JP4832512B2 - 静電容量の測定回路 - Google Patents
静電容量の測定回路 Download PDFInfo
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- JP4832512B2 JP4832512B2 JP2008512768A JP2008512768A JP4832512B2 JP 4832512 B2 JP4832512 B2 JP 4832512B2 JP 2008512768 A JP2008512768 A JP 2008512768A JP 2008512768 A JP2008512768 A JP 2008512768A JP 4832512 B2 JP4832512 B2 JP 4832512B2
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- 238000005259 measurement Methods 0.000 title description 72
- 239000003990 capacitor Substances 0.000 claims description 47
- 238000000034 method Methods 0.000 description 19
- 230000010354 integration Effects 0.000 description 11
- 238000012545 processing Methods 0.000 description 9
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- 238000010586 diagram Methods 0.000 description 7
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- 238000005516 engineering process Methods 0.000 description 5
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- 238000007789 sealing Methods 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step
- H03M3/494—Sampling or signal conditioning arrangements specially adapted for delta-sigma type analogue/digital conversion systems
- H03M3/496—Details of sampling arrangements or methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/39—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
- H03M3/412—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution
- H03M3/422—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution having one quantiser only
- H03M3/43—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the number of quantisers and their type and resolution having one quantiser only the quantiser being a single bit one
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/39—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
- H03M3/436—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the order of the loop filter, e.g. error feedback type
- H03M3/456—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the order of the loop filter, e.g. error feedback type the modulator having a first order loop filter in the feedforward path
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Description
静電容量を計測するための複数の異なるアプローチが文献によって知られており、たとえば、米国特許第6300776号には静電容量のリアクタンスを計測するためのデルタ・シグマ変調器が示され、測定されるべき静電容量が、クロック的にかつ相互に、一方で基準電圧に接続され、他方で積分器の反転入力端子に接続され、他の端子でグランドに固定して接続されている。
国際出願WO03/071230には、第2の計測静電容量を計測するための静電容量計測回路が示され、2つの静電容量を反対極性の基準電圧に接続することにより、計測されるべき静電容量の差がデルタ・シグマ変調原理により決定される。
国際出願WO2004/090570には、アナログ・デジタル変換器の入力での信号が時間的に平均してゼロとなるように、デジタル・アナログ変換器の入力がオフセット手段のオフセット信号を受ける方法が示されている。したがって、アナログ・デジタル変換器によって、信号の変化のみが検出される。
図1は、静電容量計測回路の例を示す。
図2aは、計測静電容量のスイッチングの例を示す。
図2bは、図2aの計測静電容量のスイッチングのタイミングダイアグラムを示す。
図3は、オフセットを差し引く方法を供する静電容量計測回路の例を示す。
図4は、計測すべき静電容量をその帰還回路内に含む静電容量計測回路の例を示す。
図5は、計測すべき静電容量をその入力回路内に有する静電容量計測回路の例を示す。
図6は、差分構造による静電容量計測回路の実施例を示す。
図7aは、デルタ・シグマ変調器の回路ダイアグラムを示す。
図7bは、図7aのデルタ・シグマ変調器の信号波形を示す。
図8は、デルタ・シグマ変調器の動作モードに関する基本的な回路ダイアグラムを示す。
図9は、スイッチドキャパシタンス技術によるデルタ・シグマ変調器を示す。
Qint=Qmeas−(Qoff+Qfb)
Cfb>(Cmeas−Coff)
Cmeas>Cfb
Claims (6)
- クロック的に動作する静電容量計測回路であって、
差動出力端子を有する演算増幅器(200)と、第1クロックにおいて、第1の端子で前記演算増幅器(200)の反転入力端子に接続され、第2の端子で非反転入力端子に接続される第1のキャパシタ(208)とからなる差動構造のデルタ・シグマ変調器と、
第2クロックにおいて、前記第1のキャパシタ(208)の第1の端子に接続される第1の基準信号源(224a)、および第2クロックにおいて、前記第1のキャパシタ(208)の第2の端子に接続される第2の信号源(224b)とを備え、
前記第1のキャパシタ(208)が計測されるべき静電容量を示すことを特徴とする、静電容量計測回路。 - 前記第1の基準信号源(224a)は基準電圧を供給するように実施され、前記第2の基準信号源(224b)は前記第1の基準信号源(224a)と同じ大きさで異なる符合を有する基準電圧を供給するように実施される、請求項1に記載の静電容量計測回路。
- 計測されるべきキャパシタ(208)に一定のオフセット静電容量を与えるために、前記演算増幅器(200)の反転入力端子および非反転入力端子に接続されるオフセット信号源を含む、請求項1または請求項2に記載の静電容量計測回路。
- 前記オフセット信号源は、第1の端子で前記演算増幅器(200)の反転入力端子に接続され、第2の端子で前記演算増幅器(200)の非反転入力端子に接続される第2のキャパシタ(210)を含み、
前記第2のキャパシタ(210)は、第1の端子で第2の基準信号源(224b)に接続され、第2の端子で第1の基準信号源(224a)に接続される、請求項3に記載の静電容量計測回路。 - 正負の平衡信号を供給するために、第1の平衡信号源が前記演算増幅器(200)の反転入力端子に接続され、第2の平衡信号源が前記演算増幅器(200)の非反転入力端子に接続される、請求項1ないし請求項4のいずれかに記載の静電容量計測回路。
- 前記第1および第2の平衡信号源は、それぞれ前記第1の基準信号源(224a)または前記第2の基準信号源(224b)に接続される別のキャパシタ(212,214)を含む、請求項5に記載の静電容量計測回路。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
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DE102005024098.4 | 2005-05-25 | ||
DE102005024098 | 2005-05-25 | ||
DE102005038875.2 | 2005-08-17 | ||
DE102005038875A DE102005038875A1 (de) | 2005-05-25 | 2005-08-17 | Kapazitätsmessschaltung |
PCT/EP2006/004989 WO2006125639A1 (de) | 2005-05-25 | 2006-05-24 | Kapazitätsmessschaltung |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008542696A JP2008542696A (ja) | 2008-11-27 |
JP4832512B2 true JP4832512B2 (ja) | 2011-12-07 |
Family
ID=36716930
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2008512768A Expired - Fee Related JP4832512B2 (ja) | 2005-05-25 | 2006-05-24 | 静電容量の測定回路 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8054089B2 (ja) |
EP (1) | EP1872144B1 (ja) |
JP (1) | JP4832512B2 (ja) |
DE (1) | DE102005038875A1 (ja) |
WO (1) | WO2006125639A1 (ja) |
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2006
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- 2006-05-24 EP EP06743066.0A patent/EP1872144B1/de not_active Not-in-force
- 2006-05-24 US US11/915,183 patent/US8054089B2/en not_active Expired - Fee Related
- 2006-05-24 JP JP2008512768A patent/JP4832512B2/ja not_active Expired - Fee Related
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US10514245B2 (en) | 2017-05-26 | 2019-12-24 | KYOOKA Co., Ltd. | Gap sensor and gap measuring method using a capacitance measuring technique detecting or measuring gaps between conductive member surfaces |
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WO2006125639A1 (de) | 2006-11-30 |
JP2008542696A (ja) | 2008-11-27 |
US8054089B2 (en) | 2011-11-08 |
EP1872144B1 (de) | 2016-05-04 |
DE102005038875A1 (de) | 2006-11-30 |
EP1872144A1 (de) | 2008-01-02 |
US20080191713A1 (en) | 2008-08-14 |
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