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DE60304505D1 - Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten - Google Patents

Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten

Info

Publication number
DE60304505D1
DE60304505D1 DE60304505T DE60304505T DE60304505D1 DE 60304505 D1 DE60304505 D1 DE 60304505D1 DE 60304505 T DE60304505 T DE 60304505T DE 60304505 T DE60304505 T DE 60304505T DE 60304505 D1 DE60304505 D1 DE 60304505D1
Authority
DE
Germany
Prior art keywords
polishing
conductive
article
substrate
articles
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60304505T
Other languages
English (en)
Other versions
DE60304505T2 (de
Inventor
Yongqi Hu
Yan Wang
Alain Duboust
Feng Q Liu
Rashid Mavliev
Liang-Yuh Chen
Ratson Morad
Sasson Somekh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of DE60304505D1 publication Critical patent/DE60304505D1/de
Application granted granted Critical
Publication of DE60304505T2 publication Critical patent/DE60304505T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/046Lapping machines or devices; Accessories designed for working plane surfaces using electric current
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/12Lapping plates for working plane surfaces
    • B24B37/16Lapping plates for working plane surfaces characterised by the shape of the lapping plate surface, e.g. grooved
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/12Lapping plates for working plane surfaces
    • B24B37/14Lapping plates for working plane surfaces characterised by the composition or properties of the plate materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23HWORKING OF METAL BY THE ACTION OF A HIGH CONCENTRATION OF ELECTRIC CURRENT ON A WORKPIECE USING AN ELECTRODE WHICH TAKES THE PLACE OF A TOOL; SUCH WORKING COMBINED WITH OTHER FORMS OF WORKING OF METAL
    • B23H5/00Combined machining
    • B23H5/06Electrochemical machining combined with mechanical working, e.g. grinding or honing
    • B23H5/08Electrolytic grinding
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/902Specified use of nanostructure

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
  • Electroplating Methods And Accessories (AREA)
DE60304505T 2002-05-07 2003-05-02 Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten Expired - Lifetime DE60304505T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US140010 1987-12-31
US10/140,010 US6979248B2 (en) 2002-05-07 2002-05-07 Conductive polishing article for electrochemical mechanical polishing

Publications (2)

Publication Number Publication Date
DE60304505D1 true DE60304505D1 (de) 2006-05-24
DE60304505T2 DE60304505T2 (de) 2006-09-07

Family

ID=29249779

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60304505T Expired - Lifetime DE60304505T2 (de) 2002-05-07 2003-05-02 Polierartikel zum elektrochemisch-mechanischen Polieren von Substraten

Country Status (9)

Country Link
US (1) US6979248B2 (de)
EP (1) EP1361023B1 (de)
JP (2) JP2004134732A (de)
KR (3) KR20030087569A (de)
CN (3) CN2737501Y (de)
AT (1) ATE322959T1 (de)
DE (1) DE60304505T2 (de)
SG (1) SG117444A1 (de)
TW (3) TWI274386B (de)

Families Citing this family (75)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2584882B2 (ja) * 1990-03-15 1997-02-26 富士電機株式会社 自動販売機
US7670468B2 (en) 2000-02-17 2010-03-02 Applied Materials, Inc. Contact assembly and method for electrochemical mechanical processing
US6979248B2 (en) 2002-05-07 2005-12-27 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7077721B2 (en) * 2000-02-17 2006-07-18 Applied Materials, Inc. Pad assembly for electrochemical mechanical processing
US7029365B2 (en) 2000-02-17 2006-04-18 Applied Materials Inc. Pad assembly for electrochemical mechanical processing
US7125477B2 (en) 2000-02-17 2006-10-24 Applied Materials, Inc. Contacts for electrochemical processing
US7678245B2 (en) 2000-02-17 2010-03-16 Applied Materials, Inc. Method and apparatus for electrochemical mechanical processing
US7059948B2 (en) 2000-12-22 2006-06-13 Applied Materials Articles for polishing semiconductor substrates
US7066800B2 (en) 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US6962524B2 (en) 2000-02-17 2005-11-08 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6848970B2 (en) 2002-09-16 2005-02-01 Applied Materials, Inc. Process control in electrochemically assisted planarization
US7303462B2 (en) 2000-02-17 2007-12-04 Applied Materials, Inc. Edge bead removal by an electro polishing process
US7303662B2 (en) 2000-02-17 2007-12-04 Applied Materials, Inc. Contacts for electrochemical processing
US7374644B2 (en) 2000-02-17 2008-05-20 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6991528B2 (en) 2000-02-17 2006-01-31 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7137879B2 (en) 2001-04-24 2006-11-21 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US7344432B2 (en) * 2001-04-24 2008-03-18 Applied Materials, Inc. Conductive pad with ion exchange membrane for electrochemical mechanical polishing
US6723299B1 (en) 2001-05-17 2004-04-20 Zyvex Corporation System and method for manipulating nanotubes
US20040034177A1 (en) 2002-05-02 2004-02-19 Jian Chen Polymer and method for using the polymer for solubilizing nanotubes
US6905667B1 (en) 2002-05-02 2005-06-14 Zyvex Corporation Polymer and method for using the polymer for noncovalently functionalizing nanotubes
US6783657B2 (en) * 2002-08-29 2004-08-31 Micron Technology, Inc. Systems and methods for the electrolytic removal of metals from substrates
US20040040863A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Systems for electrolytic removal of metals from substrates
JP2004181584A (ja) * 2002-12-04 2004-07-02 Showa Denko Kk 研磨用複合材料及び砥石、研削材料、研磨材料並びに電子部品の加工方法及びシリコンの加工方法
WO2004073926A1 (en) * 2003-02-18 2004-09-02 Parker-Hannifin Corporation Polishing article for electro-chemical mechanical polishing
