the housing 100, there is provided an accommodating part 110 that can accommodate the probe pin 10 with a connection part 30 of the probe pin 10 (described later) exposed to the outside of the housing 100. Each accommodating part 110 extends along the first direction (i.e., the Y direction), and is arranged side by side at intervals in the thickness direction of the accommodated probe pin 10 (i.e., the X direction). . In the first embodiment, a row composed of four accommodating parts 110 arranged in the thickness direction of the housed probe pin 10 is arranged in a direction perpendicular to the arrangement direction of the row of four accommodating parts 110 (i.e. , Z direction) with an interval between them.

A first opening 111 and a second opening 112 are provided at both ends of each accommodating portion 110 in the first direction, respectively. The first opening 111 opens in the first surface 101, which is one of a pair of surfaces of the housing 100 facing each other in the Y direction. The connecting portion 30 of the probe pin 10 is exposed to the outside of the housing 100 through the first opening 111 .

Further, inside the housing 100, a terminal hole 120 is provided that extends along the Y direction from the second surface 102 opposite to the first surface 101 in the Y direction. A second opening 112 is opened in the bottom surface 121 of this terminal hole 120 . Through this second opening 112, a contact portion 40 of the probe pin 10, which will be described later, protrudes toward the inside of the terminal hole 120. (see).

As shown in FIG. 3, each probe pin 10 is plate-shaped and includes an elastic part 20 that can be elastically deformed along the Y direction (an example of a first direction), and is provided at both ends of the elastic part 20 in the Y direction. A connecting portion 30 and a contact portion 40 are provided. Each probe pin is formed, for example, by electroforming, and has an elastic part 20, a connecting part 30, and a contact part 40 arranged in series along the Y direction and integrally configured.

As shown in FIG. 4, the elastic section 20 includes a plurality of elastic band pieces (four elastic band pieces in the first embodiment) 21, 22, 23, and 24 arranged with gaps between them. There is. As shown in FIG . 4 , each band-shaped elastic piece 21, 22, 23, 24 has an elongated band shape, and includes two straight parts 201, 202 connected to the connecting part 30 and the contact part 40, respectively, and two straight parts 201. , 202. For example, each of the band-shaped elastic pieces 21, 22, 23, and 24 has substantially the same cross-sectional shape.

As shown in FIG. 4, the connecting portion 30 is configured to be able to connect a conductor portion 200 of an electric wire. Specifically, the connecting portion 30 includes a main body portion 31 extending in the Y direction, and a direction extending from the other end of the main body portion 31 in the Y direction along the first direction (i.e., the Y direction) and away from each other (i.e., the Z direction). It has a pair of elastic clamping pieces 32 and 33 that can be elastically deformed in the direction). The main body portion 31 is connected to the elastic portion 20 at one end in the Y direction. The elastic clamping pieces 32 and 33 are arranged with a gap 34 between them in a second direction (namely, the Z direction) perpendicular to the first direction. By inserting the conductor portion 200 of the electric wire into this gap 34, the conductor portion 200 of the electric wire is held between the elastic holding pieces 32 and 33. That is, the connecting part 30 has a pair of elastic clamping pieces 32 and 33 that can clamp the conductor part 200 of the electric wire.

Further, the connecting portion 30 has a substantially C-shaped through hole 36 that passes through the connecting portion 30 in the thickness direction thereof. An end portion 341 of the gap 34 on the main body portion 31 side has a substantially circular shape when viewed from the plate thickness direction (namely, the X direction). A through hole 36 is arranged around an end 341 of this gap 34 on the main body 31 side. This through hole 36 facilitates elastic deformation of each elastic clamping piece 32, 33 in the Z direction.

