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ES524365A0 - Perceptor de campo magnetico. - Google Patents

Perceptor de campo magnetico.

Info

Publication number
ES524365A0
ES524365A0 ES524365A ES524365A ES524365A0 ES 524365 A0 ES524365 A0 ES 524365A0 ES 524365 A ES524365 A ES 524365A ES 524365 A ES524365 A ES 524365A ES 524365 A0 ES524365 A0 ES 524365A0
Authority
ES
Spain
Prior art keywords
perceiver
magnetic field
magnetic
field
field perceiver
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
ES524365A
Other languages
English (en)
Other versions
ES8405556A1 (es
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Building Technologies AG
Landis and Gyr AG
Original Assignee
Landis and Gyr AG
LGZ Landis and Gyr Zug AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Landis and Gyr AG, LGZ Landis and Gyr Zug AG filed Critical Landis and Gyr AG
Publication of ES8405556A1 publication Critical patent/ES8405556A1/es
Publication of ES524365A0 publication Critical patent/ES524365A0/es
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N52/00—Hall-effect devices
    • H10N52/101—Semiconductor Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/066—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices field-effect magnetic sensors, e.g. magnetic transistor

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
ES524365A 1982-07-26 1983-07-22 Perceptor de campo magnetico. Granted ES524365A0 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB8221522 1982-07-26
GB8234054 1982-11-30

Publications (2)

Publication Number Publication Date
ES8405556A1 ES8405556A1 (es) 1984-06-01
ES524365A0 true ES524365A0 (es) 1984-06-01

Family

ID=26283433

Family Applications (1)

Application Number Title Priority Date Filing Date
ES524365A Granted ES524365A0 (es) 1982-07-26 1983-07-22 Perceptor de campo magnetico.

Country Status (5)

Country Link
US (1) US4700211A (es)
EP (1) EP0099979B1 (es)
DE (1) DE3370875D1 (es)
ES (1) ES524365A0 (es)
GB (1) GB2126009B (es)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH659896A5 (de) * 1982-11-22 1987-02-27 Landis & Gyr Ag Magnetfeldsensor.
BG37507A1 (en) * 1983-07-08 1985-06-14 Kasabov Bipolar lateral magnetotransistor
US4801883A (en) * 1986-06-02 1989-01-31 The Regents Of The University Of California Integrated-circuit one-way isolation coupler incorporating one or several carrier-domain magnetometers
GB8711150D0 (en) * 1987-05-12 1987-06-17 Univ Alberta Semiconductor magnetic field sensor
JPH0311669A (ja) * 1989-06-08 1991-01-18 Mitsubishi Petrochem Co Ltd 磁気トランジスタ
US4939563A (en) * 1989-08-18 1990-07-03 Ibm Corporation Double carrier deflection high sensitivity magnetic sensor
US5323050A (en) * 1993-06-01 1994-06-21 Motorola, Inc. Collector arrangement for magnetotransistor
US5986461A (en) * 1996-09-17 1999-11-16 Intel Corporation UV methods for screening open circuit defects in CMOS integrated circuits
US5570034A (en) * 1994-12-29 1996-10-29 Intel Corporation Using hall effect to monitor current during IDDQ testing of CMOS integrated circuits
US5629549A (en) * 1995-04-21 1997-05-13 Johnson; Mark B. Magnetic spin transistor device, logic gate & method of operation
US7050329B2 (en) * 1995-04-21 2006-05-23 Johnson Mark B Magnetic spin based memory with inductive write lines
US6741494B2 (en) * 1995-04-21 2004-05-25 Mark B. Johnson Magnetoelectronic memory element with inductively coupled write wires
US5760581A (en) * 1996-09-17 1998-06-02 Intel Corporation Method and apparatus coupling together magneto field effect transistors in series to accumulate the effects of magnetic field for improved sensitivity and linearity
US5757055A (en) * 1996-09-17 1998-05-26 Intel Corporation Triple drain magneto field effect transistor with high conductivity central drain
US5962905A (en) * 1996-09-17 1999-10-05 Kabushiki Kaisha Toshiba Magnetoresistive element
US5801533A (en) * 1996-09-17 1998-09-01 Intel Corporation Method and apparatus with cascode biasing magneto field effect transistors for improved sensitivity and amplification
US6320403B1 (en) * 1998-08-10 2001-11-20 Advanced Micro Devices, Inc. Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material
JP4006674B2 (ja) * 2001-05-22 2007-11-14 日立金属株式会社 方位計
US7309903B2 (en) * 2002-03-26 2007-12-18 Japan Science And Technology Agency Tunneling magnetoresistance device semiconductor junction device magnetic memory and semiconductor light-emitting device
US7162381B2 (en) * 2002-12-13 2007-01-09 Knowles Electronics, Llc System and method for facilitating listening
EP1620742A2 (en) * 2003-04-28 2006-02-01 Knowles Electronics, LLC System and method for sensing a magnetic field
JP2005333103A (ja) * 2004-03-30 2005-12-02 Denso Corp 縦型ホール素子およびその製造方法
US7372674B2 (en) * 2005-07-22 2008-05-13 Hitachi Global Storage Technologies Netherlands B.V. Magnetic tunnel transistor with high magnetocurrent and stronger pinning
US8862200B2 (en) 2005-12-30 2014-10-14 DePuy Synthes Products, LLC Method for determining a position of a magnetic source
US7525309B2 (en) 2005-12-30 2009-04-28 Depuy Products, Inc. Magnetic sensor array
US8068648B2 (en) 2006-12-21 2011-11-29 Depuy Products, Inc. Method and system for registering a bone of a patient with a computer assisted orthopaedic surgery system
FR2914497B1 (fr) * 2007-04-02 2009-06-12 St Microelectronics Sa Structure de composants haute frequence a faibles capacites parasites
US7808387B1 (en) * 2007-06-07 2010-10-05 Impinj, Inc. Voltage reference circuit with low-power bandgap
ATE505735T1 (de) 2007-10-18 2011-04-15 Nxp Bv Magnetfeldsensor
CN101828261B (zh) 2007-10-18 2012-05-23 Nxp股份有限公司 背侧层的磁检测
JP5794777B2 (ja) * 2010-12-22 2015-10-14 三菱電機株式会社 半導体装置
RU2515377C1 (ru) * 2012-12-11 2014-05-10 Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Национальный исследовательский университет "МИЭТ" (МИЭТ) Ортогональный магнитотранзисторный преобразователь
EP2746799B1 (en) 2012-12-20 2016-04-20 Nxp B.V. Semiconductor magnetic field sensors
US8946860B2 (en) * 2013-02-21 2015-02-03 Freescale Semiconductor Inc. Semiconductor device and related fabrication methods
KR102116147B1 (ko) 2014-03-06 2020-05-28 매그나칩 반도체 유한회사 매립형 마그네틱 센서
US9859879B2 (en) 2015-09-11 2018-01-02 Knowles Electronics, Llc Method and apparatus to clip incoming signals in opposing directions when in an off state
US9515198B1 (en) 2015-12-11 2016-12-06 International Business Machines Corporation Magnetic-field and magnetic-field gradient sensors based on lateral SOI bipolar transistors
CN107356885B (zh) * 2017-08-18 2023-06-02 黑龙江大学 一种单片集成二维磁场传感器及其制作工艺
EP3518418A1 (en) * 2018-01-30 2019-07-31 Vrije Universiteit Brussel Electronic mixer
CN108983119A (zh) * 2018-02-12 2018-12-11 黑龙江大学 一种单片集成二维磁矢量传感器及其集成化制作工艺
DE102019004599B4 (de) * 2019-07-04 2021-01-14 Tdk-Micronas Gmbh Vertikale Hallsensorstruktur, Betrieb derselben und vertikaler Hallsensor