US7842169B2 (en) * 2003-03-04 2010-11-30 Applied Materials, Inc. Method and apparatus for local polishing control
GB2421506B (en) 2003-05-22 2008-07-09 Zyvex Corp Nanocomposites and methods thereto
WO2004108358A2 (en) * 2003-06-06 2004-12-16 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6848977B1 (en) * 2003-08-29 2005-02-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad for electrochemical mechanical polishing
US7654885B2 (en) * 2003-10-03 2010-02-02 Applied Materials, Inc. Multi-layer polishing pad
US20050173259A1 (en) * 2004-02-06 2005-08-11 Applied Materials, Inc. Endpoint system for electro-chemical mechanical polishing
US8066552B2 (en) 2003-10-03 2011-11-29 Applied Materials, Inc. Multi-layer polishing pad for low-pressure polishing
US7128821B2 (en) * 2004-01-20 2006-10-31 Taiwan Semiconductor Manufacturing Co., Ltd. Electropolishing method for removing particles from wafer surface
US20070187257A1 (en) * 2004-03-19 2007-08-16 Ebara Corporation Electrolytic processing apparatus and electrolytic processing method
US7618529B2 (en) * 2004-05-25 2009-11-17 Rohm And Haas Electronic Materials Cmp Holdings, Inc Polishing pad for electrochemical mechanical polishing
DE102004028658A1 (de) * 2004-06-15 2006-01-05 Albert-Ludwigs-Universität Freiburg, vertreten durch den Rektor Komposit-Werkzeugelektrode für die elektrochemische Materialbearbeitung und Verfahren zu deren Herstellung
US7198549B2 (en) 2004-06-16 2007-04-03 Cabot Microelectronics Corporation Continuous contour polishing of a multi-material surface
US7296576B2 (en) 2004-08-18 2007-11-20 Zyvex Performance Materials, Llc Polymers for enhanced solubility of nanomaterials, compositions and methods therefor
US7084064B2 (en) 2004-09-14 2006-08-01 Applied Materials, Inc. Full sequence metal and barrier layer electrochemical mechanical processing
US7520968B2 (en) 2004-10-05 2009-04-21 Applied Materials, Inc. Conductive pad design modification for better wafer-pad contact
EP1858694A4 (de) * 2005-02-25 2012-04-04 Superior Graphite Co Graphitbeschichtung von teilchenförmigen materialien
US20060219663A1 (en) * 2005-03-31 2006-10-05 Applied Materials, Inc. Metal CMP process on one or more polishing stations using slurries with oxidizers
US7427340B2 (en) 2005-04-08 2008-09-23 Applied Materials, Inc. Conductive pad
US20060286906A1 (en) * 2005-06-21 2006-12-21 Cabot Microelectronics Corporation Polishing pad comprising magnetically sensitive particles and method for the use thereof
US7407433B2 (en) * 2005-11-03 2008-08-05 Applied Materials, Inc. Pad characterization tool
US20070131562A1 (en) * 2005-12-08 2007-06-14 Applied Materials, Inc. Method and apparatus for planarizing a substrate with low fluid consumption
US8264137B2 (en) 2006-01-03 2012-09-11 Samsung Electronics Co., Ltd. Curing binder material for carbon nanotube electron emission cathodes
US20070153453A1 (en) * 2006-01-05 2007-07-05 Applied Materials, Inc. Fully conductive pad for electrochemical mechanical processing
US20070218587A1 (en) * 2006-03-07 2007-09-20 Applied Materials, Inc. Soft conductive polymer processing pad and method for fabricating the same
US20070235344A1 (en) * 2006-04-06 2007-10-11 Applied Materials, Inc. Process for high copper removal rate with good planarization and surface finish
US20070251832A1 (en) * 2006-04-27 2007-11-01 Applied Materials, Inc. Method and apparatus for electrochemical mechanical polishing of cu with higher liner velocity for better surface finish and higher removal rate during clearance
US7422982B2 (en) 2006-07-07 2008-09-09 Applied Materials, Inc. Method and apparatus for electroprocessing a substrate with edge profile control
US20080014845A1 (en) * 2006-07-11 2008-01-17 Alpay Yilmaz Conditioning disk having uniform structures
US8012000B2 (en) * 2007-04-02 2011-09-06 Applied Materials, Inc. Extended pad life for ECMP and barrier removal
US20080277787A1 (en) * 2007-05-09 2008-11-13 Liu Feng Q Method and pad design for the removal of barrier material by electrochemical mechanical processing
US7828634B2 (en) * 2007-08-16 2010-11-09 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Interconnected-multi-element-lattice polishing pad
US7517277B2 (en) * 2007-08-16 2009-04-14 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Layered-filament lattice for chemical mechanical polishing
US20090088050A1 (en) * 2007-09-28 2009-04-02 Wei-Yung Hsu Conductive polishing article for electrochemical mechanical polishing
WO2009048099A1 (ja) * 2007-10-09 2009-04-16 Roki Techno Co., Ltd. 研磨工具構成体、研磨表層及び研磨方法
WO2009120804A2 (en) * 2008-03-28 2009-10-01 Applied Materials, Inc. Improved pad properties using nanoparticle additives
TWI449597B (zh) * 2008-07-09 2014-08-21 Iv Technologies Co Ltd 研磨墊及其製造方法
JP5038259B2 (ja) * 2008-08-26 2012-10-03 株式会社日立ハイテクノロジーズ クリーニング装置およびクリーニング方法
CN102666021B (zh) * 2009-12-29 2015-04-22 圣戈班磨料磨具有限公司 抗填塞磨料物品
KR101329796B1 (ko) * 2011-11-02 2013-11-18 한국과학기술연구원 폴리아크릴로나이트릴계 전기 전도성 복합재료용 조성물, 상기 복합재료의 제조 방법 및 그에 따른 복합재료
TW201417195A (zh) * 2012-10-23 2014-05-01 Wecon Automation Corp 圓形式晶粒置放方法
JP5266415B1 (ja) * 2012-11-08 2013-08-21 日本蚕毛染色株式会社 静電容量式タッチパネル用筆記具
CN104919575B (zh) * 2013-01-11 2018-09-18 应用材料公司 化学机械抛光设备及方法
US9415479B2 (en) * 2013-02-08 2016-08-16 Taiwan Semiconductor Manufacturing Co., Ltd. Conductive chemical mechanical planarization polishing pad
US9914197B2 (en) 2013-12-09 2018-03-13 Saint-Gobain Abrasives, Inc. Abrasive assembly having alignment elements
US9914199B2 (en) * 2013-12-09 2018-03-13 Saint-Gobain Abrasives, Inc. Abrasive disc
CN104894634A (zh) * 2014-03-03 2015-09-09 盛美半导体设备(上海)有限公司 新型电化学抛光装置
CN105619965A (zh) * 2014-11-28 2016-06-01 苏州力合光电薄膜科技有限公司 自润滑薄膜结构及其制造方法和应用
ES2604830B1 (es) * 2016-04-28 2017-12-18 Drylyte, S.L. Proceso para alisado y pulido de metales por transporte iónico mediante cuerpos sólidos libres, y cuerpos sólidos para llevar a cabo dicho proceso.
