DE69529493D1 - Anzeigevorrichtung und Verfahren zu ihrer Herstellung - Google Patents
Anzeigevorrichtung und Verfahren zu ihrer HerstellungInfo
- Publication number
- DE69529493D1 DE69529493D1 DE69529493T DE69529493T DE69529493D1 DE 69529493 D1 DE69529493 D1 DE 69529493D1 DE 69529493 T DE69529493 T DE 69529493T DE 69529493 T DE69529493 T DE 69529493T DE 69529493 D1 DE69529493 D1 DE 69529493D1
- Authority
- DE
- Germany
- Prior art keywords
- manufacture
- display device
- display
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136277—Active matrix addressed cells formed on a semiconductor substrate, e.g. of silicon
- G02F1/136281—Active matrix addressed cells formed on a semiconductor substrate, e.g. of silicon having a transmissive semiconductor substrate
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2202/00—Materials and properties
- G02F2202/10—Materials and properties semiconductor
- G02F2202/104—Materials and properties semiconductor poly-Si
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13731994A JP3155886B2 (ja) | 1994-06-20 | 1994-06-20 | 表示装置及びその製造法 |
JP13732194 | 1994-06-20 | ||
JP13732094A JP3109956B2 (ja) | 1994-06-20 | 1994-06-20 | 表示装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69529493D1 true DE69529493D1 (de) | 2003-03-06 |
DE69529493T2 DE69529493T2 (de) | 2003-10-30 |
Family
ID=27317449
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69529493T Expired - Fee Related DE69529493T2 (de) | 1994-06-20 | 1995-06-19 | Anzeigevorrichtung und Verfahren zu ihrer Herstellung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5815223A (de) |
EP (1) | EP0689085B1 (de) |
KR (1) | KR100214097B1 (de) |
DE (1) | DE69529493T2 (de) |
Families Citing this family (70)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6133620A (en) * | 1995-05-26 | 2000-10-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and process for fabricating the same |
US7271410B2 (en) * | 1995-03-28 | 2007-09-18 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix circuit |
JPH08264802A (ja) * | 1995-03-28 | 1996-10-11 | Semiconductor Energy Lab Co Ltd | 半導体作製方法、薄膜トランジスタ作製方法および薄膜トランジスタ |
TW439003B (en) | 1995-11-17 | 2001-06-07 | Semiconductor Energy Lab | Display device |
US6800875B1 (en) | 1995-11-17 | 2004-10-05 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix electro-luminescent display device with an organic leveling layer |
KR100271222B1 (ko) * | 1995-12-14 | 2000-12-01 | 오카베 히로무 | 반도체 소자 및 그 제조 방법 |
TW309633B (de) | 1995-12-14 | 1997-07-01 | Handotai Energy Kenkyusho Kk | |
JP3565983B2 (ja) * | 1996-04-12 | 2004-09-15 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP3219685B2 (ja) | 1996-06-04 | 2001-10-15 | キヤノン株式会社 | 液晶表示装置およびその製造方法 |
JPH1054999A (ja) * | 1996-06-04 | 1998-02-24 | Canon Inc | 表示装置とその製造法 |
JP3571887B2 (ja) * | 1996-10-18 | 2004-09-29 | キヤノン株式会社 | アクティブマトリクス基板及び液晶装置 |
CN100399135C (zh) | 1996-10-22 | 2008-07-02 | 精工爱普生株式会社 | 液晶用基板和液晶面板 |