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB895629A (en) * 1959-08-15 1962-05-02 Asea Ab Measuring device for measuring electrical power and power factor or loss angle at low power factor
US3911468A (en) * 1970-05-22 1975-10-07 Kyoichiro Fujikawa Magnetic-to-electric conversion semiconductor device
US3693085A (en) * 1971-07-15 1972-09-19 Gen Motors Corp System for calibrated high level current measurement using a magnetic field responsive transistor
GB1573309A (en) * 1976-03-24 1980-08-20 Mullard Ltd Semiconductor devices and their manufacture
US4100563A (en) * 1976-09-27 1978-07-11 Motorola, Inc. Semiconductor magnetic transducers
DE2709457A1 (de) * 1977-03-04 1978-09-07 Licentia Gmbh Transistor
US4309655A (en) * 1978-06-23 1982-01-05 Lgz Landis & Gyr Zug Ag Measuring transformer
ZA784449B (en) * 1978-08-04 1980-03-26 Aeci Ltd Current measurement
US4253107A (en) * 1978-10-06 1981-02-24 Sprague Electric Company Integrated circuit with ion implanted hall-cell
US4240059A (en) * 1979-04-05 1980-12-16 Westinghouse Electric Corp. Current divider for a current sensing transducer
CH642477A5 (de) * 1979-04-20 1984-04-13 Landis & Gyr Ag Messwandler zum potentialfreien messen von stroemen oder spannungen.
CH643954A5 (de) * 1979-05-31 1984-06-29 Landis & Gyr Ag Stromteiler fuer messwandler.
CH651152A5 (de) * 1979-11-27 1985-08-30 Landis & Gyr Ag Messwandler zum messen eines insbesondere von einem messstrom erzeugten magnetfeldes.
WO1982000225A1 (en) * 1980-07-07 1982-01-21 Gen Electric Electric power supply system
CH651701A5 (de) * 1980-12-24 1985-09-30 Landis & Gyr Ag Kompensierter messwandler.
FR2504272A1 (fr) * 1981-04-20 1982-10-22 Honeywell Inc Transducteur de puissance

Also Published As

Publication number Publication date
EP0099979A3 (en) 1984-09-26
GB8320153D0 (en) 1983-08-24
GB2126009A (en) 1984-03-14
ES8405556A1 (es) 1984-06-01
EP0099979B1 (de) 1987-04-08
US4700211A (en) 1987-10-13
EP0099979A2 (de) 1984-02-08
GB2126009B (en) 1986-02-12
DE3370875D1 (en) 1987-05-14

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