KR102142197B1 (ko) * 2018-12-28 2020-09-14 임교순 필름 연결형 누설 감지 커넥터
US12094740B2 (en) 2021-03-25 2024-09-17 Applied Materials, Inc. Automated dry-in dry-out dual side polishing of silicon substrates with integrated spin rinse dry and metrology
CN116003726A (zh) * 2022-11-09 2023-04-25 合肥宏光研磨科技有限公司 碳纳米管改性聚氨酯抛光衬垫材料及其制备方法

Family Cites Families (246)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US88715A (en) * 1869-04-06 Improved material for paint
BE333311A (de) 1925-05-23
US1927162A (en) 1931-02-27 1933-09-19 Research Corp Electroplating
US2112691A (en) * 1936-01-30 1938-03-29 Pyrene Mfg Co Electroplating anode unit
US2240265A (en) * 1937-03-30 1941-04-29 John S Nachtman Method of continuously tin plating ferrous metal stock
US2431065A (en) 1938-12-12 1947-11-18 Meaker Company Continuous wire and strip electro-processing machine
US2392687A (en) * 1943-02-15 1946-01-08 John S Nachtman Apparatus for electroplating wire
US2461556A (en) * 1943-04-01 1949-02-15 Carnegie Illinois Steel Corp Method and apparatus for the electrolytic coating of metal strip
US2544510A (en) * 1943-10-23 1951-03-06 Nat Steel Corp Apparatus and method for plating strips
US2503863A (en) * 1943-11-18 1950-04-11 Siegfried G Bart Apparatus for electroplating the inside of pipes
US2509304A (en) * 1944-02-24 1950-05-30 Nat Steel Corp Method and apparatus for electrolytic coating of strip material
US2453481A (en) 1944-03-14 1948-11-09 Nat Steel Corp Anode for electrolytic coating
US2490055A (en) 1944-03-30 1949-12-06 Nat Steel Corp Metal strip electroplating apparatus
US2495695A (en) * 1944-05-08 1950-01-31 Kenmore Metals Corp Electroplating apparatus
US2536912A (en) * 1944-07-12 1951-01-02 Ibm Electrolysis etching device
US2569578A (en) 1944-08-07 1951-10-02 Nat Steel Corp Apparatus for electrocoating striplike material
US2480022A (en) 1944-10-07 1949-08-23 George B Hogaboom Rotary barrel
US2473290A (en) * 1944-10-21 1949-06-14 George E Millard Apparatus for plating journals of crankshafts
US2456185A (en) 1944-11-23 1948-12-14 Gen Motors Corp Electroplating apparatus
US2517907A (en) 1945-01-05 1950-08-08 Conmar Prod Corp Apparatus for electrotreating metal slide fasteners
US2500205A (en) * 1945-04-12 1950-03-14 Cleveland Graphite Bronze Co Method of plating
US2454935A (en) 1945-06-27 1948-11-30 Meaker Company Continuous wire and strip electroprocessing machine
NL69965C (de) 1945-08-10
US2619454A (en) 1945-08-30 1952-11-25 Brush Dev Co Method of manufacturing a magnetic recording medium by electrodeposition
US2554943A (en) * 1945-10-25 1951-05-29 Bethlehem Steel Corp Electroplating apparatus
US2506794A (en) * 1945-11-23 1950-05-09 Revere Copper & Brass Inc Apparatus for electroplating
US2530677A (en) 1946-01-17 1950-11-21 Edward L Berkenkotter Apparatus for plating crankshafts
US2457510A (en) 1946-01-23 1948-12-28 Delbert G Van Ornum Electroplating apparatus
US2519945A (en) 1946-01-25 1950-08-22 Gen Electric Electroplating apparatus
US2477808A (en) 1946-05-08 1949-08-02 Carl G Jones Electrolytic apparatus for treatment of moving strip
US2576074A (en) 1946-06-11 1951-11-20 John S Nachtman Method and apparatus for continuous strip metal treatment
US2479323A (en) 1946-06-13 1949-08-16 Udylite Corp Plating machine
US2512328A (en) * 1946-06-28 1950-06-20 Armco Steel Corp Continuous electroplating device
US2500206A (en) * 1946-06-29 1950-03-14 Cleveland Graphite Bronze Co Apparatus for plating
US2560534A (en) 1946-07-12 1951-07-17 Nat Standard Co Method of operating a continuous electroplating system
US2539898A (en) * 1946-08-16 1951-01-30 Udylite Corp Electrical contact mechanism for plating machines
US2549678A (en) * 1946-08-23 1951-04-17 Conn Ltd C G Method of and apparatus for electroforming metal articles
US2556017A (en) * 1947-01-29 1951-06-05 Edwin E Vonada Electrolytic method and apparatus for cleaning strip
US2535966A (en) 1947-02-07 1950-12-26 Teplitz Alfred Electrolytic apparatus for cleaning strip
US2540175A (en) * 1947-02-11 1951-02-06 Rosenqvist Gunnar Manufacture by electrodeposition
US2569577A (en) 1947-05-09 1951-10-02 Nat Steel Corp Method of and apparatus for electroplating
US2458676A (en) * 1947-07-22 1949-01-11 Brenner Abner Apparatus for electroplating
US2560966A (en) 1947-07-31 1951-07-17 Revere Copper & Brass Inc Method of electroplating copper clad stainless steel cooking vessels
US2571709A (en) 1947-08-26 1951-10-16 Western Electric Co Apparatus for electroplating articles