US7872728B1 (en) | 1996-10-22 | 2011-01-18 | Seiko Epson Corporation | Liquid crystal panel substrate, liquid crystal panel, and electronic device and projection display device using the same |
WO1998018044A1 (en) | 1996-10-22 | 1998-04-30 | Seiko Epson Corporation | Active matrix liquid crystal panel |
JP3392672B2 (ja) * | 1996-11-29 | 2003-03-31 | 三洋電機株式会社 | 表示装置 |
JP3782195B2 (ja) * | 1997-03-10 | 2006-06-07 | 株式会社東芝 | アクティブマトリクス型液晶表示素子及びその製造方法 |
KR100253261B1 (ko) * | 1997-06-03 | 2000-04-15 | 김영환 | 박막트랜지스터 및 그 제조방법 |
TW396454B (en) | 1997-06-24 | 2000-07-01 | Matsushita Electrics Corporati | Semiconductor device and method for fabricating the same |
JP3897873B2 (ja) * | 1997-09-11 | 2007-03-28 | 株式会社半導体エネルギー研究所 | 液晶表示装置の駆動回路 |
DE19744228C1 (de) * | 1997-10-07 | 1998-11-26 | Bosch Gmbh Robert | Sensor mit einer Membran |
JP3445121B2 (ja) * | 1997-10-24 | 2003-09-08 | キヤノン株式会社 | マトリクス基板と液晶表示装置及びこれを用いるプロジェクター |
JPH11125834A (ja) | 1997-10-24 | 1999-05-11 | Canon Inc | マトリクス基板及び液晶表示装置と投写型液晶表示装置 |
US6617648B1 (en) | 1998-02-25 | 2003-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Projection TV |
JP3980167B2 (ja) | 1998-04-07 | 2007-09-26 | 株式会社日立製作所 | Tft電極基板 |
KR100402690B1 (ko) * | 1998-12-26 | 2003-12-18 | 주식회사 대우일렉트로닉스 | 디지털 홀로그래픽 데이터 저장 시스템의 씨씨디 데이터 처리장치 |
US6380558B1 (en) | 1998-12-29 | 2002-04-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
US7821065B2 (en) | 1999-03-02 | 2010-10-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising a thin film transistor comprising a semiconductor thin film and method of manufacturing the same |
US6677613B1 (en) * | 1999-03-03 | 2004-01-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
US6858898B1 (en) | 1999-03-23 | 2005-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
TW469484B (en) * | 1999-03-26 | 2001-12-21 | Semiconductor Energy Lab | A method for manufacturing an electrooptical device |
US7145536B1 (en) | 1999-03-26 | 2006-12-05 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device |
US6475836B1 (en) | 1999-03-29 | 2002-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US6461899B1 (en) | 1999-04-30 | 2002-10-08 | Semiconductor Energy Laboratory, Co., Ltd. | Oxynitride laminate “blocking layer” for thin film semiconductor devices |
US6680487B1 (en) | 1999-05-14 | 2004-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor comprising a TFT provided on a substrate having an insulating surface and method of fabricating the same |
US6111619A (en) * | 1999-05-27 | 2000-08-29 | Sharp Laboratories Of America, Inc. | Method of forming polycrystalline silicon TFTs with TiN/Cu/TiN interconnections for a liquid crystal display pixel array |
US6414342B1 (en) * | 1999-06-18 | 2002-07-02 | Micron Technology Inc. | Photogate with improved short wavelength response for a CMOS imager |
TW459275B (en) | 1999-07-06 | 2001-10-11 | Semiconductor Energy Lab | Semiconductor device and method of fabricating the same |