As shown in FIG. 4, the contact portion 40 includes a main body portion 41 extending in the Y direction and connected to the elastic portion 20 at one end in the Y direction, and a main body portion 41 extending in the Y direction from the other end of the main body portion 41 in the Y direction. A pair of legs 42, 43 that can be bent in a direction away from each other (that is, in the Z direction), and a pair of contact parts arranged at the tips of the pair of legs 42, 43 so as to be able to contact the convex contact of the object to be inspected. 421, 431. A stopper 44 is provided on each of the opposing surfaces of the legs 42 and 43 that face each other. Each stopper 44 protrudes from the opposing surface of each leg 42, 43 in a direction toward each other. This stopper 44 can prevent, for example, excessive insertion of the connection terminal 300 of the inspection device.

Further, the connecting portion 30 and the contact portion 40 are each provided with a supporting portion 50 . Each support part 50 extends in the Z direction from the main body parts 31 and 41, and as shown in FIG. 2, when the probe pin 10 is accommodated in the accommodation part 110 of the housing 100, It is arranged so that it comes into contact with. That is, the probe pin 10 is held in the accommodating part 110 by each support part 50.

According to the probe pin 10 of the first embodiment, the elastic part 20 is elastically deformable along the Y direction, and the connecting part is provided at one end of the elastic part 20 in the Y direction to which the conductor part 200 of the electric wire can be connected. It is equipped with 30. This connecting portion 30 makes it possible to realize the probe pin 10 to which the conductor portion 200 of the electric wire can be connected.

In the first embodiment, the connecting portion 30 extends along the Y direction, and has a pair of elastic clamping pieces 32 and 33 that can be elastically deformed in a direction away from each other and can clamp the conductor portion 200 of the electric wire. . Since the pair of elastic clamping pieces 32 and 33 can clamp the conductor portion 200 of the electric wire, it is possible to realize the probe pin 10 to which the conductor portion 200 of the electric wire can be connected by crimping.

Further, according to the inspection jig 1, even if the probe pin 10 is configured such that one or both of the inspection device and the inspection target cannot be connected to each other without using the conductor portion 200 of the electric wire, It is possible to realize an inspection jig 1 to which an inspection device and an object to be inspected can be connected.

Note that the number of probe pins 10 accommodated in each accommodating portion 110 of the housing 100 is not limited to one, and may be plural. For example, as shown in FIG. 5, in each housing part 110, a plurality of probe pins 10 (three probe pins 10 in FIG. 5) are stacked in the board thickness direction while being in contact with each other, and one electric wire The probe pin stack 2 to which the conductor portion 200 is connected can be accommodated. In this way, by using the probe pin stack 2, it is possible to obtain an inspection jig 1 that can flow a larger current than, for example, an inspection jig 1 that accommodates and holds one probe pin 10. can.

Further, as shown in FIG. 6, the housing parts 110 are arranged in a row at intervals in the thickness direction (i.e., the X direction) of the housed probe pins 10, and are connected in the Z direction. The sections 30 can be arranged in a staggered manner. In this way, each accommodating section 110 changes its shape, size, and arrangement depending on the shape and size of the probe pin 10 to be accommodated, or the arrangement of the connection terminals of the inspection device and the object to be inspected. be able to.

The inspection jig 1 only needs to include at least one probe pin 10 and a housing 100 that accommodates the probe pin 10 therein.

(Second embodiment)
As shown in FIGS. 7 to 10, the probe pin 10 according to the second embodiment of the present disclosure is configured such that the connecting portion 30 has a soldering portion 35 to which a conductor portion 200 of an electric wire can be connected by soldering. This embodiment is different from the first embodiment in that the second embodiment is different from the first embodiment. In the second embodiment, the same reference numerals are given to the same parts as in the first embodiment, explanations thereof are omitted, and points different from the first embodiment will be explained.

As shown in FIGS. 7 and 8, in the second embodiment, the inspection jig 1 includes a housing 100 having a substantially L-shaped cross section along the first direction (namely, the Y direction). In this housing 100, 15 accommodating parts 110 are arranged in a row at intervals in the thickness direction of the probe pin 10 in which the accommodating parts 110 are housed.