US2646398A (en) 1948-10-08 1953-07-21 Gen Motors Corp Electroprocessing apparatus
BE494578A (de) * 1949-03-18
US2689215A (en) 1949-07-13 1954-09-14 Siegfried G Bart Method and apparatus for plating pipe
US2587630A (en) * 1949-07-28 1952-03-04 Sulphide Ore Process Company I Method for electrodeposition of iron in the form of continuous strips
US2656283A (en) 1949-08-31 1953-10-20 Ohio Commw Eng Co Method of plating wire
US2656284A (en) 1949-09-07 1953-10-20 Ohio Commw Eng Co Method of plating rolled sheet metal
US2657457A (en) 1949-09-10 1953-11-03 Ohio Commw Eng Co Continuous metal production and continuous gas plating
US2684939A (en) 1949-12-17 1954-07-27 Time Inc Apparatus for plating chromium
US2633452A (en) * 1950-05-03 1953-03-31 Jr George B Hogaboom Strainer bags for enclosing electroplating anodes
US2657177A (en) 1950-07-10 1953-10-27 United States Steel Corp Plating thickness regulator
US2674550A (en) * 1950-09-05 1954-04-06 Kolene Corp Apparatus and method for processing of steel strip continuously
US2680710A (en) * 1950-09-14 1954-06-08 Kenmore Metal Corp Method and apparatus for continuously electroplating heavy wire and similar strip material
US2675348A (en) * 1950-09-16 1954-04-13 Greenspan Lawrence Apparatus for metal plating
US2706173A (en) * 1950-10-12 1955-04-12 Harold R Wells Apparatus for electro-plating crankshaft journals
US2673836A (en) * 1950-11-22 1954-03-30 United States Steel Corp Continuous electrolytic pickling and tin plating of steel strip
US2696859A (en) 1950-12-16 1954-12-14 Gildo J Somma Screw driver attachment
US2695269A (en) 1951-03-02 1954-11-23 United States Steel Corp Apparatus for electroplating wire
US2698832A (en) * 1951-03-20 1955-01-04 Standard Process Corp Plating apparatus
US2711993A (en) * 1951-05-01 1955-06-28 Lyon George Albert Apparatus for conveying cylindrical articles through a bath
US2710834A (en) * 1951-10-27 1955-06-14 Vrilakas Marcus Apparatus for selective plating
US2708445A (en) * 1952-07-11 1955-05-17 Nat Standard Co Wire processing apparatus
US3162588A (en) 1961-04-17 1964-12-22 Hammond Machinery Builders Inc Belt type electrolytic grinding machine
US3334041A (en) 1964-08-28 1967-08-01 Norton Co Coated abrasives
US3476677A (en) 1965-02-15 1969-11-04 Carbond Corp Electrolytic grinding tools
US3433730A (en) * 1965-04-28 1969-03-18 Gen Electric Electrically conductive tool and method for making
US3448023A (en) * 1966-01-20 1969-06-03 Hammond Machinery Builders Inc Belt type electro-chemical (or electrolytic) grinding machine
US3942959A (en) * 1967-12-22 1976-03-09 Fabriksaktiebolaget Eka Multilayered flexible abrasive containing a layer of electroconductive material
AU3308268A (en) 1968-02-05 1970-03-12 Raynors Pty. Limited Plating and anodising bath racks
US3992178A (en) * 1973-04-17 1976-11-16 Fabrika Ab Eka Flexible coated abrasive with graphite outer layer
US3873512A (en) * 1973-04-30 1975-03-25 Martin Marietta Corp Machining method
US4001094A (en) * 1974-09-19 1977-01-04 Jumer John F Method for incremental electro-processing of large areas
US4047902A (en) 1975-04-01 1977-09-13 Wiand Richard K Metal-plated abrasive product and method of manufacturing the product
GB1539309A (en) 1976-12-14 1979-01-31 Inoue Japax Res Electrochemical polishing
US4119515A (en) 1977-03-28 1978-10-10 National Steel Corporation Apparatus for electroplating sheet metals
US4312716A (en) * 1980-11-21 1982-01-26 Western Electric Co., Inc. Supporting an array of elongate articles
JP2501781B2 (ja) * 1982-03-30 1996-05-29 日立マクセル株式会社 導電性研磨用部材
US4523411A (en) * 1982-12-20 1985-06-18 Minnesota Mining And Manufacturing Company Wet surface treating device and element therefor
JPS6179666U (de) 1984-10-31 1986-05-27
JPS61265279A (ja) * 1985-05-17 1986-11-25 Tohoku Metal Ind Ltd フレキシブル磁気デイスク用研摩テ−プ
JPS6133353U (ja) 1985-06-06 1986-02-28 日本高圧電気株式会社 高圧カツトアウト用限流ヒユ−ズ
US4704511A (en) 1985-10-17 1987-11-03 Inoue-Japax Research Incorporated Traveling-wire electroerosion machine with swiveling nozzle assembly
JPS62127492A (ja) 1985-11-26 1987-06-09 Shigeo Hoshino カ−ボン繊維を用いる電気めつきの方法
US4839993A (en) * 1986-01-28 1989-06-20 Fujisu Limited Polishing machine for ferrule of optical fiber connector
ES2024439B3 (es) * 1986-02-28 1992-03-01 Schering Ag Berlin Und Bergkamen Armazones alargados y piezas correspondientes para la fijacion soltable de placas de circuito impreso que han de galvanizarse, y placas de circuito impreso correspondientes.