US6876145B1 (en) * | 1999-09-30 | 2005-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Organic electroluminescent display device |
KR100586243B1 (ko) * | 2000-02-02 | 2006-06-02 | 엘지.필립스 엘시디 주식회사 | 액정표시장치 |
TW504846B (en) * | 2000-06-28 | 2002-10-01 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
KR100385082B1 (ko) * | 2000-07-27 | 2003-05-22 | 삼성전자주식회사 | 액정 표시 장치 |
TW503584B (en) * | 2000-09-29 | 2002-09-21 | Matsushita Electric Ind Co Ltd | Thin film transistor, liquid crystal display device comprising it, and electroluminescence display device |
KR100415611B1 (ko) * | 2001-05-24 | 2004-01-24 | 엘지.필립스 엘시디 주식회사 | 액정표시소자 및 그 제조방법과 이를 이용한 배향막재생방법 |
JP4002410B2 (ja) * | 2001-06-22 | 2007-10-31 | 日本電気株式会社 | アクティブマトリックス型液晶表示装置の製造方法 |
TW564471B (en) | 2001-07-16 | 2003-12-01 | Semiconductor Energy Lab | Semiconductor device and peeling off method and method of manufacturing semiconductor device |
JP3678180B2 (ja) * | 2001-07-27 | 2005-08-03 | 株式会社デンソー | フローセンサ |
US7351300B2 (en) | 2001-08-22 | 2008-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Peeling method and method of manufacturing semiconductor device |
TW594947B (en) * | 2001-10-30 | 2004-06-21 | Semiconductor Energy Lab | Semiconductor device and method of manufacturing the same |
JP2003297718A (ja) * | 2002-03-29 | 2003-10-17 | Seiko Epson Corp | 微細孔形成方法、半導体装置の製造方法、半導体装置、表示装置、および電子機器 |
TWI272641B (en) * | 2002-07-16 | 2007-02-01 | Semiconductor Energy Lab | Method of manufacturing a semiconductor device |
JP2004172389A (ja) | 2002-11-20 | 2004-06-17 | Renesas Technology Corp | 半導体装置およびその製造方法 |
TWI330269B (en) * | 2002-12-27 | 2010-09-11 | Semiconductor Energy Lab | Separating method |
JP4373085B2 (ja) | 2002-12-27 | 2009-11-25 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法、剥離方法及び転写方法 |
JP4700268B2 (ja) * | 2003-09-19 | 2011-06-15 | セイコーエプソン株式会社 | 半導体装置および半導体装置の製造方法 |
JP4791974B2 (ja) * | 2004-01-05 | 2011-10-12 | ティーピーオー ホンコン ホールディング リミテッド | Esd保護回路を有する液晶表示装置及びその製造方法 |
GB0401060D0 (en) | 2004-01-19 | 2004-02-18 | Ezra David | Optical devices |
KR100685239B1 (ko) | 2004-01-29 | 2007-02-22 | 가시오게산키 가부시키가이샤 | 트랜지스터어레이 및 그 제조방법 및 화상처리장치 |
JP4319078B2 (ja) * | 2004-03-26 | 2009-08-26 | シャープ株式会社 | 半導体装置の製造方法 |
US7554265B2 (en) * | 2004-06-25 | 2009-06-30 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
CN100592520C (zh) * | 2004-10-22 | 2010-02-24 | 株式会社半导体能源研究所 | 半导体器件及包括其的显示装置 |
JP4902362B2 (ja) * | 2005-01-12 | 2012-03-21 | シャープ株式会社 | 半導体装置の製造方法 |
KR20070002933A (ko) * | 2005-06-30 | 2007-01-05 | 엘지.필립스 엘시디 주식회사 | 폴리 박막 트랜지스터 기판 및 그 제조 방법 |
US8669644B2 (en) | 2009-10-07 | 2014-03-11 | Texas Instruments Incorporated | Hydrogen passivation of integrated circuits |
JP2012173469A (ja) * | 2011-02-21 | 2012-09-10 | Japan Display Central Co Ltd | 液晶表示装置及び液晶表示装置の駆動方法 |
KR20150120376A (ko) | 2013-02-20 | 2015-10-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 박리 방법, 반도체 장치, 및 박리 장치 |
CN105793957B (zh) | 2013-12-12 | 2019-05-03 | 株式会社半导体能源研究所 | 剥离方法及剥离装置 |