As shown in FIG. 10, the elastic part 20 of each probe pin 10 is composed of a plurality of band-shaped elastic pieces (in this embodiment, two band-shaped elastic pieces) 25 and 26 arranged with a gap between them. There is. Each of the band-shaped elastic pieces 25 and 26 includes a plurality of straight band parts 28 (in the second embodiment, ten straight band parts 28 ) extending in the Z direction, and a plurality of curved band parts 27 connected to the straight band parts 28 . (In the second embodiment, the nine curved band parts 27 ) have a meandering shape in which they are alternately connected along the Z direction , and the straight band parts 28 at both ends of the connection part 30 in the Y direction have a meandering shape. The main body part 31 and the main body part 41 of the contact part 40 are connected to each other.

As shown in FIG. 10, the connecting portion 30 of each probe pin 10 is connected to a main body portion 31 extending in the Y direction and having one end in the Y direction connected to the elastic portion 20, and the other end of the main body portion 31 in the Y direction. It has a connected soldering part 35. The soldering portion 35 has a substantially square annular shape when viewed from the thickness direction of the probe pin 10 (ie, the X direction). In the second embodiment, as shown in FIG. 8 , the soldering portion 35 of the connecting portion 30 of each probe pin 10 projects to the outside of the housing 100 through the first opening 111 of the housing portion 110.

As shown in FIG. 10, the contact portion 40 of each probe pin 10 is connected to a main body portion 41 that extends in the Y direction and has one end in the Y direction connected to the elastic portion 20, and the other end of the main body portion 41 in the Y direction. It has a pair of contact portions 421 and 431 that protrude in the Y direction.

According to the probe pin 10 of the second embodiment, the connecting portion 30 has the soldering portion 35 to which the conductor portion 200 of the electric wire can be connected by soldering. This soldering portion 35 makes it possible to realize the probe pin 10 to which the conductor portion 200 of the electric wire can be connected by soldering.

Note that the soldering portion 35 is not limited to the second embodiment, and may have any configuration as long as the conductor portion 200 of the electric wire can be connected by soldering.

The connecting portion 30 is not limited to the first embodiment and the second embodiment, and may have other configurations to which the conductor portion 200 of the electric wire can be connected.

Various embodiments of the present disclosure have been described above in detail with reference to the drawings, and finally, various aspects of the present disclosure will be described. Note that in the following description, reference numerals are also included as an example.

The probe pin 10 of the first aspect of the present disclosure includes:
an elastic part 20 that is elastically deformable along a first direction;
A connecting part 30 is provided at one end of the elastic part 20 in the first direction and to which a conductor part 200 of an electric wire can be connected.

According to the probe pin 10 of the first aspect, the connecting portion 30 makes it possible to realize the probe pin 10 to which the conductor portion 200 of the electric wire can be connected.

The probe pin 10 of the second aspect of the present disclosure includes:
The connecting portion 30 extends along the first direction and includes a pair of elastic clamping pieces 32 and 33 that can be elastically deformed in directions separating from each other and can clamp the conductor portion 200.

According to the probe pin 10 of the second aspect, the pair of elastic clamping pieces 32 and 33 can clamp the conductor part 200 of the electric wire, thereby realizing the probe pin 10 that can connect the conductor part 200 of the electric wire by crimping. can.

The probe pin 10 of the third aspect of the present disclosure includes:
The connecting portion 30 has a soldering portion 35 to which the conductor portion 200 can be connected by soldering.

According to the probe pin 10 of the third aspect, the soldering portion 35 makes it possible to realize the probe pin 10 to which the conductor portion 200 of the electric wire can be connected by soldering.

The inspection jig 1 of the fourth aspect of the present disclosure includes:
Probe pin 10 of the above embodiment,
The housing 100 includes a housing part 110 in which the probe pin 10 is housed so that the connection part 30 is exposed to the outside.

According to the inspection jig 1 of the fourth aspect, the probe pin 10 is configured such that one or both of the inspection device and the object to be inspected cannot be connected to each other except through the conductor portion 200 of the electric wire. Also, it is possible to realize an inspection jig 1 to which an inspection device and an object to be inspected can be connected.

The inspection jig 1 according to the fifth aspect of the present disclosure includes:
The probe pin 10 is a probe pin laminate 2 in which a plurality of the probe pins 10 are stacked in the thickness direction in a state in which they are in contact with each other, and the conductor portion 200 of one of the electric wires is connected,
The accommodating portion 110 can accommodate the probe pin stack 2.

According to the inspection jig 1 of the fifth aspect, the probe pin stack 2 allows a larger current to flow, for example, compared to the inspection jig 1 in which one probe pin 10 is accommodated and held. 1 can be obtained.

The inspection jig 1 according to the sixth aspect of the present disclosure includes:
The probe pin 10 is a plurality of probe pins 10,
The accommodating portion 110 is a plurality of accommodating portions 110 each capable of accommodating at least one probe pin 10,
Each of the accommodating parts 110 is arranged in a line with an interval in the thickness direction of the housed probe pin 10, and a second direction intersecting the thickness direction when viewed from the first direction. The connecting portions 30 are arranged in a staggered manner.

Note that by appropriately combining any of the various embodiments or modifications described above, the effects of each can be achieved. In addition, combinations of embodiments, combinations of examples, or combinations of embodiments and examples are possible, and combinations of features in different embodiments or examples are also possible.

The probe pin of the present disclosure can be applied to, for example, a camera device, a USB device, or an inspection jig used for inspecting semiconductors such as QFN devices and SON devices.

The inspection jig of the present disclosure can be applied to, for example, an inspection apparatus used for inspection of semiconductors such as camera devices, USB devices, or QFN devices and SON devices.

1 Inspection jig 2 Probe pin laminate 10 Probe pin 20 Elastic parts 201, 202 Straight part 203 Curved parts 21, 22, 23, 24 Band-shaped elastic pieces 25, 26 Band-shaped elastic pieces 27 Curved band part 28 Straight band part 30 Connection part 31 Main body parts 32, 33 Elastic clamping piece 34 Gap 341 End part 35 Soldering part 36 Through hole 40 Contact part 41 Main body part 42, 43 Leg part 44 Stopper 50 Support part 100 Housing 101 First surface 102 Second surface 110 Accommodation part 111 First opening 112 Second opening 120 Terminal hole 200 Conductor portion 300 Connection terminal

Claims (4)

an elastic part that is elastically deformable along the first direction;
a connecting portion provided at one end of the elastic portion in the first direction and capable of connecting a conductor portion of an electric wire;
a contact portion provided at the other end of the elastic portion in the first direction;
The elastic part has a plurality of elastic pieces arranged with gaps between them,
The contact portion has a pair of contact portions that can contact the convex contact,
The connection part is
The conductor parts extend along the first direction and are arranged with a gap between them in a second direction perpendicular to the first direction, and are configured to be elastically deformed in a direction away from each other to sandwich the conductor part. A plate-shaped probe pin having a pair of elastic clamping pieces, each having a substantially C-shaped through hole around a substantially circular end located near the elastic portion of the gap. The probe pin of claim 1 ;
An inspection jig comprising: a housing having a housing portion in which the probe pin is housed so that the connection portion is exposed to the outside. The probe pin is a probe pin laminate in which a plurality of the probe pins are stacked in the thickness direction in a state in which they are in contact with each other, and the conductor portion of one of the electric wires is connected,
The inspection jig according to claim 2 , wherein the accommodating portion is capable of accommodating the probe pin stack. The probe pin is a plurality of probe pins,
The accommodating portion is a plurality of accommodating portions each capable of accommodating at least one probe pin,
Each of the accommodating portions is arranged in a line with an interval in the thickness direction of the housed probe pin, and when viewed from the first direction, the accommodating portion is arranged in a row in a second direction intersecting the thickness direction of the probe pin. 4. The inspection jig according to claim 2 , wherein the connecting portions are arranged in a staggered manner.

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