US4772361A (en) 1987-12-04 1988-09-20 Dorsett Terry E Application of electroplate to moving metal by belt plating
US4793895A (en) 1988-01-25 1988-12-27 Ibm Corporation In situ conductivity monitoring technique for chemical/mechanical planarization endpoint detection
JPH01193166A (ja) 1988-01-28 1989-08-03 Showa Denko Kk 半導体ウェハ鏡面研磨用パッド
SU1618538A1 (ru) 1988-09-13 1991-01-07 Предприятие П/Я А-1067 Устройство дл электрохимикомеханического полировани и доводки деталей
US4934102A (en) * 1988-10-04 1990-06-19 International Business Machines Corporation System for mechanical planarization
JP2601333B2 (ja) * 1988-10-05 1997-04-16 三井金属鉱業株式会社 複合砥石およびその製造方法
CH678156A5 (de) 1989-03-20 1991-08-15 Exnii Metallorezh Stankov
US5061294A (en) * 1989-05-15 1991-10-29 Minnesota Mining And Manufacturing Company Abrasive article with conductive, doped, conjugated, polymer coat and method of making same
US5108463B1 (en) * 1989-08-21 1996-08-13 Minnesota Mining & Mfg Conductive coated abrasives
US5136817A (en) 1990-02-28 1992-08-11 Nihon Dempa Kogyo Co., Ltd. Automatic lapping apparatus for piezoelectric materials
US5257478A (en) 1990-03-22 1993-11-02 Rodel, Inc. Apparatus for interlayer planarization of semiconductor material
US5081421A (en) 1990-05-01 1992-01-14 At&T Bell Laboratories In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
US5137542A (en) 1990-08-08 1992-08-11 Minnesota Mining And Manufacturing Company Abrasive printed with an electrically conductive ink
US5066370A (en) 1990-09-07 1991-11-19 International Business Machines Corporation Apparatus, electrochemical process, and electrolyte for microfinishing stainless steel print bands
US5096550A (en) * 1990-10-15 1992-03-17 The United States Of America As Represented By The United States Department Of Energy Method and apparatus for spatially uniform electropolishing and electrolytic etching
JPH0647678Y2 (ja) 1990-12-28 1994-12-07 ユーエイチティー株式会社 穿孔装置
US5217586A (en) * 1992-01-09 1993-06-08 International Business Machines Corporation Electrochemical tool for uniform metal removal during electropolishing
CA2128089A1 (en) * 1992-02-12 1993-08-19 Herbert W. Schnabel A coated abrasive article containing an electrically conductive backing
JPH05277957A (ja) 1992-04-02 1993-10-26 Nippon Micro Kooteingu Kk 帯電防止研磨シート
US5225034A (en) 1992-06-04 1993-07-06 Micron Technology, Inc. Method of chemical mechanical polishing predominantly copper containing metal layers in semiconductor processing
US5203884A (en) * 1992-06-04 1993-04-20 Minnesota Mining And Manufacturing Company Abrasive article having vanadium oxide incorporated therein
US5328716A (en) * 1992-08-11 1994-07-12 Minnesota Mining And Manufacturing Company Method of making a coated abrasive article containing a conductive backing
MY114512A (en) 1992-08-19 2002-11-30 Rodel Inc Polymeric substrate with polymeric microelements
US5562529A (en) * 1992-10-08 1996-10-08 Fujitsu Limited Apparatus and method for uniformly polishing a wafer
US5534106A (en) 1994-07-26 1996-07-09 Kabushiki Kaisha Toshiba Apparatus for processing semiconductor wafers
US5567300A (en) 1994-09-02 1996-10-22 Ibm Corporation Electrochemical metal removal technique for planarization of surfaces
JPH08112769A (ja) * 1994-10-14 1996-05-07 Fuji Photo Film Co Ltd 研磨テープ
US5674122A (en) 1994-10-27 1997-10-07 Minnesota Mining And Manufacturing Company Abrasive articles and methods for their manufacture
US6017265A (en) * 1995-06-07 2000-01-25 Rodel, Inc. Methods for using polishing pads
US5486282A (en) 1994-11-30 1996-01-23 Ibm Corporation Electroetching process for seed layer removal in electrochemical fabrication of wafers
US5478435A (en) 1994-12-16 1995-12-26 National Semiconductor Corp. Point of use slurry dispensing system
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
EP0744248B1 (de) 1995-05-18 1998-10-28 Sandro Giovanni Giuseppe Ferronato Schleifelement zum Trockenschleifen und -Polieren und Verfahren zur Herstellung
US6024630A (en) * 1995-06-09 2000-02-15 Applied Materials, Inc. Fluid-pressure regulated wafer polishing head
US5702811A (en) * 1995-10-20 1997-12-30 Ho; Kwok-Lun High performance abrasive articles containing abrasive grains and nonabrasive composite grains
US5804507A (en) 1995-10-27 1998-09-08 Applied Materials, Inc. Radially oscillating carousel processing system for chemical mechanical polishing
US5738574A (en) * 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
US5840629A (en) 1995-12-14 1998-11-24 Sematech, Inc. Copper chemical mechanical polishing slurry utilizing a chromate oxidant
US5882491A (en) * 1996-01-02 1999-03-16 Skf Industrial Trading & Development Company B.V. Electrode for electrochemical machining, method of electrochemical machining with said electrode, a bearing and a method of determining a profile using said electrode
US5575706A (en) 1996-01-11 1996-11-19 Taiwan Semiconductor Manufacturing Company Ltd. Chemical/mechanical planarization (CMP) apparatus and polish method
US5948697A (en) 1996-05-23 1999-09-07 Lsi Logic Corporation Catalytic acceleration and electrical bias control of CMP processing
US5823854A (en) 1996-05-28 1998-10-20 Industrial Technology Research Institute Chemical-mechanical polish (CMP) pad conditioner
NL1003233C2 (nl) * 1996-05-30 1997-12-03 Skf Ind Trading & Dev Werkwijze voor het vervaardigen van een lagerring en een lager dat een dergelijke lagerring omvat.
US5871392A (en) * 1996-06-13 1999-02-16 Micron Technology, Inc. Under-pad for chemical-mechanical planarization of semiconductor wafers
JPH106213A (ja) 1996-06-18 1998-01-13 Tokyo Seimitsu Co Ltd 半導体ウェーハ用研磨盤
US6056851A (en) * 1996-06-24 2000-05-02 Taiwan Semiconductor Manufacturing Company Slurry supply system for chemical mechanical polishing
US5846882A (en) 1996-10-03 1998-12-08 Applied Materials, Inc. Endpoint detector for a chemical mechanical polishing system
US6183354B1 (en) * 1996-11-08 2001-02-06 Applied Materials, Inc. Carrier head with a flexible membrane for a chemical mechanical polishing system
FR2758285B3 (fr) 1997-01-13 1998-12-04 Struers As Procede de fixation d'un agent abrasif ou de polissage, sous forme de feuille, sur un support magnetique
US6020264A (en) * 1997-01-31 2000-02-01 International Business Machines Corporation Method and apparatus for in-line oxide thickness determination in chemical-mechanical polishing
US5938801A (en) 1997-02-12 1999-08-17 Micron Technology, Inc. Polishing pad and a method for making a polishing pad with covalently bonded particles
US6328642B1 (en) 1997-02-14 2001-12-11 Lam Research Corporation Integrated pad and belt for chemical mechanical polishing
US6769969B1 (en) 1997-03-06 2004-08-03 Keltech Engineering, Inc. Raised island abrasive, method of use and lapping apparatus
US5911619A (en) * 1997-03-26 1999-06-15 International Business Machines Corporation Apparatus for electrochemical mechanical planarization
US5807165A (en) 1997-03-26 1998-09-15 International Business Machines Corporation Method of electrochemical mechanical planarization
US5990010A (en) 1997-04-08 1999-11-23 Lsi Logic Corporation Pre-conditioning polishing pads for chemical-mechanical polishing
AU734883B2 (en) 1997-04-30 2001-06-21 Minnesota Mining And Manufacturing Company Method of planarizing the upper surface of a semiconductor wafer
US6537140B1 (en) * 1997-05-14 2003-03-25 Saint-Gobain Abrasives Technology Company Patterned abrasive tools
JPH1142554A (ja) 1997-07-25 1999-02-16 Nec Corp 研磨量制御装置
JPH1158205A (ja) * 1997-08-25 1999-03-02 Unique Technol Internatl Pte Ltd 電解研磨併用ポリシング・テクスチャー加工装置および加工方法ならびにそれに使用する電解研磨併用ポリシング・テクスチャーテープ
JPH11111656A (ja) 1997-09-30 1999-04-23 Nec Corp 半導体装置の製造方法
US6033293A (en) * 1997-10-08 2000-03-07 Lucent Technologies Inc. Apparatus for performing chemical-mechanical polishing
US6372001B1 (en) * 1997-10-09 2002-04-16 3M Innovative Properties Company Abrasive articles and their preparations
US6103096A (en) 1997-11-12 2000-08-15 International Business Machines Corporation Apparatus and method for the electrochemical etching of a wafer
WO1999026758A1 (en) * 1997-11-25 1999-06-03 John Hopkins University Electrochemical-control of abrasive polishing and machining rates
JP3074305B2 (ja) 1998-01-05 2000-08-07 京セラ株式会社 光走査装置及び該装置を用いた画像形成装置
JPH11216663A (ja) 1998-02-03 1999-08-10 Sony Corp 研磨パッド、研磨装置および研磨方法
US6153043A (en) 1998-02-06 2000-11-28 International Business Machines Corporation Elimination of photo-induced electrochemical dissolution in chemical mechanical polishing
AU2233399A (en) 1998-02-12 1999-08-30 Acm Research, Inc. Plating apparatus and method
US6004880A (en) 1998-02-20 1999-12-21 Lsi Logic Corporation Method of single step damascene process for deposition and global planarization
JP2870537B1 (ja) 1998-02-26 1999-03-17 日本電気株式会社 研磨装置及び該装置を用いる半導体装置の製造方法
AU3553599A (en) 1998-04-13 1999-11-01 Acm Research, Inc. Method and apparatus for enhancing adhesion between barrier layer and metal layer formed by plating
JP3295888B2 (ja) 1998-04-22 2002-06-24 株式会社藤森技術研究所 ケミカルマシンポリッシャの研磨盤用研磨ドレッサ
US6210257B1 (en) * 1998-05-29 2001-04-03 Micron Technology, Inc. Web-format polishing pads and methods for manufacturing and using web-format polishing pads in mechanical and chemical-mechanical planarization of microelectronic substrates
US6121152A (en) 1998-06-11 2000-09-19 Integrated Process Equipment Corporation Method and apparatus for planarization of metallized semiconductor wafers using a bipolar electrode assembly
US6447668B1 (en) 1998-07-09 2002-09-10 Acm Research, Inc. Methods and apparatus for end-point detection
US6395152B1 (en) 1998-07-09 2002-05-28 Acm Research, Inc. Methods and apparatus for electropolishing metal interconnections on semiconductor devices
US6190494B1 (en) * 1998-07-29 2001-02-20 Micron Technology, Inc. Method and apparatus for electrically endpointing a chemical-mechanical planarization process
US6248222B1 (en) 1998-09-08 2001-06-19 Acm Research, Inc. Methods and apparatus for holding and positioning semiconductor workpieces during electropolishing and/or electroplating of the workpieces
US6159079A (en) 1998-09-08 2000-12-12 Applied Materials, Inc. Carrier head for chemical mechanical polishing a substrate
US6176992B1 (en) * 1998-11-03 2001-01-23 Nutool, Inc. Method and apparatus for electro-chemical mechanical deposition
JP2000141215A (ja) * 1998-11-05 2000-05-23 Sony Corp 平坦化研磨装置及び平坦化研磨方法
US6541381B2 (en) 1998-11-06 2003-04-01 Beaver Creek Concepts Inc Finishing method for semiconductor wafers using a lubricating boundary layer
EP1133786A2 (de) 1998-11-28 2001-09-19 ACM Research, Inc. Verfahren und vorrichtung zur halterung und positionierung von halbleiterwerkstücken beim elektropolieren und/oder elektroplattieren von halbleiterwerkstücken
US6497800B1 (en) 2000-03-17 2002-12-24 Nutool Inc. Device providing electrical contact to the surface of a semiconductor workpiece during metal plating
US6328872B1 (en) 1999-04-03 2001-12-11 Nutool, Inc. Method and apparatus for plating and polishing a semiconductor substrate
US6409904B1 (en) 1998-12-01 2002-06-25 Nutool, Inc. Method and apparatus for depositing and controlling the texture of a thin film
US6251235B1 (en) 1999-03-30 2001-06-26 Nutool, Inc. Apparatus for forming an electrical contact with a semiconductor substrate
US6413388B1 (en) 2000-02-23 2002-07-02 Nutool Inc. Pad designs and structures for a versatile materials processing apparatus
US6077337A (en) * 1998-12-01 2000-06-20 Intel Corporation Chemical-mechanical polishing slurry
US6322422B1 (en) 1999-01-19 2001-11-27 Nec Corporation Apparatus for accurately measuring local thickness of insulating layer on semiconductor wafer during polishing and polishing system using the same
JP3047904B1 (ja) 1999-02-03 2000-06-05 日本電気株式会社 研磨装置
US6244935B1 (en) 1999-02-04 2001-06-12 Applied Materials, Inc. Apparatus and methods for chemical mechanical polishing with an advanceable polishing sheet
US6066030A (en) 1999-03-04 2000-05-23 International Business Machines Corporation Electroetch and chemical mechanical polishing equipment
US6238592B1 (en) * 1999-03-10 2001-05-29 3M Innovative Properties Company Working liquids and methods for modifying structured wafers suited for semiconductor fabrication
US6296557B1 (en) 1999-04-02 2001-10-02 Micron Technology, Inc. Method and apparatus for releasably attaching polishing pads to planarizing machines in mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies
US6217426B1 (en) * 1999-04-06 2001-04-17 Applied Materials, Inc. CMP polishing pad
US6431968B1 (en) 1999-04-22 2002-08-13 Applied Materials, Inc. Carrier head with a compressible film
US6238271B1 (en) * 1999-04-30 2001-05-29 Speed Fam-Ipec Corp. Methods and apparatus for improved polishing of workpieces
US20020077037A1 (en) 1999-05-03 2002-06-20 Tietz James V. Fixed abrasive articles
US6261168B1 (en) 1999-05-21 2001-07-17 Lam Research Corporation Chemical mechanical planarization or polishing pad with sections having varied groove patterns
US6156124A (en) 1999-06-18 2000-12-05 Applied Materials, Inc. Wafer transfer station for a chemical mechanical polisher
US6381169B1 (en) * 1999-07-01 2002-04-30 The Regents Of The University Of California High density non-volatile memory device
US6297159B1 (en) 1999-07-07 2001-10-02 Advanced Micro Devices, Inc. Method and apparatus for chemical polishing using field responsive materials
US6258223B1 (en) 1999-07-09 2001-07-10 Applied Materials, Inc. In-situ electroless copper seed layer enhancement in an electroplating system
US6319108B1 (en) 1999-07-09 2001-11-20 3M Innovative Properties Company Metal bond abrasive article comprising porous ceramic abrasive composites and method of using same to abrade a workpiece
US6234870B1 (en) * 1999-08-24 2001-05-22 International Business Machines Corporation Serial intelligent electro-chemical-mechanical wafer processor
US6331135B1 (en) 1999-08-31 2001-12-18 Micron Technology, Inc. Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
US6406363B1 (en) 1999-08-31 2002-06-18 Lam Research Corporation Unsupported chemical mechanical polishing belt
JP4513145B2 (ja) 1999-09-07 2010-07-28 ソニー株式会社 半導体装置の製造方法および研磨方法
US6368872B1 (en) * 1999-10-22 2002-04-09 Tecan Trading Ag Apparatus and method for chemical processing
US6520843B1 (en) * 1999-10-27 2003-02-18 Strasbaugh High planarity chemical mechanical planarization
US6551179B1 (en) * 1999-11-05 2003-04-22 Strasbaugh Hard polishing pad for chemical mechanical planarization
US6379223B1 (en) * 1999-11-29 2002-04-30 Applied Materials, Inc. Method and apparatus for electrochemical-mechanical planarization
JP2001179611A (ja) 1999-12-24 2001-07-03 Nec Corp 化学的機械研磨装置
US6569004B1 (en) * 1999-12-30 2003-05-27 Lam Research Polishing pad and method of manufacture
US6368184B1 (en) 2000-01-06 2002-04-09 Advanced Micro Devices, Inc. Apparatus for determining metal CMP endpoint using integrated polishing pad electrodes
US6630059B1 (en) 2000-01-14 2003-10-07 Nutool, Inc. Workpeice proximity plating apparatus
US6368190B1 (en) * 2000-01-26 2002-04-09 Agere Systems Guardian Corp. Electrochemical mechanical planarization apparatus and method
US20030213703A1 (en) 2002-05-16 2003-11-20 Applied Materials, Inc. Method and apparatus for substrate polishing
US7066800B2 (en) 2000-02-17 2006-06-27 Applied Materials Inc. Conductive polishing article for electrochemical mechanical polishing
US6979248B2 (en) 2002-05-07 2005-12-27 Applied Materials, Inc. Conductive polishing article for electrochemical mechanical polishing
US6537144B1 (en) * 2000-02-17 2003-03-25 Applied Materials, Inc. Method and apparatus for enhanced CMP using metals having reductive properties
US6884153B2 (en) 2000-02-17 2005-04-26 Applied Materials, Inc. Apparatus for electrochemical processing
JP2001244223A (ja) 2000-02-29 2001-09-07 Hitachi Chem Co Ltd 研磨パッド
US6797623B2 (en) 2000-03-09 2004-09-28 Sony Corporation Methods of producing and polishing semiconductor device and polishing apparatus
US6482307B2 (en) 2000-05-12 2002-11-19 Nutool, Inc. Method of and apparatus for making electrical contact to wafer surface for full-face electroplating or electropolishing
JP2001269862A (ja) 2000-03-27 2001-10-02 Toshiba Corp 研磨パッド、研磨装置及び研磨方法
US6428394B1 (en) 2000-03-31 2002-08-06 Lam Research Corporation Method and apparatus for chemical mechanical planarization and polishing of semiconductor wafers using a continuous polishing member feed
US6402591B1 (en) 2000-03-31 2002-06-11 Lam Research Corporation Planarization system for chemical-mechanical polishing
US6261959B1 (en) 2000-03-31 2001-07-17 Lam Research Corporation Method and apparatus for chemically-mechanically polishing semiconductor wafers
US6383066B1 (en) * 2000-06-23 2002-05-07 International Business Machines Corporation Multilayered polishing pad, method for fabricating, and use thereof
US6656019B1 (en) 2000-06-29 2003-12-02 International Business Machines Corporation Grooved polishing pads and methods of use
US7160176B2 (en) * 2000-08-30 2007-01-09 Micron Technology, Inc. Methods and apparatus for electrically and/or chemically-mechanically removing conductive material from a microelectronic substrate
US7112121B2 (en) * 2000-08-30 2006-09-26 Micron Technology, Inc. Methods and apparatus for electrical, mechanical and/or chemical removal of conductive material from a microelectronic substrate
JP2004509467A (ja) 2000-09-18 2004-03-25 エーシーエム リサーチ,インコーポレイティド 超低誘電率誘電体と金属の組み合わせ
JP2002093761A (ja) 2000-09-19 2002-03-29 Sony Corp 研磨方法、研磨装置、メッキ方法およびメッキ装置
US6641471B1 (en) 2000-09-19 2003-11-04 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
US6257953B1 (en) 2000-09-25 2001-07-10 Center For Tribology, Inc. Method and apparatus for controlled polishing
US6475332B1 (en) 2000-10-05 2002-11-05 Lam Research Corporation Interlocking chemical mechanical polishing system
EP1207015A3 (de) 2000-11-17 2003-07-30 Keltech Engineering, Inc. Schleifartikel mit erhobenen Inseln, Anwendungsverfahren und Läppvorrichtung
US6572463B1 (en) 2000-12-27 2003-06-03 Lam Research Corp. Methods for making reinforced wafer polishing pads utilizing direct casting and apparatuses implementing the same
US6561889B1 (en) * 2000-12-27 2003-05-13 Lam Research Corporation Methods for making reinforced wafer polishing pads and apparatuses implementing the same
US20020146963A1 (en) 2001-02-08 2002-10-10 3M Innovative Properties Company Composition containing graphite
US6736952B2 (en) 2001-02-12 2004-05-18 Speedfam-Ipec Corporation Method and apparatus for electrochemical planarization of a workpiece
US6840843B2 (en) 2001-03-01 2005-01-11 Cabot Microelectronics Corporation Method for manufacturing a polishing pad having a compressed translucent region
US6899804B2 (en) 2001-04-10 2005-05-31 Applied Materials, Inc. Electrolyte composition and treatment for electrolytic chemical mechanical polishing
US6811680B2 (en) 2001-03-14 2004-11-02 Applied Materials Inc. Planarization of substrates using electrochemical mechanical polishing
US6479962B2 (en) 2001-03-16 2002-11-12 Hewlett-Packard Company In-device charging system and method for multi-chemistry battery systems
US6517426B2 (en) * 2001-04-05 2003-02-11 Lam Research Corporation Composite polishing pad for chemical-mechanical polishing
US6572755B2 (en) 2001-04-11 2003-06-03 Speedfam-Ipec Corporation Method and apparatus for electrochemically depositing a material onto a workpiece surface
JP2002334858A (ja) 2001-05-10 2002-11-22 Canon Inc 半導体基板の研磨装置
JP2004531899A (ja) 2001-06-21 2004-10-14 マイクロン テクノロジー インコーポレイテッド ミクロ電子基板から導電物質を電気的、機械的および/または化学的に除去する方法および装置
US20030013397A1 (en) * 2001-06-27 2003-01-16 Rhoades Robert L. Polishing pad of polymer coating
KR20030015567A (ko) * 2001-08-16 2003-02-25 에스케이에버텍 주식회사 웨이브 형태의 그루브가 형성된 화학적 기계적 연마패드
US6884724B2 (en) * 2001-08-24 2005-04-26 Applied Materials, Inc. Method for dishing reduction and feature passivation in polishing processes
US6776693B2 (en) 2001-12-19 2004-08-17 Applied Materials Inc. Method and apparatus for face-up substrate polishing
US6848977B1 (en) * 2003-08-29 2005-02-01 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Polishing pad for electrochemical mechanical polishing

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CN2737501Y (zh) 2005-11-02
DE60304505T2 (de) 2006-09-07
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EP1361023A3 (de) 2004-04-07
CN1458671A (zh) 2003-11-26
KR200331228Y1 (ko) 2003-10-23
JP2004134732A (ja) 2004-04-30
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