CN105679763A (zh) * | 2016-01-05 | 2016-06-15 | 深圳市华星光电技术有限公司 | 一种阵列基板及其制作方法、显示面板 |
CN105655353A (zh) * | 2016-01-21 | 2016-06-08 | 武汉华星光电技术有限公司 | Tft阵列基板结构及其制作方法 |
FR3085763A1 (fr) * | 2018-09-07 | 2020-03-13 | Commissariat A L Energie Atomique Et Aux Energies Alternatives | Ecran transmissif a cristaux liquides sur silicium |
CN112002708B (zh) * | 2020-08-11 | 2023-04-07 | 深圳市华星光电半导体显示技术有限公司 | 阵列基板 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4477962A (en) * | 1978-05-26 | 1984-10-23 | Rockwell International Corporation | Process for and structure of high density VLSI circuits, having self-aligned gates and contacts for FET devices and conducting lines |
JPS61278163A (ja) * | 1985-06-03 | 1986-12-09 | Hitachi Ltd | 薄膜トランジスタの製造方法 |
JPH0620140B2 (ja) * | 1986-06-11 | 1994-03-16 | 株式会社日立製作所 | 薄膜トランジスタ |
JPS63101829A (ja) * | 1986-10-17 | 1988-05-06 | Nec Corp | アクテイブ・マトリツクス液晶表示装置およびその製造方法 |
JPS63155755A (ja) * | 1986-12-19 | 1988-06-28 | Sony Corp | 半導体装置の製造方法 |
JP2631476B2 (ja) * | 1987-09-09 | 1997-07-16 | 富士通株式会社 | 薄膜トランジスタの製造方法 |
JPH0395939A (ja) * | 1989-09-07 | 1991-04-22 | Canon Inc | 半導体装置の製造方法 |
JP2895166B2 (ja) * | 1990-05-31 | 1999-05-24 | キヤノン株式会社 | 半導体装置の製造方法 |
JPH04111362A (ja) * | 1990-08-30 | 1992-04-13 | Canon Inc | 薄膜トランジスタとその製造方法 |
FR2666324B1 (fr) * | 1990-09-03 | 1993-04-09 | Saint Gobain Vitrage Int | Couches minces de nitrure de silicium a proprietes ameliorees. |
US5308779A (en) * | 1991-03-28 | 1994-05-03 | Honeywell Inc. | Method of making high mobility integrated drivers for active matrix displays |
JPH04345069A (ja) * | 1991-05-22 | 1992-12-01 | Oki Electric Ind Co Ltd | 半導体装置 |
DE69223009T2 (de) * | 1991-08-02 | 1998-04-02 | Canon Kk | Flüssigkristall-Anzeigeeinheit |
JP3182833B2 (ja) * | 1992-01-14 | 2001-07-03 | ソニー株式会社 | 薄膜トランジスタおよびその製造方法 |
JP3191061B2 (ja) * | 1992-01-31 | 2001-07-23 | キヤノン株式会社 | 半導体装置及び液晶表示装置 |
US5434441A (en) * | 1992-01-31 | 1995-07-18 | Canon Kabushiki Kaisha | Silicon-on-insulator CMOS device and a liquid crystal display with controlled base insulator thickness |
EP0554060A3 (en) * | 1992-01-31 | 1993-12-01 | Canon Kk | Liquid crystal display apparatus |
TW214603B (en) * | 1992-05-13 | 1993-10-11 | Seiko Electron Co Ltd | Semiconductor device |
US5471330A (en) * | 1993-07-29 | 1995-11-28 | Honeywell Inc. | Polysilicon pixel electrode |
-
1995
- 1995-06-19 DE DE69529493T patent/DE69529493T2/de not_active Expired - Fee Related
- 1995-06-19 EP EP95304240A patent/EP0689085B1/de not_active Expired - Lifetime
- 1995-06-20 KR KR1019950016374A patent/KR100214097B1/ko not_active IP Right Cessation
-
1997
- 1997-09-30 US US08/940,944 patent/US5815223A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0689085A3 (de) | 1997-01-08 |
DE69529493T2 (de) | 2003-10-30 |
KR100214097B1 (ko) | 1999-08-02 |
EP0689085B1 (de) | 2003-01-29 |
US5815223A (en) | 1998-09-29 |
EP0689085A2 (de) | 1995-12-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |